Manipulation and contacting of individual carbon nanotubes inside a FIB workstation (Englisch)
- Neue Suche nach: Menze, S. B.
- Neue Suche nach: Vinzelberg, H.
- Neue Suche nach: Gemming, T.
- Neue Suche nach: Luysberg, Martina
- Neue Suche nach: Tillmann, Karsten
- Neue Suche nach: Weirich, Thomas
- Neue Suche nach: Menze, S. B.
- Neue Suche nach: Vinzelberg, H.
- Neue Suche nach: Gemming, T.
In:
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
: Volume 1: Instrumentation and Methods
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Kapitel: 340
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679-680
;
2008
- Aufsatz/Kapitel (Buch) / Elektronische Ressource
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Titel:Manipulation and contacting of individual carbon nanotubes inside a FIB workstation
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Beteiligte:Luysberg, Martina ( Herausgeber:in ) / Tillmann, Karsten ( Herausgeber:in ) / Weirich, Thomas ( Herausgeber:in ) / Menze, S. B. ( Autor:in ) / Vinzelberg, H. ( Autor:in ) / Gemming, T. ( Autor:in )
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Erschienen in:EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany : Volume 1: Instrumentation and Methods ; Kapitel: 340 ; 679-680
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Verlag:
- Neue Suche nach: Springer Berlin Heidelberg
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Erscheinungsort:Berlin, Heidelberg
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Erscheinungsdatum:01.01.2008
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Format / Umfang:2 pages
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ISBN:
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DOI:
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Medientyp:Aufsatz/Kapitel (Buch)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis E-Book
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 1
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Aberration corrected STEM and EELS: Atomic scale chemical mappingBleloch, A. L. / Gass, M. / Jiang, L. / Mendis, B. / Sader, K. / Wang, P. et al. | 2008
- 2
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An update on the TEAM project — first results from the TEAM 0.5 microscope, and its future developmentDahmen, U. / Erni, R. / Kisielowki, C. / Radmilovic, V. / Ramasse, Q. / Schmid, A. / Duden, T. / Watanabe, M. / Minor, A. / Denes, P. et al. | 2008
- 3
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Synchrotron based X-ray Microscopy: state of the art and applicationsSusini, J. et al. | 2008
- 4
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High-resolution spectro-microscopy with low-voltage electrons and double aberration correctionSchmidt, Thomas / Marchetto, Helder / Fink, Rainer / Umbach, Eberhard et al. | 2008
- 5
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Developments of aberration correction systems for current and future requirementsHaider, M. / Müller, H. / Uhlemann, S. / Hartel, P. / Zach, J. et al. | 2008
- 6
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STEM Aberration Correction: an Integrated ApproachKrivanek, Ondrej / Dellby, Niklas / Murfitt, Matt / Own, Christopher / Szilagyi, Zoltan et al. | 2008
- 7
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Applications of aberration-corrected TEM-STEM and high-resolution EELS for the study of functional materialsBotton, G. A. / Maunders, C. / Gunawan, L. / Cui, K. / Chang, L. Y. / Lazar, S. et al. | 2008
- 8
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Aberration corrected TEM and STEM for dynamic in situ experimentsGai, Pratibha L. / Boyes, Edward D. et al. | 2008
- 9
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HREM study of the SrTiO3 Σ3 (112) grain boundaryDudeck, K. J. / Benedek, N. / Cockayne, D. J. H. et al. | 2008
- 10
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A Method to Measure Source Size in Aberration Corrected Electron MicroscopesDwyer, C. / Etheridge, J. / Erni, R. et al. | 2008
- 11
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Determining resolution in the transmission electron microscope: object-defined resolution below 0.5ÅFreitag, B. / Kisielowski, C. et al. | 2008
- 12
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Direct measurement of aberrations by convergent-beam electron holography (CHEF)Gatel, C. / Houdellier, F. / Hÿtch, M. J. et al. | 2008
- 13
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Atomic Structure of BiFeO3-BiCrO3 film on (111) SrTiO3 Grown by Dual Cross Beam Pulsed Laser DepositionGunawan, L. / Nechache, R. / Harnagea, C. / Pignolet, A. / Botton, G. A. et al. | 2008
- 14
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Demonstration of CC/CS-correction in HRTEMHartel, P. / Müller, H. / Uhlemann, S. / Zach, J. / Löbau, U. / Höschen, R. / Haider, M. et al. | 2008
- 15
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New electron diffraction technique using Cs-corrected annular LACDIF: comparison with electron precessionHoudellier, Florent / Bals, Sara et al. | 2008
- 16
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The newly installed aberration corrected dedicated STEM (Hitachi HD2700C) at Brookhaven National LaboratoryInada, H. / Zhu, Y. / Wall, J. / Volkov, V. / Nakamura, K. / Konno, M. / Kaji, K. / Jarausch, K. / Twesten, R. D. et al. | 2008
- 17
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Uranium single atom imaging and EELS mapping using aberration corrected STEM and LN2 cold stageInada, H. / Wall, J. / Zhu, Y. / Volkov, V. / Nakamura, K. / Konno, M. / Kaji, K. / Jarausch, K. et al. | 2008
- 18
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Sub-Ångstrøm Low-Voltage Electron Microscopy — future reality for deciphering the structure of beam-sensitive nanoobjects?Kaiser, U. / Chuvilin, A. / Schröder, R. R. / Haider, M. / Rose, H. et al. | 2008
- 19
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Detecting and resolving individual adatoms, vacancies, and their dynamics on graphene membranesMeyer, J. C. / Kisielowski, C. / Erni, R. / Zettl, A. et al. | 2008
- 20
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Scanning confocal electron microscopy in a double aberration corrected transmission electron microscopeNellist, P. D. / Cosgriff, E. C. / Behan, G. / Kirkland, A. I. / D’Alfonso, A. J. / Findlay, S. D. / Allen, L. J. et al. | 2008
- 21
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Design of apochromatic TEM composed of usual round lensesNomura, S. et al. | 2008
- 22
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Back-Scattered Electron microscopy in Aberration corrected Electron microscopeOkunishi, E. / Kondo, Y. / Sawada, H. / Endo, N. / Yasuhara, A. / Endo, H. / Terao, M. / Shinpo, T. et al. | 2008
- 23
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Structure determination of H-encapsulating clathrate compounds in aberration-corrected STEMRamasse, Q. M. / Okamoto, N. L. / Morgan, D. / Neiner, D. / Condron, C. L. / Wang, J. / Yu, P. / Browning, N. D. / Kauzlarich, S. et al. | 2008
- 24
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Performance of R005 Microscope and Aberration Correction SystemSawada, H. / Hosokawa, F. / Kaneyama, T. / Tomita, T. / Kondo, Y. / Tanaka, T. / Oshima, Y. / Tanishiro, Y. / Yamamoto, N. / Takayanagi, K. et al. | 2008
- 25
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Optimum operation of Schottky electron sources: brightness, energy spread and stabilityKruit, P. / Bronsgeest, M. S. / Schwind, G. A. et al. | 2008
- 26
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The MANDOLINE filter and its performanceEssers, E. / Mittmann, D. / Mandler, T. / Benner, G. et al. | 2008
- 27
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Using a monochromator to improve the resolution in focal-series reconstructed TEM down to 0.5ÅTiemeijer, P. C. / Bischoff, M. / Freitag, B. / Kisielowski, C. et al. | 2008
- 28
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First performance measurements and application results of a new high brightness Schottky field emitter for HR-S/TEM at 80-300kV acceleration voltageFreitag, B. / Knippels, G / Kujawa, S. / Tiemeijer, P. C. / Van der Stam, M. / Hubert, D. / Kisielowski, C. / Denes, P. / Minor, A. / Dahmen, U. et al. | 2008
- 29
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Image Information transfer through a post-column energy filter detected by a lens-coupled CCD cameraLuecken, U. / Tiemeijer, P. / Barfels, M. / Mooney, P. / Bailey, B. / Agard, D. et al. | 2008
- 30
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Third-rank computation of electron and ion optical systems with several and rotated Wien filtersMarianowski, Karin / Plies, Erich et al. | 2008
- 31
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Wavelength dispersive soft X-ray emission spectroscopy attached to TEM using multi-capirary X-ray lensMuto, S. / Tatsumi, K. / Takahashi, H. et al. | 2008
- 32
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Miniature electrostatic-magnetostatic column for electronsRochow, C. / Ohnweiler, T. / Plies, E. et al. | 2008
- 33
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Comparison of monochromated electron energy-loss with X-ray absorption near-edge spectra: ELNES vs. XANESWalther, T. / Stegmann, H. et al. | 2008
- 34
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A hybrid electron energy loss spectrometer with simultaneous serial and parallel detectionYuan, Jun / Wang, Zhiway / Hu, Shu / Xie, Ling et al. | 2008
- 35
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In-focus phase contrast: Present state and future developmentsSchröder, R. R. / Barton, B. / Schultheiß, K. / Gamm, B. / Gerthsen, D. et al. | 2008
- 36
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The Detective Quantum Efficiency of Electron Area DetectorsHenderson, R. / McMullan, G. / Chen, S. / Faruqi, A. R. et al. | 2008
- 37
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Experimental observation of the improvement in MTF from backthinning a CMOS direct electron detectorMcMullan, G. / Faruqi, A. R. / Henderson, R. / Guerrini, N. / Turchetta, R. / Jacobs, A. / van Hoften, G. et al. | 2008
- 38
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High speed simultaneous X-ray and electron imaging and spectroscopy at synchrotrons and TEMsStrüder, Lothar et al. | 2008
- 39
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The image intensity in Zernike mode with electronsBeleggia, M. et al. | 2008
- 40
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Application of a Hilbert phase plate in transmission electron microscopy of materials science samplesDries, M. / Schultheiß, K. / Gamm, B. / Störmer, H. / Gerthsen, D. / Barton, B. / Schröder, R. R. et al. | 2008
- 41
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Optimal Imaging Parameters in Cs-Corrected Transmission Electron Microscopy with a Physical Phase PlateGamm, B. / Schultheiss, K. / Gerthsen, D. / Schröder, R. R. et al. | 2008
- 42
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Electron optical design of the Phase Aberration Corrected Electron MicroscopeMatijevic, M. / Lengweiler, S. / Preikszas, D. / Müller, H. / Schröder, R. R. / Benner, G. et al. | 2008
