White-light spectral interferometric techniques used to measure the group dispersion of isotropic and anisotropic optical elements (Englisch)
- Neue Suche nach: Hlubina, P.
- Neue Suche nach: Ciprian, D.
- Neue Suche nach: Chlebus, R.
- Neue Suche nach: Hlubina, P.
- Neue Suche nach: Ciprian, D.
- Neue Suche nach: Chlebus, R.
In:
Proc. SPIE
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6616
; 66161F
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2007
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Elektronische Ressource
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Titel:White-light spectral interferometric techniques used to measure the group dispersion of isotropic and anisotropic optical elements
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Beteiligte:
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Kongress:Optical Measurement Systems for Industrial Inspection V ; 2007 ; Munich,Germany
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Erschienen in:Proc. SPIE ; 6616 ; 66161F
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Verlag:
- Neue Suche nach: SPIE
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Erscheinungsdatum:18.06.2007
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ISBN:
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ISSN:
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DOI:
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Medientyp:Aufsatz (Konferenz)
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Format:Elektronische Ressource
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Sprache:Englisch
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Datenquelle:
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
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Real-time multicamera system for measurement of 3D coordinates by pattern projectionSainov, Ventseslav / Stoykova, Elena / Harizanova, Jana et al. | 2007
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White-light spectral interferometric techniques used to measure the group dispersion of isotropic and anisotropic optical elementsHlubina, P. / Ciprian, D. / Chlebus, R. et al. | 2007
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Optical and contact nondestructive measurement of the laser remelting layersChmelíčková, Hana / Lapšanská, Hana / Hiklová, Helena / Havelková, Martina / Medlín, Rostislav / Beneš, Petr et al. | 2007
- 661641
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Laser metrology of statistical and fractal structure of biological tissues polarization imagesAngelsky, Oleg / Prydij, Alexander / Ushenko, Alexander / Ushenko, Yuriy / Olar, Olena et al. | 2007
- 661642
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Metrology of biological tissue coherent images by means of estimation of complex degree of mutual polarizationMisevitch, I. Z. / Ushenko, A. G. / Ushenko, Yuriy A. / Tomka, Yu. Ya. et al. | 2007
- 661643
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Mass transfer studies in transparent liquid solutions by polarization imagingChhaniwal, Vani K. / Chakrabarty, B. S. / Anand, Arun et al. | 2007
- 661644
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Digital Shack-Hartmann Wavefront Sensor for toroidal surface measurementBai, N. / Zhao, Li. P. / Li, X. / Fang, Zhong P. et al. | 2007
- 661645
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Optical metrology devices for high-power laser large opticsDaurios, J. / Bouillet, S. / Gaborit, G. / Poncetta, J. C. et al. | 2007
- 661646
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Purity of iodine cells in relation to frequency shift of iodine stabilized Nd:YAG laserHrabina, Jan / Petru, František / Jedlička, Petr / Lazar, Josef et al. | 2007
- 661647
-
Total spectral radiant flux measurements on Xe excimer lamps from 115 nm to 1000 nmTrampert, Klaus E. / Paravia, Mark / Daub, Rüdiger / Heering, Wolfgang et al. | 2007
- 661648
-
Efficient LED spatial measurement to improve optical modelingBlanco, P. / Cifuentes, A. / Arasa, J. / Pizarro, C. / Royo, S. et al. | 2007
- 661649
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Adopting our heterodyne interferometer with sub-nm sensitivity for industrial position metrologySchuldt, Thilo / Gohlke, Martin / Weise, Dennis / Peters, Achim / Johann, Ulrich / Braxmaier, Claus et al. | 2007
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Differential signal scatterometry overlay metrology: an accuracy investigation [6616-14]Kandel, D. / Adel, M. / Dinu, B. / Golovanevsky, B. / Izikson, P. / Levinski, V. / Vakshtein, I. / Leray, P. / Vasconi, M. / Salski, B. et al. | 2007
