Mueller-Jones Matrix measurement in material identification (Englisch)
- Neue Suche nach: Xu, Jiang
- Neue Suche nach: Qian, Weixian
- Neue Suche nach: Wang, Xiao
- Neue Suche nach: Xu, Jiang
- Neue Suche nach: Qian, Weixian
- Neue Suche nach: Wang, Xiao
In:
Proc. SPIE
;
9953
; 99530I
;
2016
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Elektronische Ressource
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Titel:Mueller-Jones Matrix measurement in material identification
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Beteiligte:
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Kongress:Optical Modeling and Performance Predictions VIII ; 2016 ; San Diego,California,United States
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Erschienen in:Proc. SPIE ; 9953 ; 99530I
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Verlag:
- Neue Suche nach: SPIE
-
Erscheinungsdatum:27.09.2016
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ISBN:
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ISSN:
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DOI:
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Medientyp:Aufsatz (Konferenz)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
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The optomechanical analysis of high-accuracy mesh design in optical transmission componentsHsu, Ming-Ying / Chang, Shenq-Tsong / Huang, Ting-Ming et al. | 2016
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Mueller-Jones Matrix measurement in material identificationXu, Jiang / Qian, Weixian / Wang, Xiao et al. | 2016
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