Measurement of chromatic dispersion of microstructured polymer fibers by white-light spectral interferometry (Englisch)
- Neue Suche nach: Hlubina, P.
- Neue Suche nach: Ciprian, D.
- Neue Suche nach: Frosz, M. H.
- Neue Suche nach: Nielsen, K.
- Neue Suche nach: Hlubina, P.
- Neue Suche nach: Ciprian, D.
- Neue Suche nach: Frosz, M. H.
- Neue Suche nach: Nielsen, K.
In:
Proc. SPIE
;
7389
; 73890J
;
2009
-
ISBN:
-
ISSN:
- Aufsatz (Konferenz) / Elektronische Ressource
-
Titel:Measurement of chromatic dispersion of microstructured polymer fibers by white-light spectral interferometry
-
Beteiligte:Hlubina, P. ( Autor:in ) / Ciprian, D. ( Autor:in ) / Frosz, M. H. ( Autor:in ) / Nielsen, K. ( Autor:in )
-
Kongress:Optical Measurement Systems for Industrial Inspection VI ; 2009 ; Munich,Germany
-
Erschienen in:Proc. SPIE ; 7389 ; 73890J
-
Verlag:
- Neue Suche nach: SPIE
-
Erscheinungsdatum:17.06.2009
-
ISBN:
-
ISSN:
-
DOI:
-
Medientyp:Aufsatz (Konferenz)
-
Format:Elektronische Ressource
-
Sprache:Englisch
-
Datenquelle:
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 73890A
-
Predictive segmentation method for 3D inspection accuracy and robustness improvementReiner, J. / Stankiewicz, M. / Wójcik, M. et al. | 2009
- 73890B
-
Quality-guided phase unwrapping for the modified Fourier transform methodGuo, Hong / Huang, Peisen et al. | 2009
- 73890C
-
3D reconstruction by polarimetric imaging method based on perspective modelRantoson, Rindra / Stolz, Christophe / Fofi, David / Mériaudeau, Fabrice et al. | 2009
- 73890D
-
Optical 3D shape measurement for dynamic object using color fringe pattern projection and empirical mode decompositionZhou, Xiang / Zhao, Hong / Zhang, Pengfei et al. | 2009
- 73890F
-
Development of a high resolution pattern projection system using linescan camerasDenkena, B. / Huke, P. et al. | 2009
- 73890G
-
Industrial inspections by speckle interferometry: general requirements and a case studyViotti, Matias R. / Albertazzi G., Armando et al. | 2009
- 73890H
-
Out-of-plane vibration analysis with a transmission holographic-optical-element-based electronic speckle pattern interferometerBavigadda, Viswanath / Toal, Vincent / Jallapuram, Raghavendra / Mihaylova, Emilia et al. | 2009
- 73890I
-
Out-of-plane deformation dynamic measurement method by using virtual speckle pattern based on Carré algorithmArai, Y. / Tsutsumi, Y. / Yokozeki, S. et al. | 2009
- 73890J
-
Measurement of chromatic dispersion of microstructured polymer fibers by white-light spectral interferometryHlubina, P. / Ciprian, D. / Frosz, M. H. / Nielsen, K. et al. | 2009
- 73890K
-
Characterization of optical fibers by digital holographic interferometryWahba, Hamdy H. / Kreis, Thomas et al. | 2009
- 73890L
-
Digital holographic tomography of phase objectsAnand, Arun / Chhaniwal, Vani K. / Pedrini, Giancarlo / Osten, Wolfgang et al. | 2009
- 73890M
-
Phase object power mapping and cosmetic defects enhancement by Fourier-based deflectometryBeghuin, D. / Dubois, X. / Joannes, L. et al. | 2009
- 73890N
-
Extraction of shape and roughness using scattering lightSeewig, J. / Beichert, G. / Brodmann, R. / Bodschwinna, H. / Wendel, M. et al. | 2009
- 73890O
-
The complete acquisition of the topography of a special multi-mirror arrangement with the help of a Fizeau interferometerXu, H. / Müller, A. / Balzer, F. / Percle, B. / Manske, E. / Jäger, G. et al. | 2009
- 73890P
-
Ball bearing measurement with white light interferometrySchmit, Joanna / Han, Sen / Novak, Erik et al. | 2009
- 73890Q
-
Highly sensitive wavefront sensor for characterization of micro- to nanometer-scale surface flatness deviationsLazareva, I. / Nutsch, A. / Pfitzner, L. / Frey, L. et al. | 2009
- 73890R
-
Profilometry of semiconductor components by two-colour holography with Bi12TiO20crystalsOliveira Preto, André / Acedo Barbosa, Eduardo et al. | 2009
- 73890S
-
Fast total scattering facility for 2D inspection of optical and functional surfacesKadkhoda, P. / Sakiew, W. / Günster, S. / Ristau, D. et al. | 2009
- 73890T
-
Soft x-ray projection system for robust roundness measurementsVolk, Raimund / Neumann, Ernst / Warrikhoff, Alexander / Hanke, Randolf / Kasperl, Stefan / Funk, Christoph / Hiller, Jochen / Krumm, Michael / Acharya, Sudarsan / Sukowski, Frank et al. | 2009
- 73890U
-
Gauge block calibration by using a high speed phase shifting interferometer comprising two frequency scanning diode lasersKim, Jae Wan / Kim, Jong-Ahn / Jang, Roma / Kang, Chu-Shik et al. | 2009
- 73890V
-
Development of an ultrasensitive interferometry system as a key to precision metrology applicationsGohlke, Martin / Schuldt, Thilo / Weise, Dennis / Johann, Ulrich / Peters, Achim / Braxmaier, Claus et al. | 2009
- 73890W
-
Common-path two-wavelength interferometer with submicron precision for profile measurements in online applicationsEnguita, José M. / Álvarez, Ignacio / Frade, María / Marina, Jorge et al. | 2009
- 73890X
-
Digital interferometry using sequentially recorded intensity patternsGombkötö, B. / Kornis, J. et al. | 2009
- 73890Y
-
Small lens testing method using phase shift shearing interferometerHanayama, Ryohei / Ishii, Katsuhiro / Matsuda, Kiyofumi et al. | 2009
- 73890Z
-
Reproducibility of contact lens power measurements using the phase shifting schlieren methodJoannes, Luc / Hough, Tony / Hutsebaut, Xavier / Dubois, Xavier / Ligot, Renaud / Saoul, Bruno / Van Donink, Philip / De Coninck, Kris et al. | 2009
