Thermal and photothermal imaging on a sub 100 nanometer scale (Englisch)
- Neue Suche nach: Williams, C.C.
- Neue Suche nach: Wickramasinghe, H.K.
- Neue Suche nach: Williams, C.C.
- Neue Suche nach: Wickramasinghe, H.K.
In:
Proc. SPIE-Int. Soc. Opt. Eng., Scanning microscopy technologies and applications
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129-134
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1988
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ISBN:
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ISSN:
- Aufsatz (Konferenz) / Print
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Titel:Thermal and photothermal imaging on a sub 100 nanometer scale
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Weitere Titelangaben:Thermische und photothermische Abbildung im Bereich unterhalb von 100 nm
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Beteiligte:Williams, C.C. ( Autor:in ) / Wickramasinghe, H.K. ( Autor:in )
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Erschienen in:
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Verlag:
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Erscheinungsdatum:1988
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Format / Umfang:6 Seiten, 7 Bilder, 9 Quellen
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ISBN:
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ISSN:
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Medientyp:Aufsatz (Konferenz)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 2
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Some History And Technology Of Scanning MicroscopyWickramasinghe, H K. et al. | 1988
- 8
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Scanning Tunneling Microscopy: Instrument Design And Application In Air And VacuumPark, Sang-il / Nogami, J / Quate, C F. et al. | 1988
- 16
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Creating And Observing Surface Features With A Scanning Tunneling MicroscopeSchneir, J / Hansma, P K. / Elings, V / Gurley, John / Wickramasinghe, K / Sonnenfeld, R et al. | 1988
- 22
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Probing Surfaces With The Atomic Force MicroscopeMarti, O / Drake, B / Gould, S / Hansma, P K. et al. | 1988
- 26
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Atomic Force Microscope: ImplementationsHobbs, P C. D. / Martin, Y / Williams, C C. / Wickramasinghe, H K. et al. | 1988
- 32
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The Scanning Optical Microscope: An OverviewKino, G S. / Corte, T R. / Xiao, G Q. et al. | 1988
- 43
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Linear And Differential Techniques In The Scanning Optical MicroscopeIravani, M.Vaez / See, C W. et al. | 1988
- 55
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Infrared Beam Induced Contrast With Double IlluminationCastaldini, A / Cavallini, A et al. | 1988
- 63
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Deteriorating Effects Of Beam Truncation On Focus Sensing SystemsToker, Gregory / Brunfeld, Andrei / Shamir, Joseph et al. | 1988
- 70
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Photothermal MicroscopeDovichi, N J. / Burgi, D S. et al. | 1988
- 75
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Ultra-Violet Confocal MetrologyBennett, Simon D. / Peltzer, Eric A. / Smith, Ian R. et al. | 1988
- 84
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Scanning Near-Field Optical Microscopy (SNOM*): Basic Principles And Some Recent DevelopmentsPohl, D. W. / Fischer, U. C. / Durig, U. T. et al. | 1988
- 91
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Near-Field Scanning Optical Microscopy (NSOM)Betzig, E / Isaacson, M / Barshatzky, H / Lewis, A / Lin, K et al. | 1988
- 100
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Surface Plasmon Scanning MicroscopyYeatman, Eric M. / Ash, Eric A. et al. | 1988
- 110
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Scanning Capacitance MicroscopyMatey, J R. et al. | 1988
- 118
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Acoustic MicroscopyKhuri-Yakub, B T. et al. | 1988
- 129
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Thermal And Photothermal Imaging On A Sub 100 Nanometer ScaleWilliams, C C. / Wickramasinghe, H K. et al. | 1988
- 135
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Thermal Wave Imaging: Detection Of Subsurface Features In Opaque SolidsMurphy, John C. / Aamodt, Leonard C. / Maclachlan, Jane W. et al. | 1988
- 144
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Externally Pressurised Bearings For Systems Leading To Nanometer TechnologyStout, K J. / Tawfik, M et al. | 1988
- 154
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Magnetic Bearings For Precision Linear SlidesEisenhaure, David B. / Slocun, Alexander / Hockney, Richard et al. | 1988
- 160
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Scanning Tomographic Acoustic MicroscopyWade, G / Meyyappan, A et al. | 1988
- 160
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Scanning tomographie acoustic microscopyWade, G. / Meyyappan, A. et al. | 1988
- 169
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Application Of The PIPE Image Processing Machine To Scanning MicroscopyHerman, Martin et al. | 1988
- 176
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Determination Of Fields Near A Silver Strip On A Glass SubstrateMarx, Egon / Teague, E.Clayton et al. | 1988
- 185
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Scanning Soft X-Ray MicroscopyTrail, John A. / Byer, Robert L. et al. | 1988
- 191
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High-Resolution Capacitance Measurement By Force Microscopy: Application To Sample Characterization And PotentiometryAbraham, David W. / Martin, Yves / Wiekramasinghe, Kumar et al. | 1988
- 199
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Image Processing And Control Workstation For Scanning MicroscopyDixon, A E. / Smith, J A. / Gutjahr, T A. et al. | 1988
- 207
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High Resolution Phase Measuring Laser Interferometric Microscope For Engineering Surface MetrologyBiegen, J F. / Smythe, R A. et al. | 1988