The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
<
Volume 39,
Issue 7
Volume 39,
Issue 6
Volume 39,
Issue 5
Volume 39,
Issue 4
Volume 39,
Issue 3
Volume 39,
Issue 2
Volume 39,
Issue 1
Volume 38,
Issue 12
Volume 38,
Issue 11
Volume 38,
Issue 10
Volume 38,
Issue 9
Volume 38,
Issue 8
Volume 38,
Issue 7
Volume 38,
Issue 6
Volume 38,
Issue 5
Volume 38,
Issue 4
Volume 38,
Issue 3
Volume 38,
Issue 2
Volume 38,
Issue 1
Volume 37,
Issue 12
Volume 37,
Issue 11
Volume 37,
Issue 10
Volume 37,
Issue 9
Volume 37,
Issue 8
Volume 37,
Issue 7
Volume 37,
Issue 6
Volume 37,
Issue 5
Volume 37,
Issue 4
Volume 37,
Issue 3
Volume 37,
Issue 2
Volume 37,
Issue 1
Volume 36,
Issue 12
Volume 36,
Issue 11
Volume 36,
Issue 10
Volume 36,
Issue 9
Volume 36,
Issue 8
Volume 36,
Issue 7
Volume 36,
Issue 6
Volume 36,
Issue 5
Volume 36,
Issue 4
Volume 36,
Issue 3
Volume 36,
Issue 2
Volume 36,
Issue 1
Volume 35,
Issue 12
Volume 35,
Issue 11
Volume 35,
Issue 10
Volume 35,
Issue 9
Volume 35,
Issue 8
Volume 35,
Issue 6
Volume 34,
Issue 8
Volume 34,
Issue 7
Volume 34,
Issue 6
Volume 34,
Issue 5
Volume 34,
Issue 4
Volume 34,
Issue 3
Volume 34,
Issue 2
Volume 34,
Issue 1
Volume 33,
Issue 12
Volume 33,
Issue 11
Volume 33,
Issue 10
Volume 33,
Issue 9
Volume 33,
Issue 8
Volume 33,
Issue 7
Volume 33,
Issue 6
Volume 33,
Issue 5
Volume 33,
Issue 4
Volume 33,
Issue 3
Volume 33,
Issue 2
Volume 33,
Issue 1
Volume 32,
Issue 12
Volume 32,
Issue 11
Volume 32,
Issue 10
Volume 32,
Issue 9
Volume 32,
Issue 8
Volume 32,
Issue 7
Volume 32,
Issue 6
Volume 32,
Issue 5
Volume 32,
Issue 4
Volume 32,
Issue 3
Volume 32,
Issue 2
Volume 32,
Issue 1
Volume 31,
Issue 12
Volume 31,
Issue 11
Volume 31,
Issue 10
Volume 31,
Issue 9
Volume 31,
Issue 8
Volume 31,
Issue 7
Volume 31,
Issue 6
Volume 31,
Issue 5
Volume 31,
Issue 4
Volume 31,
Issue 3
Volume 31,
Issue 2
Volume 31,
Issue 1
Volume 30,
Issue 12
Volume 30,
Issue 11
Volume 30,
Issue 10
Volume 30,
Issue 9
Volume 30,
Issue 8
Volume 30,
Issue 7
Volume 30,
Issue 6
Volume 30,
Issue 5
Volume 30,
Issue 4
Volume 30,
Issue 3
Volume 30,
Issue 2
Volume 30,
Issue 1
Volume 29,
Issue 12
Volume 29,
Issue 11
Volume 29,
Issue 10
Volume 29,
Issue 9
Volume 29,
Issue 8
Volume 29,
Issue 7
Volume 29,
Issue 6
Volume 29,
Issue 5
Volume 29,
Issue 4
Volume 29,
Issue 3
Volume 29,
Issue 2
Volume 29,
Issue 1
Volume 28,
Issue 12
Volume 28,
Issue 11
Volume 28,
Issue 10
Volume 28,
Issue 9
Volume 28,
Issue 8
Volume 28,
Issue 7
Volume 28,
Issue 6
Volume 28,
Issue 5
Volume 28,
Issue 4
Volume 28,
Issue 3
Volume 28,
Issue 2
Volume 28,
Issue 1
Volume 27,
Issue 12
Volume 27,
Issue 11
Volume 27,
Issue 10
Volume 27,
Issue 9
Volume 27,
Issue 8
Volume 27,