- 73891A
-
Noncontact methods for optical testing of convex aspheric mirrors for future large telescopesGoncharov, Alexander V. / Druzhin, Vladislav V. / Batshev, Vladislav I. et al. | 2009
- 73891B
-
Dual-CGH interferometry test for x-ray mirror mandrelsGao, Guangjun / Lehan, John P. / Griesmann, Ulf et al. | 2009
- 73891C
-
Measurement and simulation of striae in optical glassGross, H. / Hofmann, M. / Jedamzik, R. / Hartmann, P. / Sinzinger, S. et al. | 2009
- 73891D
-
Photothermal measurement of absorptance losses, temperature-induced wavefront deformation, and compaction in DUV opticsSchäfer, Bernd / Flöter, Bernhard / Mann, Klaus et al. | 2009
- 73891H
-
Several micron-range measurements with sub-nanometric resolution by the use of dual-wavelength digital holography and vertical scanningColomb, Tristan / Kühn, Jonas / Depeursinge, Christian / Emery, Yves et al. | 2009
- 73891I
-
Digital holographic characterization of liquid microlenses array fabricated in electrode-less configurationMiccio, L. / Vespini, V. / Grilli, S. / Paturzo, M. / Finizio, A. / De Nicola, S. / Ferraro, P. et al. | 2009
- 73891J
-
Optical, mechanical, and electro-optical design of an interferometric test station for massive parallel inspection of MEMS and MOEMSGastinger, Kay / Haugholt, Karl Henrik / Kujawinska, Malgorzata / Jozwik, Michal / Schaeffel, Christoph / Beer, Stephan et al. | 2009
- 73891K
-
Thin film interferometer using a light source with spectrally nonequidistantly distributed sampling pointsHirth, Florian / Dudeck, Sven / Jakobi, Martin / Gerhard, Detlef / Koch, Alexander W. et al. | 2009
- 73891L
-
All-interferometric six-degrees-of-freedom sensor based on laser self-mixingOttonelli, Simona / De Lucia, Francesco / Dabbicco, Maurizio / Scamarcio, Gaetano et al. | 2009
- 73891M
-
Compensated laser encoder with symmetric and quasi-common-path heterodyne interferometryHsu, Cheng-Chih / Lee, Ju-Yi / Wu, Chyan-Chyi et al. | 2009
- 73891N
-
Pseudo-periodic patterns for subpixel accuracy visual control: principle, pattern designs, and performancesGaleano Zea, July A. / Sandoz, Patrick et al. | 2009
- 73891O
-
Determination of the frequency spectrum of Lamb waves from a sequence of maps of the instantaneous acoustic displacement obtained with TV holographyDeán, J. Luis / Trillo, Cristina / López-Vázquez, J. Carlos / Doval, Ángel F. / Fernández, José L. et al. | 2009
- 73891P
-
Dynamic holographic interferometry for dilatation measurements in a vacuum-thermal environmentThizy, C. / Barbier, C. / Barzin, P. / Tychon, I. / Roose, S. / Stockman, Y. / Georges, M. et al. | 2009
- 73891Q
-
In-situ position and vibration measurement of rough surfaces using laser Doppler distance sensorsCzarske, J. / Pfister, T. / Günther, P. / Büttner, L. et al. | 2009
- 73891R
-
Study on the temporal coherence function of a femtosecond optical frequency combWei, Dong / Takahashi, Satoru / Takamasu, Kiyoshi / Matsumoto, Hirokazu et al. | 2009
- 73891S
-
Structural damage identification based on laser ultrasonic propagation imaging technologyChia, Chen-Ciang / Jang, Si-Gwang / Lee, Jung-Ryul / Yoon, Dong-Jin et al. | 2009
- 73891T
-
Real-time defect detection in transparent multilayer polymer films using structured illumination and 1D filteringMichaeli, Walter / Berdel, Klaus / Osterbrink, Oliver et al. | 2009
- 73891V
-
Novel fiber-based technique for inspection of holes in narrow-bore tubesBernard, Fabien / Flaherty, Tony / O'Connor, Gerard M. et al. | 2009
- 73891W
-
Development and application of a photogrammetric endoscopic system for measurement of misalignment and internal profile of welded joints in pipelinesAlbertazzi G., Armando / Hofmann, Allan C. / Fantin, Analucia V. / Santos, João M. C. et al. | 2009
- 73891X
-
Industrial online surface defects detection in continuous casting hot slabsAlvarez, Ignacio / Marina, Jorge / Enguita, Jose Maria / Fraga, Cesar / Garcia, Ricardo et al. | 2009
- 73891Y
-
Optical classification for quality and defect analysis of train brakesGlock, Stefan / Hausmann, Stefan / Gerke, Sebastian / Warok, Alexander / Spiess, Peter / Witte, Stefan / Lohweg, Volker et al. | 2009
- 73891Z
-
Two-sided laser device for online paper caliper measurement and controlHughes, Michael K. Y. / Bengtsson, Markus / Hui, Pak / Duck, Graham et al. | 2009
- 73892B
-
Study on laser vision measurement technology of large-size workpiece straightnessZhou, Xinglin / Ye, Shenghua / Qu, Xinghua et al. | 2009
- 73892C
-
Polarized optical scattering measurements of metallic nanoparticles upon a silicon waferLiu, Cheng-Yang / Fu, Wei-En et al. | 2009
- 73892D
-
Fabrication and optical characteristics of silicon-based two-dimensional photonic crystal wavelength division multiplexing splitterLiu, Cheng-Yang et al. | 2009
- 73892E
-
Simple method for the measurement of small wavelength differences by optical activity of cholesteric liquid crystal and heterodyne interferometerChen, Jing-Heng / Chen, Kun-Huang / Lin, Jiun-You / Hsieh, Hsiang-Yung / Chang, Wei-Yao et al. | 2009
- 73892F
-
Study of the measurement of solution concentration by surface plasmon resonance heterodyne interferometerChen, Kun-Huang / Chen, Jing-Heng / Lin, Jiun-You / Chang, Wei-Yao / Hsieh, Hsiang-Yung et al. | 2009
- 73892G
-
Wavelength-modulated heterodyne speckle interferometry for displacement measurementLee, Ju-Yi / Lin, Kun-Yi / Huang, Szu-Han et al. | 2009
- 73892H
-
