Development and Operation of Special SIMS-Equipment for Use in Iron and Steel Analysis (Englisch)
- Neue Suche nach: Dittmann, J.
- Neue Suche nach: Dittmann, J.
In:
Secondary Ion Mass Spectrometry SIMS III
1
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61-65
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1982
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ISSN:
- Aufsatz/Kapitel (Buch) / Elektronische Ressource
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Titel:Development and Operation of Special SIMS-Equipment for Use in Iron and Steel Analysis
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Beteiligte:Dittmann, J. ( Autor:in )
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Erschienen in:Secondary Ion Mass Spectrometry SIMS III , 1 ; 61-65Springer Series in Chemical Physics ; 19, 1 ; 61-65
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Verlag:
- Neue Suche nach: Springer Berlin Heidelberg
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Erscheinungsort:Berlin, Heidelberg
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Erscheinungsdatum:01.01.1982
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Format / Umfang:5 pages
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ISBN:
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ISSN:
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DOI:
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Medientyp:Aufsatz/Kapitel (Buch)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis E-Book
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 2
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Instrumental Aspects of Spatially 3-Dimensional SIMS AnalysisRüdenauer, F. G. et al. | 1982
- 22
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Some Problems of Construction Implied by Requirements of Up-To-Date SIMS InstrumentationGerlach, R. L. et al. | 1982
- 30
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Description and Applications fo a New Design Cs+ Ion Source on the COALA Ion Microprobe for Negative Ion SIMSBentz, B. L. / Liebl, H. et al. | 1982
- 38
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Operational Data of a Simple Microfocus Gun Using an EHD-Type Indium Ion SourceHigatsberger, M. J. / Pollinger, P. / Studnicka, H. / Rüdenauer, F. G. et al. | 1982
- 43
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First Results on a Scanning Ion Microprobe Equipped with an EHD-Type Indium Primary Ion SourceRüdenauer, F. G. / Pollinger, P. / Studnicka, H. / Gnaser, H. / Steiger, W. / Higatsberger, M. J. et al. | 1982
- 49
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Simple Double-Channel SIMS InstrumentCherepin, V. T. / Dubinsky, I. N. / Dyad’kin, Ya. Ya. et al. | 1982
- 52
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Principles and Applications of a Dual Primary Ion Source and Mass Filter for an Ion MicroanalyserGoux, J. J. / Migeon, H. N. et al. | 1982
- 57
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A Quadrupole Mass Spectrometer with Energy Filtering for SIMS StudiesInglebert, R.-L. / Hennequin, J.-F. et al. | 1982
- 61
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Development and Operation of Special SIMS-Equipment for Use in Iron and Steel AnalysisDittmann, J. et al. | 1982
- 66
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Design Concept of a New Secondary Ion Optics System for Use with Quadrupole Mass SpectrometersJede, R. / Ganschow, O. / Benninghoven, A. et al. | 1982
- 72
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Improved Analysis of Insulators in an ARL IMMA Using Positive Primary Ions and an Electron GunBrown, J. D. / Gras, D. J. et al. | 1982
- 77
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Performance and Use of Dissector Ion MicroanalyzerCherepin, V. T. / Ol’khovsky, V. L. et al. | 1982
- 81
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Distortion of Secondary Ion Extraction Due to Sample Surface IrregularitiesBedrich, W. / Koch, B. / Mai, H. / Seidenkranz, U. / Syhre, H. / Voigtmann, R. et al. | 1982
- 88
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A Comined Direct Imaging Laser Ionization Secondary Ionization Mass SpectrometerFurman, B. K. / Evans, C. A. Jr. et al. | 1982
- 94
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Advances in Ion Probes A-DIDAFrenzel, H. / Maul, J. L. et al. | 1982
- 97
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A Novel Ion Etching Unit Applicable for Depth Profiling with SIMS and IIRGuenther, K. H. / Hauser, E. / Hobi, G. / Wierer, P. G. / Brandstaetter, E. et al. | 1982
- 102
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Improvements and Applications of the Riber MIQ 156Simondet, F. / Kubicki, D. et al. | 1982
- 106
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Molecule Formation in Oxide SputteringOechsner, H. et al. | 1982
