The effects of elevated temperature on sputter depth profiles of silver/nickel bilayers (Englisch)
- Neue Suche nach: Simko, S.J.
- Neue Suche nach: Yang-Tse Cheng
- Neue Suche nach: Militello, M.C.
- Neue Suche nach: Simko, S.J.
- Neue Suche nach: Yang-Tse Cheng
- Neue Suche nach: Militello, M.C.
In:
37th National Symposium of the American Vacuum Society, 8-12 Oct. 1990, Toronto, Ont., Canada
;
1477-1481
;
1991
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ISSN:
- Aufsatz (Zeitschrift) / Print
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Titel:The effects of elevated temperature on sputter depth profiles of silver/nickel bilayers
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Weitere Titelangaben:Einfluß erhöhter Temperatur auf Sputterprofile in Silber/Nickel-Doppelschichten
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Beteiligte:
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Erschienen in:37th National Symposium of the American Vacuum Society, 8-12 Oct. 1990, Toronto, Ont., Canada ; 1477-1481Journal of Vacuum Science and Technology, Part A (Vacuums, Surfaces, and Films) ; 9, 3, PT.2 ; 1477-1481
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Verlag:
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Erscheinungsdatum:1991
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Format / Umfang:5 Seiten, 17 Quellen
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
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Schlagwörter:KONZENTRATIONSPROFIL , OBERFLAECHENSTRUKTUR , DUENNE SCHICHT , SCHICHTSTRUKTUR , TEMPERATURGANG , DIFFUSION , GRENZFLAECHE , AUGER-EFFEKT , EIGENSPANNUNG , SILBER , ZERSTAEUBUNG , OBERFLAECHENENERGIE , AUGER-ELEKTRONENSPEKTROMETRIE , NICKEL , OBERFLAECHENDIFFUSION , GITTERFEHLANPASSUNG , MISCHUNGSWAERME , FESTKOERPERPHASENUMWANDLUNG , INSEL , IONENSTRAHLKATHODENZERSTAEUBUNG
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Datenquelle:
Inhaltsverzeichnis – Band 9, Ausgabe 3, PT.2
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Surface extended X-ray adsorption fine structure studies of the Si(001) 2*1-Sb interfaceRichter, M. / Woicik, J.C. / Pianetta, P. / Miyano, K.E. / Kendelewicz, T. / Bouldin, C.E. / Spicer, W.E. / Lindau, I. et al. | 1991
- 1956
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Structure of the Si(111) square root 3* square root 3-Sb interface by surface X-ray absorption fine structure and photoemissionWoicik, J.C. / Kendelewicz, T. / Miyano, K.E. / Bouldin, C.E. / Meissner, P.L. / Pianetta, P. / Spicer, W.E. et al. | 1991
- 1962
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Alkali metal chains on the GaAs(110) surfaceBatra, I.P. / Fong, C.Y. et al. | 1991
- 1964
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Sm/GaAs(110)interface formation: surface instabilities and kinetic constraintsKomeda, T. / Anderson, S.G. / Seo, J.M. / Schabel, M.C. / Weaver, J.H. et al. | 1991
- 1972
-
Empty electronic states of epitaxial Bi overlayers on InP(110): effects of surface relaxationJost, M.B. / Yongjun Hu / Poirier, D.M. / Weaver, J.H. et al. | 1991
- 1977
-
Comparison of hot cathode and cold cathode ionization gaugesPeacock, R.N. / Peacock, N.T. / Hauschulz, D.S. et al. | 1991
- 1986
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Reduction of space charge effect on the sensitivity of a triode gaugeHirata, M. / Ono, M. et al. | 1991
- 1991
-
Techniques for measuring mass spectrometer performance parametersBasford, J.A. et al. | 1991
- 1996
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Comparative tests of quadrupole, magnetic, and time-of-flight residual gas analyzersAbbott, P.J.J. / Kendall, B.R.F. / Trout, K.P. et al. | 1991
- 2001
-
Using microchannels to improve the performance of vacuum technology instrumentationVanderschmidt, G.F. et al. | 1991
- 2007
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'Quick Release' concept in rotary vacuum pumps: A significant output increase in harsh semiconductor applicationsDondoli, S. / Berna, A. et al. | 1991
- 2070
-
Nonevaporable getter investigation at the National Synchrotron Light SourceHalama, H.J. / Yaohua Guo et al. | 1991
- 2074
-
General considerations in the design of accelerator vacuum systemsGrobner, O. et al. | 1991
- 2081
-
Vacuum and multipactor performance of the hadron electron ring accelerator 52 MHz cavitiesBurton, R.J. / Jong, M.S. de / Funk, L.W. et al. | 1991