Electrical and structural characteristics of metamorphic In0.38Al0.62As/In0.37Ga0.63As/In0.38Al0.62As HEMT nanoheterostructures (Englisch)
- Neue Suche nach: Galiev, G. B.
- Neue Suche nach: Klimov, E. A.
- Neue Suche nach: Klochkov, A. N.
- Neue Suche nach: Maltsev, P. P.
- Neue Suche nach: Pushkarev, S. S.
- Neue Suche nach: Zhigalina, O. M.
- Neue Suche nach: Imamov, R. M.
- Neue Suche nach: Kuskova, A. N.
- Neue Suche nach: Khmelenin, D. N.
- Neue Suche nach: Galiev, G. B.
- Neue Suche nach: Klimov, E. A.
- Neue Suche nach: Klochkov, A. N.
- Neue Suche nach: Maltsev, P. P.
- Neue Suche nach: Pushkarev, S. S.
- Neue Suche nach: Zhigalina, O. M.
- Neue Suche nach: Imamov, R. M.
- Neue Suche nach: Kuskova, A. N.
- Neue Suche nach: Khmelenin, D. N.
In:
Crystallography Reports
;
58
, 6
;
914-919
;
2013
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:Electrical and structural characteristics of metamorphic In0.38Al0.62As/In0.37Ga0.63As/In0.38Al0.62As HEMT nanoheterostructures
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Beteiligte:Galiev, G. B. ( Autor:in ) / Klimov, E. A. ( Autor:in ) / Klochkov, A. N. ( Autor:in ) / Maltsev, P. P. ( Autor:in ) / Pushkarev, S. S. ( Autor:in ) / Zhigalina, O. M. ( Autor:in ) / Imamov, R. M. ( Autor:in ) / Kuskova, A. N. ( Autor:in ) / Khmelenin, D. N. ( Autor:in )
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Erschienen in:Crystallography Reports ; 58, 6 ; 914-919
-
Verlag:
- Neue Suche nach: Springer US
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Erscheinungsort:Boston
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Erscheinungsdatum:01.11.2013
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Format / Umfang:6 pages
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ISSN:
-
DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
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