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Improved microinterferometric tomography method for reconstruction of refractive index [6616-15]Kniazewski, P. / Kujawinska, M. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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A beam halo monitor based on adaptive optics [6616-19]Welsch, C. P. / Bravin, E. / Lefevre, T. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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W-band speckle contrast images for inspection of concealed objects [6616-31]Jaeger, I. / Zhang, L. / Stiens, J. / Koers, G. / Sahli, H. / Vounckx, R. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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DLP-based fringe projection as an optical 3D inline measuring method for inspection in manufacturing [6616-85]Frankowski, G. / Stenzel, M. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Special lenslet array with long focal length range for Shack-Hartmann Wavefront Sensor [6616-111]Zhao, L. P. / Bai, N. / Li, X. / Fang, Z. P. / Hein, A. A. / Zhong, Z. W. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Determination of lens parameters with digital holography [6616-165]Chhaniwal, V. K. / Anand, A. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Laser metrology of statistical and fractal structure of biological tissues polarization images [6616-146]Angelsky, O. / Prydij, A. / Ushenko, A. / Ushenko, Y. / Olar, O. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Deformation analysis in biomaterials using digital speckle interferometry [6616-127]Salvador, R. / Gonzalez-Pena, R. / Cibrian, R. / Buendia, M. / Minguez, F. / Mico, V. / Carrion, J. A. / Esteve-Taboada, J. J. / Molina-Jimenez, T. / Simon, S. et al. | 2007
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Interferometric characterization of capacitor micromachined ultrasonic transducers and validation by electrical measurements [6616-130]Martinussen, H. / Aksnes, A. / Engan, H. E. / Ronnekleiv, A. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Conical beam-based laser profilometer for testing roller bearings [6616-120]Khilo, N. / Belyi, V. / Kazak, N. / Mashchenko, A. / Ropot, P. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Digital micromirror device application for inline characterization of solar cells by tomographic light-beam-induced current imaging [6616-21]Gupta, R. / Breitenstein, O. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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About the possibility of using optical bistability effect in metrology systems [6616-32]Zenkova, C. Y. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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S-transform analysis of projected fringe patterns [6616-43]Kocahan, O. / Ozder, S. / Coskun, E. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Derivation of quasi-parallel glass plate parameters tested in a Fizeau interferometer [6616-48]Styk, A. / Patorski, K. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Grating projection Moire interferometry for high-speed 3D inspection of mesoscale objects [6616-57]Lee, S.-Y. / Kang, M.-G. / Kim, S.-W. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Adopting our heterodyne interferometer with sub-nm sensitivity for industrial position metrology [6616-156]Schuldt, T. / Gohlke, M. / Weise, D. / Peters, A. / Johann, U. / Braxmaier, C. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Particles size measurement by spectrophotometric method [6616-163]Fontani, D. / Francini, F. / Sansoni, P. / Jafrancesco, D. / Mercatelli, L. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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XtremeFringe: state-of-the-art software for automatic processing of fringe patterns [6616-143]Quiroga, J. A. / Crespo, D. / Gomez-Pedrero, J. A. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Purity of iodine cells in relation to frequency shift of iodine stabilized Nd:YAG laser [6616-152]Hrabina, J. / Petru, F. / Jedlicka, P. / Cip, O. / Lazar, J. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Projection moire measurement of the deflection of composite plates subject to bird strike impact [6616-80]Shulev, A. / Van Paepegem, W. / Harizanova, J. / Moentjens, A. / Degrieck, J. / Sainov, V. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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White light spectral interferometric technique used to measure thickness of thin films [6616-02]Hlubina, P. / Ciprian, D. / Clebus, R. / Lunacek, J. / Lesnak, M. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Paradigm shifts in optical coherence tomography (Invited Paper) [6616-01]Leitgeb, R. A. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Super-heterodyne laser interferometer using femtosecond frequency comb for linear encoder calibration system [6616-13]Kajima, M. / Matsumoto, H. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Realisation of a holographic microlaser scalpel using a digital micromirror device [6616-20]Zwick, S. / Warber, M. / Haist, T. / Osten, W. