Influence of component imperfection on null ellipsometry with phase modulation (Englisch)
- Neue Suche nach: Postava, K.
- Neue Suche nach: Hlubina, P.
- Neue Suche nach: Maziewski, A.
- Neue Suche nach: Ossikovski, R.
- Neue Suche nach: Foldyna, M.
- Neue Suche nach: Zivotsky, O.
- Neue Suche nach: Pistora, J.
- Neue Suche nach: Visnovsky, S.
- Neue Suche nach: Yamaguchi, T.
- Neue Suche nach: Postava, K.
- Neue Suche nach: Hlubina, P.
- Neue Suche nach: Maziewski, A.
- Neue Suche nach: Ossikovski, R.
- Neue Suche nach: Foldyna, M.
- Neue Suche nach: Zivotsky, O.
- Neue Suche nach: Pistora, J.
- Neue Suche nach: Visnovsky, S.
- Neue Suche nach: Yamaguchi, T.
In:
Proc. SPIE
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5856
; 143
;
2005
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Elektronische Ressource
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Titel:Influence of component imperfection on null ellipsometry with phase modulation
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Beteiligte:Postava, K. ( Autor:in ) / Hlubina, P. ( Autor:in ) / Maziewski, A. ( Autor:in ) / Ossikovski, R. ( Autor:in ) / Foldyna, M. ( Autor:in ) / Zivotsky, O. ( Autor:in ) / Pistora, J. ( Autor:in ) / Visnovsky, S. ( Autor:in ) / Yamaguchi, T. ( Autor:in )
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Kongress:Optical Measurement Systems for Industrial Inspection IV ; 2005 ; Munich,Germany
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Erschienen in:Proc. SPIE ; 5856 ; 143
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Verlag:
- Neue Suche nach: SPIE
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Erscheinungsdatum:13.06.2005
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ISBN:
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ISSN:
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DOI:
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Medientyp:Aufsatz (Konferenz)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 1
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Dedicated near-field microscopies for electronic materials and devices (Plenary Paper)Balk, Ludwig J. / Cramer, Ronald M. / Heiderhoff, Ralf / Phang, Jacob C. H. / Sergeev, Oleg / Tiedemann, Anne-Katrin et al. | 2005
- 1
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Dedicated near-field microscopies for electronic materials and devices (Plenary Paper) [5856-200]Balk, L. J. / Cramer, R. M. / Heiderhoff, R. / Phang, J. C. H. / Sergeev, O. / Tiedemann, A.-K. / SPIE et al. | 2005
- 14
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Modern approaches in phase measuring metrology (Invited Paper)Millerd, James / Brock, Neal / Hayes, John / Kimbrough, Brad / Novak, Matt / North-Morris, Michael / Wyant, James C. et al. | 2005
- 14
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Modern approaches in phase measuring metrology (Invited Paper) [5856-01]Millerd, J. / Brock, N. / Hayes, J. / Kimbrough, B. / Novak, M. / North-Morris, M. / Wyant, J. C. / SPIE et al. | 2005
- 23
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Full-field low-frequency heterodyne interferometry using CMOS and CCD cameras with online phase processing [5856-02]Lakestani, F. / Whelan, M. P. / Garvey, J. / Newport, D. / SPIE et al. | 2005
- 23
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Full-field low-frequency heterodyne interferometry using CMOS and CCD cameras with online phase processingLakestani, Fereydoun / Whelan, Maurice P. / Garvey, Julie / Newport, David et al. | 2005
- 32
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Fast three-dimensional phase-unwrapping algorithm based on sorting by reliability following a non-continuous pathAbdul-Rahman, Hussein / Gdeisat, Munther / Burton, David / Lalor, Michael et al. | 2005
- 32
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Fast three-dimensional phase-unwrapping algorithm based on sorting by reliability following a non-continuous path [5856-03]Abdul-Rahman, H. / Gdeisat, M. / Burton, D. / Lalor, M. / SPIE et al. | 2005
- 41
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Gated heterodyne coherent anti-Stokes Raman scattering for high-contrast vibrational imaging [5856-04]Greve, M. / Bodermann, B. / Telle, H. R. / Baum, P. / Riedle, E. / SPIE et al. | 2005
- 41
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Gated heterodyne coherent anti-Stokes Raman scattering for high-contrast vibrational imagingGreve, Marco / Bodermann, Bernd / Telle, Harald R. / Baum, Peter / Riedle, Eberhard et al. | 2005
- 49
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Study of polarizing intercorrelative function of coherent images of phase-inhomogeneous layer anisotropy [5856-05]Angelsky, O. V. / Ushenko, A. G. / Vashenko, I. M. / Bodnar, L. M. / SPIE et al. | 2005
- 49
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Study of polarizing intercorrelative function of coherent images of phase-inhomogeneous layer anisotropyAngelsky, O. V. / Ushenko, A. G. / Vashenko, I. M. / Bodnar, L. M. et al. | 2005
- 55
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Reconstruction of in-line hologram by using iterative algorithmZhang, Yan et al. | 2005
