Applications of intense ultra-short XUV pulses to solid state physics: time-resolved luminescence spectroscopy and radiation damage studies (Englisch)
- Neue Suche nach: De Grazia, M.
- Neue Suche nach: Merdji, H.
- Neue Suche nach: Carré, B.
- Neue Suche nach: Gaudin, J.
- Neue Suche nach: Geoffroy, G.
- Neue Suche nach: Guizard, S.
- Neue Suche nach: Fedorov, N.
- Neue Suche nach: Belsky, A.
- Neue Suche nach: Martin, P.
- Neue Suche nach: Kirm, M.
- Neue Suche nach: Babin, V.
- Neue Suche nach: Feldbach, E.
- Neue Suche nach: Vielhauer, S.
- Neue Suche nach: Nagirnyi, V.
- Neue Suche nach: Vassil'ev, A.
- Neue Suche nach: Krejci, F.
- Neue Suche nach: Kuba, J.
- Neue Suche nach: Chalupsky, J.
- Neue Suche nach: Cihelka, J.
- Neue Suche nach: Hajkova, V.
- Neue Suche nach: Ledinský, M.
- Neue Suche nach: Juha, L.
- Neue Suche nach: De Grazia, M.
- Neue Suche nach: Merdji, H.
- Neue Suche nach: Carré, B.
- Neue Suche nach: Gaudin, J.
- Neue Suche nach: Geoffroy, G.
- Neue Suche nach: Guizard, S.
- Neue Suche nach: Fedorov, N.
- Neue Suche nach: Belsky, A.
- Neue Suche nach: Martin, P.
- Neue Suche nach: Kirm, M.
- Neue Suche nach: Babin, V.
- Neue Suche nach: Feldbach, E.
- Neue Suche nach: Vielhauer, S.
- Neue Suche nach: Nagirnyi, V.
- Neue Suche nach: Vassil'ev, A.
- Neue Suche nach: Krejci, F.
- Neue Suche nach: Kuba, J.
- Neue Suche nach: Chalupsky, J.
- Neue Suche nach: Cihelka, J.
- Neue Suche nach: Hajkova, V.
- Neue Suche nach: Ledinský, M.
- Neue Suche nach: Juha, L.
In:
Proc. SPIE
;
6586
; 65860I
;
2007
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Elektronische Ressource
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Titel:Applications of intense ultra-short XUV pulses to solid state physics: time-resolved luminescence spectroscopy and radiation damage studies
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Beteiligte:De Grazia, M. ( Autor:in ) / Merdji, H. ( Autor:in ) / Carré, B. ( Autor:in ) / Gaudin, J. ( Autor:in ) / Geoffroy, G. ( Autor:in ) / Guizard, S. ( Autor:in ) / Fedorov, N. ( Autor:in ) / Belsky, A. ( Autor:in ) / Martin, P. ( Autor:in ) / Kirm, M. ( Autor:in )
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Kongress:Damage to VUV, EUV, and X-ray Optics ; 2007 ; Prague,Czech Republic
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Erschienen in:Proc. SPIE ; 6586 ; 65860I
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Verlag:
- Neue Suche nach: SPIE
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Erscheinungsdatum:03.05.2007
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ISBN:
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ISSN:
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DOI:
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Medientyp:Aufsatz (Konferenz)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 65860A
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Response of inorganic materials to laser-plasma EUV radiation focused with a lobster eye collectorBartnik, Andrzej / Fiedorowicz, Henryk / Jarocki, Roman / Kostecki, Jerzy / Szczurek, Miroslaw / Havlikova, Radka / Pína, Ladislav / Švéda, Libor / Inneman, Adolf et al. | 2007
- 65860B
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Compact EUV source and Schwarzschild objective for modification and ablation of various materialsBarkusky, Frank / Bayer, Armin / Peth, Christian / Töttger, Holger / Mann, Klaus et al. | 2007
- 65860C
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Structural change in amorphous carbon on core excitations induced by soft x-ray illuminationMaeda, Koji / Liang, Shijin / Harada, Yoshihisa / Kitajima, Yoshinori / Shin, Shik / Mera, Yutaka et al. | 2007