- 43
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Direct electron detectors for TEMMoldovan, G. / Li, X. / Wilshaw, P. / Kirkland, A. I. et al. | 2008
- 44
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A Newly Developed 64 MegaPixel camera for Transmission Electron MicroscopyTietz, H. R. et al. | 2008
- 45
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Characterization of a fiber-optically coupled 8k CCD/CMOS deviceTietz, D. / Tietz, H. / Nickell, S. / Baumeister, W. / Plitzko, J. M. et al. | 2008
- 46
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Direct Single-Electron Imaging using a pnCCD DetectorZiegler, Alexander / Hartmann, Robert / Andritschke, Robert / Schopper, Florian / Strüder, Lothar / Soltau, Heike / Plitzko, Jürgen M. et al. | 2008
- 47
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Quantitative TEM and STEM SimulationsKoch, C. T. et al. | 2008
- 48
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Quantitative determination of the chemical composition of an alloy by High Angle Annular Dark Field imagingGrillo, V. / Glas, F. / Carlino, E. et al. | 2008
- 49
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The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy dataVan Aert, S. / Bals, S. / Chang, L. Y. / den Dekker, A. J. / Kirkland, A. I. / Van Dyck, D. / Van Tendeloo, G. et al. | 2008
- 50
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First time quantification of the HRTEM information-limit reveals insufficiency of the Young’s-fringe testBarthel, J. / Thust, A. et al. | 2008
- 51
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Quantitative Investigations of the Depth of Field in a Corrected High Resolution Transmission Electron MicroscopeBiskupek, J. / Chuvilin, A. / Jinschek, J. R. / Kaiser, U. et al. | 2008
- 52
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Quantitative characterisation of surfaces on bi-metallic Pt nanoparticles using combined exit wave restoration and aberration-corrected TEMChang, L. Y. / Maunders, C. / Baranova, E. A. / Bock, C. / Botton, G. et al. | 2008
- 53
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An HAADF investigation of AlAs-GaAs interfaces using SuperSTEMCraven, A. J. / Robb, P. / Finnie, M. et al. | 2008
- 54
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Spatial Coherence and the Quantitative Interpretation of Atomic Resolution ImagesDwyer, C. / Etheridge, J. et al. | 2008
- 55
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Analysis of HRTEM diffractograms from amorphous materials: a simple and minor (but not explained so far?) question revisitedEpicier, T. et al. | 2008
- 56
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HAADF-STEM image simulation of large scale nanostructuresGalindo, P. / Pizarro, J. / Rosenauer, A. / Yáñez, A. / Guerrero, E. / Molina, S. I. et al. | 2008
- 57
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Aberration-corrected HRTEM study of incommensurate misfit layer compound interfacesGarbrecht, M. / Spiecker, E. / Jäger, W. / Tillmann, K. et al. | 2008
- 58
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Influence of atomic displacements due to elastic strain in HAADF-STEM simulated imagesGuerrero, E. / Yáñez, A. / Galindo, P. / Pizarro, J. / Molina, S. I. et al. | 2008
- 59
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Effects of electron channeling in HAADF intensityHaruta, M. / Komatsu, H. / Kurata, H. / Azuma, M. / Shimakawa, Y. / Isoda, S. et al. | 2008
- 60
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Analysis of the mechanism of N incorporation in N-doped GaAs quantum wellsHerrera, M. / Ramasse, Q. M. / Browning, N. D. / Pizarro, J. / Galindo, P. / Gonzalez, D. / Garcia, R. / Du, M. W. / Zhang, S. B. / Hopkinson, M. et al. | 2008
- 61
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Coherence of high-angle scattered phonon loss electrons and their relevance to TEM and STEM ADF Stobbs FactorsHerring, R. A. et al. | 2008
- 62
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Strain measurements in electronic devices by aberration-corrected HRTEM and dark-field holographyHüe, F. / Houdellier, F. / Snoeck, E. / Destefanis, V. / Hartmann, J. M. / Bender, H. / Claverie, A. / Hÿtch, M. J. et al. | 2008
- 63
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PPA: An Improved Implementation of Peak Pairs procedure as a DM plug-in for Strain MappingIshizuka, K. / Galindo, P. / Pizarro, J. / Molina, S. I. et al. | 2008
- 64
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Domain structure in Delithiated LiFePO4, a cathode material for Li ion Battery ApplicationsKinyanjui, M. / Chuvilin, A. / Kaiser, U. / Axmann, P. / Wohlfahrt-Mehrens, M. et al. | 2008
- 65
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New Approach to Quantitative ADF STEMLeBeau, J. M. / Findlay, S. D. / Allen, L. J. / Stemmer, S. et al. | 2008
- 66
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Reconstruction of the projected crystal potential in high-resolution transmission electron microscopyLentzen, M. / Urban, K. et al. | 2008
- 67
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Three-dimensional atomic-scale structure of size-selected nanoclusters on surfacesLi, Z. Y. / Young, N. P. / Di Vece, M. / Palomba, S. / Palmer, R. E. / Bleloch, A. L. / Curley, B. C. / Johnston, R. L. / Jiang, J. / Yuan, J. et al. | 2008
- 68
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Direct retrieval of a complex wave from its diffraction patternMartin, A. V. / Allen, L. J. et al. | 2008
- 69
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HRTEM evaluation of iron in acid treated ground vermiculite from Santa Olalla (Huelva, Spain)Murafa, N. / Maqueda, C. / Perez-Rodriguez, J. L. / Šubrt, J. et al. | 2008
- 70
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Bloch wave analysis of depth dependent strain effects in high resolution electron microscopyNellist, P. D. / Cosgriff, E. C. / Hirsch, P. B. / Cockayne, D. J. H. et al. | 2008
- 71
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Quantitative local strain analysis of Si/SiGe heterostructures using HRTEMÖzdöl, V. Burak / Phillipp, F. / Kasper, E. / van Aken, P. A. et al. | 2008
- 72
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Displacement field analysis around hydrogen implantation induced platelets (HIPs) in semi-conductorsPailloux, F. / David, M.-L. / Pizzagalli, L. / Barbot, J.-F. et al. | 2008
- 73
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Thickness effects in Tilted Sample Annular Dark Field Scanning Transmission Electron MicroscopyParisini, A. / Morandi, V. / Mezzotero, S. A. et al. | 2008
- 74
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A novel emission potential multislice method to calculate intensity contributions for thermal diffuse scattering in plane wave illumination TEMRosenauer, A. / Schowalter, M. / Titantah, J. T. / Lamoen, D. et al. | 2008
- 75
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Three-dimensional HREM Structure RetrievalSaghi, Z. / Xu, X. / Möbus, G. et al. | 2008
- 76
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Description of electron microscope image details based on structure relaxations with enhanced interaction potentialsScheerschmidt, K. et al. | 2008
- 77
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Computation and parametrization of Debye-Waller temperature factors for sphalerite type II-VI, III-V and group IV semiconductorsSchowalter, M. / Rosenauer, A. / Titantah, J. T. / Lamoen, D. et al. | 2008
- 78
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Structural Investigation of Amorphous/Crystalline Interfaces by Iterative Digital Image Series MatchingThiel, K. / Borgardt, N. I. / Niermann, T. / Seibt, M. et al. | 2008
- 79
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Novel carbon nanosheets as support foils for ultrahigh resolution TEM studies of nanoobjectsSologubenko, A. S. / Beyer, A. / Nottbohm, C. / Mayer, J. / Gölzhäuser, A. et al. | 2008
- 80
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Quantitative HRTEM studies of reconstructed exit-plane waves retrieved from CS-corrected electron microscopesSvete, M. / Mader, W. et al. | 2008
- 81
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Geometrical phase analysis of the 1:1 cation ordered domains in complex perovskite ferroelectricsTai, C. W. / Lereah, Y. et al. | 2008
- 82
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The Stobbs factor in HRTEM: Hunt for a phantom?Thust, A. et al. | 2008
- 83
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Measuring coherence in an electron beam for imagingWalther, T. / Atkinson, K. / Sweeney, F. / Rodenburg, J. M. et al. | 2008
- 84
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Argand plot: a sensitive fingerprint for electron channellingWang, A. / Van Aert, S. / Van Dyck, D. et al. | 2008
- 85
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Atomic-resolution studies of In2O3-ZnO compounds on aberration-corrected electron microscopesYu, Wentao / Houben, Lothar / Tillmann, Karsten / Mader, Werner et al. | 2008
- 86
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Advances in automated diffraction tomographyKolb, U. / Gorelik, T. / Mugnaioli, E. / Matveeva, G. / Otten, M. et al. | 2008
- 87
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Identification/ fingerprinting of nanocrystals by precession electron diffractionNicolopoulos, S. / Moeck, P. / Maniette, Y. / Oleynikov, P. et al. | 2008
- 88
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On the Origin and Asymmetry of High Order Laue Zone Lines Splitting in Convergent Beam Electron DiffractionBéché, A. / Clément, L. / Rouvière, J. L. et al. | 2008
- 89
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Precession electron diffraction: application to organic crystals and hybrid inorganic-organic materialsBithell, E. G. / Eddleston, M. D. / Merrill, C. A. / Jones, W. / Midgley, P. A. et al. | 2008
- 90
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Structural studies of amorphous materials using RDF, RMC and DFT refinementBorisensko, K. / Chen, Y. / Li, G. / Cockayne, D. J. H. / Song, S. A. et al. | 2008
- 91
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A Nanoprobe Electron Diffraction Study of Surface Phases in LiCoO2Cosandey, F. / Al-Sharab, J. F. / Pereira, N. / Badway, F. / Amatucci, G. G. et al. | 2008
- 92
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Structural features of RF magnetron sputter deposited Al-Fe and Al-Cu thin filmsLallouche, S. / Debili, M. Y. et al. | 2008
- 93
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Structural Investigation of a Layered Carbon Nitride Polymer by Electron DiffractionDöblinger, M. / Lotsch, B. V. / Seyfarth, L. / Senker, J. / Schnick, W. et al. | 2008
- 94
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Measuring the particle density of a nanocrystal deposit using DF images and a reciprocal space analysisDonnadieu, P. et al. | 2008
- 95
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Towards a quantitative understanding of precession electron diffractionEggeman, A. S. / White, T. A. / Midgley, P. A. et al. | 2008
