Erscheinungsjahr
Format
Lizenz
Synonyme wurden verwendet für: Halbleitersubstrat
Suche ohne Synonyme: keywords:(Halbleitersubstrat)
Verwendete Synonyme:
- semiconductor substrate
- semiconductor wafers
-
1999 4th International Symposium on Plasma Process-Induced Damage : May 9-11, 1999, Monterey, California, USA
TIBKAT | 1999|Schlagwörter: Semiconductor wafers -
High purity silicon VIII : proceedings of the international symposium ; [held in Honolulu, Hawaii at the 206th meeting of the Electrochemical Society, October 3 - 8, 2004]
TIBKAT | 2004|Schlagwörter: Semiconductor wafers -
1998 3rd International Symposium on Plasma Process-Induced Damage : June 4-5, 1998, Honolulu, Hawaii, USA
TIBKAT | 1998|Schlagwörter: Semiconductor wafers -
Electronic transport characterization of silicon wafers by spatially resolved steady-state photocarrier radiometric imaging
Online Contents | 2015|Schlagwörter: Semiconductor wafers -
1996 1st International Symposium on Plasma Process-Induced Damage : 13-14 May 1996, Santa Clara, California, USA
TIBKAT | 1996|Schlagwörter: Semiconductor wafers -
Design for manufacturability through design-process integration VII : 27 - 28 February 2013, San Jose, California, United States ; [part of SPIE advanced lithography]
TIBKAT | 2013|Schlagwörter: Semiconductor wafers -
Portable and reliable surface-enhanced Raman scattering silicon chip for signal-on detection of trace trinitrotoluene explosive in real systems
Online Contents | 2017|Schlagwörter: Semiconductor wafers -
1997 2nd International Symposium on Plasma Process-Induced Damage : 13-14 May 1997, Monterey, California, USA
TIBKAT | 1997|Schlagwörter: Semiconductor wafers -
1997 2nd International Symposium on Plasma Process-Induced Damage : 13 - 14 May 1997, Monterey, California, USA
TIBKAT | 1997|Schlagwörter: Semiconductor wafers -
Asymmetric band offsets in silicon heterojunction solar cells: Impact on device performance
Online Contents | 2016|Schlagwörter: Semiconductor wafers -
Combined surface-focused acoustic microscopy in transmission and scanning ultrasonic holography
Elsevier | 2006|Schlagwörter: Directly bonded semiconductor wafers -
Design for manufacturability through design-process integration VI : 15 - 16 February 2012, San Jose, California, United States ; [part of SPIE advanced lithography]
TIBKAT | 2012|Schlagwörter: Semiconductor wafers -
1996 1st International Symposium on Plasma Process-Induced Damage
TIBKAT | 1996|Schlagwörter: Semiconductor wafers -
Interlayer dielectrics for semiconductor technologies
TIBKAT | 2003|Schlagwörter: Semiconductor wafers -
Handbook of semiconductor wafer cleaning technology : science, technology, and applications
TIBKAT | 1993|Schlagwörter: Semiconductor wafers -
Cost and performance in integrated circuit creation : 27 - 28 February 2003, Santa Clara, California, USA
TIBKAT | 2003|Schlagwörter: Semiconductor wafers -
A Monolithic Patch Antenna on a Semi-insulated Alumina ($$Al_{2}O_{3}$$) Substrate for Active Integrated Antenna
Online Contents | 2020|Schlagwörter: Semiconductor substrate -
Molybdenum-14Rhenium alloy—The most promising candidate for high-temperature semiconductor substrate materials
Elsevier | 2024|Schlagwörter: Semiconductor substrate -
Formation of Ideal Rashba States on Layered Semiconductor Surfaces Steered by Strain Engineering
American Chemical Society | 2016|Schlagwörter: layered semiconductor substrate -
Ultra clean processing of silicon surfaces VII : UCPSS 2004 ; proceedings of the 7th International Symposium on Ultra Clean Processing of Silicon Surfaces (UCPSS) held in Brussels, Belgium, September
TIBKAT | 2005|Schlagwörter: Semiconductor wafers -
Flatness, roughness, and discrete defect characterization for computer disks, wafers, and flat panel displays II : 29 - 30 January 1998, San Jose, California
TIBKAT | 1998|Schlagwörter: Semiconductor wafers -
Semiconductor wafer bonding : science and technology
TIBKAT | 1999|Schlagwörter: Semiconductor wafers -
Design for manufacturability through design-process integration : 24 - 25 February 2010, San Jose, California, United States ; [SPIE advanced lithography]
TIBKAT | 2010|Schlagwörter: Semiconductor wafers -
Proceedings of the Third International Symposium on Semiconductor Wafer Bonding: Physics and Applications : [held at Reno in spring 1995]
TIBKAT | 1995|Schlagwörter: Semiconductor wafers -
