Rigorous full-vectorial optical analysis of VCSEL using FDFD method (Englisch)
- Neue Suche nach: Nashed, A. I.
- Neue Suche nach: Li, Z. Q.
- Neue Suche nach: Simon Li , Z. M.
- Neue Suche nach: Lestrade , Michel
- Neue Suche nach: Xiao, Y. G.
- Neue Suche nach: Zhou, Y. J.
- Neue Suche nach: Nashed, A. I.
- Neue Suche nach: Li, Z. Q.
- Neue Suche nach: Simon Li , Z. M.
- Neue Suche nach: Lestrade , Michel
- Neue Suche nach: Xiao, Y. G.
- Neue Suche nach: Zhou, Y. J.
In:
Proc. SPIE
;
10812
; 1081204
;
2018
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Elektronische Ressource
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Titel:Rigorous full-vectorial optical analysis of VCSEL using FDFD method
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Beteiligte:Nashed, A. I. ( Autor:in ) / Li, Z. Q. ( Autor:in ) / Simon Li , Z. M. ( Autor:in ) / Lestrade , Michel ( Autor:in ) / Xiao, Y. G. ( Autor:in ) / Zhou, Y. J. ( Autor:in )
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Kongress:Semiconductor Lasers and Applications VIII ; 2018 ; Beijing,China
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Erschienen in:Proc. SPIE ; 10812 ; 1081204
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Verlag:
- Neue Suche nach: SPIE
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Erscheinungsdatum:06.11.2018
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ISBN:
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ISSN:
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DOI:
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Medientyp:Aufsatz (Konferenz)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
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