Absolute scale-based imaging position encoder with submicron accuracy (Englisch)
- Neue Suche nach: Anisimov, Andrey G.
- Neue Suche nach: Pantyushin, Anton V.
- Neue Suche nach: Lashmanov, Oleg U.
- Neue Suche nach: Vasilev, A. S.
- Neue Suche nach: Timofeev, Alexander N.
- Neue Suche nach: Korotaev, Valery V.
- Neue Suche nach: Gordeev, Sergey V.
- Neue Suche nach: Anisimov, Andrey G.
- Neue Suche nach: Pantyushin, Anton V.
- Neue Suche nach: Lashmanov, Oleg U.
- Neue Suche nach: Vasilev, A. S.
- Neue Suche nach: Timofeev, Alexander N.
- Neue Suche nach: Korotaev, Valery V.
- Neue Suche nach: Gordeev, Sergey V.
In:
Proc. SPIE
;
8788
; 87882T
;
2013
-
ISBN:
-
ISSN:
- Aufsatz (Konferenz) / Elektronische Ressource
-
Titel:Absolute scale-based imaging position encoder with submicron accuracy
-
Beteiligte:Anisimov, Andrey G. ( Autor:in ) / Pantyushin, Anton V. ( Autor:in ) / Lashmanov, Oleg U. ( Autor:in ) / Vasilev, A. S. ( Autor:in ) / Timofeev, Alexander N. ( Autor:in ) / Korotaev, Valery V. ( Autor:in ) / Gordeev, Sergey V. ( Autor:in )
-
Kongress:Optical Measurement Systems for Industrial Inspection VIII ; 2013 ; Munich, Germany
-
Erschienen in:Proc. SPIE ; 8788 ; 87882T
-
Verlag:
- Neue Suche nach: SPIE
-
Erscheinungsdatum:09.04.2013
-
ISBN:
-
ISSN:
-
DOI:
-
Medientyp:Aufsatz (Konferenz)
-
Format:Elektronische Ressource
-
Sprache:Englisch
-
Datenquelle:
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 87880A
-
Hybrid and transflective system based on digital holographic microscope and low coherent interferometer for high gradient shape measurementLiżewski, K. / Tomczewski, S. / Kostencka, J. / Kozacki, T. et al. | 2013
- 87880B
-
Total compensation of chromatic errors in digital color holography using a single recordingLeclercq, Mathieu / Picart, Pascal et al. | 2013
- 87880D
-
Lensless object scanning holography for diffuse objectsGarcía, Javier / Ferreira, Carlos / Micó, Vicente et al. | 2013
- 87880E
-
A long trace profiler with large dynamical rangeRitucci, A. / Rossi, M. et al. | 2013
- 87880G
-
Optical characterization method for very small microlenses (sub-50 micron) for industrial mass-production applicationsKim, Myun-Sik / Sunarjo, Jonathan / Weible, Kenneth J. / Voelkel, Reinhard et al. | 2013
- 87880I
-
Shape reconstruction using dual wavelength digital holography and speckle movementsKhodadad, Davood / Hällstig, Emil / Sjödahl, Mikael et al. | 2013
- 87880J
-
Digital holographic inspection for the straight pipe inner surface using multiwavelength from laser diodesYokota, M. / Koyama, T. / Kawakami, T. et al. | 2013
- 87880K
-
Seeing through smoke and flames: a challenge for imaging capabilities, met thanks to digital holography at far infraredLocatelli, Massimiliano / Pugliese, Eugenio / Paturzo, Melania / Bianco, Vittorio / Finizio, Andrea / Pelagotti, Anna / Poggi, Pasquale / Miccio, Lisa / Meucci, Riccardo / Ferraro, Pietro et al. | 2013
- 87880L
-
A computational tool to highlight anomalies on shearographic images in optical flaw detectionFantin, A. V. / Willemann, D. P. / Viotti, M. / Albertazzi, A. et al. | 2013
- 87880M
-
ESPI based on spatial fringe analysis method using only two sheets of speckle patternsArai, Y. / Yokozeki, S. et al. | 2013
- 87880O
-
Relation between vectorial source structure and coherence-polarization of lightSingh, Rakesh K. / Naik, Dinesh N. / Itou, Hitoshi / Brundavanam, Maruthi M. / Miyamoto, Yoko / Takeda, Mitsuo et al. | 2013
- 87880P
-
A polarization-based frequency shifting interferometry for inspecting transparent objects in microelectronics manufacturingLee, Seung Hyun / Kim, Min Young et al. | 2013
- 87880Q
-
Fast and accurate line scanner based on white light interferometryLambelet, Patrick / Moosburger, Rudolf et al. | 2013
- 87880R
-
High speed measurement of specular surfaces based on carrier fringe patterns in a line scan Michelson interferometer setupKnell, Holger / Lehmann, Peter et al. | 2013
- 87880S
-
Speed-up chromatic sensors by optimized optical filtersTaphanel, Miro / Hovestreydt, Bastiaan / Beyerer, Jürgen et al. | 2013
- 87880T
-
Robust evaluation of intensity curves measured by confocal microscopiesSeewig, Jörg / Raid, Indek / Wiehr, Christian / George, Bini A. et al. | 2013
- 87880U
-
Model-based assistance system for confocal measurements of rough surfacesMauch, F. / Lyda, W. / Osten, W. et al. | 2013
- 87880V
-
Parallelized chromatic confocal sensor systemsHillenbrand, Matthias / Grewe, Adrian / Bichra, Mohamed / Kleindienst, Roman / Lorenz, Lucia / Kirner, Raoul / Weiß, Robert / Sinzinger, Stefan et al. | 2013
- 87880W
-
Robust signal evaluation for Chromatic Confocal Spectral InterferometryBoettcher, Tobias / Lyda, Wolfram / Gronle, Marc / Mauch, Florian / Osten, Wolfgang et al. | 2013
- 87880X
-
Measurement, visualization and analysis of extremely large data sets with a nanopositioning and nanomeasuring machineBirli, O. / Franke, K.-H. / Linß, G. / Machleidt, T. / Manske, E. / Schale, F. / Schwannecke, H.-C. / Sparrer, E. / Weiß, M. et al. | 2013
- 87880Y
-
Model-based, active inspection of three-dimensional objects using a multi-sensor measurement systemGronle, Marc / Lyda, Wolfram / Osten, Wolfgang et al. | 2013
- 87880Z
-
High-frequency optical fiber microphone for condition-based maintenance applicationTosi, Daniele / Olivero, Massimo / Perrone, Guido / Vallan, Alberto et al. | 2013
- 87881A
-
Highly accurate surface maps from profilometer measurementsMedicus, Kate M. / Nelson, Jessica D. / Mandina, Mike P. et al. | 2013
- 87881B
-
Lateral location error compensation algorithm for measuring aspheric surfaces by sub-aperture stitching interferometryZhao, Zixin / Zhao, Hong / Gu, Feifei / Zhang, Lu et al. | 2013
- 87881C
-
Deflectometry vs. interferometryHäusler, Gerd / Faber, Christian / Olesch, Evelyn / Ettl, Svenja et al. | 2013
