Glutaraldehyde fixation method for single‐cell lipid analysis by time‐of‐flight secondary ion‐mass spectrometry (Englisch)
- Neue Suche nach: Nagata, Yasuyuki
- Neue Suche nach: Ishizaki, Itsuko
- Neue Suche nach: Waki, Michihiko
- Neue Suche nach: Ide, Yoshimi
- Neue Suche nach: Hossen, Md Amir
- Neue Suche nach: Ohnishi, Kazunori
- Neue Suche nach: Sanada, Noriaki
- Neue Suche nach: Setou, Mitsutoshi
- Neue Suche nach: Nagata, Yasuyuki
- Neue Suche nach: Ishizaki, Itsuko
- Neue Suche nach: Waki, Michihiko
- Neue Suche nach: Ide, Yoshimi
- Neue Suche nach: Hossen, Md Amir
- Neue Suche nach: Ohnishi, Kazunori
- Neue Suche nach: Sanada, Noriaki
- Neue Suche nach: Setou, Mitsutoshi
In:
Surface and Interface Analysis
;
46
, S1
;
185-188
;
2014
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:Glutaraldehyde fixation method for single‐cell lipid analysis by time‐of‐flight secondary ion‐mass spectrometry
-
Beteiligte:Nagata, Yasuyuki ( Autor:in ) / Ishizaki, Itsuko ( Autor:in ) / Waki, Michihiko ( Autor:in ) / Ide, Yoshimi ( Autor:in ) / Hossen, Md Amir ( Autor:in ) / Ohnishi, Kazunori ( Autor:in ) / Sanada, Noriaki ( Autor:in ) / Setou, Mitsutoshi ( Autor:in )
-
Erschienen in:Surface and Interface Analysis ; 46, S1 ; 185-188
-
Verlag:
-
Erscheinungsdatum:01.11.2014
-
Format / Umfang:4 pages
-
ISSN:
-
DOI:
-
Medientyp:Aufsatz (Zeitschrift)
-
Format:Elektronische Ressource
-
Sprache:Englisch
-
Schlagwörter:
-
Datenquelle:
Inhaltsverzeichnis – Band 46, Ausgabe S1
Zeige alle Jahrgänge und Ausgaben
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 1
-
Preface for the Proceedings of SIMS XIX, Jeju, Korea 2013Lee, Yeonhee / Moon, DaeWon / Kang, Hee Jae / Kim, Kyung Joong / Lee, Tae Geol / Lee, Jae Cheol / Yi, Keewook / Hong, Tae Eun et al. | 2014
- 3
-
Computer simulations of sputtering and fragment formation during keV C60 bombardment of octane and β‐carotenePostawa, Zbigniew / Kanski, Michal / Maciazek, Dawid / Paruch, Robert J. / Garrison, Barbara J. et al. | 2014
- 7
-
Diffusion of cesium in silicon during SIMS experiments investigated by numerical simulationsPhilipp, Patrick / Barry, Peter / Wirtz, Tom et al. | 2014
- 11
-
Chemistry and sputtering induced by fullerene and argon clusters in carbon‐based materialsCzerwinski, Bartlomiej / Delcorte, Arnaud et al. | 2014
- 15
-
Ionic liquid matrices for improved detection of proteins and polymers in time‐of‐flight secondary ion mass spectrometryDertinger, Jennifer J. / Walker, Amy V. et al. | 2014
- 18
-
Does local disorder influence secondary ion formation?Weidtmann, Boris / Duvenbeck, Andreas / Wucher, Andreas et al. | 2014
- 22
-
Investigation of Cs surface layer formation in Cs‐SIMS with TOF‐MEIS and SIMSHoussiau, L. / Noël, C. / Mine, N. / Jung, K. W. / Min, W. J. / Moon, D. W. et al. | 2014
- 25
-
Cesium/Xenon dual beam sputtering in a Cameca instrumentPureti, R. / Douhard, B. / Joris, D. / Merkulov, A. / Vandervorst, W. et al. | 2014
- 31
-
Temperature dependent relocation of the cesium primary ion beam during SIMS analysisGiordani, Andrew / Tuggle, Jay / Winkler, Christopher / Hunter, Jerry et al. | 2014
- 35
-
Thin film surfaces suitable to multimodal ionization for TOF‐SIMS and LDI mass spectrometry of biomoleculesKim, Shin Hye / Shon, Hyun Kyong / Lee, Tae Geol / Han, Sang Yun et al. | 2014
- 39
-
Si− useful yields measured in Si, SiC, Si3N4 and SiO2: comparison between the Storing Matter technique and SIMSKasel, B. / Wirtz, T. et al. | 2014
