Fringe pattern projection method combined with digital holography (Englisch)
- Neue Suche nach: Prytulak, Marcin J.
- Neue Suche nach: Jozwicki, Romuald
- Neue Suche nach: Prytulak, Marcin J.
- Neue Suche nach: Jozwicki, Romuald
In:
Proc. SPIE
;
5457
; 521
;
2004
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Elektronische Ressource
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Titel:Fringe pattern projection method combined with digital holography
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Beteiligte:Prytulak, Marcin J. ( Autor:in ) / Jozwicki, Romuald ( Autor:in )
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Kongress:Optical Metrology in Production Engineering ; 2004 ; Strasbourg,France
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Erschienen in:Proc. SPIE ; 5457 ; 521
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Verlag:
- Neue Suche nach: SPIE
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Erscheinungsdatum:10.09.2004
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ISBN:
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ISSN:
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DOI:
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Medientyp:Aufsatz (Konferenz)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 1
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Photoelastic tomography for residual stress measurement in glass (Invited Paper) [5457-01]Aben, H. / Errapart, A. / Ainola, L. / Anton, J. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 1
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Photoelastic tomography for residual stress measurement in glassAben, Hillar / Errapart, Andrei / Ainola, Leo / Anton, Johan et al. | 2004
- 12
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Displacement measurements of technical surfaces with a synchronously pumped external cavity diode laserMobius, Jasper / Czarske, Jurgen / Moldenhauer, Karsten / Ertmer, Wolfgang / Muller-Wirts, Thomas et al. | 2004
- 12
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Displacement measurements of technical surfaces with a synchronously pumped external cavity diode laser [5457-02]Mobius, J. / Czarske, J. / Moldenhauer, K. / Ertmer, W. / Muller-Wirts, T. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 22
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Ultra-precise distance measurement for nanometrology [5457-03]Cip, O. / Petru, F. / Buchta, Z. / Lazar, J. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 22
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Ultra-precise distance measurement for nanometrologyCip, Ondrej / Petru, Frantisek / Buchta, Zdenek / Lazar, Josef et al. | 2004
- 26
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Signal modeling for modern interference microscopesde Groot, Peter J. / Colonna de Lega, Xavier et al. | 2004
- 26
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Signal modeling for modern interference microscopes [5457-04]de Groot, P. J. / de Lega, X. C. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 35
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UV and DUV microscopy for dimensional metrology on micro- and nano-structures [5457-05]Bodermann, B. / Ehret, G. / Mirande, W. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 35
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UV and DUV microscopy for dimensional metrology on micro- and nano-structuresBodermann, Bernd / Ehret, Gerd / Mirande, Werner et al. | 2004
- 44
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Pseudo-phase information of complex analytic signal of speckle fields and its applications: microdisplacement measurement based on phase-only correlation in signal domain [5457-06]Wang, W. / Ishii, N. / Miyamoto, Y. / Takeda, M. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 44
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Pseudo-phase information of complex analytic signal of speckle fields and its applications: microdisplacement measurement based on phase-only correlation in signal domainWang, Wei / Ishii, Nobuo / Miyamoto, Yoko / Takeda, Mitsuo et al. | 2004
- 50
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All-digital phase code: a proposal for high-speed 3D-shape recording [5457-07]Hofling, R. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 50
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All-digital phase code: a proposal for high-speed 3D-shape recordingHofling, Roland et al. | 2004
- 56
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Phasogrammetric optical 3D sensor for the measurement of large objects [5457-08]Kuhmstedt, P. / Heinze, M. / Himmelreich, M. / Notni, G. / Brauer-Burchardt, C. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 56
