Atomic force microscopy and X-ray photoelectron spectroscopy study of chitosan-carbon fiber materials (Englisch)
- Neue Suche nach: Nikolenko, Yu. M.
- Neue Suche nach: Kuryavyi, V. G.
- Neue Suche nach: Sheveleva, I. V.
- Neue Suche nach: Zemskova, L. A.
- Neue Suche nach: Sergienko, V. I.
- Neue Suche nach: Nikolenko, Yu. M.
- Neue Suche nach: Kuryavyi, V. G.
- Neue Suche nach: Sheveleva, I. V.
- Neue Suche nach: Zemskova, L. A.
- Neue Suche nach: Sergienko, V. I.
In:
Inorganic Materials
;
46
, 3
;
221-225
;
2010
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:Atomic force microscopy and X-ray photoelectron spectroscopy study of chitosan-carbon fiber materials
-
Beteiligte:Nikolenko, Yu. M. ( Autor:in ) / Kuryavyi, V. G. ( Autor:in ) / Sheveleva, I. V. ( Autor:in ) / Zemskova, L. A. ( Autor:in ) / Sergienko, V. I. ( Autor:in )
-
Erschienen in:Inorganic Materials ; 46, 3 ; 221-225
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Verlag:
- Neue Suche nach: SP MAIK Nauka/Interperiodica
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Erscheinungsort:Dordrecht
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Erscheinungsdatum:01.03.2010
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Format / Umfang:5 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 46, Ausgabe 3
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Atomic force microscopy and X-ray photoelectron spectroscopy study of chitosan-carbon fiber materialsNikolenko, Yu. M. / Kuryavyi, V. G. / Sheveleva, I. V. / Zemskova, L. A. / Sergienko, V. I. et al. | 2010
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