X-Ray and Morphological Characterization of Al-O Thin Films Used for Vertically Aligned Single-Walled Carbon Nanotube Growth (Englisch)
Nationallizenz
- Neue Suche nach: Asyadi Azam, Mohd
- Neue Suche nach: Abd Rashid, Mohd Warikh
- Neue Suche nach: Isomura, Kazuki
- Neue Suche nach: Fujiwara, Akihiko
- Neue Suche nach: Shimoda, Tatsuya
In:
Advanced Materials Research
;
620
;
213-218
;
2012
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:X-Ray and Morphological Characterization of Al-O Thin Films Used for Vertically Aligned Single-Walled Carbon Nanotube Growth
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Beteiligte:
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Erschienen in:Advanced Materials Research ; 620 ; 213-218
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Verlag:
- Neue Suche nach: Trans Tech Publications
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Erscheinungsort:Stafa-Zurich, Switzerland
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Erscheinungsdatum:13.12.2012
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Format / Umfang:6 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 620
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