A Response Surface Methodology for Modeling Time Series Response Data (Englisch)
- Neue Suche nach: Storm, Scott M.
- Neue Suche nach: Hill, Raymond R.
- Neue Suche nach: Pignatiello, Joseph J. Jr.
- Neue Suche nach: Storm, Scott M.
- Neue Suche nach: Hill, Raymond R.
- Neue Suche nach: Pignatiello, Joseph J. Jr.
In:
Quality and Reliability Engineering International
;
29
, 5
;
771-778
;
2013
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:A Response Surface Methodology for Modeling Time Series Response Data
-
Beteiligte:Storm, Scott M. ( Autor:in ) / Hill, Raymond R. ( Autor:in ) / Pignatiello, Joseph J. Jr. ( Autor:in )
-
Erschienen in:Quality and Reliability Engineering International ; 29, 5 ; 771-778
-
Verlag:
-
Erscheinungsdatum:01.07.2013
-
Format / Umfang:8 pages
-
ISSN:
-
DOI:
-
Medientyp:Aufsatz (Zeitschrift)
-
Format:Elektronische Ressource
-
Sprache:Englisch
-
Schlagwörter:
-
Datenquelle:
Inhaltsverzeichnis – Band 29, Ausgabe 5
Zeige alle Jahrgänge und Ausgaben
Die Inhaltsverzeichnisse werden automatisch erzeugt und basieren auf den im Index des TIB-Portals verfügbaren Einzelnachweisen der enthaltenen Beiträge. Die Anzeige der Inhaltsverzeichnisse kann daher unvollständig oder lückenhaft sein.
- 619
-
Editorial| 2013
- 621
-
Analysis of Confidence Lower Limits of Reliability and Hazard Rate for Electronic Stability Control SystemsNiu, Shiwen / Zhan, Wei et al. | 2013
- 631
-
Statistical Inference on Constant Stress Accelerated Life Tests under Generalized Gamma Lifetime DistributionsFan, Tsai‐Hung / Yu, Chia‐Hsiang et al. | 2013
- 639
-
The Effect of Parameter Estimation on Upper‐sided Bernoulli Cumulative Sum ChartsLee, Jaeheon / Wang, Ning / Xu, Liaosa / Schuh, Anna / Woodall, William H. et al. | 2013
- 653
-
CS‐EWMA Chart for Monitoring Process DispersionAbbas, Nasir / Riaz, Muhammad / Does, Ronald J. M. M. et al. | 2013
- 665
-
A Generalized Likelihood Ratio Chart for Monitoring Bernoulli ProcessesHuang, Wandi / Wang, Sai / Reynolds, Marion R. Jr. et al. | 2013
- 681
-
An Economic Approach to the Management of High‐Quality ProcessesYılmaz, Şebnem / Burnak, Nimetullah et al. | 2013
- 691
-
Acquisition and Testing, DT/OT Testing: The Need for Two‐Parameter RequirementsHill, Raymond R. / Gutman, Alex J. / Chambal, Stephen P. / Kitchen, Jerry W. et al. | 2013
- 699
-
Reliability Prediction Based on Variation Mode and Effect AnalysisPavasson, Jonas / Cronholm, Kent / Strand, Henrik / Karlberg, Magnus et al. | 2013
- 709
-
Reliability Modeling for Ultrathin Gate Oxides Subject to Logistic Degradation Processes with Random Onset TimePeng, Hao / Feng, Qianmei et al. | 2013
- 719
-
A Close Form Solution for the Product Acceptance Determination Based on the Popular Index CpkPearn, W. L. / Wu, C. H. et al. | 2013
- 725
-
Towards Improved Analysis Methods for Two‐Level Factorial Experiments with Time Series ResponsesVanhatalo, Erik / Bergquist, Bjarne / Vännman, Kerstin et al. | 2013
- 743
-
Nonlinear Profile Monitoring of Reflow Process Data Based on the Sum of Sine FunctionsFan, Shu‐Kai S. / Chang, Yuan‐Jung / Aidara, Nafy et al. | 2013
- 759
-
The Use of Probability Limits of COM–Poisson Charts and their ApplicationsSaghir, Aamir / Lin, Zhengyan / Abbasi, Saddam Akber / Ahmad, Shabbir et al. | 2013
- 771
-
A Response Surface Methodology for Modeling Time Series Response DataStorm, Scott M. / Hill, Raymond R. / Pignatiello, Joseph J. Jr. et al. | 2013