- 87881D
-
Approach to the measurement of astronomical mirrors with new proceduresHofbauer, E. / Rascher, R. / Stubenrauch, Th. / Liebl, J. / Maurer, R. / Zimmermann, A. / Rösch, O. / Reitberger, J. et al. | 2013
- 87881E
-
Precision aspheric optics testing with SCOTS: a deflectometry approachSu, Peng / Khreishi, Manal / Huang, Run / Su, Tianquan / Burge, James H. et al. | 2013
- 87881F
-
Methods to obtain the waveform profile from slope measurementsMoreno, Alfonso / Espínola, Manuel / Martínez, José / Campos, Juan et al. | 2013
- 87881G
-
Moiré deflectometry under incoherent illumination: 3D profiler for specular surfacesHirose, Tomohiro / Kitayama, Tsunaji et al. | 2013
- 87881H
-
Optical profilometer using laser based conical triangulation for inspection of inner geometry of corroded pipes in cylindrical coordinatesBuschinelli, Pedro D. V. / Melo, João Ricardo C. / Albertazzi, Armando / Santos, João M. C. / Camerini, Claudio S. et al. | 2013
- 87881I
-
Active retroreflector with in situ beam analysis to measure the rotational orientation in conjunction with a laser trackerHofherr, O. / Wachten, C. / Müller, C. / Reinecke, H. et al. | 2013
- 87881J
-
Automated control of robotic camera tacheometers for measurements of industrial large scale objectsHeimonen, Teuvo / Leinonen, Jukka / Sipola, Jani et al. | 2013
- 87881K
-
Development of alignment-guidance device for grooved roll mill using parallel projection imaging techniqueKodama, Toshifumi / Iwata, Teruhisa / Yamagami, Daisaku / Takagi, Keiji et al. | 2013
- 87881L
-
Photogrammetry based system for the measurement of cylindrical forgings axis straightnessZatočilová, Aneta / Poliščuk, Radek / Paloušek, David / Brandejs, Jan et al. | 2013
- 87881N
-
Sub-nanometer in-die overlay metrology: measurement and simulation at the edge of finitenessSmilde, Henk-Jan H. / Jak, Martin / den Boef, Arie / van Schijndel, Mark / Bozkurt, Murat / Fuchs, Andreas / van der Schaar, Maurits / Meyer, Steffen / Morgan, Stephen / Bhattacharyya, Kaustuve et al. | 2013
- 87881O
-
Nanometrology of periodic nanopillar arrays by means of light scatteringPaul, Oliver / Widulle, Frank / Kleemann, Bernd H. / Heinrich, Andreas et al. | 2013
- 87881P
-
Phase information in coherent Fourier scatterometryKumar, N. / El Gawhary, O. / Roy, S. / Pereira, S. F. / Urbach, H. P. et al. | 2013
- 87881Q
-
Revisiting parallel catadioptric goniophotometersKaramata, Boris / Andersen, Marilyne et al. | 2013
- 87881R
-
Metrology solutions using optical scatterometry for advanced CMOS: III-V and Germanium multi-gate field-effect transistorsChin, Hock-Chun / Liu, Bin / Zhang, Xingui / Ling, Moh-Lung / Yip, Chan-Hoe / Liu, Yongdong / Hu, Jiangtao / Yeo, Yee-Chia et al. | 2013
- 87881S
-
The road towards accurate optical width measurements at the industrial levelBodermann, Bernd / Köning, Rainer / Bergmann, Detlef / Buhr, Egbert / Hässler-Grohne, Wolfgang / Flügge, Jens / Bosse, Harald et al. | 2013
- 87881T
-
3D shape measurements of fast moving rough surfaces by two tilted interference fringe systemsKuschmierz, Robert / Günther, Philipp / Czarske, Jürgen W. et al. | 2013
- 87881U
-
Optical vibration analysis of MEMS devices with pm-resolution in x, y, and z directionsGiesen, Moritz / Kowarsch, Robert / Ochs, Wanja / Winter, Marcus / Rembe, Christian et al. | 2013
- 87881V
-
Characterization and demonstration of a 12-channel Laser-Doppler vibrometerHaist, T. / Lingel, C. / Osten, W. / Bendel, K. / Giesen, M. / Gartner, M. / Rembe, C. et al. | 2013
- 87881X
-
Diagnostic of structures in heat and power generating industries with utilization of 3D digital image correlationMalesa, M. / Kujawińska, M. / Malowany, K. / Siwek, B. et al. | 2013
- 87881Y
-
Integrated digital image correlation for residual stress measurementBaldi, Antonio / Bertolino, Filippo et al. | 2013
- 87881Z
-
Infrared differential interference contrast microscopy for overlay metrology on 3D-interconnect bonded wafersKu, Yi-sha / Shyu, Deh-Ming / Lin, Yeou-Sung / Cho, Chia-Hung et al. | 2013
- 87882C
-
Three-axis optic-electronic autocollimation system for the inspection of large-scale objectsKonyakhin, Igor A. / Timofeev, Alexandr N. / Konyakhin, Aleksey et al. | 2013
- 87882D
-
Optical device for the improvement of positioning accuracy in large machine toolsCocola, L. / Fedel, M. / Mocellin, M. / Casarin, R. / Poletto, L. et al. | 2013
- 87882E
-
Measurement uncertainty in the profile detection on solar troughsSansoni, P. / Fontani, D. / Francini, F. / Toccafondi, S. / Messeri, M. / Coraggia, S. / Mercatelli, L. / Jafrancesco, D. / Sani, E. et al. | 2013
- 87882F
-
The impact of polarization on metrology performance of the lateral shearing interferometerYao, Zhengpeng / Xing, Tingwen et al. | 2013
- 87882G
-
Comparison of Michelson and Linnik interference microscopes with respect to measurement capabilities and adjustment effortsKühnhold, Peter / Xie, Weichang / Lehmann, Peter et al. | 2013
- 87882H
-
Application of line-scanning microscopy using a linear sensor in semiconductor industry: shape and thickness measurementsMacedo, Milton P. / Correia, C. M. B. A. et al. | 2013
- 87882J
-
Optical resolution measurement system for small lens by using slanted-slit methodHuang, Kuang-Yuh / Chia, Chou-Min / Chang, Elmer et al. | 2013
- 87882K
-
A compensation method of large aperture optical lens for gravity deformationYang, Lijuan / Xing, Tingwen / Feng, Jie et al. | 2013
- 87882L
-
Reaching accuracies of Lambda/100 with the Three-Flat-TestWittek, Steffen et al. | 2013
- 87882M
-
Optical measurement system applied to continuous displacement monitoring of long-span suspension bridgesLages Martins, L. / Rebordão, J. M. / Ribeiro, A. S. et al. | 2013
- 87882N
-
Small angle light scattering for a glass fibre diameter characterizationŚwirniak, Grzegorz / Głomb, Grzegorz et al. | 2013