- 115
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Dependence of Ionization Yields Upon Elemental Composition; Isotopic VariationsSlodzian, G. et al. | 1982
- 124
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Measurements of the Energy Distributions of Positive Secondary Ions in the Energy Range from 0 to About 500 eVPahlke, C. / Düsterhöft, H. / Müller-Jahreis, U. et al. | 1982
- 128
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Ion Dose Effects in Static SIMSSpeckmann, W. / Prigge, S. / Bauer, E. et al. | 1982
- 134
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Current Density Effects on Secondary Ion Emission from Multicomponent TargetsBarcz, A. / Domanski, M. / Wojtowicz-Natanson, B. et al. | 1982
- 140
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Isotope Effect in Secondary Ion EmissionLorin, J. C. / Havette, A. / Slodzian, G. et al. | 1982
- 151
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Caesiated Surfaces and Negative Ion EmissionBernheim, M. / Slodzian, G. et al. | 1982
- 159
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Secondary Ion Mass Spectrometry of Organic Compounds; A Comparison with Other Methods (EI, CI, FI, FD, FAB)Klöppel, K. D. et al. | 1982
- 165
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Secondary Ion Emission from NbV-AlloysSchou, J. / Flentje, G. / Hofer, W. O. / Linke, U. et al. | 1982
- 172
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Depth Profiling by SIMS: Depth Resolution, Dynamic Range and SensitivityMagee, C. W. / Honig, R. E. / Evans, C. A. Jr. et al. | 1982
- 186
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Disturbing Effects in Sputter ProfilingHofmann, S. et al. | 1982
- 201
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The Theory of Concentration Depth Profiling by Sputter EtchingHofer, W. O. / Littmark, U. et al. | 1982
- 206
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Surface Topography Development During SIMS Investigations and Using it to Get Additional Information on Polycrystalline and Heterogeneous SolidsHauffe, W. et al. | 1982
- 211
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Sputtering of Metals with 20 keV O2 +; Characteristic Etch Patterns, Sputtered Atom Yields and Secondary Ion Mass SpectraTsunoyama, K. / Suzuki, T. / Ohashi, Y. / Konishi, M. et al. | 1982
- 216
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Depth Resolution of Ion Bombardment Technique Applied to NiPd, NiPt, PtPd, Thin Layer SystemsGiber, J. / Marton, D. / László, J. / Mizsei, J. et al. | 1982
- 222
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The Influence of Ion Bombardment on the Results of AES-Depth Profiling on SilicidesWirth, Th. et al. | 1982
- 227
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A Study of Secondary Ion Energy Distributions During Sputtering of MIS Layer StructuresRomanova, G. Ph. / Didenko, P. I. / Yefremov, A. A. / Litovchenko, V. G. / Marchenko, R. I. et al. | 1982
- 233
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Structural Effects in SIMS at the Depth Profiling of Boron Implanted SiliconCherepin, V. T. / Kosyachkov, A. K. / Krasyuk, A. D. / Vasiliev, M. A. et al. | 1982
- 238
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Comparison of Compositional Thin Film Depth Profiling Obtained by SIMS, IIR and AESHauser, E. / Hobi, G. / Guenther, K. H. / Brandstaetter, E. et al. | 1982
- 244
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Quantifications of SIMSMorrison, G. H. et al. | 1982
- 257
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Quantitative Chemical Analysis of Standard Iron Alloys by SIMSJurela, Z. et al. | 1982
- 264
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Application of the LTE Model to Quantifying the Secondary Ion Spectra of SteelsSuba, J. / Stopka, A. et al. | 1982
- 269
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Modification of the MISR Method with the Use of Implantation of Standard ElementsGiber, J. / Sblyom, A. / Bori, L. / Gyulai, J. et al. | 1982
- 274
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Use of Ionic Implantation for Quantification of SIMS Analysis in Metals and Oxides — Application to Corrision StudiesPivin, J. C. / Loison, D. / Roques-Carmes, C. / Chaumont, J. / Huber, A. M. / Morillot, G. et al. | 1982
- 282
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Secondary Ion Emission from Binary and Ternary Amorphous AlloysGnaser, H. / Riedel, M. / Marton, J. / Rüdenauer, F. G. et al. | 1982
- 288
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Experimental Procedures for Quantitative Analysis of Silicate MineralsHavette, A. / Slodzian, G. et al. | 1982
- 292
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SIMS Isotopic Measurements at High Mass ResolutionZinner, E. / Grasserbauer, M. et al. | 1982
- 297