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Phasogrammetric optical 3D sensor for the measurement of large objectsKuhmstedt, Peter / Heinze, Matthias / Himmelreich, Michael / Notni, Georg / Brauer-Burchardt, Christian / Notni, Gunther et al. | 2004
- 65
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Fluorescence metrology used for analytics of high-quality optical materialsEngel, Axel / Haspel, Rainer / Rupertus, Volker et al. | 2004
- 65
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Fluorescence metrology used for analysis of high-quality optical materials [5457-09]Engel, A. / Haspel, R. / Rupertus, V. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 74
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3D shape measurement of nozzles on the micrometric scaleLaguarta, Ferran / Artigas, Roger / Cadevall, Cristina et al. | 2004
- 74
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3D shape measurement of nozzles on the micrometric scale [5457-73]Laguarta, F. / Artigas, R. / Cadevall, C. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 83
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Coherent optical metrology in virtual reality [5457-76]Kornis, J. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 83
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Coherent optical metrology in virtual realityKornis, Janos et al. | 2004
- 92
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Smart pixelsSeitz, Peter et al. | 2004
- 92
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Smart pixels (Invited Paper) [5457-11]Seitz, P. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 105
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Compact excimer lasers for metrology and inspection applicationsGortler, Andreas / Matern, Ansgar / Sporlein, Sebastian / Strowitzki, Claus et al. | 2004
- 105
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Compact excimer lasers for metrology and inspection applications [5457-12]Gortler, A. / Matern, A. / Sporlein, S. / Strowitzki, C. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 115
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Fast scanning confocal sensor provides high-fidelity surface profiles on a microscopic scale [5457-13]Schick, A. / Breitmeier, U. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 115
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Fast scanning confocal sensor provides high-fidelity surface profiles on a microscopic scaleSchick, Anton / Breitmeier, Ulrich et al. | 2004
- 126
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In-factory calibration of multiocular camera systemsKruger, Lars E. / Wohler, Christian / Wurz-Wessel, Alexander / Stein, Fridtjof et al. | 2004
- 126
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In-factory calibration of multiocular camera systems [5457-14]Kruger, L. E. / Wohler, C. / Wurz-Wessel, A. / Stein, F. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 138
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A general framework for three-dimensional surface reconstruction by self-consistent fusion of shading and shadow features and its application to industrial quality inspection tasksHafezi, Kia / Wohler, Christian et al. | 2004
- 138
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A general framework for three-dimensional surface reconstruction by self-consistent fusion of shading and shadow features and its application to industrial quality inspection tasks [5457-16]Hafezi, K. / Wohler, C. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 150
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Black-box calibration methods investigated with a virtual fringe projection system [5457-17]Bottner, T. / Seewig, J. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 150
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Black-box calibration methods investigated with a virtual fringe projection systemBottner, Thomas / Seewig, Jorg et al. | 2004
- 158
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Combined interference and scanning force microscope [5457-18]Danzebrink, H. U. / Tyrrell, J. W. G. / Savio, C. D. / Kruger-Sehm, R. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 158
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Combined interference and scanning force microscopeDanzebrink, Hans U. / Tyrrell, James W. G. / Dal Savio, Claudio / Kruger-Sehm, Rolf et al. | 2004
- 166
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Dual-technology optical sensor head for 3D surface shape measurements on the micro- and nanoscalesArtigas, Roger / Laguarta, Ferran / Cadevall, Cristina et al. | 2004
- 166
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Dual-technology optical sensor head for 3D surface shape measurements on the micro- and nanoscales [5457-19]Artigas, R. / Laguarta, F. / Cadevall, C. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 175