- 87882O
-
Design and location deviation of the computer generated holograms used for aspheric surface testingFeng, Jie / Deng, Chao / Xing, Tingwen et al. | 2013
- 87882P
-
Laser welding control by monitoring of plasmaChmelickova, Hana / Sebestova, Hana / Havelkova, Martina / Rihakova, Lenka / Nozka, Libor et al. | 2013
- 87882Q
-
Design of omnidirectional camera lens system with catadioptic systemJo, Jae Heung / Lee, Sangon / Seo, Hyeon Jin / Lee, Jung Hwan / Kim, Joon Mo et al. | 2013
- 87882R
-
Dual view x-ray inspection system for foreign objects detection in canned foodLu, Zhiwen / Peng, Ningsong et al. | 2013
- 87882S
-
Development of a zero-method interferometer by means of dynamic generation of reference wave frontHanayama, Ryohei / Ishii, Katsuhiro et al. | 2013
- 87882T
-
Absolute scale-based imaging position encoder with submicron accuracyAnisimov, Andrey G. / Pantyushin, Anton V. / Lashmanov, Oleg U. / Vasilev, A. S. / Timofeev, Alexander N. / Korotaev, Valery V. / Gordeev, Sergey V. et al. | 2013
- 87882U
-
CCD camera-based analysis of thin film growth in industrial PACVD processesZauner, G. / Schulte, T. / Forsich, C. / Heim, Daniel et al. | 2013
- 87882V
-
Towards superresolution imaging with optical vortex scanning microscopeMasajada, Jan / Popiołek-Masajada, Agnieszka / Augustyniak, Ireneusz / Sokolenko, Bohdan et al. | 2013
- 87882W
-
Image quality improvement using speckle method in digital holography by means of multi-mode fiberFunamizu, H. / Shimoma, S. / Aizu, Y. et al. | 2013
- 87882X
-
Measurement of residual stress fields in FHPP welding: a comparison between DSPI combined with hole-drilling and neutron diffractionViotti, Matias R. / Albertazzi, Armando / Staron, Peter / Pisa, Marcelo et al. | 2013
- 87882Y
-
Iterative alignment of reflector segments using a laser trackerCabrera Cuevas, Lizeth / Lucero Alvarez, Maribel / Leon-Huerta, Andrea / Hernandez Rios, Emilio / Hernandez Lázaro, Josefina / Tzile Torres, Carlos / Castro Santos, David / Gale, David M. / Wilson, Grant / Narayanan, Gopal et al. | 2013
- 87882Z
-
Tilted objects EFI in digital holography by two different numerical approachesMatrecano, Marcella / Paturzo, Melania / Ferraro, Pietro et al. | 2013
- 87883A
-
Iterative improvements to the surface error of a 1.7 metre aluminium reflectorCastro Santos, David / Cabrera Cuevas, Lizeth / Hernandez Rios, Emilio / Gale, David M. / Smith, David R. et al. | 2013
- 87883B
-
Efficient testing methodologies for microcameras in a gigapixel imaging systemYoun, Seo Ho / Marks, Daniel L. / McLaughlin, Paul O. / Brady, David J. / Kim, Jungsang et al. | 2013
- 87883C
-
Wavelength modulation-based method for interference phase detection with reduced optical complexityŘeřucha, Šimon / Šarbort, Martin / Buchta, Zdeněk / Mikel, Bretislav / Šmíd, Radek / Čížek, Martin / Jedlička, Petr / Řerucha, Jan / Lazar, Josef / Číp, Ondřej et al. | 2013
- 87883D
-
Camera-based curvature measurement of a large incandescent objectOllikkala, Arttu V. H. / Kananen, Timo P. / Mäkynen, Anssi J. / Holappa, Markus et al. | 2013
- 87883E
-
Design and analysis of a low-cost compensated POF displacement sensor for industrial applicationsTosi, Daniele / Olivero, Massimo / Perrone, Guido / Vallan, Alberto et al. | 2013
- 87883F
-
Digital holographic microscopy for the study of nano-fibersWahba, Hamdy H. / Sjödahl, Mikael / Gren, Per / Olsson, Erik et al. | 2013
- 87883G
-
Implementation of a fringe visibility based algorithm in coherence scanning interferometry for surface roughness measurementMontgomery, P. C. / Salzenstein, F. / Montaner, D. / Serio, B. / Pfeiffer, P. et al. | 2013
- 87883H
-
Turbine-blade tip clearance and tip timing measurements using an optical fiber bundle sensorGarcia, Iker / Beloki, Josu / Zubia, Joseba / Durana, Gaizka / Aldabaldetreku, Gotzon et al. | 2013
- 87883I
-
Precision positioning with suppression of the influence of refractive index of airHolá, M. / Hrabina, J. / Oulehla, J. / Čížek, M. / Mikel, B. / Řeřucha, Š. / Buchta, Z. / Číp, O. / Lazar, J. et al. | 2013
- 87883J
-
Static and (quasi)dynamic calibration of stroboscopic scanning white light interferometerSeppä, Jeremias / Kassamakov, Ivan / Nolvi, Anton / Heikkinen, Ville / Paulin, Tor / Lassila, Antti / Hao, Ling / Hæggsröm, Edward et al. | 2013
- 87883K
-
Computed tomography of cylindrically symmetric object by use of digital holographyPan, Zhelang / Li, Shiping / Zhong, Jingang et al. | 2013
- 87883M
-
Stimulated LIF studied using pulsed digital holography and modellingAmer, Eynas / Stenvall, Jonas / Gren, Per / Sjödahl, Mikael et al. | 2013
- 87883O
-
Surface normal deblurring caused by conveyor movement for fast surface inspectionKurihara, Toru / Katsuki, Yugo / Ando, Shigeru et al. | 2013
- 87883P
-
Tape measuring system using linear encoder and digital cameraEom, Tae Bong / Jeong, Don Young / Kim, Myung Soon / Kim, Jae Wan / Kim, Jong Ahn et al. | 2013
- 87883Q
-
Automated hardware and software complex for extended light sources verificationGorbunova, Elena V. / Peretyagin, Vladimir S. / Chertov, Aleksandr N. et al. | 2013
- 878801
-
Front Matter: Volume 8788| 2013
- 878802
-
Low coherence full field interference microscopy or optical coherence tomography: recent advances, limitations and future trendsAbdulhalim, I. et al. | 2013
- 878803
-
Excess fraction measurement of a transparent glass thickness in wavelength tuning interferometryKim, Yangjin / Hibino, Kenichi / Harada, Kanako / Sugita, Naohiko / Mitsuishi, Mamoru et al. | 2013
- 878804
-
Metrology for adhesive layer of temporary bonding wafers using IR interferometryChang, Po-Yi / Ku, Yi-Sha / Cho, Chia-Hung et al. | 2013
- 878805
-
Concept, realization and performance of a two-beam phase-shifting point diffraction interferometerVoznesenskiy, Nikolay / Voznesenskaia, Mariia / Petrova, Natalia / Abels, Artur et al. | 2013
