Spatial dispersion of optical thin films (Englisch)
- Neue Suche nach: Liu, Xu
- Neue Suche nach: Luo, Zhen-yue
- Neue Suche nach: Shen, Wei-dong
- Neue Suche nach: Sun, Xue-zhen
- Neue Suche nach: Gu, Pei-fu
- Neue Suche nach: Liu, Xu
- Neue Suche nach: Luo, Zhen-yue
- Neue Suche nach: Shen, Wei-dong
- Neue Suche nach: Sun, Xue-zhen
- Neue Suche nach: Gu, Pei-fu
In:
Proc. SPIE
;
7101
; 71011A
;
2008
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ISBN:
-
ISSN:
- Aufsatz (Konferenz) / Elektronische Ressource
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Titel:Spatial dispersion of optical thin films
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Beteiligte:Liu, Xu ( Autor:in ) / Luo, Zhen-yue ( Autor:in ) / Shen, Wei-dong ( Autor:in ) / Sun, Xue-zhen ( Autor:in ) / Gu, Pei-fu ( Autor:in )
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Kongress:Advances in Optical Thin Films III ; 2008 ; Glasgow,Scotland,United Kingdom
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Erschienen in:Proc. SPIE ; 7101 ; 71011A
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Verlag:
- Neue Suche nach: SPIE
-
Erscheinungsdatum:16.09.2008
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ISBN:
-
ISSN:
-
DOI:
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Medientyp:Aufsatz (Konferenz)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 71010B
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New developments in magnetron sputter processes for precision opticsVergöhl, Michael / Werner, Oliver / Bruns, Stefan et al. | 2008
- 71010C
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State of the art in deterministic production of optical thin filmsRistau, D. / Ehlers, H. / Schlichting, S. / Lappschies, M. et al. | 2008
- 71010D
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All-optical in-situ analysis of PIAD deposition processesWilbrandt, Steffen / Stenzel, Olaf / Kaiser, Norbert et al. | 2008
- 71010E
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Forces in rotary motion systemsTilsch, Markus K. / Elliott, Gregory K. et al. | 2008
- 71010F
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A method for the determination of substrate temperature during thin film coating depositionGünster, St. / Ehlers, H. / Ristau, D. et al. | 2008
- 71010G
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Computer simulation of coating processes with monochromatic monitoringZöller, A. / Boos, M. / Hagedorn, H. / Romanov, B. et al. | 2008
- 71010H
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Advanced optical coatings for telecom and spectroscopic applicationsBadeen, Adam / Briere, Michelle / Hook, Peter / Montcalm, Claude / Rinfret, Robert / Schneider, Joshua / Sullivan, Brian T. et al. | 2008
- 71010I
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High performance notch filter coatings produced with PIAD and magnetron sputteringScherer, M. / Schallenberg, U. / Hagedorn, H. / Lehnert, W. / Romanov, B. / Zoeller, A. et al. | 2008
- 71010J
-
Sputter process with time-variant reactive gas mixture for the deposition of optical multilayer and gradient layer systemsBartzsch, H. / Weber, J. / Lau, K. / Glöß, D. / Frach, P. et al. | 2008
- 71010K
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Optimization and characterization of transparent photocatalytic TiO2thin films prepared by ion-assisted depositionBoughaled, Redouan / Schlichting, Sebastian / Ehlers, Henrik / Ristau, Detlev / Bannat, Inga / Wark, Michael et al. | 2008
- 71010L
-
Metal fluoride coatings prepared by ion-assisted depositionBischoff, Martin / Sode, Maik / Gäbler, Dieter / Bernitzki, Helmut / Zaczek, Christoph / Kaiser, Norbert / Tünnermann, Andreas et al. | 2008
- 71010M
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Toward picometer optical figuring of ultra-precision optical components using multi-aperture deposition techniquesArkwright, John W. / Burke, Jan / Gross, Mark et al. | 2008
- 71010O
