Industrial applications of an optical profilometer (Englisch)
- Neue Suche nach: Breitmeier, U.
- Neue Suche nach: Breitmeier, U.
In:
Proc. SPIE - Int. Soc. Opt. Eng., Optical testing and metrology
;
954
;
200-207
;
1989
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ISBN:
- Aufsatz (Konferenz) / Print
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Titel:Industrial applications of an optical profilometer
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Weitere Titelangaben:Industrielle Anwendungen eines optischen Profilometers
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Beteiligte:Breitmeier, U. ( Autor:in )
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Erschienen in:Proc. SPIE - Int. Soc. Opt. Eng., Optical testing and metrology ; 954 ; 200-207
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Verlag:
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Erscheinungsdatum:1989
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Format / Umfang:8 Seiten, 11 Bilder, 1 Quelle
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ISBN:
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Medientyp:Aufsatz (Konferenz)
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Format:Print
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis Konferenzband
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 2
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Some New Techniques For Imaging Through InhomogeneitiesLeith, E. N. / Cunha, A. et al. | 1989
- 11
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Phase-Conjugate Interferometry Using Degenerate Four-Wave Mixing And HolographyNakagawa, Kazuo / Fujiwara, Nirofumi et al. | 1989
- 16
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Pulsed Holography With Computer Vision For Nondestructive Testing In The Field EnvironmentMader, David L. et al. | 1989
- 29
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The Range Of Holographic Interferometry For Displacement MeasuringJing, Fang / Fulong, Dai et al. | 1989
- 34
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Alignment Verification Using Holographic CorrelationHarding, Kevin G. / Michniewicz, Mark et al. | 1989
- 40
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Characterization Of DCG Holograms During The Production Process: Some Practical AspectsPawluczyk, R. / Billard, T. C. / Quaglia, A. / Vienneau, T. / Hockley, B. S. et al. | 1989
- 50
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Holographic Interferometry Versus Lensless Speckle PhotographyBahuguna, R. D. / Lee, S. C. / Abramson, N. H. et al. | 1989
- 54
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Aberration-Free Fraunhofer Holography Of Micro-ObjectsVikram, C. S. / Billet, M. L. et al. | 1989
- 60
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What Can Be Interferometered?Langenbeck, P. et al. | 1989
- 66
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Scan InterferometerLangenbeck, P. / Gerspacher, P. / Muller, D. et al. | 1989
- 71
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Phase-Measuring Interferometry: Applications And TechniquesTome, Jay A. / Stahl, H.Philip et al. | 1989
- 78
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Phase-Measuring Interferometry: Performance Characterization And CalibrationStahl, H.Philip / Tome, Jay A. et al. | 1989
- 88
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The Evaluation Of A Random Sampling Error On The Polynomial Fit Of Subaperture Test DataLewis, Jeff L. / Kuhn, William P. / Stahl, H.Philip et al. | 1989
- 95
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Talbot Bands : Determination Of Material DispersionWarenghem, M. / Grover, C. P. et al. | 1989
- 101
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Optical Profiling Using An Interference MicroscopeCencic, B. / Barut, M. / Langenbeck, P. et al. | 1989
- 110
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Coded Imaging By Self-Imaging Structures (SIS) And ApplicationsSom, S. C. / Satpathi, A. et al. | 1989
- 121
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An Interpretation Of Moire Tnterferometry From Wavefront Interference TheoryDai, Fu-long / McKelvie, James / Post, Daniel et al. | 1989
- 131
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Characterization Of Images Produced By Single And Multiple Apertures And Their ApplicationsHane, K. / Grover, C. P. et al. | 1989
- 145
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Computer Moire© Deflectometry Using Talbot EffectVlad, V. I. / Popa, D. / Apostol, I. et al. | 1989
- 153
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Moire Interferometry Applied To Topographic Contour MeasurementDai, Y. Z. / Chiang, F. P. et al. | 1989
- 160
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Reflection Lau Imaging And Its Application To Displacement SensingHane, K. / Hattori, S. / Grover, C. P. et al. | 1989
- 166
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Moire Methods For Curvature MeasurementsPolitch, Jacob et al. | 1989
- 174
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Comparison Of Interferometric Contouring TechniquesCreath, Katherine / Wyant, James C. et al. | 1989
- 183
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Interferometric Measurements Of Remote Surfaces Profile's Through An Optical FiberCalatroni, Jose E. / Sainz, Carmen / Tribillon, Gilbert et al. | 1989
- 189
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Comparison Of Optical And Mechanical Measurements Of Surface FinishChurch, E. L. / Dainty, J. C. / Gale, D. M. / Takacs, P. Z. et al. | 1989
- 200
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Industrial Applications Of An Optical ProfilometerBrown, A.J. C. / Breitmeier, U. et al. | 1989
- 208
