Fabrication of Wolter type I mirror for soft x-ray (Englisch)
- Neue Suche nach: Onuki, Tetsuji
- Neue Suche nach: Sugisaki, Katsumi
- Neue Suche nach: Aoki, Sadao
- Neue Suche nach: Onuki, Tetsuji
- Neue Suche nach: Sugisaki, Katsumi
- Neue Suche nach: Aoki, Sadao
In:
Proc. SPIE
;
1720
; 258
;
1992
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Elektronische Ressource
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Titel:Fabrication of Wolter type I mirror for soft x-ray
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Beteiligte:
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Kongress:Intl Symp on Optical Fabrication, Testing, and Surface Evaluation ; 1992 ; Tokyo,Japan
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Erschienen in:Proc. SPIE ; 1720 ; 258
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Verlag:
- Neue Suche nach: SPIE
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Erscheinungsdatum:20.10.1992
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ISBN:
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ISSN:
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DOI:
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Medientyp:Aufsatz (Konferenz)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 2
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Needs for super-smooth surfaces (Invited Paper)Saito, Theodore T. et al. | 1992
- 11
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Aspheric machining form correction by form-measuring instrument and aspheric programming systemOgawa, Hideki / Endo, Yukio / Itoh, Seiichi et al. | 1992
- 22
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Super-smooth surface polishing on aspherical opticsAndo, Manabu / Negishi, Mahito / Takimoto, Masafumi / Deguchi, Akinobu / Nakamura, Nobuo / Higomura, Makoto / Yamamoto, Hironori et al. | 1992
- 34
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Measurement of large-scale and high-precision optics using a noncontact form-measuring probeMurai, Seiichiro / Ueda, Katsunobu / Sakuta, Shigeru / Ishikawa, Ken et al. | 1992
- 44
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New machining method of a large-size asymmetric aspheric mirrorHigashi, Yasuo / Koike, Sigeaki / Takatomi, Toshikazu / Koizumi, Shin et al. | 1992
- 50
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Development of ultraprecise injection molding method for thermoplasticlensesFukushima, Akiro / Kawazu, Motoaki / Ito, Hidenori / Koseko, Hisaaki / Hatakeyama, Toshiharu / Ohotani, Wataru / Kanematsu, Toshihiro et al. | 1992
- 60
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Computer-controlled polishing of aspheric surfacesCao, Tianning / Zhang, Jianping et al. | 1992
- 66
-
Present situation and prospect on optical components processing and measuring techniques in ChinaZhou, Pengfei / Ding, Jiang-wu et al. | 1992
- 78
-
Present and future standard specimens for surface-finish metrology (Summary Only)Vorburger, Theodore V. / Song, Jun-Feng / Marx, Egon / Scace, Robert I. / Lettieri, Thomas R. et al. | 1992
- 82
-
Development of new instrument detecting integrated intensity fluctuations for surface roughness measurementsMiyazaki, Eiichi / Nakanishi, Kunifumi / Yoshimura, Takeaki et al. | 1992
- 90
-
Real-time surface roughness measurement under speckle pattern illuminationNakagawa, Kiyoshi / Yoshimura, Takeaki / Minemoto, Takumi et al. | 1992
- 100
-
Noncontact measuring methods of optical surface roughnessLiang, Feng / Cao, Tianning et al. | 1992
- 106
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Aspheric technology for zoom lenses (Invited Paper)Dohi, Toshihide et al. | 1992
- 111
-
Comparison of surface roughness measured with an optical profiler and a scanning probe microscope (Invited Paper)Jahanmir, Jay / Wyant, James C. et al. | 1992
- 119
-
Surface roughness and waviness measurements for optical parts (Invited Paper)Bristow, Thomas C. et al. | 1992
- 124
-
Fringe-scanning white-light microscope for surface profile measurement and material identificationMatsui, Kumiko / Kawata, Satoshi et al. | 1992
- 133
-
Phase-shifting common-path interferometers using double-focus lenses for surface profilingKikuta, Hisao / Iwata, Koichi et al. | 1992
- 142
-
Scattering characteristics of dielectric optical multilayers in visible regionAkiyama, Takayuki et al. | 1992
- 154
-
Multiobjective space datum line available through paralleled plateShi, Dachun / Shuai, Ge / Zhou, Pengfei et al. | 1992
- 158
-