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Structural and electrical properties of low temperature deposited ITO filmsFüchsel, Kevin / Schulz, Ulrike / Kaiser, Norbert / Tünnermann, Andreas et al. | 2008
- 71010P
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Reliable production of steep edge interference filtersLappschies, Marc / Pfeifer, Peter / Schallenberg, Uwe / Ehlers, Henrik / Ristau, Detlev et al. | 2008
- 71010Q
-
Characterization of the optical properties of hydrophobic coatings and realization of high performance AR coatings with dust- and water-repellent propertiesBruynooghe, S. / Spinzig, S. / Fliedner, M. / Hsu, G. J. et al. | 2008
- 71010R
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Measurement of optical constants of thin films by non conventional ellipsometry, photothermal deflection spectroscopy and plasmon resonance spectroscopySytchkova, Anna Krasilnikova et al. | 2008
- 71010S
-
Determination of thermal and elastic coefficients of optical thin-film materialsMichel, S. / Lemarquis, F. / Lequime, M. et al. | 2008
- 71010T
-
Measurement of thermal expansion coefficient and biaxial modulus of DWDM filters using phase-shift InterferometerKuo, Chien-Cheng / Chen, Sheng-Hui / Lee, Cheng-Chung et al. | 2008
- 71010U
-
Extraction of film interface surfaces from scanning white light interferometryMansfield, Daniel et al. | 2008
- 71010V
-
Light scattering to isolate a single interface within a multilayerGeorges, Gaëlle / Deumié, Carole / Amra, Claude et al. | 2008
- 71010W
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Characterization of the optical constants of materials from the visible to the soft x-raysLarruquert, Juan I. / Fernández-Perea, Mónica / Vidal-Dasilva, Manuela / Aznárez, José A. / Méndez, José A. / Poletto, Luca / Garoli, Denis / Malvezzi, A. Marco / Giglia, Angelo / Nannarone, Stefano et al. | 2008
- 71010X
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Coatings for next generation lithographyZaczek, C. / Müllender, S. / Enkisch, H. / Bijkerk, F. et al. | 2008
- 71010Y
-
Low-loss HR coatings on fused silica substrates for 193 nm micro-lithography applicationsLaux, Sven / Bernitzki, Helmut / Fasold, Dieter / Klaus, Michael / Schuhmann, Uwe et al. | 2008
- 71010Z
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High performance EUV multilayer opticsKaiser, Norbert / Yulin, Sergiy / Perske, Marco / Feigl, Torsten et al. | 2008
- 71011A
-
Spatial dispersion of optical thin filmsLiu, Xu / Luo, Zhen-yue / Shen, Wei-dong / Sun, Xue-zhen / Gu, Pei-fu et al. | 2008
- 71011B
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Resonant gratings for narrow band pass filtering applicationsBoyko, Olga / Lemarchand, Fabien / Talneau, Anne / Fehrembach, Anne-Laure / Sentenac, Anne et al. | 2008
- 71011C
-
Photochromic mesoporous hybrid coatingsRaboin, L. / Matheron, M. / Gacoin, T. / Boilot, J.-P. et al. | 2008
- 71011D
-
Bulk- micromachined dielectric tunable optical filter realized with inductively coupled plasma chemical vapour depositionJatta, Sandro / Haberle, Klaus / Singh, Kuldip / Koegel, Benjamin / Halbritter, Hubert / Meissner, Peter et al. | 2008
- 71011F
-
Reactively sputtered aluminium nitride films for spectral emission controlZhao, S. / Ribbing, C.-G. et al. | 2008
- 71011G
-
Optical and structural properties of NbxSiyO composite films prepared by metallic co-sputtering processCheng, Xinbin / Fan, Bin / Takahashi, Haruo / Wang, Zhanshan et al. | 2008
- 71011H
-
A simple system for measuring small phase retardation of an optical thin filmHansen, T. N. / Fabricius, H. et al. | 2008
- 71011I
-
Optimizing the phase retardation caused by optical coatingsFabricius, H. / Hansen, Tue N. et al. | 2008
- 71011J
-
Metal layer beamsplitters with one dielectric achromatisation layerSchürmann, M. / Stöckl, W. / Kaiser, N. et al. | 2008
- 71011K
-
ZnS films for infrared optical coatings: improvement of adhesion to Ge substratesSánchez-Agudo, M. / Génova, I. / Orr, H. J. B. / Harris, G. / Pérez, G. et al. | 2008
- 71011L
-
Next generation end hall ion source in the optical thin film production processNiederwald, Hansjörg / Mahoney, Leonard et al. | 2008
- 71011N
