Characterization of polycrystalline In(y)Al(x)Sb(1-x-y) films deposited by magnetron sputtering (Englisch)
- Neue Suche nach: Bolzan, Charles A
- Weitere Informationen zu Bolzan, Charles A:
- https://orcid.org/0000-0002-4435-8878
- Neue Suche nach: Manzo, Danay J
- Neue Suche nach: de Andrade, Antonio Marcos H
- Neue Suche nach: Schoffen, Júlio R
- Weitere Informationen zu Schoffen, Júlio R:
- https://orcid.org/0000-0001-9734-5846
- Neue Suche nach: Giulian, Raquel
- Weitere Informationen zu Giulian, Raquel:
- https://orcid.org/0000-0002-3773-0168
- Neue Suche nach: Bolzan, Charles A
- Weitere Informationen zu Bolzan, Charles A:
- https://orcid.org/0000-0002-4435-8878
- Neue Suche nach: Manzo, Danay J
- Neue Suche nach: de Andrade, Antonio Marcos H
- Neue Suche nach: Schoffen, Júlio R
- Weitere Informationen zu Schoffen, Júlio R:
- https://orcid.org/0000-0001-9734-5846
- Neue Suche nach: Giulian, Raquel
- Weitere Informationen zu Giulian, Raquel:
- https://orcid.org/0000-0002-3773-0168
In:
Thin Solid Films
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692
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2019
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ISSN:
- Aufsatz (Zeitschrift) / Elektronische Ressource
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Titel:Characterization of polycrystalline In(y)Al(x)Sb(1-x-y) films deposited by magnetron sputtering
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Beteiligte:Bolzan, Charles A ( Autor:in ) / Manzo, Danay J ( Autor:in ) / de Andrade, Antonio Marcos H ( Autor:in ) / Schoffen, Júlio R ( Autor:in ) / Giulian, Raquel ( Autor:in )
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Erschienen in:Thin Solid Films ; 692
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Verlag:
- Neue Suche nach: Elsevier B.V.
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Erscheinungsdatum:10.10.2019
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:
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Datenquelle:
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