Advances in the use of PIXE and PESA for air pollution sampling (Englisch)
- Neue Suche nach: Hudson, G.M.
- Neue Suche nach: Kaufmann, H.C.
- Neue Suche nach: Nelson, I.W.
- Neue Suche nach: Bonacci, M.A.
- Neue Suche nach: Hudson, G.M.
- Neue Suche nach: Kaufmann, H.C.
- Neue Suche nach: Nelson, I.W.
- Neue Suche nach: Bonacci, M.A.
In:
Nuclear Instruments and Methods
;
168
, 1/3
;
259-263
;
1980
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Advances in the use of PIXE and PESA for air pollution sampling
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Weitere Titelangaben:Fortschritt bei der Anwendung von PIXE und PESA fuer die Messung von Luftverunreinigungen
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Beteiligte:Hudson, G.M. ( Autor:in ) / Kaufmann, H.C. ( Autor:in ) / Nelson, I.W. ( Autor:in ) / Bonacci, M.A. ( Autor:in )
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Erschienen in:Nuclear Instruments and Methods ; 168, 1/3 ; 259-263
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Verlag:
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Erscheinungsdatum:1980
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Format / Umfang:5 Seiten, 8 Bilder, 11 Quellen
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 168, Ausgabe 1/3
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Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 1
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Straggling in energy loss of energetic hydrogen and helium ionsBesenbacher, F. / Andersen, J.U. / Bonderup, E. et al. | 1980
- 17
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The stopping of energetic ions in solidsZiegler, J.F. et al. | 1980
- 25
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Energy-loss straggling of alpha particles in Al, Ni, and AuFriedland, E. / Lombaard, J.M. et al. | 1980
- 29
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Search for the influence of chemical effect on the stopping power: The case of oxidesBlondiaux, G. / Valladon, M. / Iskii, K. / Debrun, J.L. et al. | 1980
- 33
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Stopping ratios of 50-300 keV light ions in metalsMertens, P. / Krist, T. et al. | 1980
- 41
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Hydrogen and helium stopping powers of rare-earth metalsKnudsen, H. / Andersen, H.H. / Martini, V. et al. | 1980
- 51
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Energy loss of light ions in diamondFearick, R.W. / Sellschop, J.P.F. et al. | 1980
- 57
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Electronic energy loss of H, D and He in Au below 20 keVBlume, R. / Eckstein, W. / Verbeek, H. et al. | 1980
- 63
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Stopping powers and backscattered charge fractions for 20-150 keV H+ and He+ on goldThompson, D.A. / Poehlman, W.F. et al. | 1980
- 69
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Range parameters of protons in silicon implanted at energies from 0.5 to 300 keVDemond, F.J. / Kalbitzer, S. / Mannsperger, H. / Mueller, G. et al. | 1980
- 75
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Stopping power and straggling of 80-500 keV lithium ions in C, Al, Ni, Cu, Se, Ag, and TeAndersen, H.H. / Besenbacher, F. / Goddiksen, P. et al. | 1980
- 81
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Energy loss protons in Si, Ge and MoIzmailov, S.Z. / Sirotinin, E.I. / Tuliuov, A.F. et al. | 1980
- 85
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Nuclear cross sections for ion beam analysisBird, J.R. et al. | 1980
- 93
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Microanalysis of fluorine by nuclear reactions. I. 19.F(p, alpha)16.O and 19.F(p, alphagamma)16.O reactionsDieumegard, D. / Maurel, B. / Amsel, G. et al. | 1980
- 105
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The 14.N(d,p15N cross section 0.32-1.45 MeVNiler, A. / Birkmire, R. et al. | 1980
- 111
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A note on the 3.He+D nuclear-reaction cross sectionMoeller, W. / Besenbacher, F. et al. | 1980
- 121
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Quantitative microanalysis by heavy ion beam induced X-ray excitationMitchell, I.V. / Lennard, W.N. / Sanders, I.B. et al. | 1980
- 125
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Determination of oxygen in thin films with the 16.O(3.He,p gamma)18.FHeggie, J.C.P. / Switkowski, Z.E. / Clark, G.J. et al. | 1980
- 131
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A comparison of thin and thick target methods of measuring proton-induced K-shell ionization cross sectionsBarfoot, K.M. / Mitchell, I.V. / Eschbach, H.L. / Gilboy, W.B. et al. | 1980
- 139
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High resolution scanning ion probes: Applications to physics and biologyLevi-Setti, R. / Fox, T.R. et al. | 1980
- 151