- 96
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Electron crystallography by quantitative CHEFHoudellier, F. / Hÿtch, M. J. et al. | 2008
- 97
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Precession Electron Diffraction for the characterization of twinning in pseudo-symmetrical crystals: case of coesiteJacob, D. / Cordier, P. / Morniroli, J. P. / Schertl, H. P. et al. | 2008
- 98
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Electron precession characterization of pseudo-merohedral twins in the LaGaO3 perovskiteJi, G. / Morniroli, J. P. / Auchterlonie, G. J. / Jacob, D. et al. | 2008
- 99
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Kikuchi electron double diffractionKarakhanyan, R. K. / Karakhanyan, K. R. et al. | 2008
- 100
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The structure of the complex oxide PbMnO2.75 solved by precession electron diffractionKlein, H. et al. | 2008
- 101
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Software Precession Electron DiffractionKoch, C. T. / Bellina, P. / van Aken, P. A. et al. | 2008
- 102
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A new method for electron diffraction based analysis of phase fractions and texture in thin films of metallic nano-crystalsLábár, J. L. / Barna, P. B. / Geszti, O. / Grasin, R. / Lestyán, G. / Misják, F. / Radnóczi, G. / Sáfrán, G. / Székely, L. et al. | 2008
- 103
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Local structures of metallic glasses studied by experimental RDF and model refinementLi, G. / Borisenko, K. B. / Chen, Y. / Ma, E. / Cockayne, D. J. H. et al. | 2008
- 104
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Three groups of hexagonal phases and their relation to the i-phase in Zn-Mg-RE alloyLi, M. R. / Hovmöller, S. / Zou, X. D. et al. | 2008
- 105
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Diffraction analysis of incommensurate modulation in “chain-ladder” composite crystal (Sr/Ca)14Cu24O41Milat, O. / Salamon, K. / Tomić, S. / Vuletić, T. / Ivek, T. et al. | 2008
- 106
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Contribution of electron precession to the study of crystals displaying small symmetry departuresMorniroli, J. P. / Ji, G. / Jacob, D. / Auchterlonie, G. J. et al. | 2008
- 107
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The symmetry of microdiffraction electron precession patternsMorniroli, J. P. / Stadelmann, P. et al. | 2008
- 108
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Measurement of GaAs structure factors from the diffraction of parallel and convergent electron nanoprobesMüller, Knut / Schowalter, Marco / Rosenauer, Andreas / Lamoen, Dirk / Titantah, John / Jansen, Jacob / Tsuda, Kenji et al. | 2008
- 109
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Differential Electron DiffractionNakashima, P. N. H. et al. | 2008
- 110
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Atomic Structure Determination by “Observing” Structural Phase in 3-Beam CBED PatternsNakashima, P. N. H. / Moodie, A. F. / Etheridge, J. et al. | 2008
- 111
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Automatic space group determination using precession electron diffraction patternsOleynikov, P. / Hovmöller, S. / Zou, X. D. et al. | 2008
- 112
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Compositional dependence of the (200) electron diffraction in dilute III–V semiconductor solid solutionsRubel, O. / Nemeth, I. / Stolz, W. / Volz, K. et al. | 2008
- 113
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Investigation of the local crystal lattice parameters in SiGe nanostructures by convergent-beam electron diffraction analysisRuh, E. / Mueller, E. / Mussler, G. / Gruetzmacher, D. et al. | 2008
- 114
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Computer simulation of electron nanodiffraction from polycrystalline materialsSugio, K. / Huang, X. et al. | 2008
- 115
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An analytical approach of the HOLZ lines splitting on relaxed samplesThibault, J. / Alfonso, C. / Alexandre, L. / Jurczak, G. / Leroux, C. / Saikaly, W. / Charaï, A. et al. | 2008
- 116
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ELDISCA C# — a new version of the program for identifying electron diffraction patternsThomas, J. / Gemming, T. et al. | 2008
- 117
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Mixing Real and Reciprocal SpaceTwesten, R. D. / Thomas, P. J. / Inada, H. / Zhu, Y. et al. | 2008
- 118
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Structure solution of intermediate tin oxide, SnO2−x, by electron precessionWhite, T. A. / Moreno, S. / Midgley, P. A. et al. | 2008
- 119
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“Phase-scrambling” multislice simulations of precession electron diffractionWhite, T. A. / Eggeman, A. S. / Midgley, P. A. et al. | 2008
- 120
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High-Resolution Electron Holography on FerroelectricsLinck, M. / Lichte, H. / Rother, A. / Röder, F. / Honda, K. et al. | 2008
- 121
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Imaging parameters for optimized noise properties in high-resolution off-axis holograms in a Cs-corrected TEMLinck, M. et al. | 2008
- 122
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Partial coherence in inelastic holographyVerbeeck, J. / Bertoni, G. / Van Dyck, D. / Lichte, H. / Schattschneider, P. et al. | 2008
- 123
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FIB prepared and Tripod polished prepared p-n junction specimens examined by off-axis electron holographyAilliot, C. / Barnes, J. P. / Bertin, F. / Cooper, D. / Hartmann, J. M. / Rivallin, P. et al. | 2008
- 124
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Modelling kink vortices in high-Tc superconductorsBeleggia, M. / Pozzi, G. / Tonomura, A. et al. | 2008
- 125
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Off-axis electron holography of FIB-prepared semiconductor specimens with mV sensitivityCooper, D. / Truche, R. / Rivallin, P. / Hartmann, J. / Laugier, F. / Bertin, F. / Chabli, A. et al. | 2008
- 126
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Off-axis electron holography and the FIB, a systematic study of the artefacts observed in semiconductor specimensCooper, D. / Ailliot, C. / Truche, R. / Hartmann, J. / Barnes, J. / Bertin, F. et al. | 2008
- 127
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Analytical TEM and electron holography of magnetic field distribution in nanocrystalline Co layers deposited on CuDubiel, B. / Wolf, D. / Stepniowska, E. / Czyrska-Filemonowicz, A. et al. | 2008
- 128
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Electron Holography with Cs-corrected Tecnai F20 — elimination of the incoherent damping introduced by the biprism in conventional electron microscopesGeiger, D. / Rother, A. / Linck, M. / Lichte, H. / Lehmann, M. / Haider, M. / Freitag, B. et al. | 2008
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Can the discontinuity in the polarity of the oxide layers at the interface SrTiO3-LaAlO3 be resolved by using Electron Holography with Cs-corrected TEM?Geiger, D. / Thiel, S. / Mannhart, J. / Lichte, H. et al. | 2008
- 130
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Energy-filtered DBI/HHerring, R. A. et al. | 2008
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Strain determination by dark-field electron holographyHoudellier, F. / Hÿtch, M. J. / Hüe, F. / Snoeck, E. et al. | 2008
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Nonlinear Electron Inline HolographyKoch, C. T. / Rahmati, B. / van Aken, P. A. et al. | 2008
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Electron Holography: Performance and performance limitsLichte, Hannes et al. | 2008
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Reconstruction methods for in-line electron holography of nanoparticlesLivadaru, L. / Malac, M. / Wolkow, R. A. et al. | 2008
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Electron holography of soot nanoparticlesPawlyta, M. / Tai, C. W. / Rouzaud, J. -N. / Lereah, Y. et al. | 2008
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Holographic tomography of electrostatic potentials in semiconductor devicesRobb, P. D. / Twitchett-Harrison, A. C. et al. | 2008
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Electron Holography on the charge modulated structure In2O3(ZnO)m in comparison with DFT-calculationsRöder, Falk / Rother, Axel / Mader, Werner / Bredow, Thomas / Lichte, Hannes et al. | 2008
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Correction of the object wave using iteratively reconstructed local object tilt and thicknessScheerschmidt, K. et al. | 2008
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Extended field of view for medium resolution electron holography at Philips CM 200 MicroscopeSickmann, J. / Formánek, P. / Linck, M. / Lichte, H. et al. | 2008
- 140
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Electron holography of biological and organic objectsSimon, P. et al. | 2008
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Magnetic configurations of isolated and assemblies of iron 30 nm nanocubes studied by electron holographySnoeck, E. / Gatel, C. / Lacroix, L. M. / Blon, T. / Carrey, J. / Respaud, M. / Lachaize, S. / Chaudret, B. et al. | 2008
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Electron holography study of ferroelectric solid solutionsTai, C. W. / Lereah, Y. et al. | 2008
- 143
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Digital holographic interference microscopy of phase microscopic objects investigationTishko, T. V. / Tishko, D. N. / Titar, V. P. et al. | 2008
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Reconstruction of 3D (Ge,Si) islands by 2D phase mappingZheng, C. L. / Kirmse, H. / Häusler, I. / Scheerschmidt, K. / Neumann, W. et al. | 2008
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Quantitative electron tomography of biological structures using elastic and inelastic scatteringLeapman, R. D. / Aronova, M. A. / Sousa, A. A. / Zhang, G. / Hohmann-Marriott, M. F. et al. | 2008
- 146
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Discrete tomography in materials science: less is more?Bals, S. / Batenburg, K. J. / Van Tendeloo, G. et al. | 2008
- 147
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Towards atomic-scale bright-field electron tomography for the study of fullerene-like nanostructuresBar Sadan, M. / Houben, L. / Wolf, S. G. / Enyashin, A. / Seifert, G. / Tenne, R. / Urban, K. et al. | 2008
- 148
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DART explained: how to carry out a discrete tomography reconstructionBatenburg, K. J. / Bals, S. / Sijbers, J. / Van Tendeloo, G. et al. | 2008
- 149
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Optical depth sectioning of metallic nanoparticles in the aberration-corrected scanning transmission electron microscopeBehan, G. / Kirkland, A. I. / Nellist, P. D. et al. | 2008
- 150
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3D-Geometrical and chemical quantification of Au@SiOx nano-composites in HAADF-STEM imaging modeBenlekbir, S. / Epicier, T. / Martini, M. / Perriat, P. et al. | 2008