- 65860D
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Capillary-discharge 46.9-nm laser-induced damage to a-C thin films exposed to multiple laser shots below single-shot damage thresholdJuha, L. / Hájková, V. / Chalupsky, J. / Vorliček, V. / Ritucci, A. / Reale, A. / Zuppella, P. / Störmer, M. et al. | 2007
- 65860E
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Radiation damage processes in complex-oxide scintillatorsNikl, Martin / Mihokova, Eva / Laguta, Valentin / Pejchal, Jan / Baccaro, Stefania / Vedda, Anna et al. | 2007
- 65860F
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Interaction of short and intense light pulses with matter: visible versus VUVGuizard, S. / Geoffroy, G. / Gaudin, J. / De Grazia, M. / Carré, B. / Merdji, H. / Belsky, A. / Federov, N. / Martin, P. et al. | 2007
- 65860H
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Pillars formed by laser ablation and modified by wet etchingKolasinski, Kurt W. / Dudley, Margaret E. / Nayak, Barada K. / Gupta, Mool C. et al. | 2007
- 65860I
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Applications of intense ultra-short XUV pulses to solid state physics: time-resolved luminescence spectroscopy and radiation damage studiesDe Grazia, M. / Merdji, H. / Carré, B. / Gaudin, J. / Geoffroy, G. / Guizard, S. / Fedorov, N. / Belsky, A. / Martin, P. / Kirm, M. et al. | 2007
- 65860J
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Multilayers for next-generation x-ray sourcesBajt, S. / Chapman, H. N. / Spiller, E. / Hau-Riege, S. / Alameda, J. / Nelson, A. J. / Walton, C. C. / Kjornrattanawanich, B. / Aquila, A. / Dollar, F. et al. | 2007
- 65860L
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Plasma-induced damage of multilayer coatings in EUVLWieggers, R. C. / Goedheer, W. J. / Louis, E. / Bijkerk, F. et al. | 2007
- 65860N
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Resistivity for deep-UV laser irradiation in fluorine doped silica glass fiberOto, Masanori et al. | 2007
- 65860Q
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At-wavelength diagnostics of EUV-opticsHinze, U. / Fokoua, M. / Chichkov, B. et al. | 2007
- 65860R
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X-ray optics power considerations for high intensity x-ray free-electron lasers based on superconducting technologyTschentscher, Th. / Sinn, H. / Tiedtke, K. / Wabnitz, H. et al. | 2007
- 65860S
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Utilizing ablation of solids to characterize a focused soft x-ray laser beamChalupský, J. / Juha, L. / Kuba, J. / Hájková, V. / Cihelka, J. / Homer, P. / Kozlová, M. / Mocek, T. / Polan, J. / Rus, B. et al. | 2007
- 65860T
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Damage-resistant single-pulse optics for x-ray free electron lasersHau-Riege, Stefan P. / London, Richard A. / Bogan, Michael / Chapman, Henry N. / Bergh, Magnus et al. | 2007
- 65860V
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Quantitative modelization of particle emission from excited solids: application to spectroscopic diagnostics of buried interfaces in multilayerMahne, Nicola / Giglia, Angelo / Nannarone, Stefano / Bertoli, Juri / Mattarello, Valentina / Rigato, Valentino et al. | 2007
- 65860W
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Debris- and radiation-induced damage effects on EUV nanolithography source collector mirror optics performanceAllain, J. P. / Nieto, M. / Hendricks, M. / Harilal, S. S. / Hassanein, A. et al. | 2007
- 65860X
