Philosophical Magazine (Englisch)
In:
Philosophical Magazine
;
90
, 35-36
;
ebi
;
2010
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:Philosophical Magazine
-
Erschienen in:Philosophical Magazine ; 90, 35-36 ; ebi
-
Verlag:
- Neue Suche nach: Taylor & Francis Group
-
Erscheinungsdatum:14.12.2010
-
ISSN:
-
DOI:
-
Medientyp:Aufsatz (Zeitschrift)
-
Format:Elektronische Ressource
-
Sprache:Englisch
-
Datenquelle:
Inhaltsverzeichnis – Band 90, Ausgabe 35-36
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- ebi
-
Philosophical Magazine| 2010
- 4595
-
Electron microscopy and diffraction of defects, nanostructures, interfaces and amorphous materials Conference to mark the retirement of Professor David Cockayne FRS Oxford, 7 September 2009Hirsch, Peter / Kirkland, Angus / Nellist, Peter et al. | 2010
- 4597
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Professor D.J.H. Cockayne FRS: An appreciation in honour of his retirement in September 2009Hirsch, P.B. et al. | 2010
- 4611
-
The development and early applications of the weak-beam techniqueWhelan, M.J. et al. | 2010
- 4623
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The temperature dependence of heavy-ion damage in iron: A microstructural transition at elevated temperaturesYao, Z. / Jenkins, M.L. / Hernández-Mayoral, M. / Kirk, M.A. et al. | 2010
- 4635
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Electron microscopy of severely deformed L12 intermetallicsGeist, D. / Gammer, C. / Mangler, C. / Rentenberger, C. / Karnthaler, H.P. et al. | 2010
- 4647
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Application of electron optical techniques to the study of amorphous materialsHowie, A. et al. | 2010
- 4661
-
Fluctuation electron microscopy of medium-range order in ion-irradiated zirconZhao, Gongpu / Treacy, Michael M.J. / Buseck, Peter R. et al. | 2010
- 4679
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Applications of electron reduced density function analysis to the study of amorphous materials: An example of Zr64.13Cu15.75Ni10.12Al10.0 and Zr55Cu30Ni5Al10 metallic glassesBorisenko, Konstantin B. / Chen, Yixin / Li, Guoqiang et al. | 2010
- 4691
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A coherent photofield electron source for fast diffractive and point-projection imagingSpence, J.C.H. / Vecchione, T. / Weierstall, U. et al. | 2010
- 4703
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The interdependency of morphology, strain and composition in buried GeSi/Si(001) quantum dotsLang, Christian et al. | 2010
- 4711
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Dislocation electron tomography and precession electron diffraction – minimising the effects of dynamical interactions in real and reciprocal spaceBarnard, J.S. / Eggeman, A.S. / Sharp, J. / White, T.A. / Midgley, P.A. et al. | 2010
- 4731
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Atomic-resolution spectroscopic imaging of oxide interfacesKourkoutis, L. Fitting / Xin, H.L. / Higuchi, T. / Hotta, Y. / Lee, J.H. / Hikita, Y. / Schlom, D.G. / Hwang, H.Y. / Muller, D.A. et al. | 2010
- 4751
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Applications of the Oxford-JEOL aberration-corrected electron microscopeNellist, P.D. / Kirkland, A.I. et al. | 2010
- 4769
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The growth and characterization of Si and Ge nanowires grown from reactive metal catalystsRoss, F.M. / Wen, C.-Y. / Kodambaka, S. / Wacaser, B.A. / Reuter, M.C. / Stach, E.A. et al. | 2010