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Design aspects in the development of a standing wave interferometerMandryka, Viktor / Buchner, Hans / Jager, Gerd et al. | 2004
- 175
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Design aspects in the development of a standing wave interferometer [5457-20]Mandryka, V. / Buchner, H. / Jager, G. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 184
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Optonumerical system supporting visualization of true 3D variable in time objects in virtual reality environmentGarbat, Piotr / Wegiel, Marek / Kujawinska, Malgorzata et al. | 2004
- 184
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Optonumerical system supporting visualization of true 3D variable in time objects in virtual reality environment [5457-21]Garbat, P. / Wegiel, M. / Kujawinska, M. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 193
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Practical aspects of curvature detection for LACS free-form measuring systems [5457-23]Schulz, M. / Gerhardt, J. / Elster, C. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 193
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Practical aspects of curvature detection for LACS free-form measuring systemsSchulz, Michael / Gerhardt, Joachim / Elster, Clemens et al. | 2004
- 201
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Evaluation of a residual stresses measurement device combining a radial in-plane ESPI and the blind hole drilling methodAlbertazzi G., Armando / Peixoto Filho, Flavio T. / Suterio, Ricardo / Kleber Amaral, Felipe et al. | 2004
- 201
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Evaluation of a residual stresses measurement device combining a radial in-plane ESPI and the blind hole drilling method [5457-24]Albertazzi G, A. / Filho, F. T. P. / Suterio, R. / Amaral, F. K. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 213
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Multidimensional strain and temperature measurements using a novel high-birefringent fiber Bragg grating interrogation systemChehura, Edmon / Skordos, Alexandros A. / Ye, Chen-Chun / James, Stephen W. / Partridge, Ivana K. / Tatam, Ralph P. et al. | 2004
- 213
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Multidimensional strain and temperature measurements using a novel high-birefringent fibre Bragg grating interrogation system [5457-25]Chehura, E. / Skordos, A. A. / Ye, C.-C. / James, S. W. / Partridge, I. K. / Tatam, R. P. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 225
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Digital holography and grating interferometry: a complementary approach [5457-26]Falldorf, C. / von Kopylow, C. / Osten, W. / Juptner, W. P. O. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 225
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Digital holography and grating interferometry: a complementary approachFalldorf, Claas / von Kopylow, Christoph / Osten, Wolfgang / Juptner, Werner P. O. et al. | 2004
- 232
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Processing of low-intensity CCD images for temperature mapping in industrial processesZauner, Gerald / Heim, Daniel / Niel, Kurt / Hendorfer, Guenther / Stoeri, Herbert et al. | 2004
- 232
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Processing of low-intensity CCD images for temperature mapping in industrial processes [5457-27]Zauner, G. / Heim, D. / Niel, K. / Hendorfer, G. / Stoeri, H. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 240
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Etalon of optical frequency for the telecommunication spectral regionLazar, Josef / Ruzicka, Bohdan / Cip, Ondrej et al. | 2004
- 240
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Etalon of optical frequency for the telecommunication spectral region [5457-29]Lazar, J. / Ruzicka, B. / Cip, O. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 245
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Image processing provides low-frequency jitter correction for synchroscan streak camera temporal resolution enhancement [5457-74]Uhring, W. / Jung, M. / Summ, P. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 245
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Image processing provides low-frequency jitter correction for synchroscan streak camera temporal resolution enhancementUhring, Wilfried / Jung, Manuel / Summ, Patrick et al. | 2004
- 253
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Measuring instrument for analysis of brightness distribution in the space [5457-77]Dorosz, J. / Dybczynski, W. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 253
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Measuring instrument for analysis of brightness distribution in the spaceDorosz, Jan / Dybczynski, Wladyslaw et al. | 2004
- 262
