Identification and fine tuning and closed-loop processes under discrete EWMA and PI adjustments (Englisch)
- Neue Suche nach: Pan Rong
- Neue Suche nach: Del Castillo, E.
- Neue Suche nach: Pan Rong
- Neue Suche nach: Del Castillo, E.
In:
Quality and Reliability Engineering International
;
17
, 6
;
419-427
;
2001
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Identification and fine tuning and closed-loop processes under discrete EWMA and PI adjustments
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Beteiligte:Pan Rong ( Autor:in ) / Del Castillo, E. ( Autor:in )
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Erschienen in:Quality and Reliability Engineering International ; 17, 6 ; 419-427
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Verlag:
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Erscheinungsdatum:2001
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Format / Umfang:9 Seiten, 14 Quellen
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ISSN:
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Coden:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 17, Ausgabe 6
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