Erscheinungsjahr
Medientyp
Format
Lizenz
Sprache
-
A sample scanning system with nanometric accuracy for quantitative SPM measurements
British Library Conference Proceedings | 2001| -
A sample scanning system with nanometric accuracy for quantitative SPM measurements
British Library Online Contents | 2001| -
A Heterodyne Laser Refractometer for the Measurement of the Air Refractive Index
British Library Conference Proceedings | 1997| -
Characterisation of optical and UV gratings by means of Scanning Tunneling Microscopy and optical diffractometry
British Library Conference Proceedings | 1998| -
STM carbon nanotube tips fabrication for critical dimension measurements
British Library Online Contents | 2005| -
STM carbon nanotube tips fabrication for critical dimension measurements
British Library Conference Proceedings | 2005| -
Topography reconstruction by means of optical scatterometry analysis
British Library Conference Proceedings | 2001| -
Two scanning tunneling microscope devices for large samples
NationallizenzAmerican Institute of Physics | 1993| -
The IMGC Calibration Set-up for Microdisplacement Actuators
British Library Conference Proceedings | 1998| -
Interferometric calibration of microdisplacement actuators [5190-37]
British Library Conference Proceedings | 2003| -
Structural and surface properties of sputtered Nb films for multilayer devices
British Library Online Contents | 1997| -
Two scanning tunneling microscope devices for large samples
British Library Online Contents | 1993| -
A Novel AC Current Source for Capacitance-Based Displacement Measurements
British Library Online Contents | 1997| -
An AC Current Source for Capacitance-Based Displacement Measurements
British Library Conference Proceedings | 1996| -
Surface characterization of sputtered niobium films by scanning tunneling microscopy
American Institute of Physics | 1994| -
Capacitive sensors coupled to a scanning tunneling microscope piezoscanner for accurate measurements of the tip displacements
American Institute of Physics | 1994| -
Displacement measurements of piezoelectric actuators in the nanosize-range
British Library Conference Proceedings | 2001| -
Microhardness measurements by scanning tunneling microscope
British Library Online Contents | 1994| -
Surface characterization of sputtered niobium films by scanning tunneling microscopy
British Library Online Contents | 1994| -
Structural characterisation of Mo and Mo/Ag films for transition-edge sensors
British Library Conference Proceedings | 2001| -
Surface characterisation of electroformed mirrors for an X-ray telescope
British Library Online Contents | 1997| -
Scanning tunneling microscopy head having integrated capacitive sensors for calibration of scanner displacements
American Institute of Physics | 1996| -
STM Characterization of InP Gratings for DFB Laser Fabrication
British Library Online Contents | 1994| -
Microhardness measurements by scanning tunneling microscope
British Library Conference Proceedings | 1994| -
STM Characterization of InP Gratings for DFB Laser Fabrication
British Library Conference Proceedings | 1994| -
Capacitive sensors coupled to a scanning tunneling microscope piezoscanner for accurate measurements of the tip displacements
British Library Conference Proceedings | 1994| -
A surface profile reconstruction method based on multisensor capacitive transducers
British Library Online Contents | 1994| -
Capacitive sensors coupled to a scanning tunneling microscope piezoscanner for accurate measurements of the tip displacements
British Library Online Contents | 1994| -
Surface characterization of sputtered niobium films by scanning tunneling microscopy
British Library Conference Proceedings | 1994| -
Increase of maximum detectable slope with optical profilers, through controlled tilting and image processing
British Library Online Contents | 2007| -
Structural and electrical characterisation of Mo films for transition-edge sensors
British Library Conference Proceedings | 2002| -
A metrological SPM for dimensional surface measurements
British Library Conference Proceedings | 2001| -
A metrological SPM for dimensional surface measurements
British Library Conference Proceedings | 2001| -
Structural and electrical characterisation of Mo films for transition-edge sensors
British Library Online Contents | 2002| -
A STM head having integrated capacitive sensors for calibration of scanner displacements
British Library Conference Proceedings | 1995| -
Characterization of Josephson junction bolometers by a fibre-coupled system
British Library Conference Proceedings | 1998| -
Vickers Hardness Indentations Measured with Atomic Force Microscopy
British Library Online Contents | 1998| -
A modified STM head for scanning surface potential of thin metal films
British Library Conference Proceedings | 1997| -
A metrological SPM for dimensional surface measurements
British Library Conference Proceedings | 2002| -
A probe with differential capacitive readings of displacements
British Library Conference Proceedings | 2001|
Meine Suche schicken an (beta)
Schicken Sie ihre Suchanfrage (Suchterm ohne Filter) an andere Datenbanken, Portale und Kataloge, um ggf. weitere interessante Treffer zu finden:
Dimensions ist eine Datenbank für Abstracts und Zitate, die Informationen zu Forschungsförderungen mit daraus resultierenden Veröffentlichungen, Studien und Patenten verknüpft.
Im TIB AV-Portal können audiovisuelle Medien aus Wissenschaft und Lehre recherchiert und eigene wissenschaftliche Videos publiziert werden.
Im FID move kann nach fachspezifischer Literatur, Forschungsdaten und weitere Informationen aus der Mobilitäts- und Verkehrsforschung gesucht werden.
Der Open Research Knowledge Graph liefert strukturiert beschriebene Forschungsinhalte und macht diese vergleichbar.
Frei zugänglicher Ausschnitt der Verbunddatenbank K10plus des GBV und des SWB mit für die Fernleihe und Direktlieferdienste relevanten Materialien.