Surface Analysis Techniques (Englisch)
- Neue Suche nach: Macková, A.
- Neue Suche nach: Morton, S. A.
- Neue Suche nach: Walker, C. G. H.
- Neue Suche nach: Volka, K.
- Neue Suche nach: Gauglitz, Guenter
- Neue Suche nach: Vo‐Dinh, Tuan
- Neue Suche nach: Macková, A.
- Neue Suche nach: Morton, S. A.
- Neue Suche nach: Walker, C. G. H.
- Neue Suche nach: Volka, K.
In:
Handbook of Spectroscopy
;
497-599
;
2003
-
ISBN:
- Aufsatz/Kapitel (Buch) / Elektronische Ressource
-
Titel:Surface Analysis Techniques
-
Beteiligte:Gauglitz, Guenter ( Herausgeber:in ) / Vo‐Dinh, Tuan ( Herausgeber:in ) / Macková, A. ( Autor:in ) / Morton, S. A. ( Autor:in ) / Walker, C. G. H. ( Autor:in ) / Volka, K. ( Autor:in )
-
Erschienen in:Handbook of Spectroscopy ; 497-599
-
Verlag:
- Neue Suche nach: Wiley‐VCH Verlag GmbH & Co. KGaA
-
Erscheinungsort:Weinheim, FRG
-
Erscheinungsdatum:26.08.2003
-
Format / Umfang:102 pages
-
ISBN:
-
DOI:
-
Medientyp:Aufsatz/Kapitel (Buch)
-
Format:Elektronische Ressource
-
Sprache:Englisch
-
Schlagwörter:scanning electron microscopy , selection of method , Auger electron spectroscopy , secondary ion mass spectrometry , X‐ray absorption fine structure , electron probe microanalysis , transmission spectroscopy , surface analysis techniques , Raman spectroscopy , elastic recoil detection analysis , scanning tunneling spectroscopy , inelastic electron tunneling spectroscopy , penning ionisation electron spectroscopy , Auger photoelectron coincidence spectroscopy , electron stimulated desorption ion angular distributions , ellipsometry , electron momentum spectroscopy , atom probe field ion microscopy , X‐ray standing wave , resonant nuclear reaction analysis , total reflection X‐ray fluorescence spectroscopy , Rutherford backscattering spectrometry , low‐energy ion scattering spectrometry , particle induced X‐ray emission , definition of the surface , evanescent wave cavity ring‐down spectroscopy , surface plasmon resonance spectroscopy , neutron depth profiling , high resolution electron energy loss spectroscopy , attenuated total reflection spectroscopy , reflection‐absorption spectroscopy , charge particle activation analysis , reflection electron energy loss spectroscopy , ultraviolet photoelectron spectroscopy , X‐ray photoelectron spectroscopy , ion neutralization spectroscopy , angle resolved ultraviolet photoelectron spectroscopy , inverse photoelectron spectroscopy , spin polarized electron energy loss spectroscopy , glow discharge optical emission spectrometry , appearance potential spectroscopy , photoacoustic spectroscopy , spectroscopy of surface electromagnetic waves , particle induced gamma ray emission , electron stimulated desorption , sum‐frequency generation vibrational spectroscopy , near edge X‐ray absorption spectroscopy , positron annihilation Auger electron spectroscopy , ion probe microanalysis , photoemission electron microscopy , spin polarized ultraviolet photoelectron spectroscopy , X‐ray photoelectron diffraction , diffuse reflection spectroscopy
-
Datenquelle:
Inhaltsverzeichnis E-Book
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 1
-
IntroductionLane, Douglas A. et al. | 2003
- 1
-
BioanalysisAlbers, Willem M. / Annila, Arto / Goddard, Nicholas J. / Patonay, Gabor / Soini, Erkki et al. | 2003
- 4
-
Collection and Preparation of Gaseous SamplesLane, Douglas A. et al. | 2003
- 17
-
Sample Collection and Preparation of Liquid and SolidsCullum, Brian M. / Vo‐Dinh, Tuan et al. | 2003
- 37
-
Basics of Optical SpectroscopyHof, Martin et al. | 2003
- 48
-
InstrumentationSablinskas, Valdas et al. | 2003
- 70
-
Measurement TechniquesSteiner, Gerald et al. | 2003
- 89
-
ApplicationsSablinskas, Valdas / Steiner, Gerald / Hof, Martin et al. | 2003
- 152
-
LC‐MS in Environmental AnalysisSchröder, H. Fr. et al. | 2003
- 177
-
An Introduction to Solution, Solid‐State, and Imaging NMR SpectroscopyButler, Leslie G. et al. | 2003
- 209
-
Solution NMR SpectroscopyMartin, Gary E. / Hadden, Chad E. / Russell, David J. et al. | 2003
- 244
-
Gas Chromatography/Ion Trap Mass Spectrometry (GC/ITMS) for Environmental AnalysisSablier, Michel / Fujii, Toshihiro et al. | 2003
- 269
-
Solid‐State NMRBrown, Steven P. / Emsley, Lyndon et al. | 2003
- 279
-
Optical SpectroscopyGreen, John et al. | 2003
- 297
-
NMRWeisenberger, Loring A. et al. | 2003
- 316
-
Process Mass SpectrometryHassell, Christian et al. | 2003
- 327
-
Mass SpectrometryPrzybylski, Michael / Weinmann, Wolfgang / Fligge, Thilo A. et al. | 2003
- 336
-
Elemental AnalysisCrighton, J. S. et al. | 2003
- 363
-
X‐Ray Fluorescence AnalysisJanssens, K. et al. | 2003
- 381
-
Hyphenated Techniques for Chromatographic DetectionFetzer, John C. et al. | 2003
- 421
-
Atomic Absorption Spectrometry (AAS) and Atomic Emission Spectrometry (AES)Rosenberg, Erwin / Panne, Ulrich et al. | 2003
- 469
-
Nuclear Magnetic Resonance SpectroscopyRobien, Wolfgang et al. | 2003
- 497
-
Surface Analysis TechniquesMacková, A. / Morton, S. A. / Walker, C. G. H. / Volka, K. et al. | 2003
- 505
-
Index| 2003
- i
-
Front Matter| 2003