-
Fabrication of far infrared rib waveguides based on Te-Ge-Ga films deposited by co-thermal evaporationAlbert, Stéphanie / Barthelemy, Eleonore / Vigreux, Caroline / Pradel, Annie / Barillot, Marc et al. | 2008
- 71011O
-
Synthesis and study of structure and nonlinear optical properties of silicon carbide nanocrystal filmsBorshch, A. / Brodyn, M. / Volkov, V. / Lyakhovetski, V. / Rudenko, V. / Semenov, A. / Pusikov, V. et al. | 2008
- 71011Q
-
AZO films prepared by r.f. magnetron sputtering: structural, electrical, and optical propertiesGrilli, Maria Luisa / Sytchkova, Anna Krasilnikova / Boycheva, Sylvia / Piegari, Angela et al. | 2008
- 71011R
-
Laser induced fluorescence and absorption measurements for DUV optical thin film characterizationMühlig, Ch. / Triebel, W. / Kufert, S. / Bublitz, S. et al. | 2008
- 71011S
-
Nonlinear refraction of gold island filmsBorshch, A. / Brodyn, M. / Fedorovych, R. / Liakhovetskyi, V. / Volkov, V. et al. | 2008
- 71011U
-
Metrology in the soft x-ray range: from EUV to the water windowLaubis, Christian / Scholze, Frank / Ulm, Gerhard et al. | 2008
- 71011V
-
Comparison of measured and calculated performance of a 7-channel astronomical instrumentGünster, St. / Ristau, D. / Greiner, Jochen / Tafelmaier, Christian et al. | 2008
- 71011X
-
Modification of optical properties of metal island films by electric field-assisted dissolution of clustersSancho-Parramon, J. / Janicki, V. / Zorc, H. / Lončarić, M. et al. | 2008
- 71011Y
-
Development of a hybrid monitoring strategy to the deposition of chirped mirrors by plasma-ion assisted electron evaporationStenzel, Olaf / Wilbrandt, Steffen / Kaiser, Norbert / Fasold, Dieter et al. | 2008
- 710101
-
Front Matter: Volume 7101| 2008
- 710102
-
Progress in optical coatingsMacleod, Angus et al. | 2008
- 710103
-
Design principles for broadband AR coatingsSchallenberg, Uwe et al. | 2008
- 710104
-
Estimation for the number of layers of broad-band anti-reflection coatingsAmotchkina, Tatiana / Tikhonravov, Alexander / Trubetskov, Michael et al. | 2008
- 710105
-
'Gedankenspektrum' methods in optical coatingsGoldstein, Fred T. et al. | 2008
- 710106
-
Frequency filtering in optical thin film design revisitedVerly, Pierre G. et al. | 2008
- 710107
-
New plasma processes for antireflective structures on plasticsSchulz, U. / Munzert, P. / Leitel, R. / Bollwahn, N. / Wendling, I. / Kaiser, N. / Tünnermann, A. et al. | 2008
- 710108
-
Closed field magnetron sputtering: new generation sputtering process for optical coatingsGibson, D. R. / Brinkley, I. / Waddell, E. M. / Walls, J. M. et al. | 2008
- 710109
-
Plasma ion-assisted deposition with radio frequency powered plasma sourcesHagedorn, H. / Klosch, M. / Reus, H. / Zoeller, A. et al. | 2008
- 710110
-
Non-periodic multilayer coatings in EUV, soft x-ray and x-ray rangeWang, Zhanshan et al. | 2008
- 710112
-
Optical thin films on polarization preserving cube corner retroreflectorsLee, Hakchu et al. | 2008
- 710113
-
Thin-film filters for a high resolution miniaturized spectrometerPiegari, Angela / Sytchkova, Anna K. / Bulir, Jiri / Harnisch, Bernd / Wuttig, Andreas et al. | 2008
- 710114
-
Mid-infrared filters for astronomical and remote sensing instrumentationHawkins, Gary / Sherwood, Richard / Djotni, Karim et al. | 2008
- 710115
-
Status of NIF mirror technologies for completion of the NIF facilityStolz, C. J. et al. | 2008
- 710116
-
1.5 octave dispersive dielectric multilayers for pulse compressionPervak, Vladimir / Krausz, Ferenc / Apolonski, Alexander et al. | 2008
- 710117
-
Theoretical and experimental analysis of the laser irradiation parameters influence on the LIDT of optical coatingsGallais, Laurent / Capoulade, Jérémie / Natoli, Jean-Yves / Commandré, Mireille et al. | 2008
- 710118
-
Non-destructive evaluation on optical components for high power density applicationsNatoli, Jean-Yves / Wagner, Frank / Ciapponi, A. / Palmier, S. / Gallais, Laurent / Commandré, Mireille et al. | 2008
- 710119
-
Design and monitoring of narrow bandpass filters composed of non-quarter-wave thicknessesWilley, Ronald R. et al. | 2008