- 43
-
On the evolution of Cs droplets in SIMS cratersGiordani, Andrew / Tuggle, Jay / Winkler, Christopher / Hunter, Jerry et al. | 2014
- 46
-
Cluster impacts in organics: microscopic models and universal sputtering curvesDelcorte, Arnaud / Restrepo, Oscar A. / Hamraoui, Karim / Czerwinski, Bartlomiej et al. | 2014
- 51
-
Prospect of increasing secondary ion yields in ToF‐SIMS using water cluster primary ion beamsSheraz (née Rabbani), S. / Barber, A. / Berrueta Razo, I. / Fletcher, J. S. / Lockyer, N.P. / Vickerman, J. C. et al. | 2014
- 54
-
Fundamental aspects of Arn+ SIMS profiling of common organic semiconductorsFleischmann, C. / Conard, T. / Havelund, R. / Franquet, A. / Poleunis, C. / Voroshazi, E. / Delcorte, A. / Vandervorst, W. et al. | 2014
- 58
-
Electronic structures of SiO2 thin films via Ar gas cluster ion beam sputteringKyoung, Yong Koo / Chung, Jae Gwan / Lee, Hyung Ik / Yun, Dong‐Jin / Lee, Jae Cheol / Kim, Yong Su / Oh, Suhk Kun / Kang, Hee Jae et al. | 2014
- 62
-
New approach for simulation of large cluster impact using smoothed particle hydrodynamics methodLee, Jong Wan et al. | 2014
- 67
-
Investigations into the interactions of a MALDI Matrix with organic thin films using C60+ SIMS depth profilingLerach, Jordan O. / Keskin, Selda / Winograd, Nicholas et al. | 2014
- 70
-
Dual beam depth profiling of organic materials: assessment of capabilities and limitationsNiehuis, Ewald / Moellers, Rudolf / Rading, Derk / Bruener, Philipp et al. | 2014
- 74
-
Analysis of liposome model systems by time‐of‐flight secondary ion mass spectrometryLovrić, Jelena / Keighron, Jacqueline D. / Angerer, Tina B. / Li, Xianchan / Malmberg, Per / Fletcher, John S. / Ewing, Andrew G. et al. | 2014
- 79
-
Ar cluster sputtering of polymers: effects of cluster size and molecular weightsCristaudo, Vanina / Poleunis, Claude / Czerwinski, Bartlomiej / Delcorte, Arnaud et al. | 2014
- 83
-
A new approach for determining accurate chemical distributions using in‐situ GCIB cross‐section imagingIida, Shin‐ichi / Miyayama, Takuya / Fisher, Gregory L. / Hammond, John S. / Bryan, Scott R. / Sanada, Noriaki et al. | 2014
- 87
-
Surface analysis of diblock copolymer films by TOF‐SIMS in combination with AFMLee, Jihye / Shin, Kwanwoo / Lee, Kang‐Bong / Lee, Yeonhee et al. | 2014
- 92
-
Examination of fragment ions of polystyrene in TOF‐SIMS spectra using MS/MSKawashima, Tomoko / Kurosawa, Takako / Aoyagi, Satoka / Sheraz (née Rabbani), Sadia / Fletcher, John S. / Futigami, Masayo / Lockyer, Nicholas P. / Vickerman, John C. et al. | 2014
- 96
-
G‐SIMS analysis of organic solar cell materialsFranquet, A. / Fleischmann, C. / Conard, T. / Voroshazi, E. / Poleunis, C. / Havelund, R. / Delcorte, A. / Vandervorst, W. et al. | 2014
- 100
-
TOF–SIMS study of polyester/melamine resin with Ar gas cluster ion beamNishinomiya, S. / Toshin, K. / Hayashi, S. / Iuchi, K. / Se, N. / Moritani, K. / Mochiji, K. et al. | 2014
- 105
-
Comparison of nanostructured blend homopolymers and diblock copolymers by AFM and TOF‐SIMSKang, Minhwa / Lee, Jihye / Lee, Yeonhee et al. | 2014
- 110
-
Comparative study of the ToF‐SIMS, FT‐IR and XPS techniques for quantitative analyses of mixed self‐assembled monolayersSon, Jin Gyeong / Shon, Hyun Kyong / Choi, Changrok / Han, Sang Woo / Lee, Tae Geol et al. | 2014
- 115
-
Molecular imaging of biological tissue using gas cluster ionsTian, Hua / Wucher, Andreas / Winograd, Nicholas et al. | 2014