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Use of non-coulomb H ion backscattering to characterize thick anodized aluminium filmsGossett, C.R. et al. | 1980
- 157
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Surface topology using Rutherford backscatteringEdge, R.D. / Bill, U. et al. | 1980
- 163
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Effects of surface roughness on backscattering spectraKnudson, A.R. et al. | 1980
- 169
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A gold and aluminium implanted standard for ion beam experimentsMitchell, I.V. / Eschbach, H.L. / Barfoot, K.M. et al. | 1980
- 175
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Irradiation chamber and sample changer for biological samplesKraft, G. / Daues, H.W. / Fischer, B. / Kopf, U. / Liebold, H.P. / Quis, D. / Stelzer, H. / Kiefer, J. / Schoepfer, F. / Schneider, E. et al. | 1980
- 181
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The high sensitivity measurement of carbon using the nuclear microprobePummery, F.C. / McMillan, J.W. et al. | 1980
- 187
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A new technique for backscattering analysisKeaton, P.W. / Peercy, P.S. / Doyle, B.L. / Maggiore, C.J. et al. | 1980
- 191
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Elimination of the beam effect on channeling dips of bismuth implanted in siliconWagh, A.G. / Radhakrishnan, S. / Gaonkar, S.G. / Kansara, M.J. et al. | 1980
- 195
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Dechanneling and the nature of defect structures in natural type Ia diamondsFearick, R.W. / Sellschopp, J.P. et al. | 1980
- 203
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The nuclear microprobe determination of the spatial distribution of stable isotope tracersHirst, P.M. / McMillan, J.W. / Malcolme-Lawes, D.J. et al. | 1980
- 211
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Characterization of amorphous silicon films by Rutherford backscattering spectrometryKubota, K. / Imura, T. / Iwami, M.I. / Hiraki, A. / Satou, M. / Fujimoto, F. / Hamakawa, Y. / Minomura, S. / Tanaka, K. et al. | 1980
- 217
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A method for determining depth profiles of transition elements in steelsGossett, C.R. et al. | 1980
- 223
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Depth profiling of deuterium with the D(3.He,p)4.He reactionDieumegard, D. / Dubreuil, D. / Amsel, G. et al. | 1980
- 227
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Coincidence measurements between scattered particles and X-rays to obtain high depth and mass resolutionBahir, G. / Kalish, R. / Tserruya, I. et al. | 1980
- 233
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Ion beam monitoring using thin self-supporting reference foilsMitchell, I.V. / Barfoot, K.M. / Eschbach, H.L. et al. | 1980
- 241
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Heavy ion microlithography - A new tool to generate and investigate submicroscopic structuresFischer, B.E. / Spohr, R. et al. | 1980
- 247
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A new elektrostatic ion microprobe systemKreijcik, P. / Kelly, J.C. / Dalglish, R.L. et al. | 1980
- 251
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Trace element detection sensitivity in PIXE analysis by means of an external proton beamRaith, B. / Wilde, H.R. / Roth, M. / Stratmann, A. / Gonsior, B. et al. | 1980
- 259
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Advances in the use of PIXE and PESA for air pollution samplingHudson, G.M. / Kaufmann, H.C. / Nelson, I.W. / Bonacci, M.A. et al. | 1980
- 265
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Ion-beam-induced migration and its effect on concentration profilesMyers, S.M. et al. | 1980
- 275
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Laser induced surface alloy information and diffusion of antimony in aluminiumJain, A.K. / Kulkarni, V.N. / Soad, D.K. / Sundararaman, M. / Yadav, R.D. et al. | 1980
- 283
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The application of low angle Rutherford backscattering and channeling techniques to determine implantation induced disorder profile distributions in semiconductorsAhmed, N.A. / Christodoulides, C.E. / Carter, G. / Nobes, M.J. / Titov, A.I. et al. | 1980
- 289
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The application of ion beam methods to diffusion and permeation measurementsMoeller, W. / Scherzer, B.M.U. / Bekrisch, R. et al. | 1980
- 295
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D and 3.He trapping and mutual replacement in molybdenumSchulz, R. / Behrisch, R. / Scherzer, B.M.U. et al. | 1980
- 301
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Deuterium enrichment during ion bombardment in VD 0.01 alloysYamaguchi, S. / Ozawa, K. / Yoshinari, O. / Koiwa, M. / Hirabayashi, M. et al. | 1980
- 307
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Ion-beam-induced annealing effects in GaAsWilliams, J.S. / Austin, M.W. et al. | 1980
- 313