- 55
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Reconstruction of in-line hologram by using iterative algorithm [5856-07]Zhang, Y. / SPIE et al. | 2005
- 64
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Image focusing properties in reconstructing digital hologramsAlfieri, D. / Coppola, G. / DeNicola, S. / Ferraro, P. / Finizio, A. / Grilli, S. / Pierattini, G. / Striano, V. et al. | 2005
- 64
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Image focusing properties in reconstructing digital holograms [5856-08]Alfieri, D. / Coppola, G. / De Nicola, S. / Ferraro, P. / Finizio, A. / Grilli, S. / Pierattini, G. / Striano, V. / SPIE et al. | 2005
- 71
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High-resolution lensless Fourier-transform digital holographyBanyasz, Istvan / Kornis, Janos et al. | 2005
- 71
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High-resolution lensless Fourier-transform digital holography [5856-09]Banyasz, I. / Kornis, J. / SPIE et al. | 2005
- 80
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Determination and applications of contoured windows for ESPI fringe pattern processingYu, Qifeng / Yang, Xia / Zhang, Xiaohu / Fu, Sihua / Sun, Xiangyi et al. | 2005
- 80
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Determination and applications of contoured windows for ESPI fringe pattern processing [5856-10]Yu, Q. / Yang, X. / Zhang, X. / Fu, S. / Sun, X. / SPIE et al. | 2005
- 89
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Reflectivity function based illumination and sensor planning for industrial inspectionEllenrieder, Marc M. / Wohler, Christian / d'Angelo, Pablo et al. | 2005
- 89
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Reflectivity function based illumination and sensor planning for industrial inspection [5856-11]Ellenrieder, M. M. / Wohler, C. / d Angelo, P. / SPIE et al. | 2005
- 99
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Illumination-based segmentation of structured surfaces in automated visual inspectionLindner, Christoph / Arigita, Javier / Puente Leon, Fernando et al. | 2005
- 99
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Illumination-based segmentation of structured surfaces in automated visual inspection [5856-12]Lindner, C. / Arigita, J. / Leon, F. P. / SPIE et al. | 2005
- 109
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New method of structure light measurement system calibration based on adaptive and effective evaluation of 3D-phase distributionSitnik, Robert et al. | 2005
- 109
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New method of structure light measurement system calibration based on adaptive and effective evaluation of 3D-phase distribution [5856-13]Sitnik, R. / SPIE et al. | 2005
- 118
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Optical 3D sensor for large objects in industrial applicationKuhmstedt, Peter / Heinze, Matthias / Himmelreich, Michael / Brauer-Burchardt, Christian / Brakhage, Peter / Notni, Gunther et al. | 2005
- 118
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Optical 3D sensor for large objects in industrial application [5856-14]Kuhmstedt, P. / Heinze, M. / Himmelreich, M. / Brauer-Burchardt, C. / Brakhage, P. / Notni, G. / SPIE et al. | 2005
- 128
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Confocal micro-optical distance sensor: principle and design [5856-15]Ruprecht, A. K. / Pruss, C. / Tiziani, H. J. / Osten, W. / Lucke, P. / Last, A. / Mohr, J. / Lehmann, P. / SPIE et al. | 2005
- 128
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Confocal micro-optical distance sensor: principle and designRuprecht, Aiko K. / Pruss, Christof / Tiziani, Hans J. / Osten, Wolfgang / Lucke, Peter / Last, Arndt / Mohr, Jurgen / Lehmann, Peter et al. | 2005
- 136
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Confocal micro-optical distance sensor: realization and resultsLucke, Peter / Last, Arndt / Mohr, Jurgen / Ruprecht, Aiko K. / Pruss, Christof / Tiziani, Hans J. / Osten, Wolfgang / Lehmann, Peter / Schonfelder, Sven et al. | 2005
- 136
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Confocal micro-optical distance sensor: realization and results [5856-16]Lucke, P. / Last, A. / Mohr, J. / Ruprecht, A. K. / Pruss, C. / Tiziani, H. J. / Osten, W. / Lehmann, P. / Schonfelder, S. / SPIE et al. | 2005
- 143
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Influence of component imperfection on null ellipsometry with phase modulationPostava, K. / Hlubina, P. / Maziewski, A. / Ossikovski, R. / Foldyna, M. / Zivotsky, O. / Pistora, J. / Visnovsky, S. / Yamaguchi, T. et al. | 2005
- 143
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Influence of component imperfection on null ellipsometry with phase modulation [5856-17]Postava, K. / Hlubina, P. / Maziewski, A. / Ossikovski, R. / Foldyna, M. / Zivotsky, O. / Pistora, J. / Visnovsky, S. / Yamaguchi, T. / SPIE et al. | 2005
- 152
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A compact electronic speckle pattern interferometry system using a photopolymer reflection holographic optical elementGuntaka, Sridhar R. / Raghavendra, J. / Toal, Vincent / Naydenova, Izabela / Martin, Suzanne / Mintova, S. et al. | 2005