New type of instrument for the orientation of the optical axis of crystalCao, Tianning et al. | 1992
- 162
-
Advancements in one-dimensional profiling with a long-trace profilerIrick, Steven C. / McKinney, Wayne R. et al. | 1992
- 169
-
Progress at the Center for Optics ManufacturingJacobs, Stephen D. et al. | 1992
- 176
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X-ray imaging optics in Japan (Invited Paper)Namioka, Takeshi / Yamashita, Koujun / Yamamoto, Masaki / Matsushita, Tadashi / Aoki, Sadao / Sato, Shigeru et al. | 1992
- 191
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Structure and x-ray optical properties of MBE-grown multilayers (Invited Paper)Falco, Charles M. / Kearney, Patrick A. / Ruffner, Judith A. / Slaughter, Jon M. et al. | 1992
- 201
-
X-ray multilayer mirrors for grazing incidenceSudoh, Masaaki / Ueda, Katsunobu / Nakamura, Shinichi / Ohmori, Hirobumi et al. | 1992
- 208
-
Fabrication and evaluation of Cr-C multilayer mirrors for soft x raysNiibe, Masahito / Tsukamoto, Masami / Iizuka, Takashi / Miyake, Akira / Watanabe, Yutaka / Fukuda, Yasuaki et al. | 1992
- 217
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Design and fabrication of the Schwarzschild objective for soft x-ray microscopesHorikawa, Yoshiaki / Mochimaru, Shouichirou / Iketaki, Yoshinori / Nagai, Koumei / Okawa, Kaneyasu / Iura, Shigemi et al. | 1992
- 226
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Radiation damage of multilayer mirrors for soft x-ray lasersTsukamoto, Masami / Niibe, Masahito / Watanabe, Yutaka / Miyake, Akira / Iizuka, Takashi / Fukuda, Yasuaki / Kato, Yoshiaki / Shiraga, Hiroyuki / Daido, Hiroyuki / Murai, Kensuki et al. | 1992
- 238
-
X-ray mirrors for SR lithography (Invited Paper)Kaneko, Takashi / Itabashi, Sei-ichi / Saitoh, Yasunao / Okada, Ikuo / Yoshihara, Hideo et al. | 1992
- 246
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Thickness dependence of the optical constants of thin Pt, Au, and Rh films in the soft x-ray regionYanagihara, Mihiro / Maehara, Takaumi / Yamamoto, Masaki / Namioka, Takeshi et al. | 1992
- 252
-
Two-stage x-ray mirror system for microscopic x-ray photoelectron spectroscopyNinomiya, Ken / Hasegawa, Masaki / Aoki, Sadao et al. | 1992
- 258
-
Fabrication of Wolter type I mirror for soft x-rayOnuki, Tetsuji / Sugisaki, Katsumi / Aoki, Sadao et al. | 1992
- 264
-
Fabrication and testing of grazing incidence mirrors for hard x raysUchida, Fumihiko / Suzuki, Yoshio et al. | 1992
- 272
-
Fabrication and testing of x-ray optical elementsZhou, Changxin et al. | 1992
- 284
-
Technological challenges in the Japan National Large Telescope project (Invited Paper)Kodaira, Keiichi et al. | 1992
- 293
-
Advances in optical disk lens (Invited Paper)Kojima, Tadashi et al. | 1992
- 305
-
Zone-plate null interferometer for measuring aspherical mirror with large apertureHonda, Toshio / Kawamoto, Y. / Guan, Haike / Yamaguchi, Masahiro / Ohyama, Nagaaki et al. | 1992
- 311
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Analysis of zone-plate interference fringe patternKamiya, Kazuhide / Nomura, Takashi / Miyashiro, Hiroshi / Yoshikawa, Kazuo / Tashiro, Hatsuzo / Ozono, Shigeo / Suzuki, Masane et al. | 1992
- 317
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Application of a fringe scanning method to zone-plate interferometryNomura, Takashi / Miyashiro, Hiroshi / Kamiya, Kazuhide / Yoshikawa, Kazuo / Tashiro, Hatsuzo / Ozono, Shigeo / Suzuki, Masane et al. | 1992
- 325
-
Precision polarimetry of optical components (Invited Paper)Chipman, Russell A. et al. | 1992
- 336
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Null test of aspheric surfaces in zone-plate interferometerHuang, Junejei / Chang, Chihui et al. | 1992
- 346
-
Two-dimensional birefringence measurement using the phase-shifting techniqueOtani, Yukitoshi / Shimada, Takuya / Yoshizawa, Toru / Umeda, Norihiro et al. | 1992
- 355
-
Contour mapping of dynamic stress distributions by novel polarization interferometryOka, Kazuhiko / Ohtsuka, Yoshihiro et al. | 1992
- 367
-
Measurement of 2D birefringence distributionNoguchi, Masato / Ishikawa, Tsuyoshi / Ohno, Masahiro / Tachihara, Satoru et al. | 1992
- 379
-
Adhesive analysis of the thin film on the different optical polishing surfaceLiang, Yueshan / Zhou, Pengfei et al. | 1992
- 384
-
Fabrication and testing of x-ray telescopeYu, Jingchi / Sun, Xiafei / Huang, Zhangnan et al. | 1992
- 390