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(110)Si surface peak analysis by 100-350 keV protonsHubbes, H.H. / Schmiedeskamp, B. / Roosendaal, H.E. / Lutz, H.O. et al. | 1980
- 317
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Dependence of defect structures on implanted impurity species in Al single crystalsHussain, T. / Linker, G. et al. | 1980
- 323
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Analysis of the dechanneling mechanism due to dislocationsWielunski, L. / Wielunska, D. / Mea, G.D. / Turos, A. et al. | 1980
- 329
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Recoil mixing in solids by energetic ion beamsLittmark, U. / Hofer, W.O. et al. | 1980
- 343
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Aspects of quantitative secondary ion mass spectrometryWittmaack, K. et al. | 1980
- 357
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Sputterings rates of minerals and implications for abundances of solar elements in lunar samplesJull, A.J. / Wilson, G.C. / Long, J.V. / Reed, S.J. / Pillinger, C.T. et al. | 1980
- 367
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Trace analysis in cadmium telluride by heavy ion induced X-ray emission and by SIMSScharager, C. / Stuck, R. / Siffert, P / Cailleret, J. / Heitz, C.H. / Lagarde, G. / Tenorio, D. et al. | 1980
- 373
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Towards a universal model for sputtered ion emissionWilliams, P. / Katz, W. / Evans, C.A. jun. et al. | 1980
- 379
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Ion induced Auger spectroscopyThomas, E.W. / Legg, K.O. / Metz, W.A. et al. | 1980
- 383
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RCA Lab., Princeton, USA;Princeton Univ. USA;Saudia Lab., Albuquerque Depth distributions of low energy deuterium implanted into silicon as determined by SIMSMagee, C.W. / Cohen, S.A. / Voss, D.E. / Brice, D.K. et al. | 1980
- 389
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Distortion of depth profiles during sputtering. I. General description of collisional mixingSigmund, P. / Gras-Marti, A. et al. | 1980
- 395
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Depth resolution of sputter profiling investigated by combined Auger-X-ray analysis of thin filmsEtzkorn, H.W. / Kirchner, J. et al. | 1980
- 399
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Edge-effects correction in depth profiles obtained by ion-beam sputteringTsong, I.S. / Power, G.L. / Hoffman, D.W. / Magee, C.W. et al. | 1980
- 405
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Surface roughening of copper by low energy ion bombardmentNaundorf, V. / Macht, M.P. et al. | 1980
- 415
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Determination of carbon in EFG silicon ribbons by nuclear techniques and SIMSToulemonde, M. / Hage-Ali, M. / Stuck, R. / Siffert, R. / Wald, F.V. / Bell, R.O. et al. | 1980
- 419
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Light emission from sputtered oxygenSchartner, K.H. / Flaig, H.I. / Hasselkamp, D. / Scharmann, A. et al. | 1980
- 425
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Radioisotope detection with tandem electrostatic acceleratorsGove, H.E. / Elmore, D. / Ferraro, R. / Beukens, R.P. / Chang, K.H. / Kilius, L.R. / Lee, H.W. / Litherland, A.E. / Purser, K.H. et al. | 1980
- 435
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A possible application of the SIMS method to determine the provenance of archaeological objectsDomanski, M. / Wojtowicz-Natanson, B. et al. | 1980
- 437
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PIXE research with an external beamChen, J.X. / Li, H.K. / Reu, C.G. / Tang, G.H. / Wang, X.D. / Yang, F.C. / Yao, H.Y. et al. | 1980
- 441
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Ion backscattering and X-ray investigations of violin varnish and woodTove, P.A. / Sigurd, D. / Peterson, S. et al. | 1980
- 447
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PIXE-PIME studies of artefactsDuerden, G.P. / Bird, J.R. / Scott, M.D. / Clayton, E. / Russel, L.H. / Cohen, D.D. et al. | 1980
- 453
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Applications of (n,p) and (n, alpha) reactions and backscattering technique to fusion reactor materials, archaeometry, and nuclear spectroscopyFink, D. / Biersack, J.P. / Grawe, H. / Mueller, K. Henkelmann, R. et al. | 1980
- 459
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Ion-beam analysis of meteortic and lunar samplesTombrello, T.A. et al. | 1980
- 469
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RBS and channeling analysis of As and Ga in laser doped siliconBerger, R. / Jaccard, C. / Rudolf, F. / Roulet, M.E. / Luethy, W. / Siregar, M.R.T. / Weber, H.P. et al. | 1980
- 473
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Evaporation loss and diffusion of antimony in silicon under pulsed laser irradiationJain, A.K. / Kulkarni, V.N. / Sood, D.K. / Sundararaman, M. / Yadav, R.D.S. et al. | 1980