- 710120
-
An in-situ investigation of the surface oxidation of ultra-thin films of Ni and HfSong, Shigeng / Placido, Frank et al. | 2008
-
High performance notch filter coatings produced with PIAD and magnetron sputtering [7101-18]Scherer, M. / Schallenberg, U. / Hagedorn, H. / Lehnert, W. / Romanov, B. / Zoeller, A. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Reliable production of steep edge interference filters [7101-26]Lappschies, M. / Pfeifer, P. / Schallenberg, U. / Ehlers, H. / Ristau, D. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Optical and structural properties of Nb~xSi~yO composite films prepared by metallic co-sputtering process [7101-56]Cheng, X. / Fan, B. / Takahashi, H. / Wang, Z. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Reactively sputtered aluminium nitride films for spectral emission control [7101-55]Zhao, S. / Ribbing, C.-G. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
A simple system for measuring small phase retardation of an optical thin film [7101-57]Hansen, T.N. / Fabricius, H. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Metrology in the soft x-ray range: from EUV to the water window [7101-73]Laubis, C. / Scholze, F. / Ulm, G. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Development of a hybrid monitoring strategy to the deposition of chirped mirrors by plasma-ion assisted electron evaporation [7101-77]Stenzel, O. / Wilbrandt, S. / Kaiser, N. / Fasold, D. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Progress in optical coatings (Invited Paper) [7101-01]Macleod, A. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Estimation for the number of layers of broad-band anti-reflection coatings [7101-03]Amotchkina, T. / Tikhonravov, A. / Trubetskov, M. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Toward picometer optical figuring of ultra-precision optical components using multi-aperture deposition techniques (Invited Paper) [7101-22]Arkwright, J.W. / Burke, J. / Gross, M. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Characterization of the optical properties of hydrophobic coatings and realization of high performance AR coatings with dust- and water-repellent properties [7101-27]Bruynooghe, S. / Spinzig, S. / Fliedner, M. / Hsu, G.J. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Low-loss HR coatings on fused silica substrates for 193 nm micro-lithography applications [7101-36]Laux, S. / Bernitzki, H. / Fasold, D. / Klaus, M. / Schuhmann, U. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Fabrication of far infrared rib waveguides based on Te-Ge-Ga films deposited by co-thermal evaporation [7101-65]Albert, S. / Barthelemy, E. / Vigreux, C. / Pradel, A. / Barillot, M. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Synthesis and study of structure and nonlinear optical properties of silicon carbide nanocrystal films [7101-66]Borshch, A. / Brodyn, M. / Volkov, V. / Lyakhovetski, V. / Rudenko, V. / Semenov, A. / Pusikov, V. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
All-optical in-situ monitoring of PIAD deposition processes [7101-13]Wilbrandt, S. / Stenzel, O. / Kaiser, N. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Advanced optical coatings for telecom and spectroscopic applications (Invited Paper) [7101-17]Badeen, A. / Briere, M. / Hook, P. / Montcalm, C. / Rinfret, R. / Schneider, J. / Sullivan, B.T. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
