Effect of Back Bias on Variability in Intrinsic Channel SOI MOSFETs (Englisch)
- Neue Suche nach: Hiramoto, T.
- Neue Suche nach: Saraya, T.
- Neue Suche nach: Lee, C.H.
- Neue Suche nach: Hiramoto, T.
- Neue Suche nach: Saraya, T.
- Neue Suche nach: Lee, C.H.
- Neue Suche nach: Miyazaki, S.
- Neue Suche nach: Tabata, H.
In:
Technology Evolution for Silicon Nano-Electronics
;
214-217
;
2011
-
ISSN:
- Aufsatz (Zeitschrift) / Print
-
Titel:Effect of Back Bias on Variability in Intrinsic Channel SOI MOSFETs
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Beteiligte:Hiramoto, T. ( Autor:in ) / Saraya, T. ( Autor:in ) / Lee, C.H. ( Autor:in ) / Miyazaki, S. / Tabata, H.
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Erschienen in:KEY ENGINEERING MATERIALS ; 470 ; 214-217
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Verlag:
- Neue Suche nach: TRANS TECH PUBLICATIONS
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Erscheinungsdatum:01.01.2011
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Format / Umfang:4 pages
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ISSN:
-
Medientyp:Aufsatz (Zeitschrift)
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Format:Print
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Sprache:Englisch
- Neue Suche nach: 620.11
- Weitere Informationen zu Dewey Decimal Classification
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Klassifikation:
DDC: 620.11 -
Datenquelle:
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