Non-destructively qualitative and quantitative inspection methods based on THz spectroscopy and imaging (Unbekannt)
- Neue Suche nach: Han, Tianyu
- Neue Suche nach: Xiong, Yi
- Neue Suche nach: Engarnevis, Amin
- Neue Suche nach: Li, Jingwen
- Neue Suche nach: Han, Tianyu
- Neue Suche nach: Xiong, Yi
- Neue Suche nach: Engarnevis, Amin
- Neue Suche nach: Li, Jingwen
In:
Optical Engineering
;
63
, 2
;
023101
;
2024
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Non-destructively qualitative and quantitative inspection methods based on THz spectroscopy and imaging
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Weitere Titelangaben:Opt. Eng.
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Beteiligte:Han, Tianyu ( Autor:in ) / Xiong, Yi ( Autor:in ) / Engarnevis, Amin ( Autor:in ) / Li, Jingwen ( Autor:in )
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Erschienen in:Optical Engineering ; 63, 2 ; 023101
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Verlag:
- Neue Suche nach: Society of Photo-Optical Instrumentation Engineers
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Erscheinungsdatum:01.02.2024
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Format / Umfang:17 pages
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ISSN:
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Coden:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Unbekannt
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 63, Ausgabe 2
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