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Electron tomography of mesostructured cellular foam silicaBiermans, E. / Bals, S. / Beyers, E. / Wolf, D. / Verbeeck, J. / Cool, P. / Van Tendeloo, G. et al. | 2008
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A Study of Stacked Si Nanowire Devices by Electron TomographyCherns, P. D. / Dupré, C. / Cooper, D. / Aussenac, F. / Chabli, A. / Ernst, T. et al. | 2008
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Simulation of the electron radiation damage in an amorphous Ge sampleCroitoru, M. D. / Van Dyck, D. / Le Roux, S. / Jund, P. et al. | 2008
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Observation of Three-dimensional Elemental Distribution by using EF-TEM TomographyEndo, N. / Hamamoto, C. / Nishioka, H. / Oikawa, T. et al. | 2008
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HAADF-TEM Tomography of the precipitation state in an Al-Zn-Mg alloyEpicier, T. / Benlekbir, S. / Danoix, F. et al. | 2008
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STEM electron tomography of gold nanostructuresHernandez, J. C. / Moreno, M. S. / Coronado, E. A. / Midgley, P. A. et al. | 2008
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Three-dimensional imaging of semiconductor nanostructures by compositional-sensitive diffraction contrast electron tomography studiesHernandez, J. C. / Sanchez, A. M. / Beanland, R. / Midgley, P. A. et al. | 2008
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A full tilt range goniometer inside a TEM goniometerXu, X. J. / Lockwood, A. / Gay, R. / Wang, J. J. / Peng, Y. / Inkson, B. J. / Möbus, G. et al. | 2008
- 159
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Four-dimensional STEM-EELS TomographyJarausch, K. / Leonard, D. / Twesten, R. / Thomas, P. et al. | 2008
- 160
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Embedment-free section electron microscopy (EM): a highly potential advantage in application to EM tomographyKondo, Hisatake / Oikawa, Tetsuo et al. | 2008
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Quantification and Segmentation of Electron Tomography Data- Exemplified at ErSi2 Nanocrystals in SiCLeschner, J. / Biskupek, J. / Chuvilin, A. / Kaiser, U. et al. | 2008
- 162
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3-D TEM observation of xenon nano-precipitates in aluminium crystalsSong, M. / Matsumoto, H. / Shimojo, M. / Furuya, K. et al. | 2008
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Dark-field TEM tomography of ordered domain morphology in a Ni4Mo alloyKimura, K. / Matsuyama, K. / Hata, S. / Matsumura, S. et al. | 2008
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Optimum optical condition of Tomography for thick samplesMotoki, S. / Hamamoto, C. / Nishioka, H. / Okura, Y. / Kondo, Y. / Jinnai, H. et al. | 2008
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3-dimensional nanoparticle analysis using electron tomographyOikawa, T. / Alloyeau, D. / Ricolleau, C. / Langlois, C. / Le Bouar, Y. / Loiseau, A. et al. | 2008
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Electron Tomography of ZnO Nanocones with Secondary Signals in TEMOrtalan, V. / Li, Y. / Lavernia, E. J. / Browning, N. D. et al. | 2008
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Quantification of Nanoparticle TomogramsSaghi, Z. / Xu, X. / Möbus, G. et al. | 2008
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Tomographic imaging ultra-thick specimens with nanometer resolutionSourty, E. / Freitag, B. / Wall, D. / Tang, D. / Lu, K. / Loos, J. et al. | 2008
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Three-dimensional imaging at the mesoscopic scale using STEM-in-SEMJornsanoh, P. / Thollet, G. / Gauthier, C. / Masenelli-Varlot, K. et al. | 2008
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Three-dimensional potential mapping of nanostructures with electron-holographic tomographyWolf, Daniel / Lenk, Andreas / Lichte, Hannes et al. | 2008
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Design of high-speed tomography with the 3MV ultrahigh voltage electron microscopeYoshida, Kiyokazu / Nishi, Ryuji / Mori, Hirotaro et al. | 2008
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The point spread function assessment of MeV electron imaging quality for thick specimensWang, Fang / Zhang, Hai-Bo / Cao, Meng / Nishi, Ryuji / Yoshida, Kiyokazu / Takaoka, Akio et al. | 2008
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Relevance of the minimum projection number to specimen structures for high-quality electron tomographyZhang, Hai-Bo / Cao, Meng / Lu, Yong / Li, Chao / Nishi, Ryuji / Takaoka, Akio et al. | 2008
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Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected MicroscopyMuller, D. A. / Fitting Kourkoutis, L. / Murfitt, M. / Song, J. H. / Hwang, H. Y. / Silcox, J. / Dellby, N. / Krivanek, O. L. et al. | 2008
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EMCD with nm Resolution and Below: Experiments, Proposals, and a ParadoxSchattschneider, P. / Stöger-Pollach, M. / Tian, F. / Verbeeck, J. et al. | 2008
- 176
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Combining electronic and optical spectroscopy at the nanometer scale in a STEMMazzucco, S. / Bernard, R. / Kociak, M. / Stéphan, O. / Tencé, M. / Zagonel, L. F. / Garcia de Abajo, F. J. / Colliex, C. et al. | 2008
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Deconvolution of core loss electron energy loss spectraBertoni, G. / Verbeeck, J. et al. | 2008
- 178
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Obtaining the loss function from angle resolved electron energy loss spectraBertoni, G. / Verbeeck, J. / Brosens, F. et al. | 2008
- 179
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Revisiting the determination of carbon sp2/sp3 ratios via analysis of the EELS carbon K-edgeBrydson, R. / Zhili, Z. / Brown, A. et al. | 2008
- 180
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Orbital and spin sum rules for electron energy loss magnetic chiral dichroism: Application to metals and oxidesCalmels, L. / Warot, B. / Houdellier, F. / Schattschneider, P. / Gatel, C. / Serin, V. / Snoeck, E. et al. | 2008
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Probing bright and dark surface plasmon modes in individual and coupled Au nanoparticles using a fast electron beamChu, Ming-Wen / Myroshnychenko, Viktor / Javier García de Abajo, F. / Chen, Cheng Hsuan et al. | 2008
- 182
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Dual energy range EELS spectrum imaging using a fast beam switchCraven, A. J. / MacKenzie, M. / McFadzean, S. et al. | 2008
- 183
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Determination of local composition of Li-Si alloys by Electron Energy-Loss SpectroscopyDanet, J. / Guyomard, D. / Brousse, T. / Moreau, P. et al. | 2008
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Elemental and bond mapping of complex nanostructures by MLS analysis of EELS spectrum-imaging datade la Peña, F. / Arenal, R. / Stephan, O. / Walls, M. / Loiseau, A. / Colliex, C. et al. | 2008
- 185
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EELS analysis of plasmon resonance in the UV-vis energy range of metal alloy nanoparticlesEccles, J. W. L. / Bangert, U. / Christian, P. et al. | 2008
- 186
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Anisotropic effects in ELNES of the O-K edge in rutile: a case of trichroismMauchamp, V. / Epicier, T. / Le Bossé, J.C. et al. | 2008
- 187
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Dissimilar cation migration in (001) and (110) La2/3Ca1/3MnO3 thin filmsEstrade, S. / Infante, I.C. / Sanchez, F. / Fontcuberta, J. / de la Peña, F. / Walls, M. / Colliex, C. / Arbiol, J. / Peiró, F. et al. | 2008
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Energy-loss near edge structures of Cr2O3, CrO2 and YCrO4 phasesMoreno, M. S. / Urones-Garrote, E. / Otero-Díaz, L. C. et al. | 2008
- 189
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Distortion corrections of ESI data cubes for magnetic studiesGatel, C. / Warot-Fonrose, B. / Houdellier, F. / Schattschneider, P. et al. | 2008
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Optimisation of the Positions and the Width of the Energy Windows for the Recording of EFTEM Elemental MapsGralla, Benedikt / Kohl, Helmut et al. | 2008
- 191
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Band gap mapping using monochromated electronsGu, L. / Sigle, W. / Koch, C. T. / Srot, V. / Nelayah, J. / van Aken, P. A. et al. | 2008
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StripeSTEM, a new method for the isochronous acquisition of HAADF images and monolayer resolved EELSHeidelmann, M. / Houben, L. / Barthel, J. / Urban, K. et al. | 2008
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Comparing Transmission Electron Microscopy (TEM) and Tomographic Atom Probe (TAP) through Measurements of Thin MultilayersHeil, Tobias / Stender, Patrick / Schmitz, Guido / Kohl, Helmut et al. | 2008
- 194
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Development of a Process for Cleaning a TEM Column by Chemical Etching of Oxygen RadicalsHoriuchi, Shin / Hanada, Takeshi / Ebisawa, Masaharu et al. | 2008
- 195
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Low loss EELS study of gold nanoparticles using a monochromated TEMIrsen, S. / Pasoz, N. P. / Giersigr, M. et al. | 2008
- 196
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Analytical RPA response of Carbon and BN single-walled nanotubes: Application to EELS and wave loss spectraJoyes, P. / Stéphan, O. / Kociak, M. / Zobelli, A. / Colliex, C. et al. | 2008
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Improvement of energy resolution of VEELS spectra with deconvolution method for electronic and optical properties analysis on ferroelectric oxides in nano-scaleKiguchi, T. / Wakiya, N. / Shinozaki, K. / Konno, T. J. et al. | 2008
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Low Loss Electron Energy Spectroscopy on LiFePO4 for Li ion Battery ApplicationsKinyanjui, M. / Kaiser, U. / Wohlfahrt-Mehrens, M. / Li, J. / Vainkin, D. et al. | 2008
- 199
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Atomic-resolution studies of complex oxide materials using in-situ scanning transmission electron microscopyYang, G. / Zhao, Y. / Klie, R. F. et al. | 2008
- 200
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Low-loss EELS measurements on an oxide multilayer system using monochrome electronsKothleitner, G. / Schaffer, B. / Dienstleder, M. et al. | 2008
- 201
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White noise subtraction for calculating the two-particle-structure factor from inelastic diffractogramsKreyenschulte, C. / Kohl, H. et al. | 2008
- 202
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Local Analysis of BaTiO3/SrTiO3 interfaces by STEM-EELSKurata, H. / Kozawa, R. / Kawai, M. / Shimakawa, Y. / Isoda, S. et al. | 2008
- 203
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Experimental conditions and data evaluation for quantitative EMCD measurements in the TEMLidbaum, H. / Rusz, J. / Liebig, A. / Hjörvarsson, B. / Oppeneer, P. M. / Coronel, E. / Eriksson, O. / Leifer, K. et al. | 2008