- 118
-
Tandem MS and C60 SIMS for the identification and characterization of lipidsDurairaj, Anita / Winograd, Nicholas et al. | 2014
- 123
-
ToF‐SIMS imaging of lipids and lipid related compounds in Drosophila brainPhan, Nhu T. N. / Fletcher, John S. / Sjövall, Peter / Ewing, Andrew G. et al. | 2014
- 127
-
ToF‐SIMS imaging of plasma membrane lipids with sub‐micrometer resolutionDraude, F. / Pelster, A. / Körsgen, M. / Kassenböhmer, R. / Schwerdtle, T. / Müthing, J. / Arlinghaus, H. F. et al. | 2014
- 131
-
ToF‐SIMS data analysis for complex plant tissue samples using multivariate analysis and G‐SIMSAoyagi, Satoka / Kodani, Noriko / Yano, Akira / Asao, Toshiki / Iwai, Hideo / Kudo, Masahiro et al. | 2014
- 136
-
Comparing C60+ and (H2O)n+ clusters for mouse brain tissue analysisBerrueta Razo, Irma / Sheraz, Sadia / Henderson, Alex / Lockyer, Nicholas P. / Vickerman, John C. et al. | 2014
- 140
-
Brain stem cell division and maintenance studied using multi‐isotope imaging mass spectrometry (MIMS)Enikolopov, Grigori / Guillermier, Christelle / Wang, Mei / Trakimas, Louise / Steinhauser, Matthew L. / Lechene, Claude et al. | 2014
- 144
-
Effect of an antidepressant on mouse hippocampus protein turnover analyzed by MIMSFiliou, M. D. / Moy, J. / Wang, M. / Guillermier, C. / Poczatek, J. C. / Turck, C. W. / Lechene, C. et al. | 2014
- 147
-
Detection of immunolabels with multi‐isotope imaging mass spectrometryThiery‐Lavenant, G. / Guillermier, C. / Wang, M. / Lechene, C. et al. | 2014
- 150
-
Quasi‐simultaneous acquisition of nine secondary ions with seven detectors on NanoSIMS50L: application to biological samplesGuillermier, Christelle / Steinhauser, Matthew L. / Lechene, Claude P. et al. | 2014
- 154
-
Quantitative imaging of selenoprotein with multi‐isotope imaging mass spectrometry (MIMS)Tang, S.S. / Guillermier, C. / Wang, M. / Poczatek, J. C. / Suzuki, N. / Loscalzo, J. / Lechene, C. et al. | 2014
- 158
-
Study of protein and RNA in dendritic spines using multi‐isotope imaging mass spectrometryBrismar, H. / Aperia, A. / Westin, L. / Moy, J. / Wang, M. / Guillermier, C. / Poczatek, J. C. / Lechene, C. et al. | 2014
- 161
-
Quantifying cell division with deuterated water and multi‐isotope imaging mass spectrometry (MIMS)Steinhauser, Matthew L. / Guillermier, Christelle / Wang, Mei / Lechene, Claude P. et al. | 2014
- 165
-
Approaches to increasing analytical throughput of human samples with multi‐isotope imaging mass spectrometrySteinhauser, Matthew L. / Guillermier, Christelle / Wang, Mei / Lechene, Claude P. et al. | 2014
- 169
-
Quantitative imaging of inositol distribution in yeast using multi‐isotope imaging mass spectrometry (MIMS)Saiardi, A. / Guillermier, C. / Loss, O. / Poczatek, J. C. / Lechene, C. et al. | 2014
- 173
-
Maximising the potential for bacterial phenotyping using time‐of‐flight secondary ion mass spectrometry with multivariate analysis and Tandem Mass SpectrometryWehrli, Patrick M. / Lindberg, Erika / Angerer, Tina B. / Wold, Agnes E. / Gottfries, Johan / Fletcher, John S. et al. | 2014
- 177
-
Dye‐enhanced imaging of mammalian cells with SIMSBloom, Anna / Winograd, Nicholas et al. | 2014
- 181
-
Single cell lipidomics of SKBR‐3 breast cancer cells by using time‐of‐flight secondary‐ion mass spectrometryIde, Yoshimi / Waki, Michihiko / Ishizaki, Itsuko / Nagata, Yasuyuki / Yamazaki, Fumiyoshi / Hayasaka, Takahiro / Masaki, Noritaka / Ikegami, Koji / Kondo, Takeshi / Shibata, Kiyoshi et al. | 2014
