Sentaurus TCAD simulation of SET and Radiation-Hardened technology for FDSOI TFET devices (Unbekannt)
Freier Zugriff
- Neue Suche nach: Du, Shougang
- Neue Suche nach: Liu, Hongxia
- Neue Suche nach: Wang, Shulong
- Neue Suche nach: Du, Shougang
- Neue Suche nach: Liu, Hongxia
- Neue Suche nach: Wang, Shulong
In:
Radiation Effects and Defects in Solids
;
178
, 7-8
;
885-897
;
2023
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Sentaurus TCAD simulation of SET and Radiation-Hardened technology for FDSOI TFET devices
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Beteiligte:
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Erschienen in:Radiation Effects and Defects in Solids ; 178, 7-8 ; 885-897
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Verlag:
- Neue Suche nach: Taylor & Francis
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Erscheinungsdatum:04.07.2023
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Format / Umfang:13 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Unbekannt
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 178, Ausgabe 7-8
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