- 878806
-
Sparsity-based denoising method of wrapped-phase reconstructions in digital holographyMemmolo, Pasquale / Iannone, Maria / Ventre, Maurizio / Netti, Paolo A. / Finizio, Andrea / Paturzo, Melania / Ferraro, Pietro et al. | 2013
- 878807
-
Holographic Interferometry based on photorefractive crystal to measure 3D thermo-elastic distortion of composite structures and comparison with finite element modelsThizy, C. / Eliot, F. / Ballhause, D. / Olympio, K. R. / Kluge, R. / Shannon, A. / Laduree, G. / Logut, D. / Georges, M. P. et al. | 2013
- 878808
-
Lensless single-exposure super-resolved interferometric microscopyGranero, Luis / Ferreira, Carlos / García, Javier / Micó, Vicente et al. | 2013
- 878809
-
Resolution enhancement and autofocusing in digital holographic microscopy by using structured illuminationGao, Peng / Pedrini, Giancarlo / Osten, Wolfgang et al. | 2013
- 878810
-
A space-borne fiber-optic interrogator module based on narrow-band tunable laser diode for temperature monitoring in telecommunication satellitesPutzer, P. / Kuhenuri, N. / Koch, A. W. / Schweyer, S. / Hurni, A. / Plattner, M. et al. | 2013
- 878811
-
Miniature low-cost extrinsic Fabry-Perot interferometer for low-pressure detectionPoeggel, Sven / Tosi, Daniele / Leen, Gabriel / Lewis, Elfed et al. | 2013
- 878812
-
Applications of tilted fiber Bragg grating in liquid parameters measurementJiang, Biqiang / Zhao, Jianlin / Rauf, Abdul / Qin, Chuan / Jiang, Wei et al. | 2013
- 878813
-
Experimental comparison of phase-shifting fringe projection and statistical pattern projection for active triangulation systemsLutzke, Peter / Schaffer, Martin / Kühmstedt, Peter / Kowarschik, Richard / Notni, Gunther et al. | 2013
- 878814
-
Scanning fringe projection for fast 3D inspectionHonegger, Marc / Kahl, Michael / Trunz, Sandra / Rinner, Stefan / Ettemeyer, Andreas / Lambelet, Patrick et al. | 2013
- 878815
-
High-speed 3D shape measurement using array projectionHeist, Stefan / Sieler, Marcel / Breitbarth, Andreas / Kühmstedt, Peter / Notni, Gunther et al. | 2013
- 878816
-
Influence of the structured illumination frequency content on the correspondence assignment precision in stereophotogrammetryGroße, Marcus / Schaffer, Martin / Harendt, Bastian / Kowarschik, Richard et al. | 2013
- 878817
-
High resolution measurements of filigree, inner geometries with endoscopic micro fringe projectionOhrt, Christoph / Kästner, Markus / Reithmeier, Eduard et al. | 2013
- 878818
-
Measurement of aspheres and free-form surfaces in a non-null test interferometer: reconstruction of high-frequency errorsBaer, Goran / Schindler, Johannes / Siepmann, Jens / Pruß, Christof / Osten, Wolfgang / Schulz, Michael et al. | 2013
- 878819
-
Non-contact profiling for high precision fast asphere topology measurementPetter, Jürgen / Berger, Gernot et al. | 2013
- 878820
-
A lateral sensor for the alignment of two formation-flying satellitesRoose, S. / Stockman, Y. / Sodnik, Z. et al. | 2013
- 878822
-
Analysis of method of 3D shape reconstruction using scanning deflectometryNovák, Jiří / Novák, Pavel / Mikš, Antonín et al. | 2013
- 878823
-
CO2laser photoacoustic spectrometry: sensitivity and drift analysisSkřínský, Jan / Zelinger, Zdeněk / Nevrlý, Václav / Hejzlar, Tomáš / Baudišová, Barbora / Bitala, Petr et al. | 2013
- 878824
-
Imaging sensor for monitoring of the piston mechanism in cylindrical valvesPantiushina, Ekaterina N. / Gorbachev, Alexey A. et al. | 2013
- 878825
-
Development of program package for investigation and modeling of carbon nanostructures in diamond like carbon films with the help of Raman scattering and infrared absorption spectra line resolvingHayrapetyan, David B. / Hovhannisyan, Levon / Mantashyan, Paytsar A. et al. | 2013
- 878826
-
Temperature sensing by modulating phase of optical fiberCheng, Guanxiao / Xu, Ping / Hong, Chunquan / Cao, Yang / Zhu, Feng / Feng, Shuyang / Lin, Ruibin et al. | 2013
- 878827
-
Real-time visualization and analysis of airflow field by use of digital holographyDi, Jianglei / Wu, Bingjing / Chen, Xin / Liu, Junjiang / Wang, Jun / Zhao, Jianlin et al. | 2013
- 878828
-
Visual and dynamic measurement of temperature fields by use of digital holographic interferometryZhao, Jianlin / Di, Jianglei / Wu, Bingjing / Wang, Jun / Wang, Qian / Jiang, Hongzhen et al. | 2013
- 878829
-
Calibration of misalignment aberrations in cylindrical surface interferometric measurementPeng, Junzheng / Ge, Dongbao / Yu, Yingjie / Chen, Mingyi et al. | 2013
- 878831
-
Non-Bayesian noise reduction in digital holography by random resampling masksBianco, Vittorio / Paturzo, Melania / Memmolo, Pasquale / Finizio, Andrea / Javidi, Bahram / Ferraro, Pietro et al. | 2013
- 878832
-
Research of autocollimating angular deformation measurement system for large-size objects controlTurgalieva, Tatiana V. / Konyakhin, Igor A. et al. | 2013
- 878833
-
Design and experiment of testing an off-axis aspheric surface by computer generated hologramLi, Shijie / Wu, Fan / Chen, Qiang / Fan, Bin / Li, Lianghong et al. | 2013
- 878834
-
Spectral monitoring of toluene and ethanol in gasoline blends using Fourier-Transform Raman spectroscopyOrtega Clavero, Valentin / Weber, Andreas / Schröder, Werner / Curticapean, Dan / Meyrueis, Patrick / Javahiraly, Nicolas et al. | 2013
- 878835
-
Reflection, transmission and color measurement system for the online quality control of float glass coating processMamedbeili, Izmir / Cakiroglu, Fahrettin / Bektas, Gokhan / Riza, Dadash / Hacizade, Fikret et al. | 2013
- 878836
-
Energetic sensitivity of optical-electronic systems based on polychromatic optical equisignal zoneMaraev, Anton A. / Timofeev, Alexandr N. et al. | 2013
- 878837
-