- 152
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A compact electronic speckle pattern interferometry system using a photopolymer reflection holographic optical element [5856-18]Guntaka, S. R. / Raghavendra, J. / Toal, V. / Naydenova, I. / Martin, S. / Mintova, S. / SPIE et al. | 2005
- 158
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Fiber optic spark plug sensor for UV-LIF measurements close to the ignition spark [5856-19]Reichle, R. / Pruss, C. / Osten, W. / Tiziani, H. J. / Zimmermann, F. / Schulz, C. / SPIE et al. | 2005
- 158
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Fiber optic spark plug sensor for UV-LIF measurements close to the ignition sparkReichle, R. / Pruss, C. / Osten, W. / Tiziani, H. J. / Zimmermann, F. / Schulz, C. et al. | 2005
- 169
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Comparison of B-spline and Zernike fitting techniques in complex wavefront surfacesAres, M. / Royo, S. / Caum, J. / Pizarro, C. et al. | 2005
- 169
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Comparison of B-spline and Zernike fitting techniques in complex wavefront surfaces [5856-76]Ares, M. / Royo, S. / Caum, J. / Pizarro, C. / SPIE et al. | 2005
- 179
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Novel real-time infrared image processor with ADSP [5856-77]Ge, C. / Fan, G. / Liu, Z. / Li, Z. / Wu, J. / Huang, Z. / Liang, Z. / SPIE et al. | 2005
- 179
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Novel real-time infrared image processor with ADSPGe, Cheng-liang / Fan, Guo-bin / Liu, Zhi-qiang / Li, Zheng-dong / Wu, Jian-tao / Huang, Zhi-wei / Liang, Zheng et al. | 2005
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- 195
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Polarizing-correlative processing of images of statistical objects in the problem of visualization and topology reconstruction of their phase heterogeneity [5856-79]Angelsky, O. V. / Ushenko, A. G. / Vashenko, I. M. / Bodnar, L. M. / SPIE et al. | 2005
- 195
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Polarizing-correlative processing of images of statistical objects in the problem of visualization and topology reconstruction of their phase heterogeneityAngelsky, O. V. / Ushenko, A. G. / Vashenko, I. M. / Bodnar, L. M. et al. | 2005
- 201
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Grid-pattern design for fast scene reconstruction by a 3D vision sensor [5856-80]Guan, Q. / Chen, S. / Wang, W. / Li, Y. F. / SPIE et al. | 2005
- 201
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Grid-pattern design for fast scene reconstruction by a 3D vision sensorGuan, Qiu / Chen, ShengYong / Wang, Wanliang / Li, Y. F. et al. | 2005
- 210
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The focusing action of refractive microlens by rigorous methodLiu, Juan / Gu, Ben-Yuan / Dong, Bi-Zhen / Yang, Guo-Zhen et al. | 2005
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The focusing action of refractive microlens by rigorous method [5856-81]Liu, J. / Gu, B.-Y. / Dong, B.-Z. / Yang, G.-Z. / SPIE et al. | 2005
- 221
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Automatic tracing of interference fringes using Fourier filtering, local averaging and simultaneous horizontal and vertical scansAnand, Arun / Chhaniwal, Vani K. et al. | 2005
- 221
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Automatic tracing of interference fringes using Fourier filtering, local averaging, and simultaneous horizontal and vertical scans [5856-82]Anand, A. / Chhaniwal, V. K. / SPIE et al. | 2005
- 227
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Application of matched digital filters to noisy fringe-patterns from complex wavefrontsCaum, Jesus / Arasa, J. / Royo, Santiago / Ares, M. et al. | 2005
- 227
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Application of matched digital filters to noisy fringe-patterns from complex wavefronts [5856-83]Caum, J. / Arasa, J. / Royo, S. / Ares, M. / SPIE et al. | 2005
- 238
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A focus sensor for an application in a nanopositioning and nanomeasuring machineMastylo, Rostyslav / Dontsov, Denis / Manske, Eberhard / Jager, Gerd et al. | 2005
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A focus sensor for an application in a nanopositioning and nanomeasuring machine [5856-84]Mastylo, R. / Dontsov, D. / Manske, E. / Jager, G. / SPIE et al. | 2005
- 245
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Application of super image methods in digital holographyKornis, Janos / Gombkoto, Balazs et al. | 2005
- 245
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Application of super image methods in digital holography [5856-85]Kornis, J. / Gombkoto, B. / SPIE et al. | 2005
- 254
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Phase evaluation using interference of polychromatic light and colorimetric analysis [5856-86]Novak, P. / Novak, J. / Miks, A. / SPIE et al. | 2005
- 254