- 185
-
Glutaraldehyde fixation method for single‐cell lipid analysis by time‐of‐flight secondary ion‐mass spectrometryNagata, Yasuyuki / Ishizaki, Itsuko / Waki, Michihiko / Ide, Yoshimi / Hossen, Md Amir / Ohnishi, Kazunori / Sanada, Noriaki / Setou, Mitsutoshi et al. | 2014
- 189
-
ToF‐SIMS analysis of diadenosine triphosphate and didadenosine tetraphosphate using bismuth and argon cluster ion beamsShon, Hyun Kyong / Cho, Young‐Lai / Lim, Choung Su / Choi, Joon Sig / Chung, Sang J. / Lee, Tae Geol et al. | 2014
- 193
-
Influence of bioactive linker molecules on protein adsorptionKillian, Manuela S. / Schmuki, Patrik et al. | 2014
- 198
-
3D Imaging of TiO2 nanoparticle accumulation in Tetrahymena pyriformisAngerer, Tina B. / Fletcher, John S. et al. | 2014
- 204
-
Laser irradiation effect on carbon overcoat for HAMR applicationJi, Rong / Ma, Yansheng / Shakerzadeh, Maziar / Seet, Hang Li / Hu, Jiang Feng et al. | 2014
- 209
-
Evaluation of hydroxyapatite nanoparticles synthesized with phosphate surfactant by means of G‐SIMS and g‐ogramKajiwara, Yasuko / Iwai, Hideo / Nakagawa, Keizo / Kodani, Noriko / Aoyagi, Satoka et al. | 2014
- 213
-
ToF‐SIMS spectra multivariate analyses for the chemical characterization of microelectronic low‐k materialsScarazzini, R. / Lépinay, M. / Broussous, L. / Barnes, J. P. / Veillerot, M. / Jousseaume, V. et al. | 2014
- 217
-
Application of pan‐sharpening to SIMS imagingTarolli, Jay / Tian, Hua / Winograd, Nicholas et al. | 2014
- 221
-
On including nonlinearity in multivariate analysis of imaging SIMS dataGelb, Lev D. / Milillo, Tammy M. / Walker, Amy V. et al. | 2014
- 225
-
Using imaging ToF‐SIMS data to determine the cell wall thickness of fibers in woodGerber, Lorenz / Hoang, Viet Mai / Tran, Linh / Kiet, Hoang Anh Tuan / Malmberg, Per / Hanrieder, Jörg / Ewing, Andrew et al. | 2014
- 229
-
Mass‐scale calibration of TOF‐SIMS spectra using quaternary ammonium ionsKobayashi, Daisuke / Otomo, Shinya / Aoyagi, Satoka / Itoh, Hiroto et al. | 2014
- 233
-
NanoSIMS imaging alteration layers of a leached SON68 glass via a FIB‐made wedged craterWang, Yi‐Chung / Schreiber, Daniel K. / Neeway, James J. / Thevuthasan, Suntharampillai / Evans, James E. / Ryan, Joseph V. / Zhu, Zihua / Wei, Wei David et al. | 2014
- 238
-
Imaging of dopant distribution in optical fibers with an orthogonal TOF SIMSLorinčík, J. / Kašík, I. / Vaniš, J. / Sedláček, L. / Dluhoš, J. et al. | 2014
- 241
-
Back side SIMS analysisStevie, F. A. / Garcia, R. / Richardson, C. / Zhou, C. et al. | 2014
- 244
-
VAMAS round‐robin study to evaluate a correction method for saturation effects in D‐SIMSTakano, Akio / Nonaka, Hidehiko / Homma, Yoshikazu / Tomita, Mitsuhiro / Murase, Atsushi / Hayashi, Syunichi / Barozzi, Mario / Kim, Kyung Joon / Sykes, David / Simons, David et al. | 2014
- 249
-
Imaging and hydrogen analysis by SIMS in zirconium alloy cladding: a dual ion beam approachMine, N. / Portier, S. / Martin, M. et al. | 2014
- 253
-
How material properties affect depth profiles – insight from computer modelingParuch, Robert J. / Postawa, Zbigniew / Garrison, Barbara J. et al. | 2014
- 257
-
ToF‐SIMS depth profiling of insulating samples, interlaced mode or non‐interlaced mode?Wang, Zhaoying / Jin, Ke / Zhang, Yanwen / Wang, Fuyi / Zhu, Zihua et al. | 2014
- 261
-