3D shape measurement using curvature dataKim, ByoungChang / Kwon, MinChel / Choo, ByoungUck / Yoon, InJeong et al. | 2009
- 73892I
-
Evaluation of aliasing influence on the performance of hybrid optical-digital speckle correlatorMuravsky, Leonid I. / Sakharuk, Olexander M. / Yezhov, Pavel V. et al. | 2009
- 73892J
-
Automated ethernet-based test setup for long wave infrared camera analysis and algorithm evaluationEdeler, Torsten / Ohliger, Kevin / Lawrenz, Sönke / Hussmann, Stephan et al. | 2009
- 73892K
-
Influence of material dispersion on the measurement accuracy of chromatic sensorsMiks, Antonin / Novak, Jiri / Novak, Pavel / Kajnar, Pavel et al. | 2009
- 73892L
-
High-precision alignment technique through quality image analysisArasa, J. / Oteo, E. / Blanco, P. et al. | 2009
- 73892M
-
Makyoh topography studies of the morphology of periodic and quasi-periodic surfacesRiesz, Ferenc et al. | 2009
- 73892O
-
Surface quality control in diamond abrasive finishingFilatov, Yuriy D. / Sidorko, Volodymyr I. / Filatov, Olexandr Yu. / Yaschuk, Vasil P. / Heisel, Uwe / Storchak, Michael et al. | 2009
- 73892P
-
Analysis of low activity in dynamic speckle patternsGuzman, M. N. / Sendra, G. H. / Rabal, H. J. / Arizaga, R. / Trivi, M. et al. | 2009
- 73892Q
-
Rock porosity and fracture parameter estimation by image techniqueWang, W. / Wang, Ch. Z. / Hu, Y. Z. et al. | 2009
- 73892R
-
Multiple object image segmentation algorithm based on wavelet theoryWang, W. / Wang, Z. et al. | 2009
- 73892S
-
Auto-focusing in the scanning white-light interferometerWang, Wei Cheng / Chen, Jin-Liang et al. | 2009
- 73892T
-
Spatial resolution enhancement for Brillouin optical time domain analysis distributed sensor by use of correlation peakNouri Jouybari, Soodabeh / Latifi, Hamid / Ahmadlou, Atefeh / Karami, Morteza et al. | 2009
- 73892U
-
Simulation and fabrication of white light confocal microscope to attain the surface profile using CCD and image processing techniquesBehroodi, E. / Mousavian, A. / Latifi, H. et al. | 2009
- 73892V
-
Weighted integral method in white-light interferometry: envelope estimation from fraction of interferogramSato, Seichi / Ando, Shigeru et al. | 2009
- 73892W
-
Development of 3D control of a tiny dew droplet by scattered laser lightMatsumoto, Shigeaki et al. | 2009
- 73892X
-
Measurement of temperature, refractive index, density distribution, and convective heat transfer coefficient around a vertical wire by the Michelson interferometerMadanipour, K. / Fatehi, S. / Parvin, P. et al. | 2009
- 73892Y
-
Novel instrumentation for interferometric nanoscale comparatorCizek, Martin / Buchta, Zdenek / Mikel, Bretislav / Lazar, Josef / Cip, Ondrej et al. | 2009
- 73892Z
-
Dynamic evaluation of lateral and vertical displacement of thermally actuated MEMS devicesHanhijärvi, Kalle / Aaltonen, Juha / Kassamakov, Ivan / Sainiemi, Lauri / Grigoras, Kestutis / Franssila, Sami / Hæggström, Edward et al. | 2009
- 73893A
-
Optical noncontact roughness measurements for the assessment of stress and deformation in tubular metallic parts of auto seatsCosta, Manuel F. M. / Quierós de Melo, Francisco J. / Carneiro, Joaquim A. O. et al. | 2009
- 73893C
-
Combined stereovision and phase shifting method: a new approach for 3D shape measurementHan, Xu / Huang, Peisen et al. | 2009
- 73893D
-
Sensor for measurement of hydrocarbons concentration based on optic fiberPawłat, Joanna / Li, Xuefeng / Matsuo, Takahiro / Zimin, Yura / Ueda, Toshitsugu et al. | 2009
- 73893E
-
Three-dimensional shape measurement by means of depth-to-coherence coding of the object shapeMicó, Vicente / Valero, Estela / Zalevsky, Zeev / García, Javier et al. | 2009
- 73893F
-
Nondestructive testing of aerospace composites with an infrared matrix laser vibrometerKilpatrick, James / Apostol, Adela / Markov, Vladimir et al. | 2009
- 73893G
-
Multifocus microscope image fusion analysis based on Daubechies waveletsPadilla-Vivanco, Alfonso / Toxqui-Quitl, Carina / Santiago-Tepantlan, C. et al. | 2009
- 73893H
-
Combined stereovision and phase shifting method: use of a visibility-modulated fringe patternHan, Xu / Huang, Peisen et al. | 2009
- 73893K
-
AFM characterization of large area micro-optical elementsOliva, M. / Benkenstein, T. / Flemming, M. / Zeitner, U. D. et al. | 2009
- 73893L
-
Inspection of aspherical lenses by wavefront analysisCeyhan, Ufuk / Henning, Thomas / Fleischmann, Friedrich / Knipp, Dietmar et al. | 2009
- 73893M
-
3D shape measurement using curvature data - ErratumKim, ByoungChang / Kwon, MinChel / Choo, ByoungUck / Yoon, InJeong et al. | 2009
- 738901
-
Front Matter: Volume 7389| 2009
- 738902
-
Flexible optical metrology strategies for the control and quality assurance of small series productionSchmitt, R. / Pavim, A. et al. | 2009
- 738903
-
Sensor and actuator conditioning for multiscale measurement systems on example of confocal microscopyLyda, W. / Zimmermann, J. / Burla, A. / Regin, J. / Osten, W. / Sawodny, O. / Westkämper, E. et al. | 2009
- 738904
-
Remote online monitoring and measuring system for civil engineering structuresKujawińska, Malgorzata / Sitnik, Robert / Dymny, Grzegorz / Karaszewski, Maciej / Michoński, Kuba / Krzesłowski, Jakub / Mularczyk, Krzysztof / Bolewicki, Paweł et al. | 2009
- 738905
-
Resolution-enhanced approaches in digital holographyPaturzo, M. / Ferraro, P. et al. | 2009
- 738906
-
Investigation of the thermal lens effect of a NdYAG laserEttemeyer, A. / Jütz, J. / Spiegel, M. / Dobler, K. et al. | 2009
