Electromigration effect on low frequency noise in Al thin films (Englisch)
- Neue Suche nach: Liou, D.M.
- Neue Suche nach: Gong, J.
- Neue Suche nach: Chen, C.C.
- Neue Suche nach: Liou, D.M.
- Neue Suche nach: Gong, J.
- Neue Suche nach: Chen, C.C.
In:
Japanese Journal of Applied Physics, Part 1
;
30
, 4
;
708-710
;
1991
-
ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:Electromigration effect on low frequency noise in Al thin films
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Weitere Titelangaben:Wirkung der Elektromigration auf das niederfrequente Rauschen in Al-Dünnschichten
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Beteiligte:
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Erschienen in:Japanese Journal of Applied Physics, Part 1 ; 30, 4 ; 708-710
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Verlag:
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Erscheinungsdatum:1991
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Format / Umfang:3 Seiten
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 30, Ausgabe 4
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