Journal of vacuum science and technology / B
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Table of contents
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Ultrasensitive broadband infrared 4 × 4 Mueller-matrix ellipsometry for studies of depolarizing and anisotropic thin filmsFurchner, Andreas / Kratz, Christoph / Ogieglo, Wojciech et al. | 2020
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Effects of substrate-controlled-orientation on the electrical performance of sputtered BaTiO3 thin filmsZhang, Wei / Hu, Fangren et al. | 2020
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Spectral ellipsometry of monolayer transition metal dichalcogenides: Analysis of excitonic peaks in dispersionErmolaev, Georgy A. / Yakubovsky, Dmitry I. / Stebunov, Yury V. et al. | 2020
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Monitoring the growth of III-nitride materials by plasma assisted molecular beam epitaxy employing diffuse scattering of RHEEDSen, Sayantani / Paul, Suchismita / Singha, Chirantan et al. | 2020
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Ultraviolet light-emitting diode arrays using Ga-doped ZnO as current spreading layerBi, Wu-Liang / Lee, Wei-Hao / Yeh, Hsin-Hao et al. | 2020
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Gold nanoparticles growing in a polymer matrix: What can we learn from spectroscopic imaging ellipsometry?Guyot, Corentin / Leclère, Philippe / Voué, Michel et al. | 2020
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Mueller matrix ellipsometry of waveplates for control of their properties and alignmentKoleják, Pierre / Vala, Daniel / Postava, Kamil et al. | 2020
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Effects of mask material conductivity on lateral undercut etching in silicon nano-pillar fabricationDey, Ripon Kumar / Ekinci, Huseyin / Cui, Bo et al. | 2020
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High-brightness source of energetic He atomsJonnalagadda, Venu S. / Randhawa, Navjot S. / Awale, Apeksha et al. | 2020
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Integration of the Ni/InP system on a 300 mm platform for III-V/Si hybrid lasersBoyer, Flore / Gergaud, Patrice / Dabertrand, Karen et al. | 2020
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Line edge roughness metrology softwareYazgi, Sertac Guneri / Ivanov, Tzvetan / Holz, Mathias et al. | 2020
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Effect of oxygen plasma cleaning on nonswitching pseudo-Bosch etching of high aspect ratio silicon pillarsAydinoglu, Ferhat / Pan, Aixi / Zhu, Chenxu et al. | 2020
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Empirical modeling and Monte Carlo simulation of secondary electron yield reduction of laser drilled microporous gold surfacesIqbal, Asif / Ludwick, Jonathan / Fairchild, Steven et al. | 2020
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Transmission Mueller-matrix characterization of transparent ramie filmsMendoza-Galván, Arturo / Li, Yuanyuan / Yang, Xuan et al. | 2020
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Pulsed laser deposition nickel oxide on crystalline silicon as hole selective contactsZhao, Jing / Ho-Baillie, Anita / Bremner, Stephen P. et al. | 2020
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Electrical and optical properties of copper oxide thin films prepared by DC magnetron sputteringShukor, Anmar H. / Alhattab, Haider A. / Takano, Ichiro et al. | 2020
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Application of a B-spline model dielectric function to infrared spectroscopic ellipsometry data analysisMohrmann, Joel / Tiwald, Thomas E. / Hale, Jeffrey S. et al. | 2020
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Temperature dependent dielectric function and direct bandgap of GeEmminger, Carola / Abadizaman, Farzin / Samarasingha, Nuwanjula S. et al. | 2020
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Deep, vertical etching for GaAs using inductively coupled plasma/reactive ion etchingBooker, Katherine / Mayon, Yahuitl Osorio / Jones, Christopher et al. | 2020
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Recovery of quantum efficiency on Cs/O-activated GaN and GaAs photocathodes by thermal annealing in vacuumSato, Daiki / Nishitani, Tomohiro / Honda, Yoshio et al. | 2020
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Dynamic Stokes polarimetric imaging system with dual-wavelength operationHan, Chien-Yuan / Chen, Meng-Ting / Lai, Hong-Bin et al. | 2020
