Three-dimensional orientation microscopy in a focused ion beam-scanning electron microscope: A new dimension of microstructure characterization (Englisch)
- Neue Suche nach: Zaefferer, S.
- Neue Suche nach: Wright, S.I.
- Neue Suche nach: Raabe, D.
- Neue Suche nach: Zaefferer, S.
- Neue Suche nach: Wright, S.I.
- Neue Suche nach: Raabe, D.
In:
Metallurgical and Materials Transactions A, Physical Metallurgy and Materials Science
;
39A
, 2
;
374-389
;
2008
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Three-dimensional orientation microscopy in a focused ion beam-scanning electron microscope: A new dimension of microstructure characterization
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Beteiligte:
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Erschienen in:
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Verlag:
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Erscheinungsdatum:2008
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Format / Umfang:16 Seiten, 13 Bilder, 53 Quellen
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 39A, Ausgabe 2
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