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Short coherence transmitted light interferometer for the thickness measurement of Si membranesBreitmeier, Ulrich / Leonhardt, Klaus et al. | 2004
- 262
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Short coherence transmitted light interferometer for the thickness measurement of Si membranes [5457-78]Breitmeier, U. / Leonhardt, K. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 268
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A fast CMOS array imager for nanosecond light pulse detection in accumulation mode [5457-79]Zint, C.-V. / Uhring, W. / Casadei, B. / Le Normand, J.-P. / Morel, F. / Hu, Y. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 268
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A fast CMOS array imager for nanosecond light pulse detection in accumulation modeZint, Chantal-V. / Uhring, Wilfried / Casadei, Bruno / Le Normand, Jean-P. / Morel, Frederic / Hu, Yann et al. | 2004
- 276
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Technique for modeling diffractive multiphase holographic elements [5457-80]Lymarenko, R. A. / Budnyk, O. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 276
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Technique for modeling diffractive multiphase holographic elementsLymarenko, Ruslan A. / Budnyk, Oksana et al. | 2004
- 284
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Four-element optical system for Fourier transformMiks, Antonin / Novák, Jiri et al. | 2004
- 284
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Four-element optical system for Fourier transform [5457-81]Miks, A. / Novak, J. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 292
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Frequency shift of light reflected from vibrating mirrorMiks, Antonin / Novak, Jiri / Novak, Pavel et al. | 2004
- 292
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Frequency shift of light reflected from vibrating mirror [5457-82]Miks, A. / Novak, J. / Novak, P. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 300
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Evaluation methods for gradient measurement techniquesLi, Wansong / Bothe, Thorsten / von Kopylow, Christoph / Juptner, Werner P. O. et al. | 2004
- 300
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Evaluation methods for gradient measurement techniques [5457-83]Li, W. / Bothe, T. / von Kopylow, C. / Juptner, W. P. O. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 312
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ROM-type computer-generated-hologram memoryKurokawa, Tomoko / Kubota, Eriko / Nishimoto, Kazumasa / Yamamoto, Manabu et al. | 2004
- 312
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ROM-type computer-generated-hologram memory [5457-84]Kurokawa, T. / Kubota, E. / Nishimoto, K. / Yamamoto, M. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 320
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New approaches in depth-scanning optical metrologyKorner, Klaus / Ruprecht, Aiko K. / Wiesendanger, Tobias F. et al. | 2004
- 320
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New approaches in depth-scanning optical metrology (Invited Paper) [5457-32]Korner, K. / Ruprecht, A. K. / Wiesendanger, T. F. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 334
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A new calibration scheme for the three-dimensional depth-scanning fringe projection measurement method [5457-33]Nivet, J.-M. / Schuster, T. / Korner, K. / Droste, U. / Tiziani, H. J. / Osten, W. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 334
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A new calibration scheme for the three-dimensional depth-scanning fringe projection measurement methodNivet, Jean-Marc / Schuster, Thomas / Korner, Klaus / Droste, Ulrich / Tiziani, Hans J. / Osten, Wolfgang et al. | 2004
- 344
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Light-scattered measurements using Fourier optics: a new tool for surface characterizationBoher, Pierre / Luet, Mathieu / Leroux, Thierry et al. | 2004
- 344
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Light-scattered measurements using Fourier optics: a new tool for surface characterization [5457-34]Boher, P. / Luet, M. / Leroux, T. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 355
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Use of in-situ spectroscopic ellipsometry to study the behavior of metallic surfaces in different solutions [5457-35]Van Gils, S. K. / Le Pen, C. / Blajiev, O. / Melendres, C. A. / Stijns, E. W. / Terryn, H. / Hubin, A. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 355
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Use of in-situ spectroscopic ellipsometry to study the behavior of metallic surfaces in different solutionsVan Gils, Sake K. / Le Pen, Christophe / Blajiev, Orlin / Melendres, Carlos A. / Stijns, Erik W. / Terryn, Herman / Hubin, Annick et al. | 2004