Issue 7
Volume 27,
Issue 6
Volume 27,
Issue 5
Volume 27,
Issue 4
Volume 27,
Issue 3
Volume 27,
Issue 2
Volume 27,
Issue 1
Volume 26,
Issue 12
Volume 26,
Issue 11
Volume 26,
Issue 10
Volume 26,
Issue 9
Volume 26,
Issue 8
Volume 26,
Issue 7
Volume 26,
Issue 6
Volume 26,
Issue 5
Volume 26,
Issue 4
Volume 26,
Issue 3
Volume 26,
Issue 2
Volume 26,
Issue 1
Volume 25,
Issue 12
Volume 25,
Issue 11
Volume 25,
Issue 10
Volume 25,
Issue 9
Volume 25,
Issue 8
Volume 25,
Issue 7
Volume 25,
Issue 6
Volume 25,
Issue 5
Volume 25,
Issue 4
Volume 25,
Issue 3
Volume 25,
Issue 2
Volume 25,
Issue 1
Volume 24,
Issue 12
Volume 24,
Issue 11
Volume 24,
Issue 10
Volume 24,
Issue 9
Volume 24,
Issue 8
Volume 24,
Issue 7
Volume 24,
Issue 6
Volume 24,
Issue 5
Volume 24,
Issue 4
Volume 24,
Issue 3
Volume 24,
Issue 2
Volume 24,
Issue 1
Volume 23,
Issue 12
Volume 23,
Issue 11
Volume 23,
Issue 10
Volume 23,
Issue 9
Volume 23,
Issue 8
Volume 23,
Issue 7
Volume 23,
Issue 6
Volume 23,
Issue 5
Volume 23,
Issue 4
Volume 23,
Issue 3
Volume 23,
Issue 2
Volume 23,
Issue 1
Volume 22,
Issue 12
Volume 22,
Issue 11
Volume 22,
Issue 10
Volume 22,
Issue 9
Volume 22,
Issue 8
Volume 22,
Issue 7
Volume 22,
Issue 6
Volume 22,
Issue 5
Volume 22,
Issue 4
Volume 22,
Issue 3
Volume 22,
Issue 2
Volume 22,
Issue 1
Volume 21,
Issue 12
Volume 21,
Issue 11
Volume 21,
Issue 10
Volume 21,
Issue 9
Volume 21,
Issue 8
Volume 21,
Issue 7
Volume 21,
Issue 6
Volume 21,
Issue 5
Volume 21,
Issue 4
Volume 21,
Issue 3
Volume 21,
Issue 2
Volume 21,
Issue 1
Volume 20,
Issue 12
Volume 20,
Issue 11
Volume 20,
Issue 10
Volume 20,
Issue 9
Volume 20,
Issue 8
Volume 20,
Issue 7
Volume 20,
Issue 6
Volume 20,
Issue 5
Volume 20,
Issue 4
Volume 20,
Issue 3
Volume 20,
Issue 2
Volume 20,
Issue 1
Volume 19,
Issue 12
Volume 19,
Issue 11
Volume 19,
Issue 10
Volume 19,
Issue 9
Volume 19,
Issue 8
Volume 19,
Issue 7
Volume 19,
Issue 6
Volume 19,
Issue 5
Volume 19,
Issue 4
Volume 19,
Issue 3
Volume 19,
Issue 2
Volume 19,
Issue 1
Volume 18,
Issue 12
Volume 18,
Issue 11
Volume 18,
Issue 10
Volume 18,
Issue 9
Volume 18,
Issue 8
Volume 18,
Issue 7
Volume 18,
Issue 6
Volume 18,
Issue 5
Volume 18,
Issue 4
Volume 18,
Issue 3
Volume 18,
Issue 2
Volume 18,
Issue 1
Volume 17,
Issue 12
Volume 17,
Issue 11
Volume 17,
Issue 10
Volume 17,
Issue 9
Volume 17,
Issue 8
Volume 17,
Issue 7
Volume 17,
Issue 6
Volume 17,
Issue 5
Volume 17,
Issue 4
Volume 17,
Issue 3
Volume 17,
Issue 2
Volume 17,
Issue 1
Volume 16,
Issue 12
Volume 16,
Issue 11
Volume 16,
Issue 10
Volume 16,
Issue 9
Volume 16,
Issue 8
Volume 16,
Issue 7
Volume 16,
Issue 6
Volume 16,
Issue 5
Volume 16,
Issue 4
Volume 16,
Issue 3
Volume 16,
Issue 2
Volume 16,
