Kelvin Probe Force Microscopy in Nanoscience and Nanotechnology (Englisch)
- Neue Suche nach: Luo, Da
- Neue Suche nach: Sun, Hao
- Neue Suche nach: Li, Yan
- Neue Suche nach: Kumar, Challa S. S. R.
- Neue Suche nach: Luo, Da
- Neue Suche nach: Sun, Hao
- Neue Suche nach: Li, Yan
In:
Surface Science Tools for Nanomaterials Characterization
;
117-158
;
2015
- Aufsatz/Kapitel (Buch) / Elektronische Ressource
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Titel:Kelvin Probe Force Microscopy in Nanoscience and Nanotechnology
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Beteiligte:Kumar, Challa S. S. R. ( Herausgeber:in ) / Luo, Da ( Autor:in ) / Sun, Hao ( Autor:in ) / Li, Yan ( Autor:in )
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Erschienen in:
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Verlag:
- Neue Suche nach: Springer Berlin Heidelberg
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Erscheinungsort:Berlin, Heidelberg
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Erscheinungsdatum:01.01.2015
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Format / Umfang:42 pages
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ISBN:
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DOI:
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Medientyp:Aufsatz/Kapitel (Buch)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis E-Book
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 1
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Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM)Herpich, Max / Friedl, Jochen / Stimming, Ulrich et al. | 2015
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Recovering Time-Resolved Imaging Forces in Solution by Scanning Probe Acceleration Microscopy: Theory and ApplicationChaibva, Maxmore / Shamitko-Klingensmith, Nicole / Legleiter, Justin et al. | 2015
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Scanning Probe Microscopy for NanolithographySamantaray, C. B. et al. | 2015
- 117
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Kelvin Probe Force Microscopy in Nanoscience and NanotechnologyLuo, Da / Sun, Hao / Li, Yan et al. | 2015
- 159
-
Field Ion Microscopy for the Characterization of Scanning ProbesPaul, William / Grütter, Peter et al. | 2015
- 199
-
Scanning Conductive Torsion Mode MicroscopySun, Ling / Bonaccurso, Elmar et al. | 2015
- 227
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Field Ion and Field Desorption Microscopy: Principles and ApplicationsSuchorski, Yuri et al. | 2015
- 273
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Noncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material SurfacesBaykara, Mehmet Z. et al. | 2015
- 317
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Applications of Synchrotron-Based X-Ray Photoelectron Spectroscopy in the Characterization of NanomaterialsDoh, W. H. / Papaefthimiou, V. / Zafeiratos, S. et al. | 2015
- 367
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Exploration into the Valence Band Structures of Organic Semiconductors by Angle-Resolved Photoelectron SpectroscopyNakayama, Yasuo / Ishii, Hisao et al. | 2015
- 405
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Band Bending at Metal-Semiconductor Interfaces, Ferroelectric Surfaces and Metal-Ferroelectric Interfaces Investigated by Photoelectron SpectroscopyApostol, Nicoleta Georgiana / Teodorescu, Cristian-Mihail et al. | 2015
- 463
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Higher Resolution Scanning Probe Methods for Magnetic ImagingPiramanayagam, S. N. / Varghese, Binni et al. | 2015
- 489
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Imaging and Characterization of Magnetic Micro- and Nanostructures Using Force MicroscopyBlock, Stephan et al. | 2015
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Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Three-Dimensional Magnetic NanostructuresFernández-Pacheco, Amalio / Cowburn, Russell P. / Serrano-Ramón, Luis E. / Ibarra, M. Ricardo / De Teresa, José M. et al. | 2015
- 561
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High Resolution STM ImagingChaika, Alexander N. et al. | 2015
- 621
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Numerical and Finite Element Simulations of Nanotips for FIM/FEMRezeq, Moh’d / Ali, Ahmed E. / Homouz, Dirar et al. | 2015