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Phase evaluation using interference of polychromatic light and colorimetric analysisNovak, Pavel / Novak, Jiri / Miks, Antonin et al. | 2005
- 265
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Wavelet transform analysis of truncated fringe patterns in 3-D surface profilometryGorthi, Sai Siva / Lolla, Kameswara R. et al. | 2005
- 265
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Wavelet transform analysis of truncated fringe patterns in 3-D surface profilometry [5856-87]Gorthi, S. S. / Lolla, K. R. / SPIE et al. | 2005
- 274
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Evaluation of spectral modulated interferograms by the extended Kalman filtering methodGurov, Igor / Hlubina, Petr / Taratin, Mikhail / Zakharov, Alexey et al. | 2005
- 274
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Evaluation of spectral modulated interferograms by the extended Kalman filtering method [5856-88]Gurov, I. / Hlubina, P. / Taratin, M. / Zakharov, A. / SPIE et al. | 2005
- 281
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A compact frequency-stabilized Nd:YVO4/KTP/I2laser at 532 nm for laser interferometry and wavelength standardsVitushkin, Leonid F. / Orlov, Oleg A. et al. | 2005
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A compact frequency-stabilized Nd:YVO~4/KTP/I~2 laser at 532 nm for laser interferometry and wavelength standards [5856-89]Vitushkin, L. F. / Orlov, O. A. / SPIE et al. | 2005
- 287
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An objective measure of the quality of honed surfacesPuente Leon, Fernando et al. | 2005
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An objective measure of the quality of honed surfaces [5856-90]Leon, F. P. / SPIE et al. | 2005
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Optical high-speed 3D metrology in harsh environments: recording structural data of railway lines (Invited Paper)Hofler, H. / Baulig, C. / Blug, A. / Dambacher, M. / Dimopoulos, N. / Wolfelschneider, H. et al. | 2005
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Optical high-speed 3D metrology in harsh environments: recording structural data of railway lines (Invited Paper) [5856-20]Hofler, H. / Baulig, C. / Blug, A. / Dambacher, M. / Dimopoulos, N. / Wolfelschneider, H. / SPIE et al. | 2005
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High-speed and line-feed Fourier domain optical coherence tomography (Invited Paper)Yasuno, Yoshiaki / Makita, Shuichi / Endo, Takashi / Aoki, Gouki / Yamanari, Masahiro / Nakamura, Yoshifumi / Itoh, Masahide / Yatagai, Toyohiko et al. | 2005
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Absolute distance metrology for space interferometers [5856-21]Swinkels, B. L. / Bhattacharya, N. / Wielders, A. A. / Braat, J. J. M. / SPIE et al. | 2005
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Absolute distance metrology for space interferometersSwinkels, Bas L. / Bhattacharya, Nandini / Wielders, Arno A. / Braat, Joseph J. M. et al. | 2005
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An online laser caliper measurement for the paper industry [5856-22]Graeffe, J. / Nuyan, S. / SPIE et al. | 2005
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An online laser caliper measurement for the paper industryGraeffe, Jussi / Nuyan, Seyhan et al. | 2005
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Robust high-precision 2D optical range sensorBrandner, Markus / Thurner, Thomas et al. | 2005
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Optical distance measurements for closely spaced targets using a FMCW approach [5856-24]Grosche, R. / SPIE et al. | 2005
- 336
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Optical distance measurements for closely spaced targets using a FMCW approachGrosche, Robert et al. | 2005
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Profiling of gas turbine blade using phase shifting Talbot interferometric technique [5856-25]Shakher, C. / Mehta, D. S. / Mirza, S. / Singh, P. / SPIE et al. | 2005
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Measurements from a novel interferometer for EUVL mirror substratesKrieg, Max L. / Braat, Joseph J. M. et al. | 2005
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Measurements from a novel interferometer for EUVL mirror substrates [5856-26]Krieg, M. L. / Braat, J. J. M. / SPIE et al. | 2005
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Improved optical linewidth measurement by means of alternating dark field illumination and model-based evaluation [5856-27]Ehret, G. / Bodermann, B. / Mirande, W. / SPIE et al. | 2005
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Improved optical linewidth measurement by means of alternating dark field illumination and model-based evaluationEhret, Gerd / Bodermann, Bernd / Mirande, Werner et al. | 2005
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Mirror shape detection by reflection grating moire method with optical design validationFontani, D. / Francini, F. / Jafrancesco, D. / Mercatelli, L. / Sansoni, P. et al. | 2005
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Edge enhancement of weak-phase object in laser scanning confocal microscope [5856-40]Itoh, M. / Uematsu, S. / Ishiwata, H. / Yatagai, T. / SPIE et al. | 2005