Issue 1
Volume 15,
Issue 12
Volume 15,
Issue 11
Volume 15,
Issue 10
Volume 15,
Issue 9
Volume 15,
Issue 8
Volume 15,
Issue 7
Volume 15,
Issue 6
Volume 15,
Issue 5
Volume 15,
Issue 4
Volume 15,
Issue 3
Volume 15,
Issue 2
Volume 15,
Issue 1
Volume 14,
Issue 12
Volume 14,
Issue 11
Volume 14,
Issue 10
Volume 14,
Issue 9
Volume 14,
Issue 8
Volume 14,
Issue 7
Volume 14,
Issue 6
Volume 14,
Issue 5
Volume 14,
Issue 4
Volume 14,
Issue 3
Volume 14,
Issue 2
Volume 14,
Issue 1
Volume 13,
Issue supp
Volume 13,
Issue a
Volume 13,
Issue 12
Volume 13,
Issue 11
Volume 13,
Issue 10
Volume 13,
Issue 9
Volume 13,
Issue 8a
Volume 13,
Issue 8
Volume 13,
Issue 7
Volume 13,
Issue 6
Volume 13,
Issue 5
Volume 13,
Issue 4
Volume 13,
Issue 3
Volume 13,
Issue 2
Volume 13,
Issue 1
Volume 12,
Issue 12
Volume 12,
Issue 11
Volume 12,
Issue 10
Volume 12,
Issue 9
Volume 12,
Issue 8
Volume 12,
Issue 7
Volume 12,
Issue 6
Volume 12,
Issue 5
Volume 12,
Issue 4
Volume 12,
Issue 3
Volume 12,
Issue 2
Volume 12,
Issue 1
Volume 11,
Issue sup
Volume 11,
Issue 12
Volume 11,
Issue 11s
Volume 11,
Issue 11
Volume 11,
Issue 10
Volume 11,
Issue 9
Volume 11,
Issue 8
Volume 11,
Issue 7
Volume 11,
Issue 6
Volume 11,
Issue 5
Volume 11,
Issue 4
Volume 11,
Issue 3
Volume 11,
Issue 2
Volume 11,
Issue 1
Volume 10,
Issue 12
Volume 10,
Issue 11
Volume 10,
Issue 10
Volume 10,
Issue 9
Volume 10,
Issue 8
Volume 10,
Issue 7
Volume 10,
Issue 6
Volume 10,
Issue 5
Volume 10,
Issue 4
Volume 10,
Issue 3
Volume 10,
Issue 2
Volume 10,
Issue 1
Volume 9,
Issue sup
Volume 9,
Issue s
Volume 9,
Issue 12
Volume 9,
Issue 11s
Volume 9,
Issue 11
Volume 9,
Issue 10
Volume 9,
Issue 9
Volume 9,
Issue 8
Volume 9,
Issue 7
Volume 9,
Issue 6
Volume 9,
Issue 5s
Volume 9,
Issue 5
Volume 9,
Issue 4
Volume 9,
Issue 3
Volume 9,
Issue 2
Volume 9,
Issue 1
Volume 8,
Issue sup
Volume 8,
Issue 12
Volume 8,
Issue 11
Volume 8,
Issue 10
Volume 8,
Issue 9
Volume 8,
Issue 8
Volume 8,
Issue 7
Volume 8,
Issue 6s
Volume 8,
Issue 6
Volume 8,
Issue 5
Volume 8,
Issue 4
Volume 8,
Issue 3
Volume 8,
Issue 2
Volume 8,
Issue 1s
Volume 8,
Issue 1
Volume 7,
Issue 12
Volume 7,
Issue 11
Volume 7,
Issue 10
Volume 7,
Issue 9
Volume 7,
Issue 8
Volume 7,
Issue 7
Volume 7,
Issue 6
Volume 7,
Issue 5
Volume 7,
Issue 4
Volume 7,
Issue 3b
Volume 7,
Issue 3
Volume 7,
Issue 2
Volume 7,
Issue 1a
Volume 7,
Issue 1
Volume 6,
Issue 12c
Volume 6,
Issue 12
Volume 6,
Issue 11
Volume 6,
Issue 10b
Volume 6,
Issue 10
Volume 6,
Issue 9a
Volume 6,
Issue 9
Volume 6,
Issue 8
Volume 6,
Issue 7
Volume 6,
Issue 6
Volume 6,
Issue 5
Volume 6,
Issue 4
Volume 6,
Issue 3
Volume 6,
Issue 2
Volume 6,
Issue 1
Volume 5,
Issue 12
Volume 5,
Issue 11
Volume 5,