A method for the determination of substrate temperature during thin film coating deposition [7101-15]Gunster, S. / Ehlers, H. / Ristau, D. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Optimization and characterization of transparent photocatalytic TiO~2 thin films prepared by ion-assisted deposition [7101-20]Boughaled, R. / Schlichting, S. / Ehlers, H. / Ristau, D. / Bannat, I. / Wark, M. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Optical thin films on polarization preserving cube corner retroreflectors [7101-23]Lee, H. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Closed field magnetron sputtering: new generation sputtering process for optical coatings [7101-07]Gibson, D.R. / Brinkley, I. / Waddell, E.M. / Walls, J.M. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Measurement of optical constants of thin films by non conventional ellipsometry, photothermal deflection spectroscopy, and plasmon resonance spectroscopy (Invited Paper) [7101-29]Sytchkova, A.K. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Extraction of film interface surfaces from scanning white light interferometry [7101-32]Mansfield, D. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Status of NIF mirror technologies for completion of the NIF facility (Invited Paper) [7101-43]Stolz, C.J. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Photochromic mesoporous hybrid coatings [7101-50]Raboin, L. / Matheron, M. / Gacoin, T. / Boilot, J.-P. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
AZO films prepared by r.f. magnetron sputtering: structural, electrical, and optical properties [7101-68]Grilli, M.L. / Sytchkova, A.K. / Boycheva, S. / Piegari, A. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
New plasma processes for antireflective structures on plastics (Invited Paper) [7101-06]Schulz, U. / Munzert, P. / Leitel, R. / Bollwahn, N. / Wendling, I. / Kaiser, N. / Tunnermann, A. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Thin-film filters for a high resolution miniaturized spectrometer [7101-41]Piegari, A. / Sytchkova, A.K. / Bulir, J. / Harnisch, B. / Wuttig, A. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Theoretical and experimental analysis of the laser irradiation parameters influence on the LIDT of optical coatings [7101-45]Gallais, L. / Capoulade, J. / Natoli, J.-Y. / Commandre, M. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Non-destructive evaluation on optical components for high power density applications (Invited Paper) [7101-46]Natoli, J.-Y. / Wagner, F. / Ciapponi, A. / Palmier, S. / Gallais, L. / Commandre, M. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Modification of optical properties of metal island films by electric field-assisted dissolution of clusters [7101-76]Sancho-Parramon, J. / Janicki, V. / Zorc, H. / Loncaric, M. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Structural and electrical properties of low temperature deposited ITO films [7101-25]Fuchsel, K. / Schulz, U. / Kaiser, N. / Tunnermann, A. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Design principles for broadband AR coatings [7101-02]Schallenberg, U. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
`Gedankenspektrum' methods in optical coatings [7101-04]Goldstein, F.T. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Forces in rotary motion systems [7101-14]Tilsch, M.K. / Elliott, G.K. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Coatings for next generation lithography (Invited Paper) [7101-35]Zaczek, C. / Mullender, S. / Enkisch, H. / Bijkerk, F. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Light scattering to isolate a single interface within a multilayer [7101-33]Georges, G. / Deumie, C. / Amra, C. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Mid-infrared filters for astronomical and remote sensing instrumentation (Invited Paper) [7101-42]Hawkins, G. / Sherwood, R. / Djotni, K. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
ZnS films for infrared optical coatings: improvement of adhesion to Ge substrates [7101-60]Sanchez-Agudo, M. / Genova, I. / Orr, H.J.B. / Harris, G. / Perez, G. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Nonlinear refraction of gold island films [7101-71]Borshch, A. / Brodyn, M. / Fedorovych, R. / Liakhovetskyi, V. / Volkov, V. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Comparison of measured and calculated performance of a 7-channel astronomical instrument [7101-74]Gunster, S. / Ristau, D. / Greiner, J. / Tafelmaier, C. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Sputter process with time-variant reactive gas mixture for the deposition of optical multilayer and gradient layer systems [7101-19]Bartzsch, H. / Weber, J. / Lau, K. / Gloss, D. / Frach, P. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Determination of thermal and elastic coefficients of optical thin-film materials [7101-30]Michel, S. / Lemarquis, F. / Lequime, M. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