- 738907
-
Microfluidic system based on the digital holography microscope for analysis of motile spermDi Caprio, G. / Coppola, G. / Grilli, S. / Ferraro, P. / Puglisi, R. / Balduzzi, D. / Galli, A. et al. | 2009
- 738908
-
Automated compensation of fringe pattern in digital holography and TV holographyKornis, János / Séfel, Richárd et al. | 2009
- 738909
-
Calibration of a combined system with phase measuring deflectometry and fringe projectionBreitbarth, Martin / Kühmstedt, Peter / Notni, Gunther et al. | 2009
- 738910
-
Phase analysis error reduction in the Fourier transform method using a virtual interferogramToba, H. / Liu, Z. / Udagawa, S. / Fujiwara, N. / Nakayama, S. / Gemma, T. / Takeda, M. et al. | 2009
- 738911
-
Parameter determination of biconvex lenses using confocal imagingChhaniwal, Vani K. / Anand, Arun et al. | 2009
- 738912
-
Optical testing of lens systems with concentric designGoncharov, Alexander V. / Lobato Bailón, Laura / Devaney, Nicholas M. / Dainty, Christopher et al. | 2009
- 738913
-
Simplified laser Doppler distance sensor employing a single fan-shaped interference fringe system for dynamic position and shape measurement of laterally moving objectsPfister, Thorsten / Büttner, Lars / Czarske, Jürgen et al. | 2009
- 738914
-
Surface profile analysis using a fiber optic low-coherence interferometerSchmitt, Robert / König, Niels / Manfrin de Araújo, Elisa et al. | 2009
- 738915
-
Fiber optic interferometric sensor based on mechanical oscillationLehmann, Peter / Schulz, Markus / Niehues, Jan et al. | 2009
- 738916
-
Interferometric measurement of rotationally symmetric aspheric surfacesKüchel, Michael F. et al. | 2009
- 738918
-
New metrology approach for the production of aspheric lensesBeutler, Andreas et al. | 2009
- 738919
-
Measuring aspheres with a chromatic Fizeau interferometerSeifert, L. / Pruss, C. / Dörband, B. / Osten, W. et al. | 2009
- 738920
-
Calibration method for accurate optical measurement of thickness profile for the paper industryGraeffe, Jussi et al. | 2009
- 738921
-
FASEP ultra-automated analysis of fibre length distribution in glass-fibre-reinforced productsHartwich, Mark R. / Höhn, Norbert / Mayr, Helga / Sandau, Konrad / Stengler, Ralph et al. | 2009
- 738922
-
Electro-optic sensors dedicated to noninvasive electric field characterizationWarzecha, A. / Bernier, M. / Gaborit, G. / Duvillaret, L. / Lasserre, J.-L. et al. | 2009
- 738923
-
Spectral peak tracking for enhanced fiber optic sensingPlattner, Markus P. / Brand, C. N. / Mair, T. / Schupfer, S. / Buck, T. C. / Koch, A. W. et al. | 2009
- 738924
-
A novel fiber grating array vibration monitoring system for large area safetyMeng, FanYong / Yang, Bin / Li, Zhigang / Dong, Susan / Guo, ZhuanYun et al. | 2009
- 738925
-
New 3D high-accuracy optical coordinates measuring technique based on an infrared target and binocular stereo visionLi, Jinjun / Zhao, Hong / Fu, Qiang / Zhang, Pengfei / Zhou, Xiang et al. | 2009
- 738926
-
White-light spectral interferometry and reflectometry to measure thickness of thin filmsHlubina, P. / Luńáček, J. / Ciprian, D. et al. | 2009
- 738927
-
New approach to workpiece localization in subaperture stitching interferometric testingZhang, Pengfei / Zhao, Hong / Jiang, Tao / Li, Jinjun / Zhou, Xiang / Zhang, Lu et al. | 2009
- 738928
-
Sheath flow stability controlling research in dynamic individual particles scattering measurementZhang, Lu / Zhao, Hong / Zhang, Pengfei / Zhou, Xiang / Li, Jinjun et al. | 2009
- 738929
-
Non-metal elemental analysis by a compact low-energy high-repetition rate laser-induced-breakdown spectrometerWagner, Christian / Ewald, Johannes / Ankerhold, Georg / Kohns, Peter et al. | 2009
- 738930
-
Performance analysis of interrogators for fiber Bragg grating sensors based on arrayed waveguide gratingsBuck, Thorbjörn C. / Müller, Mathias S. / Plattner, Markus / Koch, Alexander W. et al. | 2009
- 738931
-
Interferometric characterization of mono- and polycrystalline CVD diamondVannoni, Maurizio / Molesini, Giuseppe / Sciortino, Silvio / Lagomarsino, Stefano / Olivero, Paolo et al. | 2009
- 738932
-
Effect of surface defects on the self-images produced by diffraction gratingsSanchez-Brea, Luis Miguel / Salgado-Remacha, Francisco Javier / Torcal-Milla, Francisco José et al. | 2009
- 738933
-
Precise measurement of the length by means of DFB diode and femtosecond laserŠmíd, Radek / Lazar, Josef / Jezek, Jan / Ružička, Bohdan et al. | 2009
- 738934
-
Classification of mechanical parts using an optical-digital system and the Jacobi-Fourier momentsToxqui-Quitl, Carina / Padilla-Vivanco, Alfonso / Baez-Rojas, J. et al. | 2009
- 738935
-
Characterization of deformable elastic lenses using PDI and null screenSantiago Alvarado, A. / Granados Agustín, F. S. / Vázquez Montiel, S. / Campos García, M. / Dìaz Uribe, R. et al. | 2009
- 738936
-
Correlating buried-finger photodetector for time-of-flight applicationsZach, G. / Nemecek, A. / Oberhauser, K. / Zimmermann, H. et al. | 2009
- 738937
-
Modelling for characterizing defects in plates using two-dimensional maps of instantaneous ultrasonic out-of-plane displacement obtained by pulsed TV-holographyLópez-Vázquez, J. Carlos / Deán, J. Luis / Trillo, Cristina / Doval, Ángel F. / Fernández, José L. / Amlani, Faisal / Bruno, Oscar P. et al. | 2009
- 738938
-