- 366
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Phase measuring deflectometry: a new approach to measure specular free-form surfacesKnauer, Markus C. / Kaminski, Jurgen / Hausler, Gerd et al. | 2004
- 366
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Phase measuring deflectometry: a new approach to measure specular free-form surfaces [5457-36]Knauer, M. C. / Kaminski, J. / Hausler, G. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 377
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High-resolution shape measurements with phase-shifting Schlieren (PSS)Joannes, Luc C. / Beghuin, Didier / Ligot, Renaud / Farinotti, Sebastien / Dupont, Olivier et al. | 2004
- 377
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High-resolution shape measurements with phase-shifting Schlieren (PSS) [5457-37]Joannes, L. C. / Beghuin, D. / Ligot, R. / Farinotti, S. / Dupont, O. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 386
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Visual robot control for close-range inspectionsMonning, Frank / Pfeifer, Tilo et al. | 2004
- 386
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Visual robot control for close-range inspections [5457-38]Monning, F. / Pfeifer, T. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 393
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A 3D scanning device for architectural survey based on time-of-flight technology [5457-39]Fontana, R. / Gambino, M. C. / Gianfrate, G. / Greco, M. / Pampaloni, E. / Pezzati, L. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 393
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A 3D scanning device for architectural survey based on time-of-flight technologyFontana, Raffaella / Gambino, Maria Chiara / Gianfrate, Gabriella / Greco, Marinella / Pampaloni, Enrico / Pezzati, Luca et al. | 2004
- 401
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A new method and a novel facility for ultraprecise 2D topography measurement of large optical surfaces [5457-40]Wurm, M. / Geckeler, R. D. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 401
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A new method and a novel facility for ultra precise 2D topography measurement of large optical surfacesWurm, Matthias / Geckeler, Ralf D. et al. | 2004
- 411
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High-resolution 3D shape measurement on specular surfaces by fringe reflection [5457-41]Bothe, T. / Li, W. / von Kopylow, C. / Juptner, W. P. O. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 411
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High-resolution 3D shape measurement on specular surfaces by fringe reflectionBothe, Thorsten / Li, Wansong / von Kopylow, Christoph / Juptner, Werner P. O. et al. | 2004
- 423
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New absolute distance interferometric techniqueNorgia, Michele / Giuliani, Guido / Donati, Silvano et al. | 2004
- 423
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New absolute distance interferometric technique [5457-86]Norgia, M. / Giuliani, G. / Donati, S. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 432
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User-friendly optical metrology in production engineering [5457-85]Bichmann, S. / Glaser, U. / Pfeifer, T. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 432
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User-friendly optical metrology in production engineeringBichmann, Stephan / Glaser, Ulf / Pfeifer, Tilo et al. | 2004
- 441
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Denoising of conoscopic holography fringe patterns with orientational filters: a comparative study [5457-89]Enguita, J. M. / Fernandez, Y. / Alvarez, I. / Fraga, C. / Marina, J. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 441
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Denoising of conoscopic holography fringe patterns with orientational filters: a comparative studyEnguita, Jose M. / Fernandez, Yolanda / Alvarez, Ignacio / Fraga, Cesar / Marina, Jorge et al. | 2004
- 453
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A method for automatic 3D reconstruction based on multiple views from a free-mobile camera [5457-90]Yu, Q. / Zhang, Z. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 453
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A method for automatic 3D reconstruction based on multiple views from a free-mobile cameraYu, Qingbing / Zhang, Zhijiang et al. | 2004
- 463
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Three-dimensional vision using structured light applied to quality control in production line [5457-91]Bieri, L.-S. / Jacot, J. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 463