A unified model to determine the energy partitioning between target and plasma in nanosecond laser ablation of silicon
Online Contents | 2015|Schlagwörter: Semiconductor wafers -
Design for manufacturability through design-process integration III : 26 - 27 February 2009, San Jose, California, United States
TIBKAT | 2009|Schlagwörter: Semiconductor wafers -
Statistical approach to design DRAM bitcell considering overlay errors [7275-70]
British Library Conference Proceedings | 2009|Schlagwörter: Semiconductor wafers -
Directional 2D functions as models for fast layout pattern transfer verification [7275-24]
British Library Conference Proceedings | 2009|Schlagwörter: Semiconductor wafers -
Compensating non-optical effects using electrically driven optical proximity correction [7275-15]
British Library Conference Proceedings | 2009|Schlagwörter: Semiconductor wafers -
Exploration of complex metal 2D design rules using inverse lithography [7275-13]
British Library Conference Proceedings | 2009|Schlagwörter: Semiconductor wafers -
Proceedings of the Fourth International Symposium on Cleaning Technology in Semiconductor Device Manufacturing : [contains the papers presented at the Fourth International Symposium on Wafer Cleaning Technology in Semiconductor Device Manufacturing ... held during the Fall Electrochemical Society Meeting in Chicago, Illinois, October 1995]
TIBKAT | 1996|Schlagwörter: Semiconductor wafers -
Optical micro-shadowgraph-based method for measuring micro-solderball height
SPIE | 2005|Schlagwörter: semiconductor wafers -
Modeling and simulation of transistor performance shiff under pattern-dependent RTA process [7275-78]
British Library Conference Proceedings | 2009|Schlagwörter: Semiconductor wafers -
Application of pixel-based mask optimization technique for high transmission attenuated PSM [7275-35]
British Library Conference Proceedings | 2009|Schlagwörter: Semiconductor wafers -
Computational requirements for OPC [7275-32]
British Library Conference Proceedings | 2009|Schlagwörter: Semiconductor wafers -
Model-based adaptive fragmentation [7275-67]
British Library Conference Proceedings | 2009|Schlagwörter: Semiconductor wafers -
Contour-based optical proximity correction [7275-66]
British Library Conference Proceedings | 2009|Schlagwörter: Semiconductor wafers -
Electrical impact of line-edge roughness on sub-45nm node standard cell [7275-53]
British Library Conference Proceedings | 2009|Schlagwörter: Semiconductor wafers -
Developing DRC plus rules through 2D pattern extraction and clustering techniques [7275-52]
British Library Conference Proceedings | 2009|Schlagwörter: Semiconductor wafers -
Computational technology scaling from 32 nm to 28 and 22 nm through systematic layout printability verification [7275-44]
British Library Conference Proceedings | 2009|Schlagwörter: Semiconductor wafers -
Source-mask selection using computational lithography incorporating physical resist models [7275-34]
British Library Conference Proceedings | 2009|Schlagwörter: Semiconductor wafers -
Test structures for 40 nm design rule evaluation [7275-31]
British Library Conference Proceedings | 2009|Schlagwörter: Semiconductor wafers -
Design ranking and analysis methodology for standard cells and full chip physical optimization [7275-29]
British Library Conference Proceedings | 2009|Schlagwörter: Semiconductor wafers -
Score-based fixing guidance generation with accurate hot-spot detection method [7275-26]
British Library Conference Proceedings | 2009|Schlagwörter: Semiconductor wafers -
Impact of lithography variability on analog circuit behavior [7275-17]
British Library Conference Proceedings | 2009|Schlagwörter: Semiconductor wafers -
Illustration of illumination effects on proximity, focus spillover, and design rules [7275-11]
British Library Conference Proceedings | 2009|Schlagwörter: Semiconductor wafers -
Implementing self-aligned double patterning on non-gridded design layouts [7275-59]
British Library Conference Proceedings | 2009|Schlagwörter: Semiconductor wafers -
The PIXBAR OPC for contact-hole pattern in sub-70-nm generation [7275-38]
British Library Conference Proceedings | 2009|Schlagwörter: Semiconductor wafers -
Transistor layout configuration effect on actual gate LER [7275-36]
British Library Conference Proceedings | 2009|Schlagwörter: Semiconductor wafers
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