Erscheinungsjahr
Medientyp
Format
Lizenz
Sprache
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Surface Profile Reconstruction by Means of Three Sensor Capacitive Transducer
British Library Conference Proceedings | 1992| -
Two scanning tunneling microscope devices for large samples
NationallizenzAmerican Institute of Physics | 1993| -
Two scanning tunneling microscope devices for large samples
British Library Online Contents | 1993| -
Capacitive sensors coupled to a scanning tunneling microscope piezoscanner for accurate measurements of the tip displacements
American Institute of Physics | 1994| -
Surface characterization of sputtered niobium films by scanning tunneling microscopy
American Institute of Physics | 1994| -
Microhardness measurements by scanning tunneling microscope
British Library Online Contents | 1994| -
Surface characterization of sputtered niobium films by scanning tunneling microscopy
British Library Online Contents | 1994| -
A surface profile reconstruction method based on multisensor capacitive transducers
British Library Online Contents | 1994| -
Capacitive sensors coupled to a scanning tunneling microscope piezoscanner for accurate measurements of the tip displacements
British Library Online Contents | 1994| -
STM Characterization of InP Gratings for DFB Laser Fabrication
British Library Online Contents | 1994| -
Microhardness measurements by scanning tunneling microscope
British Library Conference Proceedings | 1994| -
STM Characterization of InP Gratings for DFB Laser Fabrication
British Library Conference Proceedings | 1994| -
Capacitive sensors coupled to a scanning tunneling microscope piezoscanner for accurate measurements of the tip displacements
British Library Conference Proceedings | 1994| -
Surface characterization of sputtered niobium films by scanning tunneling microscopy
British Library Conference Proceedings | 1994| -
A STM head having integrated capacitive sensors for calibration of scanner displacements
British Library Conference Proceedings | 1995| -
Electrical and morphological properties of niobium thin films on sputter-etched substrates
British Library Conference Proceedings | 1995| -
An AC Current Source for Capacitance-Based Displacement Measurements
British Library Conference Proceedings | 1996| -
Scanning tunneling microscopy head having integrated capacitive sensors for calibration of scanner displacements
American Institute of Physics | 1996| -
A Capacitive Displacement Measurement System for Scanning Probe Microscopy
British Library Conference Proceedings | 1996|
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