On the Repudiability of Device Identification and Image Integrity Verification Using Sensor Pattern Noise (Englisch)
- Neue Suche nach: Li, Chang-Tsun
- Neue Suche nach: Chang, Chih-Yuan
- Neue Suche nach: Li, Yue
- Neue Suche nach: Li, Chang-Tsun
- Neue Suche nach: Chang, Chih-Yuan
- Neue Suche nach: Li, Yue
In:
Information Security and Digital Forensics
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19-25
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2010
- Aufsatz/Kapitel (Buch) / Elektronische Ressource
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Titel:On the Repudiability of Device Identification and Image Integrity Verification Using Sensor Pattern Noise
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Beteiligte:
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Erschienen in:
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Verlag:
- Neue Suche nach: Springer Berlin Heidelberg
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Erscheinungsort:Berlin, Heidelberg
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Erscheinungsdatum:01.01.2010
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Format / Umfang:7 pages
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ISBN:
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ISSN:
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DOI:
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Medientyp:Aufsatz/Kapitel (Buch)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis E-Book
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
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On the Repudiability of Device Identification and Image Integrity Verification Using Sensor Pattern NoiseLi, Chang-Tsun / Chang, Chih-Yuan / Li, Yue et al. | 2010
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