Catastrophic Transformation of Electron Stress and Electron Stiffness Parameter on Metal and Semiconductor (Englisch)
- Neue Suche nach: Kotake, Shigeo
- Neue Suche nach: Kimata, Hiroyuki
- Neue Suche nach: Aoki, Takashi
- Neue Suche nach: Suzuki, Yasuyuki
- Neue Suche nach: Senoo, Masafumi
- Neue Suche nach: Kotake, Shigeo
- Neue Suche nach: Kimata, Hiroyuki
- Neue Suche nach: Aoki, Takashi
- Neue Suche nach: Suzuki, Yasuyuki
- Neue Suche nach: Senoo, Masafumi
In:
Mesoscopic Dynamics of Fracture
5
;
195-209
;
1998
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ISSN:
- Aufsatz/Kapitel (Buch) / Elektronische Ressource
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Titel:Catastrophic Transformation of Electron Stress and Electron Stiffness Parameter on Metal and Semiconductor
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Beteiligte:Kotake, Shigeo ( Autor:in ) / Kimata, Hiroyuki ( Autor:in ) / Aoki, Takashi ( Autor:in ) / Suzuki, Yasuyuki ( Autor:in ) / Senoo, Masafumi ( Autor:in )
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Erschienen in:Mesoscopic Dynamics of Fracture , 5 ; 195-209Advances in Materials Research ; 1, 5 ; 195-209
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Verlag:
- Neue Suche nach: Springer Berlin Heidelberg
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Erscheinungsort:Berlin, Heidelberg
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Erscheinungsdatum:01.01.1998
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Format / Umfang:15 pages
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ISBN:
-
ISSN:
-
DOI:
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Medientyp:Aufsatz/Kapitel (Buch)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis E-Book
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
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