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Soft x-ray polarization measurement with a laboratory reflectometerYamamoto, Masaki / Mayama, Kou / Nomura, Hiroshi / Kimura, Hiroaki / Yanagihara, Mihiro / Namioka, Takeshi et al. | 1992
- 395
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Design, fabrication, and polarization of soft x-ray transmission multilayersNomura, Hiroshi / Mayama, Kou / Sasaki, Takuya / Yamamoto, Masaki / Yanagihara, Mihiro et al. | 1992
- 402
-
Fringe contrast improvement in Twyman-Green interferometer for lens testOhashi, Hitoshi / Iba, Yoichi / Okamura, Toshiro et al. | 1992
- 413
-
Heterodyne common-path interferometer for testing surface roughnessHan, Changyuan / Liu, Bin / Lu, Zhenwu / Gu, Quwu et al. | 1992
- 419
-
Refractive index measurement for irregular-shaped samplesYang, Shu-Mieh / Chang, Kuo-Hao / Kung, Ta-Kun et al. | 1992
- 428
-
Error sources in phase-measuring interferometry (Invited Paper)Creath, Katherine et al. | 1992
- 436
-
Measurement of phase change of light on reflectionDoi, Takuma / Toyoda, Kouji / Tanimura, Yoshihisa et al. | 1992
- 444
-
Measurement of large plane surface shape with interferometric aperture synthesisOtsubo, Masashi / Okada, Katsuyuki / Tsujiuchi, Jumpei et al. | 1992
- 448
-
Measurement of radius of concave mirror by zone-plate interferometerLiu, Zhi Q. / Okada, Katsuyuki / Tsujiuchi, Jumpei et al. | 1992
- 452
-
Advanced interferometry at Carl Zeiss (Summary Only)Kuechel, Michael F. et al. | 1992
- 458
-
Two-wavelength laser-diode interferometry with electronic calibration techniquesOnodera, Ribun / Ishii, Yukihiro et al. | 1992
- 464
-
Oblique incidence interferometry for gear-tooth surface profilingIno, Tomomi / Yatagai, Toyohiko et al. | 1992
- 470
-
Talbot projected 3D profilometry by means of one-step phase-shift algorithmsGu, Ruowei / Yoshizawa, Toru et al. | 1992
- 478
-
Surface condition measurement using optical heterodyne methodFujita, Hiroo et al. | 1992
- 487
-
Two holographic methods for flatness testing with subwavelength or multiple-wavelength sensitivityBoone, Pierre M. / Jacquot, Pierre M. et al. | 1992
- 496
-
Calibration of phase-shift interferometerWan, Der-Shen / Chiang, Wen-Shang / Chang, Ming-Wen et al. | 1992
- 506
-
HOE interferometer for cylindrical surfaceMinami, Yoshitaka / Yasuda, Kenji et al. | 1992
- 514
-
Approach to high-accuracy qualification of long-radius spherical surfaces (Invited Paper)Hunter, George C. / Pfluke, P. L. / Selberg, Lars A. et al. | 1992
- 522
-
Fabrication of lenslet grating with multilevel phasesYan, Yingbai / Wang, Xu / Yao, Changkun / Jin, Guofan / Wu, Minxian et al. | 1992
- 530
-
General principles behind JCII's testing of optical instruments (Invited Paper)Kondo, Hideki et al. | 1992
- 538
-
Absolute surface measurements of processed material using two-color lasersMatsumoto, Hirokazu et al. | 1992
- 543
-
Modern surface technique and its valuation on ultraprecise metrology gratingChen, Lin et al. | 1992
- 547
-
Electronic pseudocolor encoder for optical testingJutamulia, Suganda / Fujita, Akihiro / Toyoda, Shinji / Ito, Eiichi / Tanone, Aris / Yu, Francis T. S. et al. | 1992
- 553
-
Fabrication and testing issues in free-space digital optical switching and computing (Invited Paper)McCormick, Frederick B. / Sasian, Jose M. / Crisci, Randall J. / Morrison, Rick L. / Tooley, Frank A. P. / Kerbis, Esther / Walker, Sonya L. et al. | 1992
- 574
-
Displacement meter with ferroelectric liquid crystal spatial light modulator utilizing speckle photographyKobayashi, Yuji / Takemori, Tamiki / Mukohzaka, Naohisa / Yoshida, Narihiro / Hori, Terushige / Fukushima, Seiji et al. | 1992
- 581
-
Digital wavefront measuring interferometer for testing optical surfaces and lensesCao, Tianning et al. | 1992
- 586
-
Estimation of the size parameters of fine rectangular grooves based on Fraunhofer diffractionMiyoshi, Takashi / Takaya, Yasuhiro et al. | 1992
- 598
-
Crystal streak camera for infrared light pulseMatsumoto, Osamu / Ohbayashi, Yasushi et al. | 1992
- 605
-
Digital receiving mode of radial gratings and its receiving precisionShen, Song / Cao, Xiangqun et al. | 1992
- 613
-
Calculation of grating transmission functions by determining the spectral intensityCao, Xiangqun / Xie, Hong / Chen, Ling et al. | 1992
- 619
-
Method for measuring small displacements by using an electro-optic modulatorShyu, Li-Horng / Chen, Chieh-Li / Su, Der-Chin et al. | 1992
- 624
-
Aspheric lens LD collimator for an optical intersatellite linkNohara, Mitsuo / Inagaki, Keizo / Koyanagi, Hideaki / Ishibai, Isao et al. | 1992