The Barlow-Scheuer Reliability Growth Model from a Bayesian Viewpoint (Unbekannt)
- Neue Suche nach: Weinrich, Martin C.
- Neue Suche nach: Gross, Alan J.
- Neue Suche nach: Weinrich, Martin C.
- Neue Suche nach: Gross, Alan J.
In:
Technometrics
;
20
, 3
;
249-254
;
1978
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:The Barlow-Scheuer Reliability Growth Model from a Bayesian Viewpoint
-
Beteiligte:Weinrich, Martin C. ( Autor:in ) / Gross, Alan J. ( Autor:in )
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Erschienen in:Technometrics ; 20, 3 ; 249-254
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Verlag:
- Neue Suche nach: Taylor & Francis Group
-
Erscheinungsdatum:01.08.1978
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Format / Umfang:6 pages
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ISSN:
-
DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Unbekannt
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 20, Ausgabe 3
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