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Edge enhancement of weak-phase object in laser scanning confocal microscopeItoh, Masahide / Uematsu, Shin / Ishiwata, Hiroshi / Yatagai, Toyohiko et al. | 2005
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- 536
-
Liquid mirror as planarity standard: a simplified experimental approachVannoni, M. / Molesini, G. et al. | 2005
- 544
-
Wavefront reconstruction algorithms for the adaptive Shack-Hartmann sensorSeifert, Lars / Tiziani, Hans J. / Osten, Wolfgang et al. | 2005
- 544
-
Wavefront reconstruction algorithms for the adaptive Shack-Harfmann sensor [5856-93]Seifert, L. / Tiziani, H. J. / Osten, W. / SPIE et al. | 2005
- 554
-
A new approach for measurement of wire diameter by optical diffractionDiwan, Yogesh C. / Lolla, Kameswara Rao et al. | 2005
- 554
-
A new approach for measurement of wire diameter by optical diffraction [5856-94]Diwan, Y. C. / Lolla, K. R. / SPIE et al. | 2005
- 562
-
Easy calibration of a structured light vision system based on neural networks [5856-95]Xia, B. / Chen, S. / Wang, W. / Guan, Q. / SPIE et al. | 2005
- 562
-
Easy calibration of a structured light vision system based on neural networksXia, Bingbing / Chen, ShengYong / Wang, Wanliang / Guan, Qiu et al. | 2005
- 572
-
Effectible factors in optics profile testing [5856-96]Ren, H. / Jiang, X. / Huang, Z. / Xu, H. / Zhong, W. / Li, K. / SPIE et al. | 2005
- 572
-
Effectible factors in optics profile testingRen, Huan / Jiang, Xiaodong / Huang, Zuxin / Xu, Hua / Zhong, Wei / Li, Ke et al. | 2005
- 581
-
A compact shearing interferometer for testing optical systemsNovak, Jiri / Novak, Pavel / Miks, Antonin et al. | 2005
- 581
-
A compact shearing interferometer for testing optical systems [5856-97]Novak, J. / Novak, P. / Miks, A. / SPIE et al. | 2005
- 589
-
500-mm-aperture wavelength-tuning phase-shifting interferometerChai, Liqun / Xu, Qiao / Yu, Yingjie / Deng, Yang / Xu, Jiancheng et al. | 2005
- 589
-
500-mm-aperture wavelength-tuning phase-shifting interferometer [5856-98]Chai, L. / Xu, Q. / Yu, Y. / Deng, Y. / Xu, J. / SPIE et al. | 2005
- 597
-
Possible application of hyperchromatic optical systems for metrology of surfacesNovak, Jiri / Miks, Antonin et al. | 2005
- 597
-
Possible application of hyperchromatic optical systems for metrology of surfaces [5856-100]Novak, J. / Miks, A. / SPIE et al. | 2005
- 606
-
On-line measurements with optical scanners: metrological aspectsDuma, Virgil-Florin et al. | 2005
- 606
-
On-line measurements with optical scanners: metrological aspects [5856-101]Duma, V.-F. / SPIE et al. | 2005
- 618
-
Improving 3D surface measurement accuracy on metallic surfacesKokku, Raghu / Brooksby, Glen et al. | 2005
- 618
-
Improving 3D surface measurement accuracy on metallic surfaces [5856-104]Kokku, R. / Brooksby, G. / SPIE et al. | 2005
- 625
-
Zeeman laser for straightness measurements [5856-107]Rzepka, J. / Budzyn, G. / Fraczek, W. / Bielenin, M. / SPIE et al. | 2005
- 625
-
Zeeman laser for straightness measurementsRzepka, Janusz / Budzyn, Grzegorz / Fraczek, Wojciech / Bielenin, Marcin et al. | 2005
- 632
-
How to detect object-caused illumination effects in 3D fringe projectionMunkelt, Christoph / Kuhmstedt, Peter / Heinze, Matthias / Suesse, Herbert / Notni, Gunther et al. | 2005
- 632
-
How to detect object-caused illumination effects in 3D fringe projection [5856-108]Munkelt, C. / Kuhmstedt, P. / Heinze, M. / Susse, H. / Notni, G. / SPIE et al. | 2005
- 640
-
Object surface topography by means of a speckle correlation [5856-109]Smid, P. / Horvath, P. / Wagnerova, P. / Hrabovsky, M. / SPIE et al. | 2005
- 640
-
Object surface topography by means of a speckle correlationSmid, Petr / Horvath, Pavel / Wagnerova, Petra / Hrabovsky, Miroslav et al. | 2005
- 646
-
Focal spot measurement in ultra-intense ultra-short pulse laser facility [5856-110]Liu, L. / Peng, H. / Zhou, K. / Wang, X. / Zeng, X. / Zhu, Q. / Huang, X. / Wei, X. / Ren, H. / SPIE et al. | 2005
- 646
-
Focal spot measurement in ultra-intense ultra-short pulse laser facilityLiu, Lanqin / Peng, Hansheng / Zhou, Kainan / Wang, Xiaodong / Zeng, Xiaoming / Zhu, Qihua / Huang, Xiaojun / Wei, Xiaofeng / Ren, Huan et al. | 2005
- 652
-
Coherent introscopy of phase-inhomogeneous surface and layers [5856-111]Angelsky, O. V. / Ushenko, A. G. / Vashenko, I. M. / Bodnar, L. M. / SPIE et al. | 2005
- 652
-
Coherent introscopy of phase-inhomogeneous surface and layersAngelsky, O. V. / Ushenko, A. G. / Vashenko, I. M. / Bodnar, L. M. et al. | 2005
- 657
-
Recent issues on development of reference materials and standardized tests of optical methods of strain measurementBurguete, Richard / Hack, Erwin / Kujawinska, Malgorzata / Patterson, Eann / Salbut, Leszek / Saleem, Quasim / Siebert, Thorsten / Whelan, Maurice et al. | 2005
- 657
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Recent issues on development of reference materials and standardized tests of optical methods of strain measurement [5856-48]Burguete, R. / Hack, E. / Kujawinska, M. / Patterson, E. / Salbut, L. / Saleem, Q. / Siebert, T. / Whelan, M. / SPIE et al. | 2005