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Three-dimensional vision using structured light applied to quality control in production lineBieri, Louis-Severin / Jacot, Jacques et al. | 2004
- 472
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N-lambda speckle-interferometry for contouring in industrial applicationsPurde, Andreas / Meixner, Andreas / Bachfischer, Katharina / Zeh, Thomas / Kirilenko, Philipp / Koch, Alexander W. et al. | 2004
- 472
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N-lambda speckle-interferometry for contouring in industrial applications [5457-93]Purde, A. / Meixner, A. / Bachfischer, K. / Zeh, T. / Kirilenko, P. / Koch, A. W. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 481
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Recent advancements in digital holographic microscopy and its applications (Invited Paper) [5457-42]Ferraro, P. / Coppola, G. / Alfieri, D. / De Nicola, S. / Finizio, A. / Pierattini, G. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 481
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Recent advancements in digital holographic microscopy and its applicationsFerraro, Pietro / Coppola, Giuseppe / Alfieri, Domenico / De Nicola, Sergio / Finizio, Andrea / Pierattini, Giovanni et al. | 2004
- 492
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Comparative displacement measurement by digital holographic interferometryKornis, Janos / Gombkoto, Balazs / Fuzessy, Zoltan et al. | 2004
- 492
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Comparative displacement measurement by digital holographic interferometry [5457-43]Kornis, J. / Gombkoto, B. / Fuzessy, Z. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 504
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Digital holographic microscopy applied to metrology [5457-44]Depeursinge, C. D. / Charriere, F. / Marian, A. M. / Montfort, F. / Colomb, T. / Kuhn, J. / Cuche, E. / Emery, Y. / Marquet, P. / Magistretti, P. J. et al. | 2004
- 504
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Digital holographic microscopy applied to metrologyDepeursinge, Christian D. / Charriere, Florian / Marian, Anca M. / Montfort, Frederic / Colomb, Tristan / Kuhn, Jonas / Cuche, Etienne / Emery, Yves / Marquet, Pierre / Magistretti, Pierre J. et al. | 2004
- 513
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Novel solution for digital holographic interferometer design [5457-45]Michalkiewicz, A. / Kujawinska, M. / Salbut, L. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 513
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Novel solution for digital holographic interferometer designMichalkiewicz, Aneta / Kujawinska, Malgorzata / Salbut, Leszek et al. | 2004
- 521
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Fringe pattern projection method combined with digital holographyPrytulak, Marcin J. / Jozwicki, Romuald et al. | 2004
- 521
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Fringe pattern projection method combined with digital holography [5457-47]Prytulak, M. J. / Jozwicki, R. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 528
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Short-coherence digital holography for the investigation of 3D microscopic samples [5457-48]Martinez-Leon, L. / Pedrini, G. / Osten, W. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 528
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Short-coherence digital holography for the investigation of 3D microscopic samplesMartinez-Leon, Lluis / Pedrini, Giancarlo / Osten, Wolfgang et al. | 2004
- 538
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Two-wavelength contouring in difference holographic interferometry and DISCO [5457-49]Gyimesi, F. / Fuzessy, Z. / Raczkevi, B. / Borbely, V. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 538
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Two-wavelength contouring in difference holographic interferometry and DISCOGyimesi, Ferenc / Fuzessy, Zoltan / Raczkevi, Bela / Borbely, Vencel et al. | 2004
- 546
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Multicomponent laser shearography for the investigation of defects in rotating machinery [5457-50]Groves, R. M. / James, S. W. / Barnes, S. E. / Fu, S. / Furfari, D. / Irving, P. E. / Tatam, R. P. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 546
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Multicomponent laser shearography for the investigation of defects in rotating machineryGroves, Roger M. / James, Stephen W. / Barnes, Stuart E. / Fu, Shan / Furfari, Domenico / Irving, Philip E. / Tatam, Ralph P. et al. | 2004
- 557
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Dispersion of group and phase modal birefringence in optical fibers measured by time-domain and spectral-domain tandem interferometryHlubina, Petr / Martynkien, Tadeusz / Urbanczyk, Waclaw et al. | 2004