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Computer Peak Identification and Evaluation of SIMS SpectraAntal, J. / Kugler, S. / Riedel, M. et al. | 1982
- 302
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Depth Profiling of Copper Atoms Gettered in Ion-Damaged GaPGriepentrog, M. / Kerkow, H. / Klose, H. / Müller-Jahreis, U. et al. | 1982
- 308
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The Optimisation of SIMS for the Analysis of Semiconductor MaterialsClegg, J. B. et al. | 1982
- 314
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Impurity Redistribution in GaAS EpilayersHuber, A. M. / Morillot, G. / Merenda, P. / Bonnet, M. / Bessonneau, G. et al. | 1982
- 321
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Quantitative Distribution Analysis of B, As and P in Si for Process SimulationGrasserbauer, M. / Stingeder, G. / Guerrero, E. / Pötzl, H. / Tielert, R. / Ryssel, H. et al. | 1982
- 330
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High Spatial Resolution SIMS Depth Profiling of Cr Dopant in CdSe Thin Film TransistorsBrown, J. D. / Shepherd, F. R. / Westwood, W. D. et al. | 1982
- 336
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SIMS Investigation of p-n Junction Quality in Ion Implanted cw Laser Annealed SiliconMaier, M. / Bimberg, D. / Baumgart, H. / Phillippi, F. et al. | 1982
- 342
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Profiles of Implanted or Diffuses Dopants (Be, Zn, Cr, Se) in Indium PhosphideGauneau, M. / Rupert, A. / Favennec, P. N. et al. | 1982
- 351
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Applications of SIMS in Studies of Slow Diffusion and Isotope DiffusionLodding, A. / Odelius, H. / Södervall, U. et al. | 1982
- 357
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Rapid Diffusion and Gettering Studies of Bulk Oxygen in Silicon by Cs/SIMSEvans, C. A. Jr. / Furman, B. K. / Magee, T. J. et al. | 1982
- 361
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Water Diffusion in Fused Silica and Iron-Making SlagKobayashi, M. / Goto, K. S. / Someno, M. et al. | 1982
- 365
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Combined SIMS-AES-XPS Investigation of the Composition and Interface Structure of Anodic Oxide Layers on Cd0.2Hg0.8Te (CMT)Kaiser, U. / Ganschow, O. / Neelsen, J. / Nitz, H. M. / Wiedmann, L. / Benninghoven, A. et al. | 1982
- 372
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The Chemical Compositon of Oxide Films on Aluminium and Its Influence on Surface Properties Studied by SIMS, XPS and AESTextor, M. et al. | 1982
- 377
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Study of the Adsorption of Water on Titania by Secondary Ion Mass SpectrometryMarien, J. / Pauw, E. et al. | 1982
- 383
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SIMS Studies on Oxygen Adsorption on Aluminium and Its AlloysMarton, D. / Csanády, Á et al. | 1982
- 388
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Oxidation and Segregation at the Surfaces of Different Aluminium Foils and SheetsCsanády, Á. / Marton, D. / Turmezey, T. et al. | 1982
- 394
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Oxygen Adsorption on Polycrystalline PT3Pb at Elevated Temperatures. A SIMS StudyUnger, W. / Bori, L. / Marton, D. et al. | 1982
- 398
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SIMS Investigation on TiFe Nitrided by NH3-PretreatmentKirch, G. / Züchner, H. et al. | 1982
- 405
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SIMS/TDMS Studies of Hydrocarbon Interaction with NickelSchemmer, M. / Beckmann, P. / Greifendorf, D. / Benninghoven, A. et al. | 1982
- 411
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SIMS Investigation of Adsorption and Chemical Modification of C2H4 and C2H2 on a Polycrystalline Ni-SurfaceKaarmann, H. / Leidenberger, B. / Hoinkes, H. / Wisch, H. et al. | 1982
- 416
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Secondary Ion Emission from UHV-Deposited Amino Acid Overlayers on Clean Metal SurfacesLange, W. / Jirikowsky, M. / Holtkamp, D. / Benninghoven, A. et al. | 1982
- 421
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SIMS Investigation of Adsorption of O2, H2O, CO, CO2, CH2O, and CH3OH and Coadsorption of O2 with CH2O and CH3OH on Polycrystalline Silver SurfacesWiedmann, L. / Wang, N. L. / Jede, R. / An, L. D. / Ganschow, O. / Benninghoven, A. et al. | 1982
- 426
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Distribution of Ni, Co, Ga, and Cu in Iron MeteoritiesOkano, J. / Nishimura, H. et al. | 1982
- 431
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Metallurgical Applications of Ionic MicroscopyDarque-Ceretti, E. / Dennebouy, R. / Pivin, J. C. / Roques-Carmes, C. et al. | 1982
- 438
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Secondary Ion Mass Spectrometry of Organic CompoundsBenninghoven, A. et al. | 1982