Improved Raman sensitivity using polarization analysis (Englisch)
- Neue Suche nach: Christesen, Steven
- Neue Suche nach: Christesen, Steven
In:
Proc. SPIE
;
7665
; 76651B
;
2010
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Elektronische Ressource
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Titel:Improved Raman sensitivity using polarization analysis
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Beteiligte:Christesen, Steven ( Autor:in )
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Kongress:Chemical, Biological, Radiological, Nuclear, and Explosives (CBRNE) Sensing XI ; 2010 ; Orlando,Florida,United States
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Erschienen in:Proc. SPIE ; 7665 ; 76651B
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Verlag:
- Neue Suche nach: SPIE
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Erscheinungsdatum:27.04.2010
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ISBN:
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ISSN:
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DOI:
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Medientyp:Aufsatz (Konferenz)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
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