Stress polishing of E-ELT segment at LAM: full-scale demonstrator status (Englisch)
- Neue Suche nach: Laslandes, Marie
- Neue Suche nach: Rousselet, Nicolas
- Neue Suche nach: Ferrari, Marc
- Neue Suche nach: Hugot, Emmanuel
- Neue Suche nach: Floriot, Johan
- Neue Suche nach: Vivès, Sébastien
- Neue Suche nach: Lemaitre, Gérard
- Neue Suche nach: Carré, Jean François
- Neue Suche nach: Cayrel, Marc
- Neue Suche nach: Laslandes, Marie
- Neue Suche nach: Rousselet, Nicolas
- Neue Suche nach: Ferrari, Marc
- Neue Suche nach: Hugot, Emmanuel
- Neue Suche nach: Floriot, Johan
- Neue Suche nach: Vivès, Sébastien
- Neue Suche nach: Lemaitre, Gérard
- Neue Suche nach: Carré, Jean François
- Neue Suche nach: Cayrel, Marc
In:
Proc. SPIE
;
8169
; 816903
;
2011
-
ISBN:
-
ISSN:
- Aufsatz (Konferenz) / Elektronische Ressource
-
Titel:Stress polishing of E-ELT segment at LAM: full-scale demonstrator status
-
Beteiligte:Laslandes, Marie ( Autor:in ) / Rousselet, Nicolas ( Autor:in ) / Ferrari, Marc ( Autor:in ) / Hugot, Emmanuel ( Autor:in ) / Floriot, Johan ( Autor:in ) / Vivès, Sébastien ( Autor:in ) / Lemaitre, Gérard ( Autor:in ) / Carré, Jean François ( Autor:in ) / Cayrel, Marc ( Autor:in )
-
Kongress:Optical Fabrication, Testing, and Metrology IV ; 2011 ; Marseille,France
-
Erschienen in:Proc. SPIE ; 8169 ; 816903
-
Verlag:
- Neue Suche nach: SPIE
-
Erscheinungsdatum:21.09.2011
-
ISBN:
-
ISSN:
-
DOI:
-
Medientyp:Aufsatz (Konferenz)
-
Format:Elektronische Ressource
-
Sprache:Englisch
-
Datenquelle:
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 81690A
-
Wavefront reconstruction and piston measurement using Ronchi testPenalver, Dayana H. / Granados-Agustin, Fermin / Romero-Antequera, David L. et al. | 2011
- 81690C
-
Wafer-level micro-optics: trends in manufacturing, testing, and packagingVoelkel, Reinhard / Weible, Kenneth J. / Eisner, Martin et al. | 2011
- 81690D
-
Fabrication and testing of highly efficient resonance domain diffractive optical elementsBarlev, Omri / Golub, Michael A. / Friesem, Asher A. / Mahalu, Diana / Nathan, Menachem et al. | 2011
- 81690E
-
Method for the characterization of Fresnel lens flux transfer performanceMartinez Antón, Juan Carlos / Vázquez Moliní, Daniel / Muñoz de Luna, Javier / Gómez Pedrero, José Antonio / Fernández-Balbuena, Antonio Álvarez et al. | 2011
- 81690G
-
Manufacturing, testing, and metrology of axi-symmetric circular phase masks for stellar coronagraphyN'Diaye, Mamadou / Dohlen, Kjetil / Tisserand, Stéphane / Gautier, Sophie / El Hadi, Kacem / Moreaux, Gabriel / Soummer, Rémi / Cuevas, Salvador / Sánchez-Pérez, Celia et al. | 2011
- 81690H
-
Fabrication of bilayer wire grid polarizer using replicated polymer nano gratingHan, Yunah / Kim, Jwasun / Byeon, Euihyeon / Kim, Seok-Min / Lee, Yong-ho / Hwangbo, Chang Kwon et al. | 2011
- 81690K
-
Multimodal scattering facilities and modelization tools for a comprehensive investigation of optical coatingsZerrad, Myriam / Lequime, Michel / Amra, Claude et al. | 2011
- 81690N
-
Spectrophotometric bench dedicated to the characterization of micro-patterned optical coatingsSorce, Stéphane / Abel-Tiberini, Laetitia / Lequime, Michel et al. | 2011
- 81690O
-
SCPEM-based polarization modulation ellipsometry in the NIRBammer, F. / Petkovsek, R. et al. | 2011
- 81690P
-
Roughness characterization of large EUV mirror optics by laser light scatteringTrost, Marcus / Schröder, Sven / Feigl, Torsten / Duparré, Angela / Tünnermann, Andreas et al. | 2011
- 81690Q
-
3D features measurement using YieldStar: an angle resolved polarized scatterometerCharley, Anne-Laure / Leray, Philippe / D'havé, Koen / Cheng, Shaunee / Hinnen, Paul / Li, Fahong / Vanoppen, Peter / Dusa, Mircea et al. | 2011
- 81690R
-
Impact of surface roughness on the scatter losses and the scattering distribution of surfaces and thin film coatingsSchröder, Sven / Herffurth, Tobias / Duparré, Angela / Harvey, James E. et al. | 2011
- 81690T
-
Isara 400 ultra-precision CMMSpaan, H. A. M. / Widdershoven, I. et al. | 2011
- 81690V
-
Non-contact measurement of aspherical and freeform optics with a new confocal tracking profilerPintó, Agustí / Laguarta, Ferran / Artigas, Roger / Cadevall, Cristina et al. | 2011
- 81690W
-
Phase-shifting fringe projection system using freeform opticsZwick, Susanne / Kühmstedt, Peter / Notni, Gunther et al. | 2011
- 81690X
-
Data handling and representation of freeform surfacesSteinkopf, Ralf / Dick, Lars / Kopf, Tino / Gebhardt, Andreas / Risse, Stefan / Eberhardt, Ramona et al. | 2011