- 479
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Correction factor for hair analysis by PIXEMontenegro, E.C. / Baptista, G.B. / Paschoa, A.S. / Castro Faria, L.V.de et al. | 1980
- 485
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Investigation of the solid-state reaction between nickel oxide and alumina by Rutherford backscattering (RBS)Roos, G.de / Geus, Y.W. / Fluit, J.M. / Wit, Y.H.de et al. | 1980
- 491
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An interface-marker technique applied to the study of metal silicide growthBaglin, J.E.E. / D'Heurle, F.M. / Hammer, W.N. / Peterson, S. et al. | 1980
- 499
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Nuclear reaction analysis of hydrogen in amorphous silicon and silicon carbide filmsLigeon, E. / Guivarch, A. / Fonteuille, J. / Contellec, M. le / Danielau, R. / Richard, J. et al. | 1980
- 505
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Measurements of 10.Be distributions using a tandem Van de Graaff acceleratorLanford, W.A. / Parker, P.D. / Bauer, K. / Turekian, K.K. / Cochran, J.K. / Krishnaswami, S. et al. | 1980
- 511
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The use of proton induced X-ray emission in the design and evaluation of catalystsCairns, J.A. / Cookson, J.A. et al. | 1980
- 517
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PIXE and NRA environmental studies by means of Lichen indicatorsHrynkiewicz, A.Z. / Szymczyk, S. / Kajfosz, J. / Olech, M. et al. | 1980
- 523
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The use of PIXE for the measurement of thorium and uranium microgram per gram levels in thick ore samplesCohen, D.D. / Duerden, P. / Clayton, E. / Wall, T. et al. | 1980
- 529
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Light volatiles in diamond: Physical interpretation and genetic significanceSellschop, J.P.F. / Madiba, C.C.P. / Annegarn, H.J. et al. | 1980
- 535
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Nuclear reaction analysis for measuring moisture profiles in graphite/epoxy compositesSchulte, R.L. / Deiasi, R.J. et al. | 1980
- 541
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Changes in the surface composition of Ag-Pd, Au-Pd and Cu-Pd alloys under ion bombardmentBetz, G. / Marton, J. / Braun, P. et al. | 1980
- 547
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Hydrogen ratios and profiles in deposited amorphous and polycrystalline films and in metals using nuclear techniquesBenenson, R.E. / Feldman, L.C. / Bagley, B.G. et al. | 1980
- 551
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Biomedical application of PIXE at the University of LiegeWeber, G. / Robaye, G. / Delbrouck, J.M. / Roelandts, I. / Dideberg, O. / Bartsch, P. / Pauw, M.C. de et al. | 1980
- 557
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Particle-induced X-ray emission (PIXE) analysis of biological materials: Presicision, accuracy, and application to cancer tissuesMaenhaut, W. / Reu, L. de / Rinsvelt, H.A. van / Cafmeyer, J. / Espen, P. van et al. | 1980
- 563
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Elemental microanalysis of biological and medical specimens with a scanning proton microprobeLegge, G.J.E. / Mazzolini, A.P. et al. | 1980
- 571
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Ion beam induced desorption of surface layersTaglauer, E. / Heiland, W. / Ousgaard, J. et al. | 1980
- 579
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Ion induced secondary electron emission as a probe for adsorbed oxygen on tungstenHasselkamp, D. / Scharmann, A. / Stiller, N. et al. | 1980
- 585
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Analysis of surface contaminant covering by ion-electron spectroscopy methodsSoszka, M. / Soszka, W. et al. | 1980
- 589
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Si(001) surface studies using high energy ion scatteringFeldman, L.C. / Silverman, P.J. / Stensgaard, I. et al. | 1980
- 595
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Creation of surface damage on a nickel (110) surface by bombardment with 3-30 keV noble gas ionsVerhej, L.K. / Loenen, E. van / Berg, J.A. van den / Armour, D.G. et al. | 1980
- 601
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Heavy ion induced desoroption of organic compoundsDueck, P. / Treu, W. / Galster, W. / Froehlich, H. / Voit, H. et al. | 1980
- 607
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Ion-induced adsorption of oxygen at a Cu(110) surfaceWit, A.G.de / Fluit, J.M. / Hupkens, T.M. / Bronckers, R.P.N. et al. | 1980
- 611
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Absolute coverage measurement of adsorbed CO and D2 on platinumDavies, J.A. / Norton, P.R. et al. | 1980
- 617
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Author index| 1980
- IFC
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Editorial Board| 1980
- viii
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Conference photo| 1980