- 557
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Dispersion of group and phase modal birefringence in optical fibers measured by time-domain and spectral-domain tandem interferometry [5457-51]Hlubina, P. / Martynkien, T. / Urbanczyk, W. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 566
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Surface plasmon resonance heterodyne interferometry for measuring physical parameters [5457-52]Su, D.-C. / Chen, J.-H. / Chen, K.-H. / Lin, J.-Y. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 566
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Surface plasmon resonance heterodyne interferometry for measuring physical parametersSu, Der-Chin / Chen, Jing-Heng / Chen, Kun-Huang / Lin, Jiun-You et al. | 2004
- 574
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Nanodisplacement control with optical heterodyne interferometryChassagne, Luc / Topcu, Suat / Haddad, Darine / Alayli, Yasser / Juncar, Patrick et al. | 2004
- 574
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Nanodisplacement control with optical heterodyne interferometry [5457-53]Chassagne, L. / Topcu, S. / Haddad, D. / Alayli, Y. / Juncar, P. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 581
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Holographic interferometric microscopy systems for the application on biological samplesKemper, Bjorn / Carl, Daniel / Knoche, Sabine / Thien, Rainer / von Bally, Gert et al. | 2004
- 581
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Holographic interferometric microscopy systems for the application on biological samples [5457-54]Kemper, B. / Carl, D. / Knoche, S. / Thien, R. / von Bally, G. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 589
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Correction of aberrations in an optical correlator by using it as a point diffraction interferometer [5457-55]Iemmi, C. / Moreno, A. / Nicolas, J. / Campos, J. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 589
-
Correction of aberrations in an optical correlator by using it as a point diffraction interferometerIemmi, Claudio / Moreno, Alfonso / Nicolas, Josep / Campos, Juan et al. | 2004
- 598
-
Application of comparative digital holography for distant shape controlBaumbach, Torsten / Osten, Wolfgang / von Kopylow, Christoph / Juptner, Werner P. O. et al. | 2004
- 598
-
Application of comparative digital holography for distant shape control [5457-58]Baumbach, T. / Osten, W. / von Kopylow, C. / Juptner, W. P. O. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 610
-
Analogue and digital developments for project DISCO at Budapest University of Technology and EconomicsFuzessy, Zoltan / Gyimesi, Ferenc / Kornis, Janos / Raczkevi, Bela / Borbely, Vencel / Gombkoto, Balazs et al. | 2004
- 610
-
Analogue and digital developments for project DISCO at Budapest University of Technology and Economics [5457-59]Fuzessy, Z. / Gyimesi, F. / Kornis, J. / Raczkevi, B. / Borbely, V. / Gombkoto, B. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 621
-
An all-fiber Pr/Yb-doped up-conversion laser in different laser operation modes [5457-60]Zeller, M. / Limberger, H. G. / Lasser, T. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 621
-
An all-fiber Pr/Yb-doped up-conversion laser in different laser operation modesZeller, M. / Limberger, Hans G. / Lasser, Theo et al. | 2004
- 627
-
Nematic LCoS spatial light modulators: performance in diffractive optics [5457-61]Kruger, S. / Wernicke, G. / Langner, A. / Gruber, H. / Osten, S. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 627
-
Nematic LCoS spatial light modulators: performance in diffractive opticsKruger, Sven / Wernicke, Gunther / Langner, Andreas / Gruber, Hartmut / Osten, Stefan et al. | 2004
- 632
-
Optical characterization of liquid-crystal-on-silicon displays [5457-62]Proll, K.-P. / Kohler, C. / Baumbach, T. / Osten, W. / Osten, S. / Gruber, H. / Langner, A. / Wernicke, G. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 632
-
Optical characterization of liquid-crystal-on-silicon displaysProll, Klaus-Peter / Kohler, Christian / Baumbach, Torsten / Osten, Wolfgang / Osten, Stefan / Gruber, Hartmut / Langner, Andreas / Wernicke, Gunther et al. | 2004
- 643
-
Time-averaged holographic interferometry using subtraction digital holography [5457-87]Demoli, N. / Vukicevic, D. / Torzynski, M. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 643
-
Time-averaged holographic interferometry using subtraction digital holographyDemoli, Nazif / Vukicevic, Dalibor / Torzynski, Marc et al. | 2004
- 651
-
A novel interferometric spectrometer obtained by imaging Talbot effect in digital holography [5457-95]Ferraro, P. / Coppola, G. / Alfieri, D. / De Nicola, S. / Grilli, S. / Finizio, A. / Pierattini, G. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 651