- 81690Y
-
Adaptive two-beam interferometer for testing optical surfacesMiks, Antonin / Novak, Jiri / Novak, Pavel et al. | 2011
- 81690Z
-
Adaptive null test system using a ferrofluid deformable mirrorLandry, Daniel B. / Brousseau, Denis / Thibault, Simon / Borra, Ermanno F. et al. | 2011
- 816901
-
Front Matter: Volume 8169| 2011
- 816902
-
MRF with adjustable pHJacobs, Stephen D. et al. | 2011
- 816903
-
Stress polishing of E-ELT segment at LAM: full-scale demonstrator statusLaslandes, Marie / Rousselet, Nicolas / Ferrari, Marc / Hugot, Emmanuel / Floriot, Johan / Vivès, Sébastien / Lemaitre, Gérard / Carré, Jean François / Cayrel, Marc et al. | 2011
- 816904
-
Manufacturing and testing of the large lenses for Dark Energy Survey (DES) at SESOFappani, Denis / Fourez, Julien / Doel, Peter / Brooks, David / Flaugher, Brenna et al. | 2011
- 816905
-
TMA optics for HISUI HSS and MSS imagersGeyl, R. / Leplan, H. / Rodolfo, J. et al. | 2011
- 816906
-
Fused silica long-term stability: case studiesVannoni, Maurizio / Sordini, Andrea / Molesini, Giuseppe et al. | 2011
- 816907
-
Metrology for an imaging Fourier transform spectrometer working in the far-UV (IFTSUV)Ruiz de Galarreta Fanjul, C. / Philippon, A. / Vial, J.-C. / Maillard, J.-P. / Appourchaux, T. et al. | 2011
- 816909
-
Experimental determination of aberration in lithographic lens by aerial imageDuan, Lifeng / Wang, Xiangzhao / Yan, Guanyong / Bourov, Anatoly et al. | 2011
- 816910
-
Optical method for the surface topographic characterization of Fresnel lensesMartínez Antón, Juan Carlos / Gómez Pedrero, José Antonio / Alonso Fernández, José / Quiroga, Juan Antonio et al. | 2011
- 816912
-
Extremely aspheric surfaces: toward a manufacturing process based on active opticsChallita, Zalpha / Hugot, Emmanuel / Ferrari, Marc / Le Mignant, David / Vivès, Sébastien / Cuby, Jean-Gabriel et al. | 2011
- 816913
-
Two-dimensional thickness measurement of a dielectric thin layer on a metal by use of surface-plasmon-resonance-based ellipsometryIwata, Tetsuo / Wada, Yusuke / Nishigaki, Kentaro / Mizutani, Yasuhiro et al. | 2011
- 816914
-
Wavefront instabilities in thin glass mirrorsBouillet, Stéphane / Lanternier, Thomas / Lavastre, Eric / Chappuis, Christian / Macias, François et al. | 2011
- 816915
-
Absolute calibration of three reference flats based on an iterative algorithm: study and implementationMorin, Chloé / Bouillet, Stéphane et al. | 2011
-
Manufacturing and testing of the large lenses for Dark Energy Survey (DES) at SESO [8169-03]Fappani, D. / Fourez, J. / Doel, P. / Brooks, D. / Flaugher, B. / SPIE (Society) et al. | 2011
-
Two-dimensional thickness measurement of a dielectric thin layer on a metal by use of surface-plasmon-resonance-based ellipsometry [8169-40]Iwata, T. / Wada, Y. / Nishigaki, K. / Mizutani, Y. / SPIE (Society) et al. | 2011
-
Fused silica long-term stability: case studies [8169-05]Vannoni, M. / Sordini, A. / Molesini, G. / SPIE (Society) et al. | 2011
-
MRF with adjustable pH (Invited Paper) [8169-01]Jacobs, S.D. / SPIE (Society) et al. | 2011
-
Experimental determination of aberration in lithographic lens by aerial image [8169-09]Duan, L. / Wang, X. / Yan, G. / Bourov, A. / SPIE (Society) et al. | 2011
-
Wavefront instabilities in thin glass mirrors [8169-41]Bouillet, S. / Lanternier, T. / Lavastre, E. / Chappuis, C. / Macias, F. / SPIE (Society) et al. | 2011
-
Extremely aspheric surfaces: toward a manufacturing process based on active optics [8169-38]Challita, Z. / Hugot, E. / Ferrari, M. / Le Mignant, D. / Vives, S. / Cuby, J.-G. / SPIE (Society) et al. | 2011
-
TMA optics for HISUI HSS and MSS imagers [8169-04]Geyl, R. / Leplan, H. / Rodolfo, J. / SPIE (Society) et al. | 2011
-
Absolute calibration of three reference flats based on an iterative algorithm: study and implementation [8169-42]Morin, C. / Bouillet, S. / SPIE (Society) et al. | 2011
-
Wavefront reconstruction and piston measurement using Ronchi test [8169-10]Penalver, D.H. / Granados-Agustin, F. / Romero-Antequera, D.L. / SPIE (Society) et al. | 2011
-
Stress polishing of E-ELT segment at LAM: full-scale demonstrator status [8169-02]Laslandes, M. / Rousselet, N. / Ferrari, M. / Hugot, E. / Floriot, J. / Vives, S. / Lemaitre, G. / Carre, J.F. / Cayrel, M. / SPIE (Society) et al. | 2011
-
Metrology for an imaging Fourier transform spectrometer working in the far-UV (IFTSUV) [8169-06]de Galarreta Fanjul, C.R. / Philippon, A. / Vial, J.-C. / Maillard, J.-P. / Appourchaux, T. / SPIE (Society) et al. | 2011