Ar cluster ion beam sputtering of InSb investigated by ToF‐SIMSMiyasaka, Toyomitsu / Yamauchi, Takeshi / Nagatomi, Takaharu / Kono, Teiichiro et al. | 2014
- 264
-
Use of ionic liquids in SIMS depth profilingNakata, Yoshihiko / Fujiyama, Noriyuki / Sameshima, Junichiro / Yoshikawa, Masanobu et al. | 2014
- 267
-
Mechanism of abnormal interface artifacts in SIMS depth profiling of a Si/Ge multilayer by oxygen ionsJang, Jong Shik / Kang, Hee Jae / Kim, Kyung Joong et al. | 2014
- 272
-
Determination of interface locations and layer thicknesses in SIMS and AES depth profiling of Si/Ti multilayer films by 50 at% definitionHwang, Hye Hyun / Jang, Jong Shik / Kang, Hee Jae / Kim, Kyung Joong et al. | 2014
- 276
-
Quantitative analysis for CIGS thin films by surface analytical techniquesKim, Seon Hee / Jang, Yun Jung / Yoon, Jung Hyeon / Jeong, Jeung‐hyun / Lee, Yeonhee et al. | 2014
- 281
-
The elemental distribution in the oxide scale on a conventionally cast and a metallurgical ODS FeCrAl alloy characterized by ToF‐SIMSMalmberg, Per / Hellström, Kristina et al. | 2014
- 285
-
FIB‐SIMS quantification using TOF‐SIMS with Ar and Xe plasma sourcesStevie, F. A. / Sedlacek, L. / Babor, P. / Jiruse, J. / Principe, E. / Klosova, K. et al. | 2014
- 288
-
SIMS analysis of high‐performance accelerator niobiumMaheshwari, P. / Stevie, F. A. / Myneni, G. R. / Ciovati, G. / Rigsbee, J. M. / Dhakal, P. / Griffis, D. P. et al. | 2014
- 291
-
Secondary ion mass spectrometry for Mg tracer diffusion: issues and solutionsTuggle, Jay / Giordani, Andrew / Kulkarni, Nagraj / Warmack, Bruce / Hunter, Jerry et al. | 2014
- 294
-
A chemical analysis method to identify the source of pellicle adhesive contaminantsPenley, C. / Guenther, T. / Walker, M. et al. | 2014
- 299
-
Characterization of nitride‐based LED materials and devices using TOF‐SIMSWei, Xuecheng / Zhao, Lixia / Wang, Junxi / Zeng, Yiping / Li, Jinmin et al. | 2014
- 303
-
Interface characterization of nitrogen plasma‐treated gate oxide film formed by RTP technologyChoi, Jae‐Sung / Park, Jae‐Gun et al. | 2014
- 307
-
TOF SIMS analysis of fatty acid outgassing from wafer boxes adsorbed on wafersGui, D. / Shao, J. J. / Hao, M. / Xing, Z. X. / Lee, H. S. / Shen, Y. Q. / Li, X. M. / Cha, L. Z. et al. | 2014
- 312
-
Analysis of natural dyes in archeological textiles using TOF‐SIMS and other analytical techniquesLee, Jihye / Kim, Man‐Ho / Lee, Kang‐Bong / van Elslande, Elsa / Walter, Philippe / Lee, Yeonhee et al. | 2014
- 317
-
Characterization and sequence determination of pen inks, red sealing inks, and laser toners by TOF‐SIMS and ATR FTIRLee, Jihye / Kim, Seon Hee / Cho, Youn‐Jeong / Nam, Yun Sik / Lee, Kang‐Bong / Lee, Yeonhee et al. | 2014
- 322
-
Effect of impact energy on SIMS U–Pb zircon geochronologyMagee, Charles Jr. / Ferris, Jim / Magee, Charles Sr. et al. | 2014
- 326
-
The development of uranium isotopic ratio analysis for uranium‐bearing particles by using oxygen flooding technique with SIMSShen, Yan / Zhang, Yan / Zhao, Yonggang / Wang, Tongxin / Wang, Fan et al. | 2014
- 330
-
ToF‐SIMS as a tool for mapping reaction products of coupled dissolution–precipitation processes at mineral grain surfacesRinnen, S. / Gröger‐Trampe, J. / Ostertag‐Henning, C. / Arlinghaus, H. F. et al. | 2014
- 334
-
Identification of nano clay in composite polymersTentschert, Jutta / Jungnickel, Harald / Reichardt, Philipp / Leube, Peter / Kretzschmar, Bernd / Taubert, A. / Luch, A. et al. | 2014
- 337
-
