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Synonyme wurden verwendet für: SFM
Suche ohne Synonyme: keywords:(SFM)
Verwendete Synonyme:
- afm
- atomic force microscopy
- kraftmikroskopie
- rasterkraftmikroskopie
- rkm
- scanning force microscopy
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Comparative study between conventional macroscopic IV techniques and advanced AFM based methods for electrical characterization of dielectrics at the nanoscale: Poster at 16th biannual conference of Insulating Films on Semiconductors (INFOS 2009), 29.06.-01.07.2009, Cambridge University, UK
Freier ZugriffFraunhofer Publica | 2009|Schlagwörter: tunneling atomic force microscopy (TUNA), conductive atomic force microscopy (c-AFM) -
Nanoscale patterning of self-assembled monolayer (SAM)-functionalised substrates with single molecule contact printing
Freier ZugriffFraunhofer Publica | 2017|Schlagwörter: atomic force microscopy -
Surface characterization with nanometer lateral resolution using the vibration modes of atomic force microscope cantilevers
Freier ZugriffFraunhofer Publica | 2006|Schlagwörter: atomic force microscopy -
Magnetic micro- and nanostructures of unalloyed steels: Domain wall interactions with cementite precipitates observed by MFM
Freier ZugriffFraunhofer Publica | 2013|Schlagwörter: Atomic Force Microscopy (AFM) -
Near-field acoustical imaging using lateral bending mode of atomic force microscope cantilevers: Applications to fracture mechanics of NC-zirconia
Freier ZugriffFraunhofer Publica | 2007|Schlagwörter: atomic force microscopy -
Approaches for the reduction of the influence of parasitic capacitances on local IV characteristics for conductive AFM: Presentations held at 17th Workshop on Dielectrics in Microelectronics, June 25-27, Dresden, Germany
Freier ZugriffFraunhofer Publica | 2012|Schlagwörter: conductive AFM, tunneling AFM, shielded AFM probes -
Manufacturing, characterization, and application of nanoimprinted metallic probe demonstrators for electrical scanning probe microscopy: Poster at MNE 2010, 36th International Conference on Micro and Nano Engineering, Genoa, Italy
Freier ZugriffFraunhofer Publica | 2010|Schlagwörter: AFM, atomic force microscopy -
Piezo-force and vibration analysis of ZnO nanowire arrays for sensor application
Freier ZugriffFraunhofer Publica | 2016|Schlagwörter: AFM -
Nanoimprinted metallic probe demonstrators for electrical scanning probe microscopy: Manufacturing, characterization, and application: Poster at 14th European FIB Users Group Meeting (EFUG 2010), Gaeta, Italy
Freier ZugriffFraunhofer Publica | 2010|Schlagwörter: AFM, atomic force microscopy -
Current voltage characteristics through grains and grain boundaries of high-k dielectric thin films measured by tunneling atomic force microscopy: Poster at International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, May 23-26, 2011, Grenoble, France
Freier ZugriffFraunhofer Publica | 2011|Schlagwörter: conductive AFM, tunneling AFM -
Fabrication and application of shielded probes for conductive AFM measurements: Poster at Seeing at the Nanoscale 2012, 10th annual scientific conference, July 09th - 11th 2012, Bristol, UK
Freier ZugriffFraunhofer Publica | 2012|Schlagwörter: conductive AFM, tunneling AFM -
Nanoscale characterization of TiO2 films grown by atomic layer deposition: Poster at 17th Workshop on Dielectrics in Microelectronics, June 25-27, 2012, Dresden
Freier ZugriffFraunhofer Publica | 2012|Schlagwörter: conductive AFM, tunneling AFM -
Atomic force microscopy - what is it all about, and what does it tell us about the microstructure of metals?
Freier ZugriffFraunhofer Publica | 2012|Schlagwörter: Atomic Force Microscopy (AFM) -
Experimental characterisation of FIB induced lateral damage on silicon carbide samples: Poster presented at MNE 2015, 41st International Conference on Micro and Nano Engineering, The Hague, The Netherlands, 21-24 September 2015
Freier ZugriffFraunhofer Publica | 2015|Schlagwörter: conductive AFM -
Verification of grain boundaries in annealed thin ZrO2 films by electrical AFM technique: Poster at E-MRS Fall Meeting, September 17-21 2007, Warsaw
Freier ZugriffFraunhofer Publica | 2007|Schlagwörter: AFM -
Electrical AFM techniques for the advanced characterization of materials in semiconductor technology: Poster at NanoScale VI, Berlin, Germany, July 9-11, 2008
Freier ZugriffFraunhofer Publica | 2008|Schlagwörter: AFM -
Combinatorial synthesis of thin mixed oxide-films and examinations of their piezoelectricity by ultrasonic piezo-mode imaging
Freier ZugriffFraunhofer Publica | 2007|Schlagwörter: AFM -
Effect of HfO2 polycrystallinity on distribution of the CAFM-induced TDDB in high-k gate stacks: Poster at 17th Workshop on Dielectrics in Microelectronics, June 25-27, 2012, Dresden
Freier ZugriffFraunhofer Publica | 2012|Schlagwörter: conductive AFM -
Gate oxide reliability at the nano-scale evaluated by combining cAFM and CVS
Freier ZugriffFraunhofer Publica | 2011|Schlagwörter: AFM -
Electrical scanning probe microscopy techniques for the detailed characterization of high-k dielectric layers
Freier ZugriffFraunhofer Publica | 2010|Schlagwörter: AFM
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