Method for measuring the refractive index distribution of a GRIN lens with heterodyne interferometry (Englisch)
- Neue Suche nach: Hsieh, H. C.
- Neue Suche nach: Chen, Y. L.
- Neue Suche nach: Wu, W. T.
- Neue Suche nach: Su, D. C.
- Neue Suche nach: Hsieh, H. C.
- Neue Suche nach: Chen, Y. L.
- Neue Suche nach: Wu, W. T.
- Neue Suche nach: Su, D. C.
In:
Proc. SPIE
;
7390
; 73900G
;
2009
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Elektronische Ressource
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Titel:Method for measuring the refractive index distribution of a GRIN lens with heterodyne interferometry
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Beteiligte:Hsieh, H. C. ( Autor:in ) / Chen, Y. L. ( Autor:in ) / Wu, W. T. ( Autor:in ) / Su, D. C. ( Autor:in )
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Kongress:Modeling Aspects in Optical Metrology II ; 2009 ; Munich,Germany
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Erschienen in:Proc. SPIE ; 7390 ; 73900G
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Verlag:
- Neue Suche nach: SPIE
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Erscheinungsdatum:17.06.2009
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ISBN:
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ISSN:
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DOI:
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Medientyp:Aufsatz (Konferenz)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
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Method for measuring the refractive index distribution of a GRIN lens with heterodyne interferometryHsieh, H. C. / Chen, Y. L. / Wu, W. T. / Su, D. C. et al. | 2009
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Depth-of-field extension and 3D reconstruction in digital holographic microscopy [7390-49]Bergoend, I. / Colomb, T. / Pavillon, N. / Emery, Y. / Depeursinge, C. / SPIE (Society) et al. | 2009
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Adaptive Bessel-autocorrelation of ultrashort pulses with phase-only spatial light modulators [7390-10]Luepke, S.H.-v. / Bock, M. / Grunwald, R. / SPIE (Society) et al. | 2009
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Variable waveplate-based polarimeter for polarimetric metrology [7390-07]Peinado, A. / Lizana, A. / Vidal, J. / Iemmi, C. / Marquez, A. / Moreno, I. / Campos, J. / SPIE (Society) et al. | 2009
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Traceability of the F25 vision system for calibration of grated structures with submicron accuracy [7390-03]Mares, A.I. / Bergmans, R.H. / Kotte, G.J.W.L. / Tromp, R.R. / SPIE (Society) et al. | 2009
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Comparison of electromagnetic field solvers for the 3D analysis of plasmonic nanoantennas [7390-18]Hoffmann, J. / Hafner, C. / Leidenberger, P. / Hesselbarth, J. / Burger, S. / SPIE (Society) et al. | 2009
-
Nanoshaped objects of equal phase volume: scattered far field comparison [7390-29]Normatov, A. / Spektor, B. / SPIE (Society) et al. | 2009
-
Optical characteristics of a one-dimensional photonic crystal with an additional regular layer [7390-40]Tolmachev, V.A. / Baldycheva, A.V. / Krutkova, E.Y. / Perova, T.S. / Berwick, K. / SPIE (Society) et al. | 2009
-
Modeling of the polarization mode dispersion in the single mode optical fiber links [7390-43]Cherbi, L. / Mehenni, M. / SPIE (Society) et al. | 2009
-
Temperature sensitivity of TE double-negative metamaterial optical sensor [7390-09]El-Khozondar, H.J. / Muller, M. / El-Khozondar, R.J. / Shabat, M.M. / Koch, A.W. / SPIE (Society) et al. | 2009
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Reduced basis method for fast and robust simulation of electromagnetic scattering problems [7390-17]Pomplun, J. / Schmidt, F. / SPIE (Society) et al. | 2009
-
Spatial elliptical polariscope for polarization distribution measurements [7390-08]Wozniak, W.A. / Drobczynski, S. / Kurzynowski, P. / SPIE (Society) et al. | 2009
-
Method of matrix Riccati equation for nanoshape control of diffraction gratings [7390-19]Barabanenkov, M.Y. / Kazmiruk, V.V. / Shapoval, S.Y. / SPIE (Society) et al. | 2009
-
Modelling of laser range measurement of underwater objects in maritime environment [7390-39]Ostrowski, R. / Cywinski, A. / SPIE (Society) et al. | 2009
-
Talbot effect with aberrated beams [7390-38]Torcal-Milla, F.J. / Sanchez-Brea, L.M. / Bernabeu, E. / SPIE (Society) et al. | 2009
-
Numerical and experimental study of the characteristic functions of polygon scanners [7390-42]Duma, V.-F. / Nicolov, M. / SPIE (Society) et al. | 2009
-
Method for measuring the refractive index distribution of a GRIN lens with heterodyne interferometry [7390-15]Hsieh, H.C. / Chen, Y.L. / Wu, W.T. / Su, D.C. / SPIE (Society) et al. | 2009
-
Measurement errors from internal shear strain within fiber-Bragg-grating sensors [7390-06]Muller, M.S. / Buck, T.C. / El-Khozondar, H.J. / Koch, A.W. / SPIE (Society) et al. | 2009
-
Inspection of misalignment factors in lens assembly [7390-05]Li, X. / Zhao, L. / Fang, Z.P. / SPIE (Society) et al. | 2009
-
On numerical reconstructions of lithographic masks in DUV scatterometry [7390-25]Henn, M.-A. / Model, R. / Bar, M. / Wurm, M. / Bodermann, B. / Rathsfeld, A. / Gross, H. / SPIE (Society) et al. | 2009
-
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-
Full-field absolute phase measurements in the heterodyne interferometer with an electro-optic modulator [7390-14]Chen, Y.L. / Hsieh, H.C. / Wu, W.T. / Su, D.C. / SPIE (Society) et al. | 2009
-
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-
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-
Interferometric Ronchi test by using substructured gratings [7390-47]Campos-Garcia, M. / Granados-Agustin, F. / SPIE (Society) et al. | 2009
-
Angle-resolved optical metrology using multi-technique nested uncertainties (Invited Paper) [7390-24]Silver, R.M. / Barnes, B.M. / Zhou, H. / Zhang, N.F. / Dixson, R. / SPIE (Society) et al. | 2009
-
Specular and diffuse scattering from random asperities of any profile using the rigorous method for x-rays and neutrons [7390-30]Goray, L.I. / SPIE (Society) et al. | 2009
-
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-
Far field of binary phase gratings with errors in the height of the strips [7390-45]Rico-Garcia, J.M. / Sanchez-Brea, L.M. / SPIE (Society) et al. | 2009
-
Metallic nonlinear magneto-optical nonreciprocal isolator [7390-02]El-Khozondar, H.J. / El-Khozondar, R.J. / Shabat, M.M. / Koch, A.W. / SPIE (Society) et al. | 2009
-
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-
Evaluation of measurement uncertainties in EUV scatterometry [7390-23]Gross, H. / Scholze, F. / Rathsfeld, A. / Bar, M. / SPIE (Society) et al. | 2009
-
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-
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-
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-
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Towards deconvolution in holography [7390-33]Wang, N. / Falldorf, C. / von Kopylow, C. / SPIE (Society) et al. | 2009
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