SIMS study on the improvement of electrical conductivity of a Si quantum dot layer by insertion of polycrystalline Si interlayersBaek, Hyun Jeong / Kim, Tae Woon / Jang, Jong Shik / Kim, An Soon / Kim, Kyung Joong et al. | 2014
- 341
-
SIMS depth profiling analysis of P‐doped n‐type Si layer to develop the Si QD solar cellKim, Tae Woon / Baek, Hyun Jeong / Jang, Jong Shik / Lee, Seung Mi / Kim, Kyung Joong et al. | 2014
- 344
-
TOF‐SIMS analysis of lithium air battery discharge products utilizing gas cluster ion beam sputtering for surface stabilizationKaren, Akiya / Ito, Kimihiko / Kubo, Yoshimi et al. | 2014
- 348
-
Time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) using an ionic‐liquid primary ion beam sourceFujiwara, Yukio / Saito, Naoaki et al. | 2014
- 353
-
Lipid compounds analysis with MeV‐SIMS apparatus for biological applicationsFujii, Makiko / Kusakari, Masakazu / Matsuda, Kazuhiro / Man, Naoki / Seki, Toshio / Aoki, Takaaki / Matsuo, Jiro et al. | 2014
- 357
-
Fragmentation of polystyrene during sputter deposition in the storing matter instrumentTurgut, Canan / Wirtz, Tom / Belmahi, Mohammed / Philipp, Patrick et al. | 2014
- 360
-
Storing matter technique performed in the analytical chamber of a quadrupole SIMS analyserKonarski, P. / Miśnik, M. / Zawada, A. / Brongersma, H. H. et al. | 2014
- 364
-
Evaluation of a diode laser‐assisted vacuum‐type charged droplet beam sourceNinomiya, Satoshi / Chen, Lee Chuin / Sakai, Yuji / Hiraoka, Kenzo et al. | 2014
- 368
-
Development of organic SIMS system with Ar‐GCIB and IMS‐4fNojima, Masashi / Suzuki, Masato / Fujii, Makiko / Seki, Toshio / Matsuo, Jiro et al. | 2014
- 372
-
Differentially pumped quadrupole SIMS probe on FIB‐based and two‐beam microscopesChater, Richard J. / Shollock, Barbara A. / McPhail, David S. / Smith, Alan J. / Cooke, Graham et al. | 2014
- 375
-
Probing the lipid chemistry of neurotoxin‐induced hippocampal lesions using multimodal imaging mass spectrometryHanrieder, Jörg / Karlsson, Oskar / B. Brittebo, Eva / Malmberg, Per / Ewing, Andrew G. et al. | 2014
- 379
-
Gold and silver nanoparticle‐assisted laser desorption ionization mass spectrometry compatible with secondary ion mass spectrometry for lipid analysisMohammadi, Amir Saeid / Fletcher, John S. / Malmberg, Per / Ewing, Andrew G. et al. | 2014
- 383
-
Atom probe tomography of nanostructuresGnaser, Hubert et al. | 2014
- 389
-
Development of characterization procedure of particulate matter pollution collected in immediate vicinity of urban residentsKonarski, P. / Miśnik, M. / Zawada, A. / Olszewska‐Czopik, K. / Iwanejko, I. / Ścibor, M. / Balcerzak, B. / Hałuszka, J. et al. | 2014
- 393
-
Quantification of phosphorus diffusion and incorporation in silicon nanocrystals embedded in silicon oxideMastromatteo, M. / Arduca, E. / Napolitani, E. / Nicotra, G. / De Salvador, D. / Bacci, L. / Frascaroli, J. / Seguini, G. / Scuderi, M. / Impellizzeri, G. et al. | 2014
- 397
-
Combined SIMS and AFM study of complex structures of streamers on metallic multilayersAudinot, J.‐N. / Hamdan, A. / Grysan, P. / Fleming, Y. / Noel, C. / Kosior, F. / Henrion, G. / Belmonte, T. et al. | 2014
- 401
-
Coordinated test‐rig and ToF‐SIMS experiments to investigate the influence of phosphate glass layers on the friction behavior of a wet clutchMayer, C. / Lipinsky, D. / Wohlleber, F. / Pflaum, H. / Stahl, K. / Arlinghaus, H. F. et al. | 2014
- 406
-
Author index| 2014
- 409
-
Keyword index| 2014