Determination of thermal lens effect by white light interferometryÖnal Tayyar, Duygu / Emir, Ahmet / Saraç, Zehra et al. | 2009
- 738939
-
A Fizeau interferometer system with double-pass and stitching for characterizing the figure error of large (>1m) synchrotron opticsLudbrook, G. D. / Alcock, S. G. / Sawhney, K. J. S. et al. | 2009
-
Flexible optical metrology strategies for the control and quality assurance of small series production [7389-01]Schmitt, R. / Pavim, A. / SPIE (Society) et al. | 2009
-
Microfluidic system based on the digital holography microscope for analysis of motile sperm [7389-07]Di Caprio, G. / Coppola, G. / Grilli, S. / Ferraro, P. / Puglisi, R. / Balduzzi, D. / Galli, A. / SPIE (Society) et al. | 2009
-
Soft x-ray projection system for robust roundness measurements [7389-30]Volk, R. / Neumann, E. / Warrikhoff, A. / Hanke, R. / Kasperi, S. / Funk, C. / Hiller, J. / Krumm, M. / Acharya, S. / Sukowski, F. et al. | 2009
-
Compensated laser encoder with symmetric and quasi-common-path heterodyne interferometry [7389-59]Hsu, C.-C. / Lee, J.-Y. / Wu, C.-C. / SPIE (Society) et al. | 2009
-
Simple method for the measurement of small wavelength differences by optical activity of cholesteric liquid crystal and heterodyne interferometer [7389-86]Chen, J.-H. / Chen, K.-H. / Lin, J.-Y. / Hsieh, H.-Y. / Chang, W.-Y. / SPIE (Society) et al. | 2009
-
High-precision alignment technique through quality image analysis [7389-96]Arasa, J. / Oteo, E. / Blanco, P. / SPIE (Society) et al. | 2009
-
Interferometric characterization of mono- and polycrystalline CVD diamond [7389-102]Vannoni, M. / Molesini, G. / Sciortino, S. / Lagomarsino, S. / Olivero, P. / SPIE (Society) et al. | 2009
-
Precise measurement of the length by means of DFB diode and femtosecond laser [7389-114]Smid, R. / Cip, O. / Lazar, J. / Jezek, J. / Ruzicka, B. / SPIE (Society) et al. | 2009
-
Determination of thermal lens effect by white light interferometry [7389-119]Tayyar, D.O. / Emir, A. / Sarac, Z. / SPIE (Society) et al. | 2009
-
Industrial inspections by speckle interferometry: general requirements and a case study (Invited Paper) [7389-16]Viotti, M.R. / Albertazzi G., A. / SPIE (Society) et al. | 2009
-
Out-of-plane vibration analysis with a transmission holographic-optical-element-based electronic speckle pattern interferometer [7389-17]Bavigadda, V. / Toal, V. / Jallapuram, R. / Mihaylova, E. / SPIE (Society) et al. | 2009
-
Out-of-plane deformation dynamic measurement method by using virtual speckle pattern based on Carre algorithm [7389-18]Arai, Y. / Tsutsumi, Y. / Yokozeki, S. / SPIE (Society) et al. | 2009
-
Common-path two-wavelength interferometer with submicron precision for profile measurements in online applications [7389-33]Enguita, J.M. / Alvarez, I. / Frade, M. / Marina, J. / SPIE (Society) et al. | 2009
-
In-situ position and vibration measurement of rough surfaces using laser Doppler distance sensors [7389-63]Czarske, J. / Pfister, T. / Gunther, P. / Buttner, L. / SPIE (Society) et al. | 2009
-
Novel instrumentation for interferometric nanoscale comparator [7389-109]Cizek, M. / Buchta, Z. / Mikel, B. / Lazar, J. / Cip, O. / SPIE (Society) et al. | 2009
-
Performance analysis of interrogators for fiber Bragg grating sensors based on arrayed waveguide gratings [7389-111]Buck, T.C. / Muller, M.S. / Plattner, M. / Koch, A.W. / SPIE (Society) et al. | 2009
-
Investigation of the thermal lens effect of a NdYAG laser [7389-05]Ettemeyer, A. / Jutz, J. / Spiegel, M. / Dobler, K. / SPIE (Society) et al. | 2009
-
Automated compensation of fringe pattern in digital holography and TV holography [7389-129]Kornis, J. / Sefel, R. / SPIE (Society) et al. | 2009
-
3D reconstruction by polarimetric imaging method based on perspective model [7389-12]Rantoson, R. / Stolz, C. / Fofi, D. / Meriaudeau, F. / SPIE (Society) et al. | 2009
-
Characterization of optical fibers by digital holographic interferometry [7389-21]Wahba, H.H. / Kreis, T. / SPIE (Society) et al. | 2009
-
Noncontact methods for optical testing of convex aspheric mirrors for future large telescopes [7389-47]Goncharov, A.V. / Druzhin, V.V. / Batshev, V.I. / SPIE (Society) et al. | 2009
-
Novel fiber-based technique for inspection of holes in narrow-bore tubes [7389-67]Bernard, F. / Flaherty, T. / O Connor, G.M. / SPIE (Society) et al. | 2009
-
Spectral peak tracking for enhanced fiber optic sensing [7389-75]Plattner, M.P. / Brand, C.N. / Mair, T. / Schupfer, S. / Buck, T.C. / Koch, A.W. / SPIE (Society) et al. | 2009
-
Influence of material dispersion on the measurement accuracy of chromatic sensors [7389-95]Miks, A. / Novak, J. / Novak, P. / Kajnar, P. / SPIE (Society) et al. | 2009
-
Makyoh topography studies of the morphology of periodic and quasi-periodic surfaces [7389-97]Riesz, F. / SPIE (Society) et al. | 2009
-
Classification of mechanical parts using an optical-digital system and the Jacobi-Fourier moments [7389-115]Toxqui-Quitl, C. / Padilla-Vivanco, A. / Baez-Rojas, J. / SPIE (Society) et al. | 2009
-
Fast total scattering facility for 2D inspection of optical and functional surfaces [7389-29]Kadkhoda, P. / Sakiew, W. / Gunster, S. / Ristau, D. / SPIE (Society) et al. | 2009
-
Phase analysis error reduction in the Fourier transform method using a virtual interferogram [7389-37]Toba, H. / Liu, Z. / Udagawa, S. / Fujiwara, N. / Nakayama, S. / Gemma, T. / Takeda, M. / SPIE (Society) et al. | 2009
-
