Crystal orientation effects on sputtering and depth resolution in GDOES (Englisch)
- Neue Suche nach: Chen, L.
- Neue Suche nach: Simmonds, M. C.
- Neue Suche nach: Habesch, S.
- Neue Suche nach: Rodenburg, J. M.
- Neue Suche nach: Chen, L.
- Neue Suche nach: Simmonds, M. C.
- Neue Suche nach: Habesch, S.
- Neue Suche nach: Rodenburg, J. M.
In:
Surface and Interface Analysis
;
31
, 3
;
206-211
;
2001
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:Crystal orientation effects on sputtering and depth resolution in GDOES
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Beteiligte:Chen, L. ( Autor:in ) / Simmonds, M. C. ( Autor:in ) / Habesch, S. ( Autor:in ) / Rodenburg, J. M. ( Autor:in )
-
Erschienen in:Surface and Interface Analysis ; 31, 3 ; 206-211
-
Verlag:
- Neue Suche nach: John Wiley & Sons, Ltd.
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Erscheinungsdatum:01.03.2001
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Format / Umfang:6 pages
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ISSN:
-
DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
Inhaltsverzeichnis – Band 31, Ausgabe 3
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