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Optical Enhancement Of Surface Contour Variations For Sheet Metal And Plastic Panel InspectionReynolds, Rodger L. / Hageniers, Omer L. et al. | 1989
- 217
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Surface Measurements And Applications For Manufactured Parts Using Noncontact ProfilometerBristow, T. C. / Bouzid, A. / Bietry, J. et al. | 1989
- 226
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Coordinate Mastering Using Optical CouplingBieman, Leonard H. et al. | 1989
- 234
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Laser -Aided SpherometerSoares, Oliverio D. D. / Fernandez, Jose F. et al. | 1989
- 241
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An Improved Fourier Transform ProfilometrySu, Xian-Yu / Li, Jian / Guo, Lu-Rong / Su, Wan-Yong et al. | 1989
- 246
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Interferometric Measurement Of The Roughness Of Machined PartsCreath, Katherine / Wyant, James C. et al. | 1989
- 252
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Automated Optical Rouginess InspectionZimmerman, Jay H. / Vorburger, Theodore V. / Moncarz, Howard T. et al. | 1989
- 252
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Automated optical roughness inspectionZimmerman, J.H. / Vorburger, T.V. / Moncarz, H.T. et al. | 1988
- 265
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Comparison Of Techniques For The Measurement Of 3-Dimensional Surface MicrotopographyFairlie, M. J. / Akkerman, J. G. / Smith, D. / Timsit, R. S. et al. | 1989
- 272
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Rough Surfaces Classification Using Fourier TransformGorecki, C. et al. | 1989
- 279
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High Precision And Miniaturized Mark Position Sensing Methods For 3-D Shape MeasurementIdesawa, Masanori et al. | 1989
- 287
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A Non-Contact ED Sensor For Irterferometric End Gauge CalibrationTanwar, L. S. / Jain, P. C. et al. | 1989
- 287
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A non-contact EO sensor for interferometric end gauge calibrationTanwar, L.S. / Jain, P.C. et al. | 1989
- 292
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Profilometry In The Angstrom RegionPolitch, Jacob et al. | 1989
- 300
-
The Development Of ESPI With View-Points Of Optical System Set-UpsChang, Ming-Wen et al. | 1989
- 310
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Digital processing of Young's fringers in speckle photographyChen, D.J. / Chiang, F.P. et al. | 1989
- 310
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Digital Processing Of Young's Fringes In Speckle PhotographyChen, D. J. / Chiang, F. P. et al. | 1989
- 321
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Optical Surface Inspection Using A Transverse Speckle Detection TechniqueOulamara, A. / Tribillon, G. / Spajer, M. / Duvernoy, J. et al. | 1989
- 327
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New Method Of Contouring Using Digital Speckle Pattern Interferometry (DSPI)Ganesan, A. R. / Sirohi, R. S. et al. | 1989
- 333
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A Fast Deformation Analysis Method By Digital Correlation TechniqueFang, Qiang / Yiao, Hong / Tan, Yushan / Ku, Chungshien et al. | 1989
- 338
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Changed Parameter Method In PhotomechanicsChen, Fang et al. | 1989
- 342
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Holography In Science And Industry - Measurement With Picosecond PulsesAbramson, Nils H. et al. | 1989
- 344
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Elastic Scattering Of Light From A Few Atomic Dipoles On A Flat Metal SurfaceKeller, Ole / Sonderkaer, Peter et al. | 1989
- 366
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Technologies In AspherisationHradaynath, R. et al. | 1989
- 375
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Optical Flatness Standard II: Reduction Of InterferogramsPrimak, William et al. | 1989
- 382
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In-Process Analysis Of Optical Components Machined On A Diamond Turning LatheParker, R. A. et al. | 1989
- 392
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Developments In Radial MetrologyGreguss, Pal / Gilbert, John A. / Matthys, Donald R. / Lehner, David L. et al. | 1989
- 399
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Testing Reflective Optical Surfaces With A Non-Contacting ProbeMolesini, G. / Quercioli, F. / Tiribilli, B. / Trivi, M. et al. | 1989
- 408
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State Of The Art Of Applications Of Holography In Medicine And Biologyvon Bally, G. et al. | 1989
- 413
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Review Of Optical Methods In ImmunosensingSadowski, Janusz W. et al. | 1989
- 420
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Biomedical Aspects Of Optical TestingGreguss, Pal et al. | 1989
- 438
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Digital Image Correlation Measurements Of Strain In Bovine RetinaDurig, B. R. / Peters, W. H. / Hammer, M. E. et al. | 1989
- 444
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Some Experiments On The Perceived Size Of Laser SpecklesBahuguna, R. D. / Gupta, K. K. / Singh, K. et al. | 1989
- 448
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Traceability Of Optical Length MeasurementsSawabe, Masaji / Ohta, Shigekata / Hiroshima, Seiji et al. | 1989
- 456
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Alignment Aspects Of The Optical System On The VEGA SpacelabsAbraham, Gyorgy / Wenzel, Klara et al. | 1989
- 464
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Applications Of Neural Networks To The Manufacturing EnvironmentCaulfield, H. J. et al. | 1989