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Investigation of the valency distribution in Cu1.2Mn1.8O4 using quantitative EELS near-edge structures analysisMaunders, C. / Martin, B. E. / Wei, P. / Petric, A. / Botton, G. A. et al. | 2008
- 205
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EELS mapping of surface plasmons in star-shaped gold nanoparticles: morphological behaviour of optical properties from star to sphereMazzucco, S. / Stéphan, O. / Kociak, M. / Colliex, C. et al. | 2008
- 206
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Fast local determination of phases in LixFePO4Moreau, P. / Mauchamp, V. / Boucher, F. et al. | 2008
- 207
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EELS/EFTEM in life science: proof of the presence of H2O2 in human skin by Ce deposition in melanosomesMüller, Elisabeth / Droste, Miriam / Gläser, Katja / Wepf, Roger et al. | 2008
- 208
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Phase separation study of annealed SiOx films through energy filtered scanning transmission electron microscopeNicotra, G. / Bongiorno, C. / Spinella, C. / Rimini, E. et al. | 2008
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Phase Identification of Aluminium Oxide Phases by Analysis of the Electron Energy-loss Near Edge StructurePark, Daesung / Weirich, Thomas E. / Mayer, Joachim et al. | 2008
- 210
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Valence sensitivity of Fe-L2,3 white-line ratios extracted from EELSRiedl, T. / Serra, R. / Calmels, L. / Serin, V. et al. | 2008
- 211
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Calculation of inelastic scattering events within second order QED — Implications of fully relativistic scatteringRother, A. et al. | 2008
- 212
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Role of asymmetries for EMCD sum rulesRusz, J. / Lidbaum, H. / Liebig, A. / Novák, P. / Oppeneer, P. M. / Eriksson, O. / Leifer, K. / Hjörvarsson, B. et al. | 2008
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Smart acquisition EELSSader, K. / Wang, P. / Bleloch, A. L. / Brown, A. / Brydson, R. et al. | 2008
- 214
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EELS fine structure tomography using spectrum imagingSaghi, Z. / Xu, X. / Möbus, G. et al. | 2008
- 215
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Shift in electron energy loss compared for different nickel silicides in a Pt alloyed thin filmFalke, M. / Schaarschmidt, T. / Schletter, H. / Jelitzki, R. / Schulze, S. / Beddies, G. / Hietschold, M. / MacKenzie, M. / Craven, A. J. / Bleloch, A. et al. | 2008
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Distribution of Fe and In dopants in ZnO: A combined EELS/EDS analysisSchmid, H. / Mader, W. et al. | 2008
- 217
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Changes in the Soot Microstructure during Combustion studied by SEM, TEM, Raman and EELSSchuster, M. E. / Knauer, M. / Ivleva, N. P. / Niessner, R. / Su, D. S. / Schlögl, R. et al. | 2008
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EELS and EFTEM-investigations of aluminum alloy 6016 concerning the elements Al, Si and MgSchwarz, S. / Stöger-Pollach, M. et al. | 2008
- 219
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EELS modelling using a pseudopotential DFT codeSeabourne, C. R. / Scott, A. J. / Brydson, R. et al. | 2008
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The EELS spectrum databaseSikora, Thierry / Serin, Virginie et al. | 2008
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STEM-EELS analysis of interface magnetic moments in Fe(100)/Co(bcc) superlatticesSerra, R. / Calmels, L. / Serin, V. / Warot-Fonrose, B. / Andrieu, S. et al. | 2008
- 222
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EMCD at high spatial resolution: comparison of STEM with EELS profilingStöger-Pollach, M. / Schattschneider, P. / Perkins, J. / McComb, D. et al. | 2008
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Elemental, Chemical and Physical State Mapping in Three-Dimensions using EELS-SI TomographyThomas, P. J. / Booth, C. / Harmon, R. / Markovic, S. / Twesten, R. D. / Jarausch, K. et al. | 2008
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Sub-0.5 eV EFTEM Mapping using the Zeiss SESAMKoch, C. T. / Sigle, W. / Nelayah, J. / Gu, L. / Srot, V. / van Aken, P. A. et al. | 2008
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Acquisition of the EELS data cube by tomographic spectroscopic imagingVan den Broek, W. / Verbeeck, J. / De Backer, S. / Schryvers, D. / Scheunders, P. et al. | 2008
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A low electron fluence EELS study of Fe-coordination within ferrihydrite and phosphorous doped ferrihydrite nanoparticlesVaughan, G. / Brown, A. P. / Brydson, R. / Sader, K. et al. | 2008
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Optimal aperture sizes and positions for EMCD experimentsVerbeeck, J. / Hébert, C. / Rubino, S. / Novák, P. / Rusz, J. / Houdellier, F. / Gatel, C. / Schattschneider, P. et al. | 2008
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Chemical analysis of nickel silicides with high spatial resolution by combined EDS and EELS (ELNES)Verleysen, E. / Richard, O. / Bender, H. / Schryvers, D. / Vandervorst, W. et al. | 2008
- 229
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Retrieving dielectric function by VEELSZhang, L. / Verbeeck, J. / Erni, R. / Van Tendeloo, G. et al. | 2008
- 230
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Some Recent Materials Applications of In Situ High Resolution Electron MicroscopySinclair, R. / Kang, S. K. / Kim, K. H. / Park, J. S. et al. | 2008
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Melting and solidification of alloys embedded in a matrix at nanoscaleChattopadhyay, K. / Bhattacharya, V. / Biswas, K. et al. | 2008
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Advances in transmission electron microscopy: in situ nanoindentation and in situ straining experimentsDe Hosson, Jeff Th. M. et al. | 2008
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Observing Nanosecond Phenomena at the Nanoscale with the Dynamic Transmission Electron MicroscopeCampbell, G. H. / Browning, N. D. / Kim, J. S. / King, W. E. / LaGrange, T. / Reed, B. W. / Taheri, M. L. et al. | 2008
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TEM characterization of nanostructures formed from SiGeO films: effect of electron beam irradiationBallesteros, C. / Ortiz, M. I. / Morana, B. / Rodríguez, A. / Rodríguez, T. et al. | 2008
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In situ Lorentz microscopy in an alternating current magnetic fieldAkase, Z. / Kakinuma, H. / Shindo, D. / Inoue, M. et al. | 2008
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In-situ transmission electron microscopy investigation of TiO islands nucleating on SrTiO3 (100) and (110) surfaces at high temperatureBellina, P. J. / Phillipp, F. / van Aken, P. A. et al. | 2008
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Probing integration strength of colloidal spheres self-assembled from TiO2 nanocrystals by in-situ TEM indentationChen, C. Q. / Pei, Y. T. / De Hosson, J. Th. M. et al. | 2008
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Installation and operation of an in situ electron microscopy facilityFay, M. W. / Edwards, H. K. / Zong, M. / Thurecht, K. J. / Howdle, S. M. / Brown, P. D. et al. | 2008
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Bringing chemical reactions to life: environmental transmission electron microscopy (E-TEM)Freitag, B. / Kim, S. M. / Zakharov, D. N. / Stach, E. A. / Stokes, D. J. et al. | 2008
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Dynamic in situ experiments in a 1Å double aberration corrected environmentGai, Pratibha L. / Boyes, Edward D. et al. | 2008
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A very high temperature (2000°C) stage for atomic resolution in situ ETEMGai, Pratibha L. / Boyes, Edward D. et al. | 2008
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Environmental High Resolution Electron Microscopy With a Closed Ecell: Application to CatalystsGiorgio, S. / Cabié, M. / Henry, C. R. et al. | 2008
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Pulsed-mode photon and electron microscopy surveyedHowie, A. et al. | 2008
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In-situ Observation of Nano-particulate Gold Catalysts during Reaction by Closed-type Environmental-cell Transmission Electron MicroscopeKawasaki, T. / Hasegawa, H. / Ueda, K. / Tanji, T. et al. | 2008
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In situ transmission electron microscopy on leadzirconate-titanate under electrical fieldKling, J. / Schmitt, L. / Kleebe, H. -J. / Fuess, H. et al. | 2008
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Elongation of Atomic-size Wires: Atomistic Aspects and Quantum Conductance StudiesLagos, M. / Rodrigues, V. / Ugarte, D. et al. | 2008
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Atomic-size Silver NanotubeLagos, M. / Sato, F. / Bettini, J. / Rdrigues, V. / Galvão, D. / Ugarte, D. et al. | 2008
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In-situ TEM mechanical testing of a Si MEMS nanobridgeLockwood, A. J. / Bunyan, R. J. T. / Inkson, B. J. et al. | 2008
- 249
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In-situ TEM nanoindentation and deformation of Si-nanoparticle clustersLockwood, A. J. / Inkson, B. J. et al. | 2008
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Electron Holography of in-situ ferroelectric polarisation switchingMatzeck, Ch. / Einenkel, B. / Müller, H. / Lichte, H. et al. | 2008
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Development of fast CCD Cameras for in-situ Electron MicroscopyMollon, Bill / Tsung, Lancy / Pan, Ming / Jia, Yan / Mooney, Paul / Mao, Chengye et al. | 2008
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In situ characterization of the mechanical properties of nanoparticles and nanoscale structuresDeneen Nowak, J. / Shan, Z. W. / Warren, O. L. et al. | 2008
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In-situ engineering of nanostructures with near atomic precision and property measurementsPeng, L. -M. / Wang, M. S. / Liu, Y. / Chen, Q. et al. | 2008
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In-situ TEM investigation of the contrast of nanocrystals embedded in an amorphous matrixPeterlechner, M. / Waitz, T. / Karnthaler, H. P. et al. | 2008
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In situ HRTEM — Image corrected and monochromated Titan equipped with environmental cellWagner, J. B. / Jinschek, J. R. / Hansen, T. W. / Boothroyd, C. B. / Dunin-Borkowski, R. E. et al. | 2008
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The surface dynamics of the transient oxidation stages of Cu and Cu binary alloysYang, J. C. / Li, Z. / Sun, L. / Zhou, G. W. / Pearson, J. E. / Eastman, J. A. / Fong, D. D. / Fuoss, P. H. / Baldo, P. M. / Rehn, L. E. et al. | 2008