Issue 10
Volume 5,
Issue 9
Volume 5,
Issue 8
Volume 5,
Issue 7
Volume 5,
Issue 6
Volume 5,
Issue 5
Volume 5,
Issue 4
Volume 5,
Issue 3s
Volume 5,
Issue 3
Volume 5,
Issue 2
Volume 5,
Issue 1
Volume 4,
Issue 12
Volume 4,
Issue 11
Volume 4,
Issue 10
Volume 4,
Issue 9
Volume 4,
Issue 8
Volume 4,
Issue 7
Volume 4,
Issue 6
Volume 4,
Issue 5
Volume 4,
Issue 4
Volume 4,
Issue 3
Volume 4,
Issue 2
Volume 4,
Issue 1
Volume 3,
Issue 12
Volume 3,
Issue 11
Volume 3,
Issue 10
Volume 3,
Issue 9
Volume 3,
Issue 8
Volume 3,
Issue 7
Volume 3,
Issue 6
Volume 3,
Issue 5
Volume 3,
Issue 4
Volume 3,
Issue 3
Volume 3,
Issue 2
Volume 3,
Issue 1
Volume 2,
Issue 12
Volume 2,
Issue 11
Volume 2,
Issue 10
Volume 2,
Issue 9
Volume 2,
Issue 8
Volume 2,
Issue 7
Volume 2,
Issue 6
Volume 2,
Issue 5
Volume 2,
Issue 4
Volume 2,
Issue 3
Volume 2,
Issue 2
Volume 2,
Issue 1
Volume 1,
Issue 6
Volume 1,
Issue 5
Volume 1,
Issue 4
Volume 1,
Issue 3
Volume 1,
Issue 2
Volume 1,
Issue 1
>
Table of contents
69
Positive and negative magnetoresistance on both sides of the metal#8211insulator transition in metallic n-type InP
Kaaouachi, A.El
et al.
| 2003
69
Positive and negative magnetoresistance on both sides of the metal–insulator transition in metallic n-type InP
A El Kaaouachi
/ A Nafidi
/ Ah Nafidi
et al.
| 2003
75
Barrier characteristics of Cd-p-GaTe Schottky diodes based on I#8211V#8211T measurements
Abay, B.
et al.
| 2003
75
Barrier characteristics of Cd/p-GaTe Schottky diodes based on I–V–T measurements
B Abay
/ G Çankaya
/ H S Güder
et al.
| 2003
82
A model for capacitance reconstruction from measured lossy MOS capacitance#8211voltage characteristics
Kwa, K.S.K.
et al.
| 2003
82
A model for capacitance reconstruction from measured lossy MOS capacitance–voltage characteristics
K S K Kwa
/ S Chattopadhyay
/ N D Jankovic
et al.
| 2003
88
Multiple gate oxide technology using nitrogen implantation and high-pressure O2 oxidation
C H Lee
/ D L Kwong
et al.
| 2003
92
Electrical properties of deposited ZrO2 films on ZnO/n-Si substrates
S Chatterjee
/ S K Nandi
/ S Maikap
et al.
| 2003
97
The effect of high acceptor dopant concentration of Zn2+ on electrical, optical and structural properties of the In2 O3 transparent conducting thin films
Mohammad-Mehdi Bagheri-Mohagheghi
/ Mehrdad Shokooh-Saremi
et al.
| 2003
104
A comparative study of hydrogen sensing performances between electroless plated and thermal evaporated Pd/InP Schottky diodes
Huey-Ing Chen
/ Yen-I Chou
et al.
| 2003
111
Photoluminescence and structural properties of cadmium sulphide thin films grown by different techniques
J Aguilar-Hernández
/ G Contreras-Puente
/ A Morales-Acevedo
et al.