-
A novel interferometric spectrometer obtained by imaging Talbot effect in digital holographyFerraro, Pietro / Coppola, Giuseppe / Alfieri, Domenico / De Nicola, Sergio / Grilli, Simonetta / Finizio, Andrea / Pierattini, Giovanni et al. | 2004
- 660
-
Measurement of the very thin metallic wires diameter for the industrial automatic controlSerroukh, Ibrahim / Martinez, J. C. / Serrano, Angel / Bernabeu, Eusebio et al. | 2004
- 660
-
Measurement of the very thin metallic wires diameter for the industrial automatic control [5457-88]Serroukh, I. / Martinez, J. C. / Serrano, A. / Bernabeu, E. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 669
-
Ultrathin hard films: optical characterization and metrology in industrial manufacturing [5457-64]Pokrowsky, P. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 669
-
Ultra/thin hard films: optical characterization and metrology in industrial manufacturingPokrowsky, Peter et al. | 2004
- 678
-
Color prediction in textile applicationDe Lucia, Maurizio / Buonopane, Massimo et al. | 2004
- 678
-
Color prediction in textile application [5457-65]De Lucia, M. / Buonopane, M. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 689
-
Absolute deflectometric measurement of topography: influence of systematic deviationsIllemann, Jens / Just, Andreas et al. | 2004
- 689
-
Absolute deflectometric measurement of topography: influence of systematic deviations [5457-66]Illemann, J. / Just, A. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 701
-
Bulk absorption measurements of highly transparent DUV/VUV optical materials [5457-67]Muhlig, C. / Kufert, S. / Triebel, W. / Coriand, F. / Parthier, L. / Voitsch, A. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 701
-
Bulk absorption measurements of highly transparent DUV/VUV optical materialsMuhlig, Christian / Kufert, Siegfried / Triebel, Wolfgang / Coriand, Frank / Parthier, Lutz / Voitsch, Andreas et al. | 2004
- 713
-
Production integrated laser-based measurement system for railway sleepers [5457-68]Stanke, G. / Kessler, T. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 713
-
Production integrated laser-based measurement system for railway sleepersStanke, Gerd / Kessler, Thomas et al. | 2004
- 719
-
High-resolution 3D survey of artworks [5457-69]Fontana, R. / Gambino, M. C. / Mazzotta, C. / Greco, M. / Pampaloni, E. / Pezzati, L. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 719
-
High-resolution 3D survey of artworksFontana, Raffaella / Gambino, Maria Chiara / Mazzotta, Cinzia / Greco, Marinella / Pampaloni, Enrico / Pezzati, Luca et al. | 2004
- 727
-
Some studies to prevent the production of some types of moire effects in fabrics [5457-70]Serrano, A. / Ponce, R. / Serroukh, I. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 727
-
Some studies to prevent the production of some types of moire effects in fabricsSerrano, Alfonso / Ponce, Rodrigo / Serroukh, Ibrahim et al. | 2004
- 738
-
Nondestructive testing (NDT) and vibration analysis of defects in components and structures using laser diode shearography [5457-71]Steinchen, W. / Gan, Y. / Kupfer, G. / Mackel, P. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 738
-
Non/destructive testing (NDT) and vibration analysis of defects in components and structures using laser diode shearographySteinchen, Wolfgang / Gan, Ymin / Kupfer, Gerhard / Mackel, Peter et al. | 2004
- 749
-
Digital holography used for measurement of deformations during gas quenching processesAlsen, Jens / von Kopylow, Christoph / Juptner, Werner P. O. et al. | 2004
- 749
-
Digital holography used for measurement of deformations during gas quenching processes [5457-72]Alsen, J. / von Kopylow, C. / Juptner, W. P. O. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 756
-
Spectral reflectrometry and white-light interferometry used to measure thin films [5457-96]Hiubina, P. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 756
-
Spectral reflectrometry and white-light interferometry used to measure thin filmsHlubina, Petr et al. | 2004
- 765
-
Direct phase distribution evaluation by continuous Paul wavelet transformsBouamama, Larbi L. / Segueni, Sonia / Mellah, Rabah / Bouafia, Mohamed / Ayadi, Khaled / Wernicke, Gunther / Kruger, Sven / Gruber, Hartmut et al. | 2004
- 765
-
Direct phase distribution evaluation by continuous Paul wavelet transforms [5457-98]Bouamama, L. L. / Segueni, S. / Mellah, R. / Bouafia, M. / Ayadi, K. / Wernicke, G. / Kruger, S. / Gruber, H. / Society of Photo-optical Instrumentation Engineers et al. | 2004
- 772
-
Characterization of surface qualities of polished optical glass by ellipsometric wayManallah, Aissa / Bouafia, Mohamed et al. | 2004
- 772
-
Characterization of surface qualities of polished optical glass by ellipsometric way [5457-99]Manallah, A. / Bouafia, M. / Society of Photo-optical Instrumentation Engineers et al. | 2004