- 664
-
Polarization plane rotator used as a phase stepping device in a 2-channel shearing speckle interferometer [5856-49]Somers, P. A. A. M. / Bhattacharya, N. / SPIE et al. | 2005
- 664
-
Polarization plane rotator used as a phase stepping device in a 2-channel shearing speckle interferometerSomers, Peter A. A. M. / Bhattacharya, Nandini et al. | 2005
- 674
-
TV-holographic mapping of airborne sound fields for the design of parametric arraysJoost, Holger / Hinsch, Klaus D. / Gulker, Gerd et al. | 2005
- 674
-
TV-holographic mapping of airborne sound fields for the design of parametric arrays [5856-50]Joost, H. / Hinsch, K. D. / Gulker, G. / SPIE et al. | 2005
- 682
-
Comparison of shearography and optical fibre Bragg grating strain sensors with resistance foil strain gauge measurementsGroves, Roger M. / Chehura, Edmon / Li, Weilai / Staines, Stephen E. / James, Stephen W. / Tatam, Ralph P. et al. | 2005
- 682
-
Comparison of shearography and optical fibre Bragg grating strain sensors with resistance foil strain gauge measurements [5856-51]Groves, R. M. / Chehura, E. / Li, W. / Staines, S. E. / James, S. W. / Tatam, R. P. / SPIE et al. | 2005
- 691
-
Fast distance sensing by use of the speckle effectNippolainen, Ervin / Semenov, Dmitry V. / Kamshilin, Alexei A. / Belyaev, Andrey V. / Andreev, Sergei V. / Gurevich, Boris S. et al. | 2005
- 691
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Fast distance sensing by use of the speckle effect [5856-52]Nippolainen, E. / Semenov, D. V. / Kamshilin, A. A. / Belyaev, A. V. / Andreev, S. V. / Gurevich, B. S. / SPIE et al. | 2005
- 698
-
The laser-scanning confocal vibrometer microscopeRembe, Christian / Drabenstedt, Alexander et al. | 2005
- 698
-
The laser-scanning confocal vibrometer microscope [5856-53]Rembe, C. / Drabenstedt, A. / SPIE et al. | 2005
- 710
-
Accuracy analysis of major signal processing techniques in laser Doppler velocimetry [5856-54]Popov, I. A. / SPIE et al. | 2005
- 710
-
Accuracy analysis of major signal processing techniques in laser Doppler velocimetryPopov, Ivan A. et al. | 2005
- 722
-
Interferogram intensity modulation calculations using temporal phase shifting: error analysis [5856-55]Patorski, K. / Styk, A. / SPIE et al. | 2005
- 722
-
Interferogram intensity modulation calculations using temporal phase shifting: error analysisPatorski, Krzysztof / Styk, Adam et al. | 2005
- 734
-
Development and investigation of high resolution resonant pressure sensor with optical interrogation [5856-56]Jozwik, M. / Gorecki, C. / Sabac, A. / Heinis, D. / Dean, T. / Jacobelli, A. / SPIE et al. | 2005
- 734
-
Development and investigation of high resolution resonant pressure sensor with optical interrogationJozwik, Michal / Gorecki, Christophe / Sabac, Andrei / Heinis, Dominique / Dean, Thierry / Jacobelli, Alain et al. | 2005
- 740
-
Time synchronization of oscillating objects with laser pulse in pulse interferometry [5856-57]Bartold, J. / Kacperski, J. / Salbut, L. / SPIE et al. | 2005
- 740
-
Time synchronization of oscillating objects with laser pulse in pulse interferometryBartold, Jaroslaw / Kacperski, Jacek / Salbut, Leszek et al. | 2005
- 746
-
Specification of vibrational modes and amplitudes in large-scale structure by time averaging moire technique [5856-58]Rasouli, S. / Tavassoly, M. T. / SPIE et al. | 2005
- 746
-
Specification of vibrational modes and amplitudes in large-scale structure by time averaging moire techniqueRasouli, Saifollah / Tavassoly, Mohammad T. et al. | 2005
- 755
-
Phase correlation method for subpixel in-plane vibration measurements of MEMS by stroboscopic microscopy [5856-113]Serio, B. / Hunsinger, J. J. / Teyssieux, D. / Cretin, B. / SPIE et al. | 2005
- 755
-
Phase correlation method for subpixel in-plane vibration measurements of MEMS by stroboscopic microscopySerio, B. / Hunsinger, J. J. / Teyssieux, D. D. / Cretin, B. et al. | 2005
- 763
-
Performance evaluation of a residual stress measurement device using indentation and a radial in-plane ESPI interferometer [5856-59]Suterio, R. / Albertazzi G, A. / Amaral, F. K. / Pacheco, A. / SPIE et al. | 2005
- 763
-
Performance evaluation of a residual stress measurement device using indentation and a radial in-plane ESPI interferometerSuterio, Ricardo / Albertazzi G., Armando / Amaral, Felipe K. / Pacheco, Anderson et al. | 2005
- 775
-
Superconductor ceramics behavior analyses during service by speckle metrology [5856-60]Recuero, S. / Andres, N. / Arroyo, M. P. / Lera, F. / Angurel, L. A. / SPIE et al. | 2005
- 775
-
Superconductor ceramics behavior analyses during service by speckle metrologyRecuero, S. / Andres, N. / Arroyo, M. P. / Lera, F. / Angurel, L. A. et al. | 2005
- 786
-
Automatic detection of the natural frequencies using digital shearography [5856-61]Gan, Y. / Kupfer, G. / Steinchen, W. / SPIE et al. | 2005
- 786
-
Automatic detection of the natural frequencies using digital shearographyGan, Y. / Kupfer, G. / Steinchen, W. et al. | 2005
- 793
-
Experimental comparison of shearography and laser optical feedback imaging for crack detection in concrete structures [5856-62]Muzet, V. / Lacot, E. / Hugon, O. / Guillard, Y. / SPIE et al. | 2005