| 2003
115
Si accumulation at the surface upon re-evaporation of Si-doped GaAs(100)
D Reuter
/ P Schafmeister
/ P Kailuweit
et al.
| 2003
118
Monte Carlo simulation of hot-phonon and degeneracy effects in the AlGaN/GaN two-dimensional electron gas channel
M Ramonas
/ A Matulionis
/ L Rota
et al.
| 2003
124
Two-dimensional numerical modelling of a deep submicron irradiated MOSFET to extract its global characteristics
S Dasgupta
et al.
| 2003
133
Memory switching in In#8211Te glasses: results of heat-transport measurements
Rajesh, R.
et al.
| 2003
133
Memory switching in In–Te glasses: results of heat-transport measurements
R Rajesh
/ J Philip
et al.
| 2003
139
Effect of germanium on redistribution of boron and phosphorus during thermal oxidation of silicon
O V Aleksandrov
/ N N Afonin
et al.
| 2003
144
Electroluminescence of diamond:Ce thin films
Xiaoping Wang
/ Lijun Wang
/ Binglin Zhang
et al.
| 2003
147
Hot-electron-induced luminescence of metal–oxide-semiconductor tunnel devices
N Asli
/ M I Vexler
/ A F Shulekin
et al.
| 2003
147
Hot-electron-induced luminescence of metal#8211oxide-semiconductor tunnel devices
Asli, N.
et al.
| 2003
154
Rapid thermal annealing effect on crystalline yttria-stabilized zirconia gate dielectrics
S J Wang
/ C K Ong
et al.
| 2003
158
An empirical model for charge leakage through oxide–nitride–oxide interpoly dielectric in stacked-gate flash memory devices
Jang Han Kim
/ Jung Bum Choi
/ Bong Jo Shin
et al.
| 2003
158
An empirical model for charge leakage through oxide#8211nitride#8211oxide interpoly dielectric in stacked-gate flash memory devices
Kim, Jang Han
et al.
| 2003
163
Influence of doping on gain characteristics of GaInNAs/GaAs quantum well lasers
B Gönül
/ M Oduncuoglu
/ S Dindaroglu
et al.
| 2003
170
Fabrication of wavelength-shifted In0.2 Ga0.8 As/GaAs multiple quantum well laser diodes by impurity-free vacancy disordering at different thermal annealing temperatures
Jae Su Yu
/ Jin Dong Song
/ Yong Tak Lee
et al.
| 2003
174
Effects of detrapping on electron traps generated in gate oxides
W D Zhang
/ J F Zhang
/ M J Lalor
et al.
| 2003
183
Growth and electrical characterization of laser ablated highly oriented zirconium titanate thin films in a metal–oxide semiconductor configuration
P Victor
/ J Nagaraju
/ S B Krupanidhi
et al.
| 2003
183
Growth and electrical characterization of laser ablated highly oriented zirconium titanate thin films in a metal#8211oxide semiconductor configuration
Victor, P.
et al.
| 2003
190
Semiconducting Cu3 BiS3 thin films formed by the solid-state reaction of CuS and bismuth thin films
Verónica Estrella
/ M T S Nair
/ P K Nair
et al.
| 2003
L9
Sharp variations in the temperature dependence of optical reflectivity from AlN/GaN heterostructures
V V Ursaki
/ I M Tiginyanu
/ N N Syrbu
et al.
| 2003
L12
Resonant wavelength control of a 1.3 μm microcavity by intracavity steam oxidation
R Macaluso
/ F Robert
/ A C Bryce
et al.
| 2003
L12
Resonant wavelength control of a 1.3 micron microcavity by intracavity steam oxidation
Macaluso, R.
/ Robert, F.
/ Bryce, A.C.
et al.
| 2003
LETTER TO THE EDITOR: Resonant wavelength control of a 1.3 IMG entity="mu" SRC="http: ej.iop.org-icons-Entities-mu.gif" ALT="mu" ALIGN="MIDDLE">m microcavity by intracavity steam oxidation
Macaluso, R.
et al.
| 2003
LETTER TO THE EDITOR: Sharp variations in the temperature dependence of optical reflectivity from AlN-GaN heterostructures
Ursaki, V.V.
et al.
| 2003