X-ray Diffractometry Studies of the Structural Properties of Solid Solutions Based on Gallium Nitride (Englisch)
- Neue Suche nach: Vigdorovich, E. N.
- Neue Suche nach: Ermoshin, I. G.
- Neue Suche nach: Vigdorovich, E. N.
- Neue Suche nach: Ermoshin, I. G.
In:
Russian Microelectronics
;
46
, 7
;
458-461
;
2017
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:X-ray Diffractometry Studies of the Structural Properties of Solid Solutions Based on Gallium Nitride
-
Beteiligte:Vigdorovich, E. N. ( Autor:in ) / Ermoshin, I. G. ( Autor:in )
-
Erschienen in:Russian Microelectronics ; 46, 7 ; 458-461
-
Verlag:
- Neue Suche nach: Pleiades Publishing
-
Erscheinungsort:Moscow
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Erscheinungsdatum:01.12.2017
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Format / Umfang:4 pages
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ISSN:
-
DOI:
-
Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
-
Sprache:Englisch
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Schlagwörter:
-
Datenquelle:
Inhaltsverzeichnis – Band 46, Ausgabe 7
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