Automatic unit for measuring refractive index of air based on Ciddor equation and its verification using direct interferometric measurement methodHucl, V. / Čížek, M. / Hrabina, J. / Mikel, B. / Řeřucha, Š. / Buchta, Z. / Jedlička, P. / Lešundák, A. / Oulehla, J. / Mrňa, L. et al. | 2013
- 878839
-
Alignment of a large outdoor antenna surface using a laser trackerLeon-Huerta, Andrea / Lucero Alvarez, Maribel / Hernandez Rios, Emilio / Tzile Torres, Carlos / Cabrera Cuevas, Lizeth / Castro Santos, David / Hernandez Lázaro, Josefina / Gale, David M. / Wilson, Grant / Narayanan, Gopal et al. | 2013
-
Metrology for adhesive layer of temporary bonding wafers using IR interferometry [8788-3]Chang, P.-Y. / Ku, Y.-S. / Cho, C.-H. / SPIE (Society) et al. | 2013
-
Seeing through smoke and flames: a challenge for imaging capabilities, met thanks to digital holography at far infrared [8788-19]Locatelli, M. / Pugliese, E. / Paturzo, M. / Bianco, V. / Finizio, A. / Pelagotti, A. / Poggi, P. / Miccio, L. / Meucci, R. / Ferraro, P. et al. | 2013
-
Model-based assistance system for confocal measurements of rough surfaces [8788-29]Mauch, F. / Lyda, W. / Osten, W. / SPIE (Society) et al. | 2013
-
Measurement, visualization and analysis of extremely large data sets with a nanopositioning and nanomeasuring machine [8788-32]Birli, O. / Franke, K.-H. / Linss, G. / Machleidt, T. / Manske, E. / Schale, F. / Schwannecke, H.-C. / Sparrer, E. / Weiss, M. / SPIE (Society) et al. | 2013
-
Highly accurate surface maps from profilometer measurements [8788-45]Medicus, K.M. / Nelson, J.D. / Mandina, M.P. / SPIE (Society) et al. | 2013
-
Development of alignment-guidance device for grooved roll mill using parallel projection imaging technique [8788-55]Kodama, T. / Iwata, T. / Yamagami, D. / Takagi, K. / SPIE (Society) et al. | 2013
-
Metrology solutions using optical scatterometry for advanced CMOS: III-V and Germanium multi-gate field-effect transistors [8788-62]Chin, H.-C. / Liu, B. / Zhang, X. / Ling, M.-L. / Yip, C.-H. / Liu, Y. / Hu, J. / Yeo, Y.-C. / SPIE (Society) et al. | 2013
-
Comparison of Michelson and Linnik interference microscopes with respect to measurement capabilities and adjustment efforts [8788-87]Kuhnhold, P. / Xie, W. / Lehmann, P. / SPIE (Society) et al. | 2013
-
Small angle light scattering for a glass fibre diameter characterization [8788-94]Swirniak, G. / Glomb, G. / SPIE (Society) et al. | 2013
-
Design and location deviation of the computer generated holograms used for aspheric surface testing [8788-95]Feng, J. / Deng, C. / Xing, T. / SPIE (Society) et al. | 2013
-
Absolute scale-based imaging position encoder with submicron accuracy [8788-101]Anisimov, A.G. / Pantyushin, A.V. / Lashmanov, O.U. / Vasilev, A.S. / Timofeev, A.N. / Korotaev, V.V. / Gordeev, S.V. / SPIE (Society) et al. | 2013
-
Tilted objects EFI in digital holography by two different numerical approaches [8788-107]Matrecano, M. / Paturzo, M. / Ferraro, P. / SPIE (Society) et al. | 2013
-
Iterative alignment of reflector segments using a laser tracker [8788-106]Cuevas, L.C. / Alvarez, M.L. / Leon-Huerta, A. / Rios, E.H. / Lazaro, J.H. / Torres, C.T. / Santos, D.C. / Gale, D.M. / Wilson, G. / Narayanan, G. et al. | 2013
-
Iterative improvements to the surface error of a 1.7 metre aluminium reflector [8788-118]Santos, D.C. / Cuevas, L.C. / Rios, E.H. / Gale, D.M. / Smith, D.R. / SPIE (Society) et al. | 2013
-
Implementation of a fringe visibility based algorithm in coherence scanning interferometry for surface roughness measurement [8788-124]Montgomery, P.C. / Salzenstein, F. / Montaner, D. / Serio, B. / Pfeiffer, P. / SPIE (Society) et al. | 2013
-
Digital holographic microscopy for the study of nano-fibers [8788-123]Wahba, H.H. / Sjodahl, M. / Gren, P. / Olsson, E. / SPIE (Society) et al. | 2013
-
Resolution enhancement and autofocusing in digital holographic microscopy by using structured illumination [8788-8]Gao, P. / Pedrini, G. / Osten, W. / SPIE (Society) et al. | 2013
-
Experimental comparison of phase-shifting fringe projection and statistical pattern projection for active triangulation systems [8788-38]Lutzke, P. / Schaffer, M. / Kuhmstedt, P. / Kowarschik, R. / Notni, G. / SPIE (Society) et al. | 2013
-
Methods to obtain the waveform profile from slope measurements [8788-50]Moreno, A. / Espinola, M. / Martinez, J. / Campos, J. / SPIE (Society) et al. | 2013
-
The impact of polarization on metrology performance of the lateral shearing interferometer [8788-86]Yao, Z. / Xing, T. / SPIE (Society) et al. | 2013
-
Computed tomography of cylindrically symmetric object by use of digital holography [8788-128]Pan, Z. / Li, S. / Zhong, J. / SPIE (Society) et al. | 2013
-
Lensless object scanning holography for diffuse objects [8788-12]Garcia, J. / Ferreira, C. / Mico, V. / SPIE (Society) et al. | 2013
-
Digital holographic inspection for the straight pipe inner surface using multiwavelength from laser diodes [8788-18]Yokota, M. / Koyama, T. / Kawakami, T. / SPIE (Society) et al. | 2013
-
Robust evaluation of intensity curves measured by confocal microscopies [8788-28]Seewig, J. / Raid, I. / Wiehr, C. / George, B.A. / SPIE (Society) et al. | 2013
-
Miniature low-cost extrinsic Fabry-Perot interferometer for low-pressure detection [8788-36]Poeggel, S. / Tosi, D. / Leen, G. / Lewis, E. / SPIE (Society) et al. | 2013
-
Sub-nanometer in-die overlay metrology: measurement and simulation at the edge of finiteness [8788-58]Smilde, H.-J.H. / Jak, M. / Boef, A.d. / van Schijndel, M. / Bozkurt, M. / Fuchs, A. / van der Schaar, M. / Meyer, S. / Morgan, S. / Bhattacharyya, K. et al. | 2013
-
Phase information in coherent Fourier scatterometry [8788-60]Kumar, N. / El Gawhary, O. / Roy, S. / Pereira, S.F. / Urbach, H.P. / SPIE (Society) et al. | 2013
-