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Design, conception, and metrology of EUV mirrors for aggressive environmentsHecquet, Christophe / Ravet-Krill, Marie-Françoise / Delmotte, Franck / Jérôme, Arnaud / Hardouin, Aurélie / Bridou, Françoise / Varnière, Françoise / Roulliay, Marc / Bourcier, Frédéric / Desmarres, Jean-Michel et al. | 2007
- 658601
-
Front Matter: Volume 6586| 2007
- 658602
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Optics challenges in 4GLS: radiation damage (Invited Paper) [6586-02]Bowler, M. A. / Roper, M. D. / Gleeson, A. J. / Quinn, F. M. / Fell, B. N. / Thompson, N. R. / MacDonald, M. A. / SPIE Europe / Society of Photo-optical Instrumentation Engineers et al. | 2007
- 658602
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Optics challenges in 4GLS: radiation damageBowler, M. A. / Roper, M. D. / Gleeson, A. J. / Quinn, F. M. / Fell, B. N. / Thompson, N. R. / MacDonald, M. A. et al. | 2007
- 658604
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The BESSY soft X-ray FELFollath, Rolf et al. | 2007
- 658604
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The BESSY soft x-ray FEL (Invited Paper) [6586-03]Follath, R. / SPIE Europe / Society of Photo-optical Instrumentation Engineers et al. | 2007
- 658605
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Optics development for Japanese XFEL project (Invited Paper) [6586-04]Yabashi, M. / Higashiya, A. / Tamasaku, K. / Kimura, H. / Kudo, T. / Ohashi, H. / Takahashi, S. / Goto, S. / Ishikawa, T. / SPIE Europe et al. | 2007
- 658605
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Optics development for Japanese XFEL projectYabashi, Makina / Higashiya, Atsushi / Tamasaku, Kenji / Kimura, Hiroaki / Kudo, Togo / Ohashi, Haruhiko / Takahashi, Sunao / Goto, Shunji / Ishikawa, Tetsuya et al. | 2007
- 658608
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State-of-the-art thin film x-ray optics for synchrotrons and FEL sources [6586-07]Hertlein, F. / Wiesmann, J. / Michaelsen, C. / Stormer, M. / Seifert, A. / SPIE Europe / Society of Photo-optical Instrumentation Engineers et al. | 2007
- 658608
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State-of-the-art thin film x-ray optics for synchrotrons and FEL sourcesHertlein, Frank / Wiesmann, Jörg / Michaelsen, Carsten / Störmer, Michael / Seifert, Andreas et al. | 2007
- 658609
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Ablation of inorganic materials using laser plasma soft x-rays (Invited Paper) [6586-08]Makimura, T. / Fujimori, T. / Uchida, S. / Murakami, K. / Niino, H. / SPIE Europe / Society of Photo-optical Instrumentation Engineers et al. | 2007
- 658609
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Ablation of inorganic materials using laser plasma soft x-raysMakimura, Tetsuya / Fujimori, Takashige / Uchida, Satoshi / Murakami, Kouichi / Niino, Hiroyuki et al. | 2007
-
Damage-resistant single-pulse optics for x-ray free electron lasers (Invited Paper) [6586-28]Hau-Riege, S. P. / London, R. A. / Bogan, M. / Chapman, H. N. / Bergh, M. / SPIE Europe / Society of Photo-optical Instrumentation Engineers et al. | 2007
-
Debris- and radiation-induced damage effects on EUV nanolithography source collector mirror optics performance [6586-31]Allain, J. P. / Nieto, M. / Hendricks, M. / Harilal, S. S. / Hassanein, A. / SPIE Europe / Society of Photo-optical Instrumentation Engineers et al. | 2007
-
Compact EUV source and Schwarzschild objective for modification and ablation of various materials [6586-10]Barkusky, F. / Bayer, A. / Peth, C. / Tottger, H. / Mann, K. / SPIE Europe / Society of Photo-optical Instrumentation Engineers et al. | 2007
-