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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External-cavity diode laser utilizing a micromirror device for spectral tuning [6616-24]Breede, M. / Kasseck, C. / Brenner, C. / Gerhardt, N. C. / Hofling, R. / Hofmann, M. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Phase retrieval based on wavefront modulation [6616-37]Zhang, F. / Pedrini, G. / Osten, W. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Characterization and compensation of decorrelations in interferometric set-ups using active optics [6616-42]Hallstig, E. / Svanbro, A. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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A novel algorithm to stitch adjacent cloud of points of long cylindrical surfaces [6616-47]Viotti, M. R. / Albertazzi, A. / Pont, A. D. / Fantin, A. V. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Using phase objects to qualify the transfer function of Fizeau interferometers for high spatial frequencies [6616-60]Bouillet, S. / Daurios, J. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Thin film thickness measurement by double laser interferometry [6616-157]Domingo, M. / Millan, C. / Satorre, M. A. / Canto, J. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Absolute interferometric measurement of flatness: application of different methods to test a 600mm diameter reference flat [6616-164]Morin, F. / Bouillet, S. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Mass transfer studies in transparent liquid solutions by polarization imaging [6616-148]Chhaniwal, V. K. / Chakrabarty, B. S. / Anand, A. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Quantification of defect size in shearing direction by shearography and wavelet transform [6616-88]Michel, F. / Moreau, V. / Rosso, V. / Habraken, S. / Tilkens, B. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Fiber optic strain measurement for machine monitoring [6616-92]Hoffmann, L. / Mueller, M. S. / Koch, A. W. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Measurement of the thermal deformation of a highly stable antenna with pulse ESPI [6616-78]Nosekabel, E.-H. / Ernst, T. / Haefker, W. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Correlation method for shape measurement of optical surfaces [6616-121]Miks, A. / Novak, J. / Novak, P. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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High-resolution tomographic interferometry of optical phase elements [6616-16]Gorski, W. / Rafler, S. / Osten, W. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Realisation of quantitative Makyoh topography using a digital micromirror device [6616-18]Riesz, F. / Lukacs, I. E. / Makai, J. P. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Stability analysis for the TMS method: influence of high spatial frequencies [6616-41]Wiegmann, A. / Elster, C. / Geckeler, R. D. / Schulz, M. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Designing a new optical sensor using wide band speckle patterns [6616-100]El Ghandoor, H. / El Sherif, A. F. / Darwish, M. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Method of optical axis determination in crystals by use of light depolarization measurements [6616-168]Domanski, A. W. / Budaszewski, D. / Poziemski, P. / Wolinski, T. R. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Precision mechatronics based on high-precision measuring and positioning systems and machines (Invited Paper) [6616-53]Jager, G. / Manske, E. / Hausotte, T. / Mastylo, R. / Dorozhovets, N. / Hofmann, N. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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New technique for flexible and rapid measurement of precision aspheres [6616-61]Garbusi, E. / Pruss, C. / Liesener, J. / Osten, W. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Optical scanner for the measurement of surface profile of large size panels: analysis of metrologic performance and measurement uncertainty [6616-65]Castellini, P. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Measurement of index of refraction of air by optical frequency method [6616-159]Smid, R. / Cizek, M. / Buchta, Z. / Mikel, B. / Lazar, J. / Cip, O. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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On-axis non-contact measurement of glass thicknesses and airgaps in optical systems with submicron accuracy [6616-95]Wilhelm, R. / Courteville, A. / Garcia, F. / de Vecchi, F. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Interference microscopes for tribology and corrosion quantification [6616-84]Novak, E. / Blewett, N. / Stout, T. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Nonlinearity correction in digital fringe projection profilometry by using histogram matching technique [6616-70]Guo, H. / Zhao, Z. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Digital holocameras for laboratory and outdoor measurements of engineering objects [6616-71]Michalkiewicz, A. / Kujawinska, M. / Stasiewicz, K. / Jaroszewicz, L. R. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Dispersive white light interferometry for 3D inspection of thin film layers of flat panel displays [6616-96]Ghim, Y.-S. / You, J. / Kim, S.-W. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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3D optical measurement of curved edges [6616-67]Naudet-Collette, S. / Gaspard, F. / Martinsson, H. / Dekeyser, F. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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3D digitising using structured illumination: application to mould redesign [6616-158]Granero, L. / Sanchez, J. / Mico, V. / Esteve, J. J. / Hervas, J. / Simon, S. / Perez, E. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik et al. | 2007
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Metrology of biological tissue coherent images by means of estimation of complex degree of mutual polarization [6616-147]Misevitch, I. Z. / Ushenko, A. G. / Ushenko, Y. A. / Tomka, Y. Y. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Optical metrology devices for high-power laser large optics [6616-151]Daurios, J. / Bouillet, S. / Gaborit, G. / Poncetta, J. C. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Advances in optoelectronic methodology for micro- and nano-scale measurements (Invited Paper) [6616-76]Pryputniewicz, R. J. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Fluid mechanics measurement based on the anisotropic core structure of pseudophase singularities in analytic signal representation of speckle pattern [6616-29]Wang, W. / Dennis, M. R. / Ishijima, R. / Yokozeki, T. / Matsuda, A. / Hanson, S. G. / Takeda, M. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik et al. | 2007
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Implementation a new real-time structure for driving an IRFPA and image enhancement [6616-101]Homaei, A. / Koohestani, E. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Experimental validation of 20nm sensitivity of singular beam microscopy [6616-54]Spektor, B. / Normatov, A. / Shamir, J. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Design of an optical scanner for real-time on-line measurement of wood-panel profiles [6616-162]Castellini, P. / Bruni, A. / Paone, N. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Optical and contact non-destructive measurement of the laser re-melting layers [6616-145]Chmelickova, H. / Lapsanska, H. / Hiklova, H. / Havelkova, M. / Medlin, R. / Benes, P. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Total spectral radiant flux measurements on Xe excimer lamps from 115 nm to 1000 nm [6616-154]Trampert, K. E. / Paravia, M. / Daub, R. / Heering, W. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Feasibility study of in-process weld quality control by means of scanning laser profilometry [6616-136]Jezersek, M. / Polajnar, I. / Diaci, J. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Inspection of plastic weld joints with terahertz imaging [6616-98]Wietzke, S. / Krumbholz, N. / Jordens, C. / Baudrit, B. / Bastian, M. / Koch, M. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Fibre grating refractometer sensors for composite process monitoring. [6616-87]Buggy, S. J. / Chehura, E. / Skordos, A. A. / Dimopoulos, A. / James, S. W. / Partridge, I. K. / Tatam, R. P. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik et al. | 2007
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Accurate measurement of intraocular lens parameters [6616-126]Vannoni, M. / Molesini, G. / Mencucci, R. / Volpe, R. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Infrared Electronic speckle pattern interferometry at 10 mum [6616-72]Vandenrijt, J.-F. / Georges, M. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Real-time multicamera system for measurement of 3D coordinates by pattern projection [6616-08]Sainov, V. / Stoykova, E. / Harizanova, J. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Photon-noise limited distance resolution of optical metrology methods (Invited Paper) [6616-06]Seitz, P. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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In situ monitoring of periodic domain formation in ferroelectric crystals [6616-25]Grilli, S. / Paturzo, M. / Miccio, L. / Ferraro, P. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Polarization correlometry of polarization singularities of biological tissues object fields [6616-28]Angelsky, O. V. / Ushenko, A. G. / Angelska, A. O. / Ushenko, Y. A. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Reaching lambda/100 resolution in static fringes interferometry using linear prediction [6616-33]Mestre, M. / Pasquelin, D. / Flug, P. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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An efficient mesh oriented algorithm for 3D measurement in multiple camera fringe projection [6616-44]Fantin, A. V. / Albertazzi, A. / Pinto, T. L. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Influences of linear birefringence on bulk glass current sensors with return-back optical paths [6616-114]Wang, Z. / Liu, X. / Huang, Z. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Influences of reciprocal parameters upon a Faraday-mirror typed OCT [6616-115]Huang, Z. / Wang, Z. / Liu, X. / Kang, C. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Measurement errors of mirrorlike tilted objects in white-light interferometry [6616-123]Berger, R. / Sure, T. / Osten, W. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Efficient LED spatial measurement to improve optical modeling [6616-155]Blanco, P. / Cifuentes, A. / Arasa, J. / Pizarro, C. / Royo, S. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Optical correlation measurement of surface roughness [6616-68]Angelsky, O. V. / Maksimyak, A. P. / Maksimyak, P. P. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Multi-technique platform for dynamic and static MEMS characterisation [6616-83]Gastinger, K. / Lovhaugen, P. / Skotheim, O. / Hunderi, O. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Fiber-optic-based sensors design to test concrete structures [6616-131]Mico, V. / Lozano, M. L. / Esteve-Taboada, J. J. / Carrion, J. A. / Molina-Jimenez, T. / Simon, S. / Perez, E. / Lloris, J. M. / Cruz-Yusta, M. / Lopez-Tendero, M. J. et al. | 2007
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In-plane displacement measurement with sub-pixel resolution: application to vibration characterization of a shear-force scanning probe [6616-77]Sandoz, P. / Friedt, J.-M. / Carry, E. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Two-dimensional method for surface determination by optical deflectometry [6616-118]Moreno, A. / Espinola, M. / Lizana, A. / Campos, J. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Nematic liquid crystals light valve: application to phase shifting speckle interferometry [6616-169]Slangen, P. / Gautier, B. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Dual-wavelength vertical scanning low-coherence interference microscopy [6616-03]Niehues, J. / Lehmann, P. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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White-light interferometry in combination with a nanopositioning and nanomeasuring machine (NPMM) [6616-04]Kapusi, D. / Machleidt, T. / Franke, K.-H. / Jahn, R. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Point-diffraction interferometer by electro-optic effect in lithium niobate crystals [6616-106]Paturzo, M. / Grilli, S. / Ferraro, P. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Properties of the DMD digital micromirror device for new emerging applications in optical engineering (Invited Paper) [6616-17]Dunn, C. / Hofling, R. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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A complete digital optics applied to digital holographic microscopy: application to chromatic aberration compensation [6616-45]Colomb, T. / Charriere, F. / Kuhn, J. / Montfort, F. / Depeursinge, C. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Multidirectional holographic interferometer with dodecagon geometry [6616-104]Antos, M. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Orthogonal conjugate reflecting current sensor [6616-116]Huang, Z. / Wang, Z. / Wang, H. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Proposal on MEMS-based interferometric profiler for in-situ etching depth control [6616-50]Smirnov, A. G. / Schreiber, J. / Richter, U. / Wullinger, I. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Force plate for measuring small animal forces by digital speckle pattern interferometry [6616-161]Arroyo, M. P. / Bea, J. A. / Andres, N. / Osta, R. / Doblare, M. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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AIT of optical payloads in Thales Alenia Space-F: an experience of more than 20 years [6616-139]Thibout, R. / Benard, H. / Delmonte, S. / Chessel, J.-P. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Depth tracing the influence of oxygen on UV curing [6616-142]Pieke, S. / Heering, W. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Multiscale segmentation method for small inclusion detection in 3D industrial computed tomography [6616-93]Zauner, G. / Harrer, B. / Angermaier, D. / Reiter, M. / Kastner, J. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Optical fiber sensors in health monitoring of composite high-pressure vessels for hydrogen [6616-135]Gasior, P. / Kaleta, J. / Sankowska, A. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Development of a 3D dynamic measurement system using a high-speed camera with white-light scanning interference microscopy associated with real-time FPGA image processing [6616-129]Johnson, G. / Montgomery, P. / Anstotz, F. / Kiefer, R. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Measurement of surface strain using multi-component pulsed laser shearography with coherent fibre-optic bundles [6616-74]Francis, D. / James, S. W. / Tatam, R. P. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Application of reflection hologram interferometry with a high resolution to residual stresses characterisation by local material removing [6616-75]Pisarev, V. S. / Balalov, V. V. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Vertical scanning interferometry with a mixed-coherence light source [6616-05]Molnar, G. / Tutsch, R. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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A method for edge detection of textile preforms using a light-section sensor for the automated manufacturing of fibre-reinforced plastics [6616-07]Schmitt, R. / Orth, A. / Niggemann, C. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Time-of-flight based pixel architecture with integrated double-cathode photodetector [6616-10]Oberhauser, K. / Zach, G. / Nemecek, A. / Zimmermann, H. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Real-time dual-wavelength digital holographic microscopy with a single hologram [6616-38]Kuhn, J. / Colomb, T. / Montfort, F. / Charriere, F. / Depeursinge, C. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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3D defect detection using optical wide-field microscopy [6616-46]Tympel, V. / Schaaf, M. / Srocka, B. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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White-light spectral interferometric techniques used to measure the group dispersion of isotropic and anisotropic optical elements [6616-99]Hlubina, P. / Ciprian, D. / Chlebus, R. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Multi-resolution optical 3D sensor [6616-105]Kuhmstedt, P. / Heinze, M. / Schmidt, I. / Breitbarth, M. / Notni, G. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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New features of Doppler-free saturated-absorption resonance in field of counterpropagating waves [6616-102]Brazhnikov, D. V. / Taichenachev, A. V. / Tumaikin, A. M. / Yudin, V. I. / Zibrov, S. A. / Dudin, Y. O. / Siushev, P. A. / Radnaev, A. G. / Vasil ev, V. V. / Velichansky, V. L. et al. | 2007
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Non-contact torsion transducer based on the measurement of Moire patterns using plastic optical fibres [6616-110]Lomer, M. / Contreras, K. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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White-light Fourier spectrometer: Monte Carlo noise analysis and test measurements [6616-109]Stoykova, E. / Ivanov, B. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Improving the measurement of thick and thin films with optical profiling techniques [6616-51]Cadevall, C. / Oriach-Font, C. / Artigas, R. / Pinto, A. / Laguarta, F. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Artefacts with rough surfaces for verification of optical microsensors [6616-58]Ehrig, W. / Neuschaefer-Rube, U. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Surface metrology with a stitching Shack-Hartmann profilometric head [6616-62]Floriot, J. / Levecq, X. / Bucourt, S. / Thomasset, M. / Polack, F. / Idir, M. / Mercere, P. / Brochet, S. / Moreno, T. / SPIE Europe et al. | 2007
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Large-scale full-field metrology using projected fringes: some challenges and solutions [6616-64]Huntley, J. M. / Ogundana, T. / Burguete, R. L. / Coggrave, C. R. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Profile detection by projection of coloured patterns [6616-69]Fontani, D. / Francini, F. / Sansoni, P. / Jafrancesco, D. / Mercatelli, L. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Digital Shack-Hartmann Wavefront Sensor for toroidal surface measurement [6616-150]Bai, N. / Zhao, L. P. / Li, X. / Fang, Z. P. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Fiber-coupled THz spectroscopy for monitoring polymeric compounding processes [6616-27]Vieweg, N. / Krumbholz, N. / Hasek, T. / Wilk, R. / Bartels, V. / Keseberg, C. / Pethukhov, V. / Mikulics, M. / Wetenkamp, L. / Koch, M. et al. | 2007
