Fast and automatic security test on cryptographic ICs against fault injection attacks based on design for security test (Englisch)
Freier Zugriff
- Neue Suche nach: Shao, Cuiping
- Neue Suche nach: Li, Huiyun
- Neue Suche nach: Zhou, Jianbin
- Neue Suche nach: Shao, Cuiping
- Neue Suche nach: Li, Huiyun
- Neue Suche nach: Zhou, Jianbin
In:
IET Information Security
;
11
, 6
;
312-318
;
2017
- Aufsatz (Zeitschrift) / Elektronische Ressource
-
Titel:Fast and automatic security test on cryptographic ICs against fault injection attacks based on design for security test
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Beteiligte:
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Erschienen in:IET Information Security ; 11, 6 ; 312-318
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Verlag:
- Neue Suche nach: The Institution of Engineering and Technology
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Erscheinungsdatum:13.06.2017
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Format / Umfang:7 pages
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ISSN:
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DOI:
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Medientyp:Aufsatz (Zeitschrift)
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Format:Elektronische Ressource
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Sprache:Englisch
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Schlagwörter:crypto modules , workload statistics , public key cryptography , design for security test method , volume production , test patterns , DFST method , RSA implementation , scan chains , integrated circuit testing , fault injection attacks , cryptographic integrated circuits , design for testability , industrial automatic test equipment
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Datenquelle:
Metadata by IET is licensed under CC BY 3.0
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