Characterization of polycrystalline In(y)Al(x)Sb(1-x-y) films deposited by magnetron sputtering (English)
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In:
Thin Solid Films
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692
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2019
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ISSN:
- Article (Journal) / Electronic Resource
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Title:Characterization of polycrystalline In(y)Al(x)Sb(1-x-y) films deposited by magnetron sputtering
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Contributors:Bolzan, Charles A ( author ) / Manzo, Danay J ( author ) / de Andrade, Antonio Marcos H ( author ) / Schoffen, Júlio R ( author ) / Giulian, Raquel ( author )
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Published in:Thin Solid Films ; 692
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Publisher:
- New search for: Elsevier B.V.
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Publication date:2019-10-10
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 692
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
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Characterization of polycrystalline In(y)Al(x)Sb(1-x-y) films deposited by magnetron sputteringBolzan, Charles A / Manzo, Danay J / de Andrade, Antonio Marcos H / Schoffen, Júlio R / Giulian, Raquel et al. | 2019
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Correlation between electrical properties and cation distribution in [(NixMn1- x)0.84Cu0.16]3O4 thin films prepared by metal-organic decomposition for microbolometer applicationsChoi, Yong Ho / Khang, Dahl-Young / Cho, Jeong Ho et al. | 2019
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Editorial Board| 2019
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