- 468
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Image Processing Techniques For Fringe Pattern AnalysisReid, G. T. et al. | 1989
- 478
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The Analysis Of Precision In Digital Image MetrologyHavelock, D. I. et al. | 1989
- 491
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Use Of The Radon Transform In Surface InspectionPieralli, Christian / Regnault, Philippe / Tribillon, Gilbert et al. | 1989
- 497
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Procedures For Reliable Evaluation Of Measurement Data In Electrooptical Coordinate Measurement SystemsKeferstein, C. P. / Warnecke, H.-J. et al. | 1989
- 505
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Application Of Heterodyne Nrofilometry And Digital Image Processings To The Stufiilly Of Erosion PhenomenaPieralli, C. / Tribillon, G. et al. | 1989
- 505
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Application of heterodyne profilometry and digital image processings to the study of erosion phenomenaPieralli, C. / Tribillon, G. et al. | 1989
- 510
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Detection And Characterization Of Flaws On Machined Metal SurfacesSafabakhsh, Reza / Gonzalez, Rafael C. et al. | 1989
- 518
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Vector Wave Imagery, Image Processing And Temporal FilteringChakraborty, A. K. et al. | 1989
- 526
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Structurally Integrated Fiber Optic Recticulate Sensors (SIFORS) - The Key To Smart StructuresMeasures, R. M. et al. | 1989
- 543
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Quality Control Using Optical Probe ArraysStewart, Robert M. et al. | 1989
- 548
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Misalignment Tolerances For A Phased Array Imaging SystemYoung, Eric W. / Peters, Shelah M. et al. | 1989
- 560
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Photometry And Radiometry Of Diode Emitters: LEDs And IREDsMuray, Kathleen et al. | 1989
- 568
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Infrared Sensors For Seam Tracking And Penetration Depth ControlNagarajan, S. / Chen, W. H. .. / Groom, K. N. / Chin, B. A. .. et al. | 1989
- 574
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Design And E-0 Performance Of A Low Voltage Highly Reflective Dichroic LCD Using λ/4 PlateBahadur, Birendra et al. | 1989
- 579
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A Dual-Imager And Its Applications For Active Vision Robot Welding, Surface Inspection And Two Color PyrometryMaldague, X. / Dufour, M. et al. | 1989
- 593
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Application Of Photothermoelastic Effect To Noncontact Inspection Of Soldered ConnectionsHane, K. / Hattori, S. et al. | 1989
- 599
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Photoelastic Simulation Technique Of Welding Residual StressesZhang, H. Q. / Lai, Z. M. et al. | 1989
- 606
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Ontical Sensing Principles And Optic Sensor BusesPaton, Barry E. et al. | 1989
- 617
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Optical Heterodyne-Detection Schemes For Fiber-Optic GyroscopesOhtsuka, Yoshihiro et al. | 1989
- 625
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Fiber Optic Sensing Based On Counterpropagating WavesValis, T. / Turner, R. D. / Measures, R. M. et al. | 1989
- 634
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Fiber Optic Geophysics Sensor ArrayGrochowski, Lucjan et al. | 1989
- 640
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Multifibre Sensor Systems Using Optical-RAM DetectorsPaton, B. E. / MacKay, I. B. et al. | 1989
- 647
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Fiber Optic Sensors With Internal ReferencingAdamovsky, Grigory / Maitland, Duncan J. et al. | 1989
- 652
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Discrete Measurement Of Field Distribution Ming Fiber Optic Microbend SensorShadaram, Mehdi et al. | 1989
- 657
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A Fibre Optic Fluid Level Sensor: Practical ConsiderationsSnow, James W. .. et al. | 1989
- 664
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Positioning Error In Fiber-Optic Due To Focal Shift Produced By GRIN ConnectorsGomez-Reino, C. / Linares, J. / Flores, J. R. / Acosta, E. et al. | 1989
- 670
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Ultrahigh Resolution Optical Time-Domain ReflectometryGarside, B. K. et al. | 1989
- 676
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Robot Mounted Laser Scanner For Paint InspectionWest, R. N. / Baker, L. R. / Atkinson, R. M. / Claridge, J. F. et al. | 1989
- 681
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Photometric Camera Alignment And Focus Using ReflectionLabick, David G. / Estes, Judson B. et al. | 1989
- 686
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Portable Laser Tools For Vibration MeasurementHalliwell, N. A. et al. | 1989
- 694
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Laser Alignment Techniques For Simultaneous Machine Tool Geometric Error DetectionNi, J. / Wu, S. M. et al. | 1989
- 702
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A Laser-Based 3D Sensor For Teaching Robot PathsMakynen, A. / Kostamovaara, J. / Myllyla, R. et al. | 1989
- 710
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Laser-Based Instrument For Noncontact Measurement Of Fan-Belt SlippageMengel, Finn et al. | 1989
- 716
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Optical Triangulation Using A CCD Array With Sub-Pixel ResolutionJones, Robert / Rowbotham, Lucy / Pritchett, Michael et al. | 1989