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In-situ TEM for altering nanostructures and recording the changes at an atomic resolutionZhang, X. F. / Kamino, T. et al. | 2008
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Aberration correction in SEM: Relaunching an old projectZach, J. et al. | 2008
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Changes and reversals of contrasts in SEMCazaux, J. et al. | 2008
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Surface potential and SE detection in the SEMCazaux, J. et al. | 2008
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On the Spatial Resolution and Nanoscale Features Visibility in Scanning Electron Microscopy and Low-Energy Scanning Transmission Electron MicroscopyMorandi, V. / Migliori, A. / Corticelli, F. / Ferroni, M. et al. | 2008
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Scanning electron microscopy techniques for cross-sectional analyses of thin-film solar cellsAbou-Ras, D. / Jahn, U. / Bundesmann, J. / Caballero, R. / Kaufmann, C. A. / Klaer, J. / Nichterwitz, M. / Unold, T. / Schock, H. W. et al. | 2008
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Maximising EBSD acquisition speed and indexing rateAsahina, Shunsuke / Charles, Franck / Dicks, Keith / Erdman, Natasha et al. | 2008
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Helium ion microscope: advanced contrast mechanisms for imaging and analysis of nanomaterialsBell, David C. / Stern, L. A. / Farkas, L. / Notte, J. A. et al. | 2008
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Hygroscopic properties of individual aerosol particles from aluminum smelter potrooms determined by environmental scanning electron microscopyBenker, N. / Ebert, M. / Drabløs, P. A. / Ellingsen, D. G. / Thomassen, Y. / Weinbruch, S. et al. | 2008
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Analysis of individual aerosol particles by automated scanning electron microscopyBenker, N. / Kandler, K. / Ebert, M. / Weinbruch, S. et al. | 2008
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A new quantitative height standard for the routine calibration of a 4-quadrant-large-angles-BSE-detectorBerger, D. / Ritter, M. / Hemmleb, M. / Dai, G. / Dziomba, T. et al. | 2008
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SEM-EDS for effective surface science and as a next generation defect review tool for nanoparticle analysis?Boyes, Edward D. et al. | 2008
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Detection of Signal Electrons by Segmental Ionization DetectorCernoch, P. / Jirak, J. et al. | 2008
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Low-voltage Scanning Transmission Electron Microscopy of InGaAs nanowiresFelisari, L. / Grillo, V. / Jabeen, F. / Rubini, S. / Martelli, F. et al. | 2008
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Secondary Electrons Characterization of Hydrogenated Dilute NitridesFelisari, L. / Grillo, V. / Rubini, S. / Martelli, F. / Trotta, R. / Polimeni, A. / Capizzi, M. / Mariucci, L. et al. | 2008
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Mapping of the local density of states with very slow electrons in SEMPokorná, Z. / Frank, L. et al. | 2008
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Thickness and composition measurement of thin TEM samples with EPMA and the thin film analysis software STRATAGemGalbert, F. / Berger, D. et al. | 2008
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Automatic acquisition of large amounts of 3D data at the ultrastructural level, using serial block face scanning electron microscopyGenoud, C. / Mancuso, J. / Monteith, S. / Kraus, B. et al. | 2008
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MCSEM- a modular Monte Carlo simulation program for various applications in SEM metrology and SEM photogrammetryGnieser, D. / Frase, C. G. / Bosse, H. / Tutsch, R. et al. | 2008
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Wien filter electron optical characteristics determining using shadow projection methodVlček, I. / Horáček, M. / Zobač, M. et al. | 2008
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Strain related Contrast mechanisms in crystalline materials imaged with AsB detectionJaksch, Heiner et al. | 2008
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Low Loss BSE imaging with the EsB Detection system on the Gemini Ultra FE-SEMJaksch, Heiner et al. | 2008
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Accurate calculations of thermionic electron gun propertiesJánský, P. / Lencová, B. / Zlámal, J. et al. | 2008
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Scintillation SE Detector for Variable Pressure Scanning Electron MicroscopeJirak, J. / Cernoch, P. / Nedela, V. / Spinka, J. et al. | 2008
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The stability of retained austenite in supermartensitic stainless steel (SMSS) examined by means of SEM/EBSDKarlsen, M. / Hjelen, J. / Grong, Ø. / Rørvik, G. / Chiron, R. / Schubert, U. et al. | 2008
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In-situ EBSD studies of hydrogen induced stress cracking (HISC) in pipelines of super-duplex stainless steelKarlsen, M. / Wåsjø, J. / Hjelen, J. / Grong, Ø. / Rørvik, G. / Chiron, R. / Schubert, U. et al. | 2008
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E-beam hardening SEM glue for fixation of small objects in the SEMKleindiek, S. / Rummel, A. / Schock, K. et al. | 2008
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Development of the charging reduction system by electron beam irradiation for scanning electron microscopesKono, Y. / Suzuki, O. / Honda, K. et al. | 2008
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Aberrations of the cathode lens combined with a focusing magnetic/immersion-magnetic lensKonvalina, I. / Müllerová, I. / Hovorka, M. et al. | 2008
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Identification possibilities of micro/nanoparticles and nanocomposites in forensic practiceKotrly, M. / Turkova, I. / Grunwaldova, V. et al. | 2008
- 287
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Mass thickness determination of thin specimens using high-resolution scanning electron microscopyKrzyzanek, V. / Reichelt, R. et al. | 2008
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Benefits of Low Vacuum SEM for EBSD ApplicationsKunze, K. / Buzzi, St. / Löffler, J. / Burg, J. -P. et al. | 2008
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In-situ combination of SEMPA, STM, and FIB for magnetic imaging and nanoscale structuringMennig, J. / Kollamana, J. / Gliga, S. / Cherifi, S. / Matthes, F. / Bürgler, D. E. / Schneider, C. M. et al. | 2008
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Characterisation of the subgrain structure of the aluminium alloy AA6082 after homogenization and hot forming by EBSDMitsche, S. / Sherstnev, P. / Sommitsch, C. / Ebner, T. / Hacksteiner, M. et al. | 2008
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An improved detection system for low energy Scanning Transmission Electron MicroscopyMorandi, V. / Migliori, A. / Maccagnani, P. / Ferroni, M. / Tamarri, F. et al. | 2008
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Thickness determination of thin samples by transmission measurements in a scanning electron microscopeMüller, E. et al. | 2008
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Role of the high-angle BSE in SEM imagingMüllerová, I. / Frank, L. et al. | 2008
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Experimental and simulated signal amplification in variable pressure SEMNeděla, V. / Jánský, P. / Lencová, B. / Zlámal, J. et al. | 2008
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Study of highly-aggressive samples using the variable pressure SEMRunštuk, J. / Neděla, V. et al. | 2008
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Characterization of the focusing properties of polycapillary X-ray lenses in the scanning electron microscopeNissen, J. / Berger, D. / Kanngießer, B. / Mantouvalou, I. / Wolff, T. et al. | 2008
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Numerical Simulation of Signal Transfer in Scintillator-Photomultiplier DetectorNovák, L. et al. | 2008
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In-situ Electrical Measurements on Nanostructures in a Scanning Electron MicroscopeNoyong, M. / Blech, K. / Juillerat, F. / Hofmann, H. / Simon, U. et al. | 2008
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3D Sculptures From SEM ImagesPintus, R. / Podda, S. / Vanzi, M. et al. | 2008
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Influence of tilt of sample on axial beam propertiesRadlička, T. / Lencová, B. et al. | 2008
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Experimental determination of the total scattering cross section of water vapour and of the effective beam gas path length in a low vacuum scanning electron microscope.Rattenberger, J. / Wagner, J. / Schröttner, H. / Mitsche, S. / Schaffer, M. / Zankel, A. et al. | 2008
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Response function of the semiconductor detector of backscattered electrons in SEMRau, E. I. / Ditsman, S. A. / Luk’yanov, F. A. / Sennov, R. A. et al. | 2008
- 303
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Main principles of microtomography using backscattered electronsRau, E. I. et al. | 2008
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Considerations of some charging effects on dielectrics by electron beam irradiationRau, E. I. / Evstaf’eva, E. N. / Sennov, R. A. / Plies, E. et al. | 2008
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The reduction of pileup effects in spectra collected with silicon drift detectorsElam, T. / Anderhalt, R. / Sandborg, A. / Nicolosi, J. / Redfern, D. et al. | 2008
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High-temperature oxidation of steel in the ESEM with subsequent scale characterisation by Raman microscopyReichmann, A. / Poelt, P. / Brandl, C. / Chernev, B. / Wilhelm, P. et al. | 2008
- 307
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Method to determine image sharpness and resolution in Scanning Electron Microscopy imagesRieger, B. / van Veen, G. N. A et al. | 2008
- 308
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Instrumentation of an electron microscope for lithography and analysis of devices over a wide dimensional rangeRosolen, G. et al. | 2008
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Ultra-low energy, high-resolution scanning electron microscopyRoussel, L. Y. / Stokes, D. J. / Young, R. J. / Gestmann, I. et al. | 2008
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Non-destructive 3D imaging of the objects internal microstructure by microCT attachment for SEMSasov, A. et al. | 2008
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A novel use of rf-GD sputtering for sample surface preparation for SEM: its impact on surface analysisShimizu, K. / Mitani, T. / Chapon, P. et al. | 2008
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Development of an ultra-fast EBSD detector systemSøfferud, M. / Hjelen, J. / Karlsen, M. / Breivik, T. / Krieger Lassen, N. C. / Schwarzer, R. et al. | 2008