Optical vibration analysis of MEMS devices with pm-resolution in x, y, and z directions [8788-65]Giesen, M. / Kowarsch, R. / Ochs, W. / Winter, M. / Rembe, C. / SPIE (Society) et al. | 2013
-
CO~2 laser photoacoustic spectrometry: sensitivity and drift analysis [8788-74]Skrinsky, J. / Zelinger, Z. / Hejzlar, T. / Nevrly, V. / Baudisova, B. / Bitala, P. / SPIE (Society) et al. | 2013
-
Energetic sensitivity of optical-electronic systems based on polychromatic optical equisignal zone [8788-114]Maraev, A.A. / Timofeev, A.N. / SPIE (Society) et al. | 2013
-
Wavelength modulation-based method for interference phase detection with reduced optical complexity [8788-120]Rerucha, S. / Sarbort, M. / Buchta, Z. / Mikel, B. / Smid, R. / Cizek, M. / Jedlicka, P. / Rerucha, J. / Lazar, J. / Cip, O. et al. | 2013
-
Relation between vectorial source structure and coherence-polarization of light [8788-23]Singh, R.K. / Naik, D.N. / Itou, H. / Brundavanam, M.M. / Miyamoto, Y. / Takeda, M. / SPIE (Society) et al. | 2013
-
Applications of tilted fiber Bragg grating in liquid parameters measurement [8788-37]Jiang, B. / Zhao, J. / Rauf, A. / Qin, C. / Jiang, W. / SPIE (Society) et al. | 2013
-
Deflectometry vs. interferometry (Invited Paper) [8788-47]Hausler, G. / Faber, C. / Olesch, E. / Ettl, S. / SPIE (Society) et al. | 2013
-
Nanometrology of periodic nanopillar arrays by means of light scattering [8788-59]Paul, O. / Widulle, F. / Kleemann, B.H. / Heinrich, A. / SPIE (Society) et al. | 2013
-
Integrated digital image correlation for residual stress measurement [8788-69]Baldi, A. / Bertolino, F. / SPIE (Society) et al. | 2013
-
Optical profilometer using laser based conical triangulation for inspection of inner geometry of corroded pipes in cylindrical coordinates [8788-52]Buschinelli, P.D.V. / Melo, J.C. / Albertazzi, A. / Santos, J.M.C. / Camerini, C.S. / SPIE (Society) et al. | 2013
-
Active retroreflector with in situ beam analysis to measure the rotational orientation in conjunction with a laser tracker [8788-53]Hofherr, O. / Wachten, C. / Muller, C. / Reinecke, H. / SPIE (Society) et al. | 2013
-
The road towards accurate optical width measurements at the industrial level [8788-63]Bodermann, B. / Koning, R. / Bergmann, D. / Buhr, E. / Hassler-Grohne, W. / Flugge, J. / Bosse, H. / SPIE (Society) et al. | 2013
-
Imaging sensor for monitoring of the piston mechanism in cylindrical valves [8788-75]Pantiushina, E.N. / Gorbachev, A.A. / SPIE (Society) et al. | 2013
-
Measurement uncertainty in the profile detection on solar troughs [8788-85]Sansoni, P. / Fontani, D. / Francini, F. / Toccafondi, S. / Messeri, M. / Coraggia, S. / Mercatelli, L. / Jafrancesco, D. / Sani, E. / SPIE (Society) et al. | 2013
-
Towards superresolution imaging with optical vortex scanning microscope [8788-103]Masajada, J. / Popiolek-Masajada, A. / Augustyniak, I. / Sokolenko, B. / SPIE (Society) et al. | 2013
-
Design and experiment of testing an off-axis aspheric surface by computer generated hologram [8788-111]Li, S. / Wu, F. / Chen, Q. / Fan, B. / Li, L. / SPIE (Society) et al. | 2013
-
Turbine-blade tip clearance and tip timing measurements using an optical fiber bundle sensor [8788-125]Garcia, I. / Beloki, J. / Zubia, J. / Durana, G. / Aldabaldetreku, G. / SPIE (Society) et al. | 2013
-
Precision positioning with suppression of the influence of refractive index of air [8788-126]Hola, M. / Hrabina, J. / Oulehla, J. / Cizek, M. / Mikel, B. / Rerucha, S. / Buchta, Z. / Cip, O. / Lazar, J. / SPIE (Society) et al. | 2013
-
Lensless single-exposure super-resolved interferometric microscopy [8788-7]Granero, L. / Ferreira, C. / Garcia, J. / Mico, V. / SPIE (Society) et al. | 2013
-
Sparsity-based denoising method of wrapped-phase reconstructions in digital holography [8788-5]Memmolo, P. / Iannone, M. / Ventre, M. / Netti, P.A. / Finizio, A. / Paturzo, M. / Ferraro, P. / SPIE (Society) et al. | 2013
-
Analysis of method of 3D shape reconstruction using scanning deflectometry [8788-73]Novak, J. / Novak, P. / Miks, A. / SPIE (Society) et al. | 2013
-
Temperature sensing by modulating phase of optical fiber [8788-77]Cheng, G. / Xu, P. / Hong, C. / Cao, Y. / Zhu, F. / Feng, S. / Lin, R. / SPIE (Society) et al. | 2013
-
Optical device for the improvement of positioning accuracy in large machine tools [8788-84]Cocola, L. / Fedel, M. / Mocellin, M. / Casarin, R. / Poletto, L. / SPIE (Society) et al. | 2013
-
A compensation method of large aperture optical lens for gravity deformation [8788-91]Yang, L. / Xing, T. / Feng, J. / SPIE (Society) et al. | 2013
-
Non-Bayesian noise reduction in digital holography by random resampling masks [8788-109]Bianco, V. / Paturzo, M. / Memmolo, P. / Finizio, A. / Javidi, B. / Ferraro, P. / SPIE (Society) et al. | 2013
-
Static and (quasi)dynamic calibration of stroboscopic scanning white light interferometer [8788-127]Seppa, J. / Kassamakov, I. / Nolvi, A. / Heikkinen, V. / Paulin, T. / Lassila, A. / Hao, L. / Hoeggsrom, E. / SPIE (Society) et al. | 2013
-
Concept, realization and performance of a two-beam phase-shifting point diffraction interferometer [8788-4]Voznesenskiy, N. / Voznesenskaia, M. / Petrova, N. / Abels, A. / SPIE (Society) et al. | 2013
-
Speed-up chromatic sensors by optimized optical filters [8788-27]Taphanel, M. / Hovestreydt, B. / Beyerer, J. / SPIE (Society) et al. | 2013
-
High speed measurement of specular surfaces based on carrier fringe patterns in a line scan Michelson interferometer setup [8788-26]Knell, H. / Lehmann, P. / SPIE (Society) et al. | 2013
-
Parallelized chromatic confocal sensor systems [8788-30]Hillenbrand, M. / Grewe, A. / Bichra, M. / Kleindienst, R. / Lorenz, L. / Kirner, R. / Weiss, R. / Sinzinger, S. / SPIE (Society) et al. | 2013
-