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Formation of CdSe quantum dots from single source precursor obtained by thermal and laser treatmentLimosani, Francesca / Carcione, Rocco / Antolini, Francesco et al. | 2020
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Influence of specific forming algorithms on the device-to-device variability of memristive Al-doped HfO2 arraysMahadevaiah, Mamathamba K. / Perez, Eduardo / Wenger, Christian et al. | 2020
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Imaging ellipsometry for curved surfacesNegara, Christian / Längle, Thomas / Beyerer, Jürgen et al. | 2020
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Simplified patterning process for the selective 1D ZnO nanorods growthGeng, Yulin / Jeronimo, Karina / Bin Che Mahzan, Muhammad Ammar et al. | 2020
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Ion bombardment induced formation of self-organized wafer-scale GaInP nanopillar assembliesVisser, Dennis / Jaramillo-Fernandez, Juliana / Haddad, Gabriel et al. | 2020
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Formation and optical response of self-assembled gold nanoparticle lattices on oxidized silicon synthesized using block copolymersAlvarez-Fernandez, Alberto / Fleury, Guillaume / Ponsinet, Virginie et al. | 2020
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Mid-IR and UV-Vis-NIR Mueller matrix ellipsometry characterization of tunable hyperbolic metamaterials based on self-assembled carbon nanotubesSchöche, Stefan / Ho, Po-Hsun / Roberts, John A. et al. | 2020
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Bismuth vanadate photoanodes for water splitting deposited by radio frequency plasma reactive co-sputteringPedroni, Matteo / Chiarello, Gian Luca / Haghshenas, Niloofar et al. | 2020
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Evaluation of residual defects created by plasma exposure of Si substrates using vertical and lateral pn junctionsSato, Yoshihiro / Shibata, Satoshi / Urabe, Keiichiro et al. | 2020
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Plasmonic coupling and how standard ellipsometry can feel surface plasmonBortchagovsky, Eugene et al. | 2020
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Mueller matrix ellipsometry study of a circular polarizing filterHong, Nina / Hilfiker, James N. et al. | 2020
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Nanoscale etching of perovskite oxides for field effect transistor applicationsCheng, Junao / Yang, Hao / Wang, Caiyu et al. | 2020
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Silicon chip field emission electron source fabricated by laser micromachiningLanger, Christoph / Bomke, Vitali / Hausladen, Matthias et al. | 2020
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Nonideal optical response of liquid crystal variable retarders and its impact on their performance as polarization modulatorsGarcía Parejo, Pilar / Campos-Jara, Antonio / García-Caurel, Enric et al. | 2020
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Corrosion behavior of Ag film lines in atmospheric conditions estimated by means of electrical resistance techniqueSasaki, Takahiro / Tohmyoh, Hironori et al. | 2020
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In situ real-time and ex situ spectroscopic analysis of Al2O3 films prepared by plasma enhanced atomic layer depositionNaumann, Franziska / Reck, Johanna / Gargouri, Hassan et al. | 2020
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Electrical resistivity and mechanical properties of nitrogen-containing diamondlike carbon/tungsten and nitrogen-containing diamondlike carbon/tungsten carbide multilayer films prepared under low substrate temperatureTamekuni, Koki / Harigai, Toru / Toya, Takafumi et al. | 2020
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Modification of near band edge emission and structure with Ga-related clusters in Ga-doped ZnO nanocrystal filmsTorchynska, Tetyana V. / El Filali, Brahim / Ballardo Rodriguez, Chetzyl I. et al. | 2020
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Effective structural chirality of beetle cuticle determined from transmission Mueller matrices using the Tellegen constitutive relationsArwin, Hans / Magnusson, Roger / Järrendahl, Kenneth et al. | 2020
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Retroreflex ellipsometry for isotropic substrates with nonplanar surfacesChen, Chia-Wei / Hartrumpf, Matthias / Längle, Thomas et al. | 2020