Dual-CGH interferometry test for x-ray mirror mandrels [7389-48]Gao, G. / Lehan, J.P. / Griesmann, U. / SPIE (Society) et al. | 2009
-
Real-time defect detection in transparent multilayer polymer films using structured illumination and 1D filtering [7389-65]Michaeli, W. / Berdel, K. / Osterbrink, O. / SPIE (Society) et al. | 2009
-
Development and application of a photogrammetric endoscopic system for measurement of misalignment and internal profile of welded joints in pipelines [7389-68]Albertazzi G., A. / Hofmann, A.C. / Fantin, A.V. / Santos, J.M.C. / SPIE (Society) et al. | 2009
-
Calibration method for accurate optical measurement of thickness profile for the paper industry [7389-72]Graeffe, J. / SPIE (Society) et al. | 2009
-
A novel fiber grating array vibration monitoring system for large area safety [7389-76]Meng, F. / Yang, B. / Li, Z. / Dong, S. / Guo, Z. / SPIE (Society) et al. | 2009
-
New 3D high-accuracy optical coordinates measuring technique based on an infrared target and binocular stereo vision [7389-77]Li, J. / Zhao, H. / Fu, Q. / Zhang, P. / Zhou, X. / SPIE (Society) et al. | 2009
-
Weighted integral method in white-light interferometry: envelope estimation from fraction of interferogram [7389-106]Sato, S. / Ando, S. / SPIE (Society) et al. | 2009
-
Small lens testing method using phase shift shearing interferometer [7389-35]Hanayama, R. / Ishii, K. / Matsuda, K. / SPIE (Society) et al. | 2009
-
New metrology approach for the production of aspheric lenses [7389-45]Beutler, A. / SPIE (Society) et al. | 2009
-
Measuring aspheres with a chromatic Fizeau interferometer [7389-46]Seifert, L. / Pruss, C. / Dorband, B. / Osten, W. / SPIE (Society) et al. | 2009
-
FASEP ultra-automated analysis of fibre length distribution in glass-fibre-reinforced products [7389-73]Hartwich, M.R. / Hohn, N. / Mayr, H. / Sandau, K. / Stengler, R. / SPIE (Society) et al. | 2009
-
Characterization of deformable elastic lenses using PDI and null screen [7389-116]Alvarado, A.S. / Agustin, F.S.G. / Montiel, S.V. / Garcia, M.C. / Uribe, R.D. / SPIE (Society) et al. | 2009
-
The complete acquisition of the topography of a special multi-mirror arrangement with the help of a Fizeau interferometer [7389-25]Xu, H. / Muller, A. / Balzer, F. / Percle, B. / Manske, E. / Jager, G. / SPIE (Society) et al. | 2009
-
Digital interferometry using sequentially recorded intensity patterns [7389-34]Gombkoto, B. / Kornis, J. / SPIE (Society) et al. | 2009
-
Photothermal measurement of absorptance losses, temperature-induced wavefront deformation, and compaction in DUV optics [7389-50]Schafer, B. / Floter, B. / Mann, K. / SPIE (Society) et al. | 2009
-
Several micron-range measurements with sub-nanometric resolution by the use of dual-wavelength digital holography and vertical scanning [7389-54]Colomb, T. / Kuhn, J. / Depeursinge, C. / Emery, Y. / SPIE (Society) et al. | 2009
-
Determination of the frequency spectrum of Lamb waves from a sequence of maps of the instantaneous acoustic displacement obtained with TV holography [7389-61]Dean, J.L. / Trillo, C. / Lopez-Vazquez, J.C. / Doval, A.F. / Fernandez, J.L. / SPIE (Society) et al. | 2009
-
Automated ethernet-based test setup for long wave infrared camera analysis and algorithm evaluation [7389-94]Edeler, T. / Ohliger, K. / Lawrenz, S. / Hussmann, S. / SPIE (Society) et al. | 2009
-
Dynamic evaluation of lateral and vertical displacement of thermally actuated MEMS devices [7389-110]Hanhijarvi, K. / Aaltonen, J. / Kassamakov, I. / Sainiemi, L. / Grigoras, K. / Franssila, S. / Hoeggstrom, E. / SPIE (Society) et al. | 2009
-
Resolution-enhanced approaches in digital holography (Invited Paper) [7389-04]Paturzo, M. / Ferraro, P. / SPIE (Society) et al. | 2009
-
Fiber optic interferometric sensor based on mechanical oscillation [7389-42]Lehmann, P. / Schulz, M. / Niehues, J. / SPIE (Society) et al. | 2009
-
Measurement and simulation of striae in optical glass [7389-49]Gross, H. / Hofmann, M. / Jedamzik, R. / Hartmann, P. / Sinzinger, S. / SPIE (Society) et al. | 2009
-
Thin film interferometer using a light source with spectrally nonequidistantly distributed sampling points [7389-57]Hirth, F. / Dudeck, S. / Jakobi, M. / Gerhard, D. / Koch, A.W. / SPIE (Society) et al. | 2009
-
Optical classification for quality and defect analysis of train brakes [7389-70]Glock, S. / Hausmann, S. / Gerke, S. / Warok, A. / Spiess, P. / Witte, S. / Lohweg, V. / SPIE (Society) et al. | 2009
-
New approach to workpiece localization in subaperture stitching interferometric testing [7389-79]Zhang, P. / Zhao, H. / Jiang, T. / Li, J. / Zhou, X. / Zhang, L. / SPIE (Society) et al. | 2009
-
Polarized optical scattering measurements of metallic nanoparticles upon a silicon wafer [7389-84]Liu, C.-Y. / Fu, W.-E. / SPIE (Society) et al. | 2009
-
Analysis of low activity in dynamic speckle patterns [7389-100]Guzman, M.N. / Sendra, G.H. / Rabal, H.J. / Arizaga, R. / Trivi, M. / SPIE (Society) et al. | 2009
-
Surface quality control in diamond abrasive finishing [7389-99]Filatov, Y.D. / Sidorko, V.I. / Filatov, O.Y. / Yaschuk, V.P. / Heisel, U. / Storchak, M. / SPIE (Society) et al. | 2009
-
Optical noncontact roughness measurements for the assessment of stress and deformation in tubular metallic parts of auto seats [7389-123]Costa, M.F.M. / de Melo, F.J.Q. / Carneiro, J.A.O. / SPIE (Society) et al. | 2009
-