- 793
-
Experimental comparison of shearography and laser optical feedback imaging for crack detection in concrete structuresMuzet, V. / Lacot, E. / Hugon, O. / Guillard, Y. et al. | 2005
- 800
-
Interferometric optical tomography applied to dendritic crystal growth model scenes [5856-63]Dewandel, J.-L. / Heraud, M. / Rex, S. / Mathes, M. / Lanen, T. / Joannes, L. / SPIE et al. | 2005
- 800
-
Interferometric optical tomography applied to dendritic crystal growth model scenesDewandel, J-L. / Heraud, M. / Rex, S. / Mathes, M. / Lanen, T. / Joannes, L. et al. | 2005
- 811
-
Experimental studies of mechanical joints by automated grating (moire) interferometryDymny, G. / Kujawinska, M. / Salbut, L. / Boronski, D. et al. | 2005
- 811
-
Experimental studies of mechanical joints by automated grating (moire) interferometry [5856-114]Dymny, G. / Kujawinska, M. / Salbut, L. / Boronski, D. / SPIE et al. | 2005
- 819
-
Close infrared thermography using an intensified CCD camera: application in nondestructive high resolution evaluation of electrothermally actuated MEMSSerio, B. / Hunsinger, J. J. / Conseil, F. / Derderian, P. / Collard, D. / Buchaillot, L. / Ravat, M. F. et al. | 2005
- 819
-
Close infrared thermography using an intensified CCD camera: application in nondestructive high resolution evaluation of electrothermally actuated MEMS [5856-117]Serio, B. / Hunsinger, J. J. / Conseil, F. / Derderian, P. / Collard, D. / Buchaillot, L. / Ravat, M. F. / SPIE et al. | 2005
- 830
-
Measurement of beating effects in narrowband multimode Lamb wave displacement fields in aluminum plates by pulsed TV holography [5856-118]Fernandez, J. L. / Trillo, C. / Doval, A. F. / Cernadas, D. / Lopez, C. / Dorrio, B. V. / Miranda, M. / Rodriguez, F. / SPIE et al. | 2005
- 830
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Measurement of beating effects in narrowband multimode Lamb wave displacement fields in aluminum plates by pulsed TV HolographyFernandez, Jose L. / Trillo, Cristina / Doval, Angel F. / Cernadas, Daniel / Lopez, Carlos / Dorrio, Benito V. / Miranda, Marta / Rodriguez, Francisco et al. | 2005
- 842
-
Assessment of technology and (thermo)mechanical behaviour of MEMS devices by interference microscopy (Invited Paper)Bosseboeuf, Alain / Breluzeau, Cedric / Petitgrand, Sylvain et al. | 2005
- 842
-
Assessment of technology and (thermo)mechanical behaviour of MEMS devices by interference microscopy (Invited Paper) [5856-64]Bosseboeuf, A. / Breluzeau, C. / Petitgrand, S. / SPIE et al. | 2005
- 856
-
Characterisation of high-density particle distributions for optimisation of laser cladding processes using digital holography [5856-71]Kebbel, V. / Geldmacher, J. / Partes, K. / Juptner, W. / SPIE et al. | 2005
- 856
-
Characterisation of high-density particle distributions for optimisation of laser cladding processes using digital holographyKebbel, Volker / Geldmacher, Jurgen / Partes, Knut / Juptner, Werner et al. | 2005
- 865
-
Laval nozzle flow characterization by Fourier-transform Mach-Zehnder interferometry [5856-72]Rodriguez, F. / Dorrio, B. V. / Doval, A. F. / Trillo, C. / Quintero, F. / Miranda, M. / Lopez, C. / Fernandez, J. L. / SPIE et al. | 2005
- 865
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Laval nozzle flow characterization by Fourier-transform Mach-Zehnder interferometryRodriguez, Francisco / Dorrio, Benito V. / Doval, Angel F. / Trillo, Cristina / Quintero, Felix / Miranda, Marta / Lopez, Carlos / Fernandez, Jose L. et al. | 2005
- 874
-
Methods based on one component laser Doppler anemometer and hot film anemometer for three-dimensional turbulent measurementsZeris, Athanasios P. et al. | 2005
- 874
-
Methods based on one component laser Doppler anemometer and hot film anemometer for three-dimensional turbulent measurements [5856-73]Zeris, A. P. / SPIE et al. | 2005
- 882
-
Measurements of material refractive index with a circular heterodyne interferometer [5856-74]Jian, Z.-C. / Lin, J.-Y. / Hsieh, P.-J. / Su, D.-C. / SPIE et al. | 2005
- 882
-
Measurements of material refractive index with a circular heterodyne interferometerJian, Zhi-Cheng / Lin, Jiun-You / Hsieh, Po-Jen / Su, Der-Chin et al. | 2005
- 893
-
Laser acoustic characterization of Ta and TaN diffusion barriers beneath Cu layers [5856-65]Vollmann, J. / Profunser, D. M. / Bryner, J. / Dual, J. / SPIE et al. | 2005
- 893
-
Laser acoustic characterization of Ta and TaN diffusion barriers beneath Cu layersVollmann, Jacqueline / Profunser, Dieter M. / Bryner, Jurg / Dual, Jurg et al. | 2005
- 903
-
Local measurements by noise in dynamic force microscopyVairac, Pascal / Cretin, Bernard / Joly, Benjamin et al. | 2005
- 903
-
Local measurements by noise in dynamic force microscopy [5856-66]Vairac, P. / Cretin, B. / Joly, B. / SPIE et al. | 2005
- 914
-
Enhancement of image contrast by fluorescence in microtechnology [5856-67]Berndt, M. / Tutsch, R. / SPIE et al. | 2005
- 914
-
Enhancement of image contrast by fluorescence in microtechnologyBerndt, Michael / Tutsch, Rainer et al. | 2005
- 922
-