High resolution measurements of filigree, inner geometries with endoscopic micro fringe projection [8788-42]Ohrt, C. / Kastner, M. / Reithmeier, E. / SPIE (Society) et al. | 2013
-
Non-contact profiling for high precision fast asphere topology measurement [8788-44]Petter, J. / Berger, G. / SPIE (Society) et al. | 2013
-
Lateral location error compensation algorithm for measuring aspheric surfaces by sub-aperture stitching interferometry [8788-46]Zhao, Z. / Zhao, H. / Gu, F. / Zhang, L. / SPIE (Society) et al. | 2013
-
Approach to the measurement of astronomical mirrors with new procedures [8788-48]Hofbauer, E. / Rascher, R. / Liebl, J. / Maurer, R. / Zimmermann, A. / Rosch, O. / Reitberger, J. / SPIE (Society) et al. | 2013
-
Automated control of robotic camera tacheometers for measurements of industrial large scale objects [8788-54]Heimonen, T. / Leinonen, J. / Sipola, J. / SPIE (Society) et al. | 2013
-
Laser welding control by monitoring of plasma [8788-96]Chmelickova, H. / Sebestova, H. / Havelkova, M. / Rihakova, L. / Nozka, L. / SPIE (Society) et al. | 2013
-
Development of a zero-method interferometer by means of dynamic generation of reference wave front [8788-100]Hanayama, R. / Ishii, K. / SPIE (Society) et al. | 2013
-
Alignment of a large outdoor antenna surface using a laser tracker [8788-117]Leon-Huerta, A. / Alvarez, M.L. / Rios, E.H. / Torres, C.T. / Cuevas, L.C. / Santos, D.C. / Lazaro, J.H. / Gale, D.M. / Wilson, G. / Narayanan, G. et al. | 2013
-
Tape measuring system using linear encoder and digital camera [8788-133]Eom, T.B. / Jeong, D.Y. / Kim, M.S. / Kim, J.W. / Kim, J.A. / SPIE (Society) et al. | 2013
-
Low coherence full field interference microscopy or optical coherence tomography: recent advances, limitations and future trends (Invited Paper) [8788-1]Abdulhalim, I. / SPIE (Society) et al. | 2013
-
Holographic Interferometry based on photorefractive crystal to measure 3D thermo-elastic distortion of composite structures and comparison with finite element models [8788-6]Thizy, C. / Eliot, F. / Ballhause, D. / Olympio, K.R. / Kluge, R. / Shannon, A. / Laduree, G. / Logut, D. / Georges, M.P. / SPIE (Society) et al. | 2013
-
Total compensation of chromatic errors in digital color holography using a single recording [8788-10]Leclercq, M. / Picart, P. / SPIE (Society) et al. | 2013
-
3D shape measurements of fast moving rough surfaces by two tilted interference fringe systems [8788-64]Kuschmierz, R. / Gunther, P. / Czarske, J.W. / SPIE (Society) et al. | 2013
-
Calibration of misalignment aberrations in cylindrical surface interferometric measurement [8788-80]Peng, J. / Ge, D. / Yu, Y. / Chen, M. / SPIE (Society) et al. | 2013
-
Excess fraction measurement of a transparent glass thickness in wavelength tuning interferometry [8788-2]Kim, Y. / Hibino, K. / Harada, K. / Sugita, N. / Mitsuishi, M. / SPIE (Society) et al. | 2013
-
Shape reconstruction using dual wavelength digital holography and speckle movements [8788-17]Khodadad, D. / Hallstig, E. / Sjodahl, M. / SPIE (Society) et al. | 2013
-
Scanning fringe projection for fast 3D inspection [8788-135]Honegger, M. / Kahl, M. / Trunz, S. / Rinner, S. / Ettemeyer, A. / Lambelet, P. / SPIE (Society) et al. | 2013
-
Precision aspheric optics testing with SCOTS: a deflectometry approach [8788-49]Su, P. / Khreishi, M. / Huang, R. / Su, T. / Burge, J.H. / SPIE (Society) et al. | 2013
-
Infrared differential interference contrast microscopy for overlay metrology on 3D-interconnect bonded wafers [8788-70]Ku, Y. / Shyu, D.-M. / Lin, Y.-S. / Cho, C.-H. / SPIE (Society) et al. | 2013
-
Real-time visualization and analysis of airflow field by use of digital holography [8788-78]Di, J. / Wu, B. / Chen, X. / Liu, J. / Wang, J. / Zhao, J. / SPIE (Society) et al. | 2013
-
Image quality improvement using speckle method in digital holography by means of multi-mode fiber [8788-104]Funamizu, H. / Shimoma, S. / Aizu, Y. / SPIE (Society) et al. | 2013
-
Spectral monitoring of toluene and ethanol in gasoline blends using Fourier-Transform Raman spectroscopy [8788-112]Clavero, V.O. / Weber, A. / Schroder, W. / Curticapean, D. / Meyrueis, P. / Javahiraly, N. / SPIE (Society) et al. | 2013
-
Automatic unit for measuring refractive index of air based on Ciddor equation and its verification using direct interferometric measurement method [8788-115]Hucl, V. / Cizek, M. / Hrabina, J. / Mikel, B. / Rerucha, S. / Buchta, Z. / Jedlicka, P. / Lesundak, A. / Oulehla, J. / Mrna, L. et al. | 2013
-
Hybrid and transflective system based on digital holographic microscope and low coherent interferometer for high gradient shape measurement [8788-9]Lizewski, K. / Tomczewski, S. / Kostencka, J. / Kozacki, T. / SPIE (Society) et al. | 2013
-
ESPI based on spatial fringe analysis method using only two sheets of speckle patterns [8788-21]Arai, Y. / Yokozeki, S. / SPIE (Society) et al. | 2013
-
A computational tool to highlight anomalies on shearographic images in optical flaw detection [8788-20]Fantin, A.V. / Willemann, D.P. / Viotti, M. / Albertazzi, A. / SPIE (Society) et al. | 2013
-
A polarization-based frequency shifting interferometry for inspecting transparent objects in microelectronics manufacturing [8788-24]Lee, S.H. / Kim, M.Y. / SPIE (Society) et al. | 2013
-
Fast and accurate line scanner based on white light interferometry [8788-25]Lambelet, P. / Moosburger, R. / SPIE (Society) et al. | 2013
-
A space-borne fiber-optic interrogator module based on narrow-band tunable laser diode for temperature monitoring in telecommunication satellites [8788-35]Putzer, P. / Kuhenuri, N. / Koch, A.W. / Schweyer, S. / Hurni, A. / Plattner, M. / SPIE (Society) et al. | 2013
-
Diagnostic of structures in heat and power generating industries with utilization of 3D digital image correlation [8788-68]Malesa, M. / Kujawinska, M. / Malowany, K. / Siwek, B. / SPIE (Society) et al. | 2013