Sensor for measurement of hydrocarbons concentration based on optic fiber [7389-126]Pawlat, J. / Li, X. / Matsuo, T. / Zimin, Y. / Ueda, T. / SPIE (Society) et al. | 2009
-
Multifocus microscope image fusion analysis based on Daubechies wavelets [7389-130]Padilla-Vivanco, A. / Toxqui-Quitl, C. / Santiago-Tepantian, C. / SPIE (Society) et al. | 2009
-
Combined stereovision and phase shifting method: use of a visibility-modulated fringe pattern [7389-131]Han, X. / Huang, P. / SPIE (Society) et al. | 2009
-
Remote online monitoring and measuring system for civil engineering structures [7389-03]Kujawinska, M. / Sitnik, R. / Dymny, G. / Karaszewski, M. / Michonski, K. / Krzeslowski, J. / Mularczyk, K. / Bolewicki, P. / SPIE (Society) et al. | 2009
-
Optical 3D shape measurement for dynamic object using color fringe pattern projection and empirical mode decomposition [7389-13]Zhou, X. / Zhao, H. / Zhang, P. / SPIE (Society) et al. | 2009
-
Measurement of chromatic dispersion of microstructured polymer fibers by white-light spectral interferometry [7389-20]Hlubina, P. / Ciprian, D. / Frosz, M.H. / Nielsen, K. / SPIE (Society) et al. | 2009
-
Ball bearing measurement with white light interferometry [7389-26]Schmit, J. / Han, S. / Novak, E. / SPIE (Society) et al. | 2009
-
Highly sensitive wavefront sensor for characterization of micro- to nanometer-scale surface flatness deviations [7389-27]Lazareva, I. / Nutsch, A. / Pfitzner, L. / Frey, L. / SPIE (Society) et al. | 2009
-
Optical testing of lens systems with concentric design [7389-39]Goncharov, A.V. / Bailon, L.L. / Devaney, N.M. / Dainty, C. / SPIE (Society) et al. | 2009
-
Optical, mechanical, and electro-optical design of an interferometric test station for massive parallel inspection of MEMS and MOEMS [7389-56]Gastinger, K. / Haugholt, K.H. / Kujawinska, M. / Jozwik, M. / Schaeffel, C. / Beer, S. / SPIE (Society) et al. | 2009
-
Digital holographic characterization of liquid microlenses array fabricated in electrode-less configuration [7389-55]Miccio, L. / Vespini, V. / Grilli, S. / Paturzo, M. / Finizio, A. / De Nicola, S. / Ferraro, P. / SPIE (Society) et al. | 2009
-
All-interferometric six-degrees-of-freedom sensor based on laser self-mixing [7389-58]Ottonelli, S. / De Lucia, F. / Dabbicco, M. / Scamarcio, G. / SPIE (Society) et al. | 2009
-
Pseudo-periodic patterns for subpixel accuracy visual control: principle, pattern designs, and performances [7389-60]Zea, J.A.G. / Sandoz, P. / SPIE (Society) et al. | 2009
-
Dynamic holographic interferometry for dilatation measurements in a vacuum-thermal environment [7389-08]Thizy, C. / Barbier, C. / Barzin, P. / Tychon, I. / Roose, S. / Stockman, Y. / Georges, M. / SPIE (Society) et al. | 2009
-
Non-metal elemental analysis by a compact low-energy high-repetition rate laser-induced-breakdown spectrometer [7389-81]Wagner, C. / Ewald, J. / Ankerhold, G. / Kohns, P. / SPIE (Society) et al. | 2009
-
Rock porosity and fracture parameter estimation by image technique [7389-101]Wang, W. / Wang, C.Z. / Hu, Y.Z. / SPIE (Society) et al. | 2009
-
Multiple object image segmentation algorithm based on wavelet theory [7389-112]Wang, W. / Wang, Z. / SPIE (Society) et al. | 2009
-
Auto-focusing in the scanning white-light interferometer [7389-103]Wang, W.C. / Chen, J.-L. / SPIE (Society) et al. | 2009
-
Evaluation of aliasing influence on the performance of hybrid optical-digital speckle correlator [7389-93]Muravsky, L.I. / Sakharuk, O.M. / Karpenko, G.V. / Yezhov, P.V. / SPIE (Society) et al. | 2009
-
Nondestructive testing of aerospace composites with an infrared matrix laser vibrometer [7389-128]Kilpatrick, J. / Apostol, A. / Markov, V. / SPIE (Society) et al. | 2009
-
Inspection of aspherical lenses by wavefront analysis [7389-136]Ceyhan, U. / Henning, T. / Fleischmann, F. / Knipp, D. / SPIE (Society) et al. | 2009
-
Sensor and actuator conditioning for multiscale measurement systems on example of confocal microscopy [7389-02]Lyda, W. / Zimmermann, J. / Burla, A. / Regin, J. / Osten, W. / Sawodny, O. / Westkamper, E. / SPIE (Society) et al. | 2009
-
Extraction of shape and roughness using scattering light (Invited Paper) [7389-24]Seewig, J. / Beichert, G. / Brodmann, R. / Bodschwinna, H. / Wendel, M. / SPIE (Society) et al. | 2009
-
Profilometry of semiconductor components by two-colour holography with Bi~1~2TiO~2~0 crystals [7389-28]Preto, A.O. / Barbosa, E.A. / SPIE (Society) et al. | 2009
-
Parameter determination of biconvex lenses using confocal imaging [7389-38]Chhaniwal, V.K. / Anand, A. / SPIE (Society) et al. | 2009
-
White-light spectral interferometry and reflectometry to measure thickness of thin films [7389-78]Hlubina, P. / Lunacek, J. / Ciprian, D. / SPIE (Society) et al. | 2009
-
Fabrication and optical characteristics of silicon-based two-dimensional photonic crystal wavelength division multiplexing splitter [7389-85]Liu, C.-Y. / SPIE (Society) et al. | 2009
-
Spatial resolution enhancement for Brillouin optical time domain analysis distributed sensor by use of correlation peak [7389-104]Jouybari, S.N. / Latifi, H. / Ahmadlou, A. / Karami, M. / SPIE (Society) et al. | 2009
-
Modelling for characterizing defects in plates using two-dimensional maps of instantaneous ultrasonic out-of-plane displacement obtained by pulsed TV-holography [7389-118]Lopez-Vazquez, J.C. / Dean, J.L. / Trillo, C. / Doval, A.F. / Fernandez, J.L. / Amlani, F. / Bruno, O.P. / SPIE (Society) et al. | 2009
-