Quantitative modelization of particle emission from excited solids: application to spectroscopic diagnostics of buried interfaces in multilayer [6586-30]Mahne, N. / Giglia, A. / Nannarone, S. / Bertoli, J. / Mattarello, V. / Rigato, V. / SPIE Europe / Society of Photo-optical Instrumentation Engineers et al. | 2007
-
Design, conception, and metrology of EUV mirrors for aggressive environments [6586-32]Hecquet, C. / Ravet-Krill, M.-F. / Delmotte, F. / Jerome, A. / Hardouin, A. / Bridou, F. / Varniere, F. / Roulliay, M. / Bourcier, F. / Desmarres, J.-M. et al. | 2007
-
Capillary-discharge 46.9-nm laser-induced damage to a-C thin films exposed to multiple laser shots below single-shot damage threshold [6586-12]Juha, L. / Hajkova, V. / Chalupsky, J. / Vorlicek, V. / Ritucci, A. / Reale, A. / Zuppella, P. / Stormer, M. / SPIE Europe / Society of Photo-optical Instrumentation Engineers et al. | 2007
-
Applications of intense ultra-short XUV pulses to solid state physics: time-resolved luminescence spectroscopy and radiation damage studies [6586-17]De Grazia, M. / Merdji, H. / Carre, B. / Gaudin, J. / Geoffroy, G. / Guizard, S. / Fedorov, N. / Belsky, A. / Martin, P. / Kirm, M. et al. | 2007
-
At-wavelength diagnostics of EUV-optics [6586-25]Hinze, U. / Fokoua, M. / Chichkov, B. / SPIE Europe / Society of Photo-optical Instrumentation Engineers et al. | 2007
-
Resistivity for deep-UV laser irradiation in fluorine doped silica glass fiber (Invited Paper) [6586-22]Oto, M. / SPIE Europe / Society of Photo-optical Instrumentation Engineers et al. | 2007
-
Radiation damage processes in complex-oxide scintillators (Invited Paper) [6586-13]Nikl, M. / Mihokova, E. / Laguta, V. / Pejchal, J. / Baccaro, S. / Vedda, A. / SPIE Europe / Society of Photo-optical Instrumentation Engineers et al. | 2007
-
Interaction of short and intense light pulses with matter: visible versus VUV (Invited Paper) [6586-14]Guizard, S. / Geoffroy, G. / Gaudin, J. / De Grazia, M. / Carre, B. / Merdji, H. / Belsky, A. / Federov, N. / Martin, P. / SPIE Europe et al. | 2007
-
Multilayers for next-generation x-ray sources (Invited Paper) [6586-18]Bajt, S. / Chapman, H. N. / Spiller, E. / Hau-Riege, S. / Alameda, J. / Nelson, A. J. / Walton, C. C. / Kjornrattanawanich, B. / Aquila, A. / Dollar, F. et al. | 2007
-
Utilizing ablation of solids to characterize a focused soft x-ray laser beam [6586-26]Chalupsky, J. / Juha, L. / Kuba, J. / Hajkova, V. / Cihelka, J. / Homer, P. / Kozlova, M. / Mocek, T. / Polan, J. / Rus, B. et al. | 2007
-
X-ray optics power considerations for high intensity x-ray free-electron lasers based on superconducting technology (Invited Paper) [6586-01]Tschentscher, T. / Sinn, H. / Tiedtke, K. / Wabnitz, H. / SPIE Europe / Society of Photo-optical Instrumentation Engineers et al. | 2007
-
Response of inorganic materials to laser-plasma EUV radiation focused with a lobster eye collector [6586-09]Bartnik, A. / Fiedorowicz, H. / Jarocki, R. / Kostecki, J. / Szczurek, M. / Havlikova, R. / Pina, L. / Sveda, L. / Inneman, A. / SPIE Europe et al. | 2007
-
Structural change in amorphous carbon on core excitations induced by soft x-ray illumination (Invited Paper) [6586-11]Maeda, K. / Liang, S. / Harada, Y. / Kitajima, Y. / Shin, S. / Mera, Y. / SPIE Europe / Society of Photo-optical Instrumentation Engineers et al. | 2007
-
Pillars formed by laser ablation and modified by wet etching (Invited Paper) [6586-16]Kolasinski, K. W. / Dudley, M. E. / Nayak, B. K. / Gupta, M. C. / SPIE Europe / Society of Photo-optical Instrumentation Engineers et al. | 2007
-
Plasma-induced damage of multilayer coatings in EUVL [6586-20]Wieggers, R. C. / Goedheer, W. J. / Louis, E. / Bijkerk, F. / SPIE Europe / Society of Photo-optical Instrumentation Engineers et al. | 2007