GIS very fast transients overvoltage testing using electric field measurements (Englisch)
- Neue Suche nach: Suo, Chunguang
- Neue Suche nach: Xu, Xueqin
- Neue Suche nach: Zhang, Wenbin
- Neue Suche nach: Gui, Jinbin
- Neue Suche nach: Tan, Xiangyu
- Neue Suche nach: Li, Tianwen
- Neue Suche nach: Suo, Chunguang
- Neue Suche nach: Xu, Xueqin
- Neue Suche nach: Zhang, Wenbin
- Neue Suche nach: Gui, Jinbin
- Neue Suche nach: Tan, Xiangyu
- Neue Suche nach: Li, Tianwen
In:
Integrated Ferroelectrics
;
178
, 1
;
23-34
;
2017
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:GIS very fast transients overvoltage testing using electric field measurements
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Beteiligte:Suo, Chunguang ( Autor:in ) / Xu, Xueqin ( Autor:in ) / Zhang, Wenbin ( Autor:in ) / Gui, Jinbin ( Autor:in ) / Tan, Xiangyu ( Autor:in ) / Li, Tianwen ( Autor:in )
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Erschienen in:Integrated Ferroelectrics ; 178, 1 ; 23-34
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Verlag:
- Neue Suche nach: Taylor & Francis
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Erscheinungsdatum:12.02.2017
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Format / Umfang:12 pages
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ISSN:
-
DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 178, Ausgabe 1
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