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Future prospects on EBSD speeds using a 40 nA FESEMSøfferud, M. / Hjelen, J. / Karlsen, M. / Dingley, D. / Jaksch, H. et al. | 2008
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High pressure imaging in the environmental scanning electron microscope (ESEM)Stokes, D. J. / Chen, J. / Neijssen, W. A. J. / Baken, E. / Uncovsky, M. et al. | 2008
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Cathodoluminescence spectrum-imaging in the scanning electron microscope using automated stage controlStowe, D. J. / Thomas, P. J. / Galloway, S. A. et al. | 2008
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Low voltage, high resolution SEM imaging for mesoporous materialsTakagi, O. / Takeuchi, Shuichi / Miyaki, Atsushi / Ito, Hiroyuki / Sato, Hirofumi / Dan, Yukari / Nakagawa, Mine / Kataoka, Sho / Inagi, Yuki / Endo, Akira et al. | 2008
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New developments in state of the art silicon drift detectors (SDD) and multiple element SDDTerborg, R. / Rohde, M. et al. | 2008
- 318
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SEM in forensic scienceTurkova, I. / Kotrly, M. et al. | 2008
- 319
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Secondary electron imaging due to interface trapped charges for a buried SiO2 microstructureZhang, Hai-Bo / Li, Wei-Qin / Wu, Xing / Wu, Dan-Wei et al. | 2008
- 320
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HRSEM Secondary Electron Doping Contrast: Theory based on Band Bending and Electron Affinity MeasurementsZhebova, I. / Molotskii, M. / Barkay, Z. / Meshulam, G. / Grunbaum, E. / Rosenwaks, Y. et al. | 2008
- 321
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3D EBSD-based orientation microscopy and 3D materials simulation tools: an ideal combination to study microstructure formation processesZaefferer, S. et al. | 2008
- 322
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Capturing Sub-Nanosecond Quenching in DualBeam FIB/SEM Serial SectioningMoberlyChan, W. J. / Gash, A. E. et al. | 2008
- 323
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Deformation mechanisms in 1D nanostructures revealed by in situ tensile testing in an SEM/FIBGianola, D. S. / Mönig, R. / Kraft, O. / Volkert, C. A. et al. | 2008
- 324
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Focused Ion Beam Tomography of Insulating Biological and Geological MaterialsHumbel, B. M. / de Winter, D. A. M. / Schneijdenberg, C. T. W. M. / Lich, B. H. / Drury, M. R. / Verkleij, A. J. et al. | 2008
- 325
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Redeposition and differential sputtering of La in TEM samples of LaAlO3 / SrTiO3 multilayers prepared by FIBMontoya, Eduardo / Bals, Sara / Van Tendeloo, Gustaaf et al. | 2008
- 326
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Fabrication and characterization of highly reproducible, high resistance nanogaps made by focused ion beam millingBlom, T. / Welch, K. / Strømme, M. / Coronel, E. / Leifer, K. et al. | 2008
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TEM sample preparation on photoresistCazzaniga, F. / Mondonico, E. / Ricci, E. / Sammiceli, F. / Somaschini, R. / Testai, S. / Zorz, M. et al. | 2008
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Advanced FIB preparation of semiconductor specimens for examination by off-axis electron holographyCooper, D. / Truche, R. / Twitchett-Harrison, A. C. / Midgley, P. A. / Dunin Borkowski, R. E. et al. | 2008
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Comparison of ion- and electron-beam-induced Pt nanodeposits: composition, volume per dose, microstructure, and in-situ resistanceCórdoba, R. / De Teresa, J. M. / Fernández-Pacheco, A. / Montero, O. / Strichovanec, P. / Ibarra, A. / Ibarra, M. R. et al. | 2008
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In-line FIB TEM sample preparation induced effects on advanced fully depleted silicon on insulator transistorsDelaye, V. / Andrieu, F. / Aussenac, F. / Carabasse, C. et al. | 2008
- 331
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The development of cryo-FIBSEM techniques for the sectioning and TEM analysis of the cell-biomaterial interfaceEdwards, H. K. / Fay, M. W. / Scotchford, C. A. / Grant, D. M. / Brown, P. D. et al. | 2008
- 332
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Three-slit interference experiments with electronsFrabboni, S. / Gazzadi, G. C. / Pozzi, G. et al. | 2008
- 333
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Contrast in ion induced secondary electron imagesGiannuzzi, Lucille A. / Utlaut, Mark / Swanson, Lynwood et al. | 2008
- 334
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Quantitative in situ thickness determination of FIB TEM lamella by using STEM in a SEMGolla-Schindler, U. et al. | 2008
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Analysis of ion diffusion in multilayer materials by depth profiling in a Crossbeam FIB-SIMS microscopeHospach, A. / Malik, A. M. / Nisch, W. / Burkhardt, C. et al. | 2008
- 336
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Growth of In2O3 islands on Y-stabilised ZrO2: a study by FIB and HRTEMHutchison, J. L. / Bourlange, A. / Egdell, R. / Schertel, A. et al. | 2008
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Carbon nanotubes grown in contact holes for nano electronic applications: how to prepare TEM samples by FIB?Ke, X. / Bals, S. / Romo Negreira, A. / Hantschel, T. / Bender, H. / Van Tendeloo, G. et al. | 2008
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Advances in 3-dimensional material characterisation using simultaneous EDS and EBSD analysis in a combined FIB-SEM microscopede Kloe, René / Schulz, Hubert / Reinauer, Felix et al. | 2008
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Investigation of the effects of the TEM specimen preparation method on the analysis of the dielectric gate stack in GaAs based MOSFET devicesLongo, P. / Smith, W. / Miller, B. / Craven, A. J. et al. | 2008
- 340
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Manipulation and contacting of individual carbon nanotubes inside a FIB workstationMenze, S. B. / Vinzelberg, H. / Gemming, T. et al. | 2008
- 341
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High volume TEM-sample preparation using a wafer saving in-line preparation toolMuehle, U. / Jansen, S. / Schuetten, R. / Prang, R. / Schampers, R. / Lehmann, R. et al. | 2008
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The influence of beam defocus on volume growth rates for electron beam induced platinum depositionPlank, H. / Dienstleder, M. / Kothleitner, G. / Hofer, F. et al. | 2008
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Reducing of ion beam induced surface damaging using “low voltage” focused ion beam technique for transmission electron microscopy sample preparationSalzer, R. / Simon, M. / Graff, A. / Altmann, F. / Pastewka, L. / Moseler, M. et al. | 2008
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DualBeam FIB application of 3D EDXS for superalloy δ-phase characterizationWagner, J. / Schaffer, M. / Schroettner, H. / Mitsche, S. / Letofsky-Papst, I. / Stotter, Ch. / Sommitsch, Ch. et al. | 2008
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Time-resolved photoemission electron microscopySchönhense, Gerd et al. | 2008
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Quantitative 3D imaging of cells at 50 nm resolution using soft x-ray tomographyLarabell, C. / Parkinson, D. Y. / Gu, W. / Knoechel, C. / McDermott, G. / Le Gros, M. A. et al. | 2008
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STXM-NEXAFS of individual titanate-based nanoribbonBittencourt, C. / Felten, A. / Gillon, X. / Pireaux, J. -J. / Najafi, E. / Hitchcock, A. P. / Ke, X. / Van Tendeloo, G. / Ewels, C. P. / Umek, P. et al. | 2008
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The fine structure of bioreactor liver tissue seen through the eyes of X-ray micro-computed tomographyFernandes, C. / Dwarte, D. / Nagatsuma, K. / Saito, M. / Matsuura, T. / Braet, F. et al. | 2008
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Comparing the Si(Li)-detector and the silicon drift detector (SDD) using EDX in SEMGernert, U. et al. | 2008
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Enhancing contrast of Al traces on Si substrates using low-voltage SEM-hosted XRMGundrum, B. C. / Hunt, J. A. et al. | 2008
- 351
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An optical demonstration of ptychographical imaging of a single defect in a model crystalHurst, A. / Zhang, F. / Rodenburg, J. M. et al. | 2008
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HRTEM and STXM, a combined study of an individual focused-ion-beam patterned CNTFelten, A. / Ke, X. / Gillon, X. / Pireaux, J. -J. / Najafi, E. / Hitchcock, A. P. / Bittencourt, C. / Van Tendeloo, G. et al. | 2008
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Compact micro-CT/micro-XRF system for non-destructive 3D analysis of internal chemical compositionSasov, A. / Liu, X. / Rushmer, D. et al. | 2008
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NanoCT: Visualising of Internal 3D-Structures with Submicrometer ResolutionSieker, F. / Brunke, O. et al. | 2008
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Dynamics of nanostructures on surfaces revealed by high-resolution, fast-scanning STMBesenbacher, Flemming et al. | 2008
- 356
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Spin mapping on the atomic scaleWiesendanger, Roland et al. | 2008
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Researching the structure of the surface of undoped ZnO thin films by means of Atomic Force MicroscopyMuñoz Aguirre, N. / Tamayo Meza, P. / Martínez Pérez, L. et al. | 2008
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Improving the structural characterization of supported on glass gold nanoparticles using Atomic Force Microscopy on vacuum conditionsMuñoz Aguirre, N. / Rivera López, J. E. / Martínez Pérez, L. / Tamayo Meza, P. et al. | 2008
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CO and O2 chemisorption on Pd70Au30(110) : evolution of the surface studied by in situ STM and complementary surface analysis techniques at elevated pressuresLanguille, M. A. / Cadete Santos Aires, F. J. / Mun, B. S. / Jugnet, Y. / Saint-Lager, M. C. / Bluhm, H. / Robach, O. / Starr, D. E. / Rioche, C. / Dolle, P. et al. | 2008
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Height measurements on soft samples: applied force, molecules deformation and phase shiftAlbonetti, C. / Martínez, N. F. / Straub, A. / Biscarini, F. / Pérez, R. / García, R. et al. | 2008
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Effect of temperature on phase transition of cardiolipin liquid-crystalline aggregates studied by AFMAlessandrini, A. / Muscatello, U. et al. | 2008
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Investigating the influence of dynamic scattering on ptychographical iterative techniquesLiu, Cheng / Walther, T. / Rodenburg, J. M. et al. | 2008
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Determination of the lateral Resolution of a Cantilever based Solid Immersion Lens Near Field MicroscopeMerz, T. / Rebner, K. / Kessler, R. W. et al. | 2008
