Quantitative analysis of effect of tilted misalignment on image quality in integral imaging system (Englisch)
- Neue Suche nach: Chen, Yujiao
- Neue Suche nach: Chen, Jing
- Neue Suche nach: Nie, Liang
- Neue Suche nach: Chen, Yujiao
- Neue Suche nach: Chen, Jing
- Neue Suche nach: Nie, Liang
In:
Proc. SPIE
;
11565
; 115650B
;
2020
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Elektronische Ressource
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Titel:Quantitative analysis of effect of tilted misalignment on image quality in integral imaging system
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Beteiligte:
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Kongress:AOPC 2020: Display Technology; Photonic MEMS, THz MEMS, and Metamaterials; and AI in Optics and Photonics ; 2020 ; Beijing,China
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Erschienen in:Proc. SPIE ; 11565 ; 115650B
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Verlag:
- Neue Suche nach: SPIE
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Erscheinungsdatum:05.11.2020
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ISBN:
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ISSN:
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DOI:
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Medientyp:Aufsatz (Konferenz)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
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Quantitative analysis of effect of tilted misalignment on image quality in integral imaging systemChen, Yujiao / Chen, Jing / Nie, Liang et al. | 2020
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