AFM characterization of large area micro-optical elements [7389-135]Oliva, M. / Benkenstein, T. / Flemming, M. / Zeitner, U.D. / SPIE (Society) et al. | 2009
-
Development of a high resolution pattern projection system using linescan cameras [7389-15]Denkena, B. / Huke, P. / SPIE (Society) et al. | 2009
-
Simplified laser Doppler distance sensor employing a single fan-shaped interference fringe system for dynamic position and shape measurement of laterally moving objects [7389-40]Pfister, T. / Buttner, L. / Czarske, J. / SPIE (Society) et al. | 2009
-
Surface profile analysis using a fiber optic low-coherence interferometer [7389-41]Schmitt, R. / Konig, N. / de Araujo, E.M. / SPIE (Society) et al. | 2009
-
Two-sided laser device for online paper caliper measurement and control [7389-71]Hughes, M.K.Y. / Bengtsson, M. / Hui, P. / Duck, G. / SPIE (Society) et al. | 2009
-
Study on laser vision measurement technology of large-size workpiece straightness [7389-83]Zhou, X. / Ye, S. / Qu, X. / SPIE (Society) et al. | 2009
-
Wavelength-modulated heterodyne speckle interferometry for displacement measurement [7389-89]Lee, J.-Y. / Lin, K.-Y. / Huang, S.-H. / SPIE (Society) et al. | 2009
-
Simulation and fabrication of white light confocal microscope to attain the surface profile using CCD and image processing techniques [7389-105]Behroodi, E. / Mousavian, A. / Latifi, H. / SPIE (Society) et al. | 2009
-
Development of 3D control of a tiny dew droplet by scattered laser light [7389-107]Matsumoto, S. / SPIE (Society) et al. | 2009
-
Measurement of temperature, refractive index, density distribution, and convective heat transfer coefficient around a vertical wire by the Michelson interferometer [7389-108]Madanipour, K. / Fatehi, S. / Parvin, P. / SPIE (Society) et al. | 2009
-
Combined stereovision and phase shifting method: a new approach for 3D shape measurement [7389-125]Han, X. / Huang, P. / SPIE (Society) et al. | 2009
-
Quality-guided phase unwrapping for the modified Fourier transform method [7389-11]Guo, H. / Huang, P. / SPIE (Society) et al. | 2009
-
Gauge block calibration by using a high speed phase shifting interferometer comprising two frequency scanning diode lasers [7389-31]Kim, J.W. / Kim, J.-A. / Jang, R. / Kang, C.-S. / SPIE (Society) et al. | 2009
-
Development of an ultrasensitive interferometry system as a key to precision metrology applications [7389-32]Gohlke, M. / Schuldt, T. / Weise, D. / Johann, U. / Peters, A. / Braxmaier, C. / SPIE (Society) et al. | 2009
-
Structural damage identification based on laser ultrasonic propagation imaging technology [7389-64]Chia, C.-C. / Jang, S.-G. / Lee, J.-R. / Yoon, D.-J. / SPIE (Society) et al. | 2009
-
Industrial online surface defects detection in continuous casting hot slabs [7389-69]Alvarez, I. / Marina, J. / Enguita, J.M. / Fraga, C. / Garcia, R. / SPIE (Society) et al. | 2009
-
Electro-optic sensors dedicated to noninvasive electric field characterization [7389-74]Warzecha, A. / Bernier, M. / Gaborit, G. / Duvillaret, L. / Lasserre, J.-L. / SPIE (Society) et al. | 2009
-
Sheath flow stability controlling research in dynamic individual particles scattering measurement [7389-80]Zhang, L. / Zhao, H. / Zhang, P. / Zhou, X. / Li, J. / SPIE (Society) et al. | 2009
-
Three-dimensional shape measurement by means of depth-to-coherence coding of the object shape [7389-127]Mico, V. / Valero, E. / Zalevsky, Z. / Garcia, J. / SPIE (Society) et al. | 2009
-
Predictive segmentation method for 3D inspection accuracy and robustness improvement [7389-10]Reiner, J. / Stankiewicz, M. / Wojcik, M. / SPIE (Society) et al. | 2009
-
Calibration of a combined system with phase measuring deflectometry and fringe projection [7389-09]Breitbarth, M. / Kuhmstedt, P. / Notni, G. / SPIE (Society) et al. | 2009
-
Phase object power mapping and cosmetic defects enhancement by Fourier-based deflectometry [7389-23]Beghuin, D. / Dubois, X. / Joannes, L. / SPIE (Society) et al. | 2009
-
Digital holographic tomography of phase objects [7389-22]Anand, A. / Chhaniwal, V.K. / Pedrini, G. / Osten, W. / SPIE (Society) et al. | 2009
-
Reproducibility of contact lens power measurements using the phase shifting schlieren method [7389-36]Joannes, L. / Hough, T. / Hutsebaut, X. / Dubois, X. / Ligot, R. / Saoul, B. / Van Donink, P. / De Coninck, K. / SPIE (Society) et al. | 2009
-
Study on the temporal coherence function of a femtosecond optical frequency comb [7389-62]Wei, D. / Takahashi, S. / Takamasu, K. / Matsumoto, H. / SPIE (Society) et al. | 2009
-
3D shape measurement using curvature data [7389-92]Kim, B. / Kwon, M. / Choo, B. / Yoon, I. / SPIE (Society) et al. | 2009
-
Study of the measurement of solution concentration by surface plasmon resonance heterodyne interferometer [7389-87]Chen, K.-H. / Chen, J.-H. / Lin, J.-Y. / Chang, W.-Y. / Hsieh, H.-Y. / SPIE (Society) et al. | 2009
-
Effect of surface defects on the self-images produced by diffraction gratings [7389-113]Sanchez-Brea, L.M. / Salgado-Remacha, F.J. / Torcal-Milla, F.J. / SPIE (Society) et al. | 2009
-
Correlating buried-finger photodetector for time-of-flight applications [7389-117]Zach, G. / Nemecek, A. / Oberhauser, K. / Zimmermann, H. / SPIE (Society) et al. | 2009
-
A Fizeau interferometer system with double-pass and stitching for characterizing the figure error of large (>1m) synchrotron optics [7389-121]Ludbrook, G.D. / Alcock, S.G. / Sawhney, K.J.S. / SPIE (Society) et al. | 2009