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LT-STM manipulation and spectroscopy of single copper and cobalt atomsZupanič, E. / Žitko, R. / van Midden, H. J. P. / Prodan, A. / Muševič, I. et al. | 2008
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3D atomic-scale chemical analysis of engineering alloysCerezo, A. / Marquis, E. A. / Saxey, D. W. / Williams, C. / Zandbergen, M. / Smith, G. D. W. et al. | 2008
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New Applications for Atom-Probe Tomography in Metals, Semiconductors and CeramicsKelly, Thomas F. / Larson, David J. / Alvis, Roger L. / Clifton, Peter H. / Gerstl, Stephan S. A. / Ulfig, Rob M. / Lawrence, Daniel / Olson, David P. / Reinhard, David A. / Stiller, Krystyna et al. | 2008
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Pulsed laser atom probe tomography analysis of advanced semiconductor nanostructuresMüller, M. / Cerezo, A. / Smith, G. D. W. / Chang, L. et al. | 2008
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Low Energy Electron Microscopy: A 10 Year OutlookTromp, Rudolf M. et al. | 2008
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Imaging of Surface Plasmon Waves in Nonlinear Photoemission MicroscopyMeyer zu Heringdorf, Frank -J. / Buckanie, N. M. / Chelaru, L. I. / Raß, N. et al. | 2008
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High resolution surface analysis of metallic and biological specimens by NanoSIMSGrovenor, C. R. M. et al. | 2008
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Elemental distribution profiles across Cu(In,Ga)Se2 solar-cell absorbers acquired by various techniquesAbou-Ras, D. / Kaufmann, C. A. / Schöpke, A. / Eicke, A. / Döbeli, M. / Gade, B. / Nunney, T. et al. | 2008
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High resolution Kelvin force microscopyFenner, Matthias A. / Alexander, John / Magonov, Sergei et al. | 2008
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High resolution in interferometric microscopyJobin, Marc / Foschia, Raphael et al. | 2008
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Effects of annealing on the microstructural evolution of copper films using texture analysisMoskvinova, A. / Schulze, S. / Hietschold, M. / Schubert, I. / Ecke, R. / Schulz, S. E. et al. | 2008
- 375
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Characterisation of Ga-distribution on a silicon wafer after inline FIB-preparation using inline ToFSIMSMuehle, U. / Gaertner, R. / Steinhoff, J. / Zahn, W. et al. | 2008
- 376
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First results in thin film analysis based on a new EDS software to determine composition and/or thickness of thin layers on substratesSempf, K. / Herrmann, M. / Bauer, F. et al. | 2008
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Calibration of RHEED patterns for the appraisal of titania surface crystallographyTao, T. / Walton, R. / Edwards, H. K. / Fay, M. W. / Grant, D. M. / Brown, P. D. et al. | 2008
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Surface orientation dependent termination and work-function of in situ annealed strontium titanateBarrett, N. / Zagonel, L. F. / Bailly, A. / Renault, O. / Leroy, J. / Cezar, J. C. / Brookes, N. / Shih, Shao-Ju / Cockayne, D. et al. | 2008
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Structure determination of zeolites by electron crystallographySun, Junliang / Zhang, Daliang / He, Zhanbing / Hovmöller, Sven / Zou, Xiaodong / Gramm, Fabian / Baerlocher, Christian / McCusker, Lynne B. et al. | 2008
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3D electron diffraction of protein crystals: data collection, cell determination and indexingGeorgieva, D. G. / Jiang, L. / Zandbergen, H. W. / Nicolopoulos, S. / Abrahams, J. P. et al. | 2008
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Self-assembly of cholesterol-based nonionic surfactants in water. Unusual micellar structure and transitionsAbezgauz, Ludmila / Portnaya, Irina / Danino, Dganit et al. | 2008
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Quantitative study of anode microstructure related to SOFC stack degradationFaes, A. / Hessler-Wyser, A. / Presvytes, D. / Brisse, A. / Vayenas, C. G. / Van Herle, J. et al. | 2008
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New considerations for exit wavefunction restoration under aberration corrected conditionsHaigh, S. J. / Chang, L -Y. / Sawada, H. / Young, N. P. / Kirkland, A. I. et al. | 2008
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High quality electron diffraction data by precessionHovmöller, Sven / Zhang, Daliang / Sun, Junliang / Zou, Xiaodong / Oleynikov, Peter et al. | 2008
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Optimal noise filters for high-resolution electron microscopy of non-ideal crystalsIshizuka, K. / Eilers, P. H. C. / Kogure, T. et al. | 2008
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Noise considerations in the application of the transport of intensity equation for phase recoveryMcVitie, S. et al. | 2008
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elmiX — An Electron Microscopy Software Collection for Data Analysis and EducationReinholdt, A. / Weirich, T. E. et al. | 2008
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Speed considerations when performing particle analysis and chemical classification by SEM/EDSScheller, S. et al. | 2008
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Morphological characterization of particles with very broad size distributions using program MDISTSlouf, M. / Lapcikova, M. / Vlkova, H. / Pavlova, E. / Hromadkova, J. et al. | 2008
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Multiple protein structures in one shot: maximum-likelihood image classification in 3D-EMScheres, S. H. W. / Carazo, J. M. et al. | 2008
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Compensation and evaluation of errors of 3D reconstructions from confocal microscopic imagesČapek, M. / Brůža, P. / Kocandová, L. / Janáček, J. / Kubínová, L. / Vagnerová, R. et al. | 2008
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High content image-based cytometry as a tool for nuclear fingerprintingDe Vos, W. H. / Dieriks, B. / Joss, G. / Van Oostveldt, P. et al. | 2008
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Measurement of surface area of biological structures, based on 3D microscopic image dataKubínová, L. / Janáček, J. et al. | 2008
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The imaging function for tilted samples: simulation, image analysis and correction strategiesMariani, V. / Schenk, A. / Engel, A. / Philippsen, A. et al. | 2008
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4D-MicroscopyMironov, Alexander A. / Micaroni, Massimo / Beznoussenko, Galina V. et al. | 2008
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Strategies for high content imaging screening and analysis of primary neuronsMunck, S. / Annaert, W. et al. | 2008
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Modelling and analysis of clustering and colocalization patterns in ultrastructural immunogold labelling of cell compartments based on 3-D image dataVyhnal, A. et al. | 2008
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Modern Methods of TEM Specimen Preparation in Material SciencePenkalla, H. J. et al. | 2008
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Ultramicrotomy in biology and materials science: an overviewGnaegi, H. / Studer, D. / Bos, E. / Peters, P. / Pierson, J. et al. | 2008
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Preparation of Biological Samples for Electron MicroscopySchwarz, H. / Humbel, B. M. et al. | 2008
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Web sample preparation guide for transmission electron microscopy (TEM)Ayache, Jeanne / Beaunier, Luc / Boumendil, Jacqueline / Ehret, Gabrielle / Laub, Danièle et al. | 2008
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Novel carbon nanosheets as support for ultrahigh resolution structural analysis of nanoparticlesBeyer, André / Nottbohm, Christoph / Sologubenko, Alla / Ennen, Inga / Hütten, Andreas / Rösner, Harald / Mayer, Joachim / Gölzhäuser, Armin et al. | 2008
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A new automated plunger for cryopreparation of proteins in defined - even oxygen free - atmospheresDepoix, F. / Meissner, U. / Markl, J. et al. | 2008
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A novel method for precipitates preparation using extraction replicas combined with focused ion beam techniquesDienstleder, M. / Plank, H. / Kothleitner, G. / Hofer, F. et al. | 2008
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An appraisal of FIBSEM and ultramicrotomy for the TEM analysis of the cell-biomaterial interfaceEdwards, H. K. / Fay, M. W. / Anderson, S. I. / Scotchford, C. A. / Grant, D. M. / Brown, P. D. et al. | 2008
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Observation of the structure of aqueous polymers with cryo-SEMFujino, A. / Yamashita, M. / Satoh, N. et al. | 2008
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Lipid nanotube encapsulating method in low voltage scanning transmission electron microscopyFurusho, H. / Mishima, Y. / Kameta, N. / Yamane, M. / Masuda, M. / Asakawa, M. / Yamashita, I. / Takaoka, A. / Shimizu, T. et al. | 2008
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Microscopy observation of food biopolymers and related sample preparation methodsGaillard, C. et al. | 2008
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Preparation of SiC/SiC thin foils for TEM observations by wedge polishing methodGec, M. / Toplišek, T. / Šrot, V. / Dražić, G. / Kobe, S. / van Aken, P. A. / Čeh, M. et al. | 2008
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Serial-section Polishing TomographyHunt, J. A. / Prasad, P. / Raz, E. et al. | 2008
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Visualization of detergent resistant membrane rafts in human colorectal cancer cells with correlative confocal and transmission electron microscopyJahn, K. / Kable, E. P. / Braet, F. et al. | 2008
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Contribution of low tension ion-milling to heterostructural semiconductors preparationKorytov, M. / Tottereau, O. / Chauveau, J. M. / Vennéguès, P. et al. | 2008
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Metallographic characterization of MgH2-Mg systemVittori Antisari, M. / Montone, A. / Aurora, A. / Mancini, M. R. / Mirabile Gattia, D. / Pilloni, L. et al. | 2008
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LSM tomography of 2-cell mouse embryoPogorelova, M. A. / Golichenkov, V. A. / Pogorelova, V. N. et al. | 2008
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Microwave-assisted sample preparation for life scienceSchroeder, J. A. et al. | 2008
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Comparison TEM specimen preparation of perovskite thin films by conventional Ar ion milling and tripod polishingEberg, E. / van Helvoort, A. T. J. / Soleim, B. G. / Monsen, A. F. / Wennberg, L. C. / Tybell, T. / Holmestad, R. et al. | 2008
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