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Polarization metrology of speckle-reconstructed biological layers roughness [6616-97]Misevitch, I. Z. / Ushenko, Y. / Ushenko, A. G. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Optical scan method for fine surface roughness measurement [6616-119]Wang, Z. / Wang, L. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Stress behavior of ball grid array (BGA) studied by dynamic electronic speckle pattern interferometry (DESPI) [6616-73]Madjarova, V. D. / Toyooka, S. / Chida, H. / Kadono, H. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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The confocal Raman AFM: a powerful tool for the characterization of surface coatings [6616-11]Schmidt, U. / Ibach, W. / Mueller, J. / Hollricher, O. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Coherent fringe projector for 3D surface profilometry [6616-103]Tavares, P. / Viriato, N. / Reis, J. / Vaz, M. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Influence of non-linearities in wavelength-swept absolute distance interferometry [6616-49]Perret, L. / Pfeiffer, P. / Chakari, A. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Online monitoring of the laser brazing of titanium overlap joints [6616-91]Schmitt, R. / Vielhaber, K. / Donst, D. / Klocke, F. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Performance of optical speckle displacement technique near stress concentrators [6616-132]Muravsky, L. I. / Sakharuk, O. M. / Kostyukevych, S. O. / Maksymenko, O. P. / Kostyukevych, K. V. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Composition of virtual speckle pattern for spatial fringe analysis method in ESPI by using single camera [6616-34]Arai, Y. / Shimamura, R. / Yokozeki, S. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Phase measurement errors due to holographic interferograms compression [6616-36]Darakis, E. / Singh, V. R. / Asundi, A. K. / Soraghan, J. J. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Interferometry of thick and thin films [6616-52]Conroy, M. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Application of the metrological scanning probe microscope for high-precision, long-range, traceable measurements [6616-56]Dorozhovets, N. / Hausotte, T. / Jager, G. / Manske, E. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Terahertz multiwavelength phase imaging without 2pi ambiguity [6616-26]Zhang, Y. / Zhang, L. / Zhang, C. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Shape and vibration measurement of fast rotating objects employing novel laser Doppler techniques [6616-86]Pfister, T. / Gunther, P. / Buttner, L. / Czarske, J. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Validation of an algorithm for wave propagations in graded materials with an analytical solution [6616-134]Aebi, L. / Loffel, K. / Vollmann, J. / Dual, J. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Phase-only SLM as a reference element in Twyman-Green laser interferometer for MEMS measurement [6616-133]Kacperski, J. / Kujawinska, M. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Double exposure time-averaged in-line digital holography [6616-81]Singh, V. R. / Asundi, A. / Miao, J. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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3D shape measurement with phase correlation based fringe projection [6616-09]Kuhmstedt, P. / Munckelt, C. / Heinze, M. / Brauer-Burchardt, C. / Notni, G. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Fourier-based design of asynchronous phase detection algorithms [6616-35]Gomez-Pedrero, J. A. / Crespo, D. / Quiroga, J. A. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Fast demodulation technique for a quasi-distributed temperature sensor [6616-39]Crunelle, C. / Wuilpart, M. / Caucheteur, C. / Megret, P. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Effective dynamic range measurement for a CCD in full-field industrial x-ray imaging applications [6616-107]Bettuzzi, M. / Brancaccio, R. / Morigi, M. P. / Casali, F. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Optical fiber rotation sensor for application in oil refinery and high electromagnetic noise environment [6616-167]Wolinski, T. R. / Budaszewski, D. / Domanski, A. W. / Ertman, S. / Goleniewski, G. / Wydmanski, M. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Measuring 3D geometries of microstructures with the laser-scanning confocal vibrometer microscope [6616-55]Rembe, C. / Bodecker, S. / Armbruster, B. / Bauer, M. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Superposition fringes for profiling applications [6616-59]Schwider, J. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Performance of a fiber optic ring depolarizer in fiber sensing applications [6616-137]Mueller, M. S. / Hoffmann, L. / Koch, A. W. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Laser ultrasound: a flexible tool for the inspection of complex CFK components and welded seams (Invited Paper) [6616-82]von Kopylow, C. / Focke, O. / Kalms, M. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007
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Quantification of displacement and velocity noise in vibrometer measurements on transversely moving or rotating surfaces [6616-128]Drabenstedt, A. / SPIE Europe / European Optical Society / Wissenschaftliche Gesellschaft Lasertechnik / Society of Photo-optical Instrumentation Engineers et al. | 2007