-
Characterization and demonstration of a 12-channel Laser-Doppler vibrometer [8788-66]Haist, T. / Lingel, C. / Osten, W. / Bendel, K. / Giesen, M. / Gartner, M. / Rembe, C. / SPIE (Society) et al. | 2013
-
Three-axis optic-electronic autocollimation system for the inspection of large-scale objects [8788-83]Konyakhin, I.A. / Timofeev, A.N. / Konyakhin, A.I. / SPIE (Society) et al. | 2013
-
Application of line-scanning microscopy using a linear sensor in semiconductor industry: shape and thickness measurements [8788-88]Macedo, M.P. / Correia, C.M.B.A. / SPIE (Society) et al. | 2013
-
Reaching accuracies of Lambda/100 with the Three-Flat-Test [8788-92]Wittek, S. / SPIE (Society) et al. | 2013
-
Optical measurement system applied to continuous displacement monitoring of long-span suspension bridges [8788-93]Martins, L.L. / Rebordao, J.M. / Ribeiro, A.S. / SPIE (Society) et al. | 2013
-
Dual view x-ray inspection system for foreign objects detection in canned food [8788-99]Lu, Z. / Peng, N. / SPIE (Society) et al. | 2013
-
CCD camera-based analysis of thin film growth in industrial PACVD processes [8788-102]Zauner, G. / Schulte, T. / Forsich, C. / Heim, D. / SPIE (Society) et al. | 2013
-
Reflection, transmission and color measurement system for the online quality control of float glass coating process [8788-113]Mamedbeili, I. / Cakiroglu, F. / Bektas, G. / Riza, D. / Hacizade, F. / SPIE (Society) et al. | 2013
-
Design and analysis of a low-cost compensated POF displacement sensor for industrial applications [8788-122]Tosi, D. / Olivero, M. / Perrone, G. / Vallan, A. / SPIE (Society) et al. | 2013
-
Stimulated LIF studied using pulsed digital holography and modelling [8788-130]Amer, E. / Stenvall, J. / Gren, P. / Sjodahl, M. / SPIE (Society) et al. | 2013
-
Automated hardware and software complex for extended light sources verification [8788-134]Gorbunova, E.V. / Peretyagin, V.S. / Chertov, A.N. / SPIE (Society) et al. | 2013
-
A long trace profiler with large dynamical range [8788-13]Ritucci, A. / Rossi, M. / SPIE (Society) et al. | 2013
-
Robust signal evaluation for Chromatic Confocal Spectral Interferometry [8788-31]Boettcher, T. / Lyda, W. / Gronle, M. / Mauch, F. / Osten, W. / SPIE (Society) et al. | 2013
-
Influence of the structured illumination frequency content on the correspondence assignment precision in stereophotogrammetry [8788-41]Grosse, M. / Schaffer, M. / Harendt, B. / Kowarschik, R. / SPIE (Society) et al. | 2013
-
Measurement of aspheres and free-form surfaces in a non-null test interferometer: reconstruction of high-frequency errors [8788-43]Baer, G. / Schindler, J. / Siepmann, J. / Pruss, C. / Osten, W. / Schulz, M. / SPIE (Society) et al. | 2013
-
Photogrammetry based system for the measurement of cylindrical forgings axis straightness [8788-56]Zatocilova, A. / Poliscuk, R. / Palousek, D. / Brandejs, J. / SPIE (Society) et al. | 2013
-
Development of program package for investigation and modeling of carbon nanostructures in diamond like carbon films with the help of Raman scattering and infrared absorption spectra line resolving [8788-76]Hayrapetyan, D.B. / Hovhannisyan, L.T. / Mantashyan, P.A. / SPIE (Society) et al. | 2013
-
Measurement of residual stress fields in FHPP welding: a comparison between DSPI combined with hole-drilling and neutron diffraction [8788-105]Viotti, M.R. / Albertazzi, A. / Staron, P. / Pisa, M. / SPIE (Society) et al. | 2013
-
Efficient testing methodologies for microcameras in a gigapixel imaging system [8788-119]Youn, S.H. / Marks, D.L. / McLaughlin, P.O. / Brady, D.J. / Kim, J. / SPIE (Society) et al. | 2013
-
Surface normal deblurring caused by conveyor movement for fast surface inspection [8788-132]Kurihara, T. / Katsuki, Y. / Ando, S. / SPIE (Society) et al. | 2013
-
Optical characterization method for very small microlenses (sub-50 micron) for industrial mass-production applications [8788-15]Kim, M.-S. / Sunarjo, J. / Weible, K.J. / Voelkel, R. / SPIE (Society) et al. | 2013
-
Model-based, active inspection of three-dimensional objects using a multi-sensor measurement system [8788-33]Gronle, M. / Lyda, W. / Osten, W. / SPIE (Society) et al. | 2013
-
High-frequency optical fiber microphone for condition-based maintenance application [8788-34]Tosi, D. / Olivero, M. / Perrone, G. / Vallan, A. / SPIE (Society) et al. | 2013
-
High-speed 3D shape measurement using array projection [8788-40]Heist, S. / Sieler, M. / Breitbarth, A. / Kuhmstedt, P. / Notni, G. / SPIE (Society) et al. | 2013
-
Moire deflectometry under incoherent illumination: 3D profiler for specular surfaces [8788-51]Hirose, T. / Kitayama, T. / SPIE (Society) et al. | 2013
-
Revisiting parallel catadioptric goniophotometers [8788-61]Karamata, B. / Andersen, M. / SPIE (Society) et al. | 2013
-
A lateral sensor for the alignment of two formation-flying satellites [8788-71]Roose, S. / Stockman, Y. / Sodnik, Z. / SPIE (Society) et al. | 2013
-
Visual and dynamic measurement of temperature fields by use of digital holographic interferometry [8788-79]Zhao, J. / Di, J. / Wu, B. / Wang, J. / Wang, Q. / Jiang, H. / SPIE (Society) et al. | 2013
-
Optical resolution measurement system for small lens by using slanted-slit method [8788-90]Huang, K.-Y. / Chia, C.-M. / SPIE (Society) et al. | 2013
-
Design of omnidirectional camera lens system with catadioptic system [8788-98]Jo, J.H. / Lee, S. / Seo, H.J. / Lee, J.H. / Kim, J.M. / SPIE (Society) et al. | 2013
-
Research of autocollimating angular deformation measurement system for large-size objects control [8788-110]Turgalieva, T.V. / Konyakhin, I.A. / SPIE (Society) et al. | 2013
-
Camera-based curvature measurement of a large incandescent object [8788-121]Ollikkala, A.V.H. / Kananen, T.P. / Makynen, A.J. / Holappa, M. / SPIE (Society) et al. | 2013