Point-diffraction fiber interferometer for vibration desensitization [5856-69]Park, J. / Kihm, H. / Kim, S.-W. / SPIE et al. | 2005
- 922
-
Point-diffraction fiber interferometer for vibration desensitizationPark, Jungjae / Kihm, Hagyong / Kim, Seung-Woo et al. | 2005
- 930
-
Digital holography microscopy (DHM): fast and robust systems for industrial inspection with interferometer resolutionEmery, Yves / Cuche, Etienne / Marquet, Francois / Aspert, Nicolas / Marquet, Pierre / Kuhn, Jonas / Botkine, Mikhail / Colomb, Tristan / Montfort, Frederic / Charriere, Florian et al. | 2005
- 930
-
Digital holography microscopy (DHM): fast and robust systems for industrial inspection with interferometer resolution [5856-70]Emery, Y. / Cuche, E. / Marquet, F. / Aspert, N. / Marquet, P. / Kuhn, J. / Botkine, M. / Colomb, T. / Montfort, F. / Charriere, F. et al. | 2005
- 938
-
On-line non-contact measuring of synchronizer hubsFraga, Cesar / Enguita, Jose M. / Alvarez, Ignacio / Marina, Jorge / Martinez, Nestor et al. | 2005
- 938
-
On-line non-contact measuring of synchronizer hubs [5856-120]Fraga, C. / Enguita, J. M. / Alvarez, I. / Marina, J. / Martinez, N. / SPIE et al. | 2005
- 950
-
Enhancement of high-resolution electronic autocollimators by application of phase grating technology [5856-121]Futterer, G. / SPIE et al. | 2005
- 950
-
Enhancement of high-resolution electronic autocollimators by application of phase grating technologyFutterer, Gerald et al. | 2005
- 960
-
3D optical measuring technologies and systems for industrial applicationsChugui, Yu. V. et al. | 2005
- 960
-
3D optical measuring technologies and systems for industrial applications [5856-123]Chugui, Y. V. / SPIE et al. | 2005
- 972
-
Filter radiometer based realization of photometric scale traceable to cryogenic radiometer at UMEDurak, Murat / Samedov, Farhad et al. | 2005
- 972
-
Filter radiometer based realization of photometric scale traceable to cryogenic radiometer at UME [5856-124]Durak, M. / Samedov, F. / SPIE et al. | 2005
- 980
-
New method for real-time surface cleanliness measurement [5856-126]Bilmes, G. M. / Orzi, D. J. O. / Martinez, O. E. / Lencina, A. / SPIE et al. | 2005
- 980
-
New method for real-time surface cleanliness measurementBilmes, Gabriel M. / Orzi, Daniel J. O. / Martinez, Oscar E. / Lencina, Alberto et al. | 2005
- 987
-
Utilizing a TII aspherical measurement machine in a computer controlled polishing process [5856-128]Pitschke, E. / Schinhaerl, M. / Sperber, P. / Rascher, R. / SPIE et al. | 2005
- 987
-
Utilizing a TII aspherical measurement machine in a computer controlled polishing processPitschke, E. / Schinhaerl, M. / Sperber, P. / Rascher, R. et al. | 2005
- 994
-
The evaluation of particle counting efficacy of the new optical scattering method detecting the fluorescence for the particle number concentration standard in liquidSakaguchi, Takayuki / Ehara, Kensei et al. | 2005
- 994
-
The evaluation of particle counting efficacy of the new optical scattering method detecting the fluorescence for the particle number concentration standard in liquid [5856-129]Sakaguchi, T. / Ehara, K. / SPIE et al. | 2005
- 1003
-
Seismic damage identification using multi-line distributed fiber optic sensor systemOu, Jinping / Hou, Shuang et al. | 2005
- 1003
-
Seismic damage identification using multi-line distributed fiber optic sensor system [5856-131]Ou, J. / Hou, S. / SPIE et al. | 2005
- 1009
-
Diffusion coefficient measurement of transparent liquid solutions using digital holographic interferometry [5856-132]Chhaniwal, V. K. / Anand, A. / Narayanamurthy, C. S. / SPIE et al. | 2005
- 1009
-
Diffusion coefficient measurement of transparent liquid solutions using digital holographic interferometryChhaniwal, Vani K. / Anand, Arun / Narayanamurthy, C. S. et al. | 2005
- 1014
-
Pulsed Nd:YAG laser beam profile analysis [5856-134]Chmelickova, H. / Lapsanska, H. / Ctvrtlik, R. / SPIE et al. | 2005
- 1014
-
Pulsed Nd:YAG laser beam profile analyseChmelickova, Hana / Lapsanska, Hana / Ctvrtlik, Radim et al. | 2005
- 1022
-
Birefringence measurement by use of digital holographic microscopy: examples with fiber optics and concrete samplesColomb, Tristan / Cuche, Etienne / Depeursinge, Christian et al. | 2005
- 1022
-
Birefringence measurement by use of digital holographic microscopy: examples with fiber optics and concrete samples [5856-138]Colomb, T. / Cuche, E. / Depeursinge, C. / SPIE et al. | 2005
- 1028
-
CCD based emissivity measurements for surface characterization in heat treatment processesZauner, Gerald / Darilion, Gerald / Heim, Daniel / Hendorfer, G. / Mueller, Thomas et al. | 2005
- 1028
-
CCD based emissivity measurements for surface characterization in heat treatment processes [5856-139]Zauner, G. / Darilion, G. / Heim, D. / Hendorfer, G. / Mueller, T. / SPIE et al. | 2005
- 1036
-
A method for measuring the complex refractive index of a turbid medium [5856-140]Jian, Z.-C. / Lin, J.-Y. / Hsieh, P.-J. / Chen, H.-W. / Su, D.-C. / SPIE et al. | 2005
- 1036
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A method for measuring the complex refractive index of a turbid mediumJian, Zhi-Cheng / Lin, Jiun-You / Hsieh, Po-Jen / Chen, Huei-Wen / Su, Der-Chin et al. | 2005