1.5 octave dispersive dielectric multilayers for pulse compression [7101-44]Pervak, V. / Krausz, F. / Apolonski, A. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Resonant gratings for narrow band pass filtering applications [7101-49]Boyko, O. / Lemarchand, F. / Talneau, A. / Lehrembach, A.-L. / Sentenac, A. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Measurement of thermal expansion coefficient and biaxial modulus of DWDM filters using phase-shift interferometer [7101-31]Kuo, C.-C. / Chen, S.-H. / Lee, C.-C. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
High performance EUV and multilayer optics [7101-37]Kaiser, N. / Yulin, S. / Perske, M. / Feigl, T. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Non-periodic multilayer coatings in EUV, soft x-ray and x-ray range (Invited Paper) [7101-38]Wang, Z. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Spatial dispersion of optical thin films (Invited Paper) [7101-48]Liu, X. / Luo, Z. / Shen, W. / Sun, X. / Gu, P. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Bulk-micromachined dielectric tunable optical filter realized with inductively coupled plasma chemical vapour deposition [7101-51]Jatta, S. / Haberle, K. / Singh, K. / Koegel, B. / Halbritter, H. / Meissner, P. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
State of the art in deterministic production of optical thin films (Invited Paper) [7101-12]Ristau, D. / Ehlers, H. / Schlichting, S. / Lappschies, M. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Plasma ion-assisted deposition with radio frequency powered plasma sources [7101-08]Hagedorn, H. / Klosch, M. / Reus, H. / Zoeller, A. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Frequency filtering in optical thin film design revisited [7101-05]Verly, P.G. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
New developments in magnetron sputter processes for precision optics (Invited Paper) [7101-11]Vergohl, M. / Werner, O. / Bruns, S. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Computer simulation of coating processes with monochromatic monitoring [7101-16]Zoller, A. / Boos, M. / Hagedorn, H. / Romanov, B. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Metal fluoride coatings prepared by ion-assisted deposition [7101-21]Bischoff, M. / Sode, M. / Gabler, D. / Bernitzki, H. / Zaczek, C. / Kaiser, N. / Tunnermann, A. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Characterization of the optical constants of materials from the visible to the soft x-rays (Invited Paper) [7101-34]Larruquert, J.I. / Fernandez-Perea, M. / Vidal-Dasilva, M. / Aznarez, J.A. / Mendez, J.A. / Poletto, L. / Garoli, D. / Malvezzi, A.M. / Giglia, A. / Nannarone, S. et al. | 2008
-
Optimizing the phase retardation caused by optical coatings [7101-58]Fabricius, H. / Hansen, T.N. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Next generation end hall ion source in the optical thin film production process [7101-61]Niederwald, H. / Mahoney, L. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Metal layer beamsplitters with one dielectric achromatisation layer [7101-59]Schurmann, M. / Stockl, W. / Kaiser, N. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Laser induced fluorescence and absorption measurements for DUV optical thin film characterization [7101-69]Muhlig, C. / Triebel, W. / Kufert, S. / Bublitz, S. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
An in-situ investigation of the surface oxidation of ultra-thin films of Ni and Hf [7101-79]Song, S. / Placido, F. / Society of Photo-optical Instrumentation Engineers et al. | 2008
-
Design and monitoring of narrow bandpass filters composed of non-quarter-wave thicknesses [7101-54]Willey, R.R. / Society of Photo-optical Instrumentation Engineers et al. | 2008