IEEE Transactions on Instrumentation and Measurement
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Table of contents
- 225
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EditorialFeller, U. et al. | 2003
- 225
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SPECIAL ISSUE ON CPEM 2002 - Guest EditorialFeller, U. et al. | 2003
- 227
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Frequency Standards, Lasers, and Trapped Particles - Optical Frequency Standards and MeasurementHall, J.L. et al. | 2003
- 227
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Optical frequency standards and measurementHall, J.L. / Jun Ye, et al. | 2003
- 232
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Frequency Standards, Lasers, and Trapped Particles - The BIPM Laser Standards at 633 nm and 532 nm Simultaneously Linked to the SI Second Using a Femtosecond Laser in an Optical Clock ConfigurationMa, L.-S. et al. | 2003
- 232
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The BIPM laser standards at 633 nm and 532 nm simultaneously linked to the SI second using a femtosecond laser in an optical clock configurationLong-Sheng Ma, / Robertsson, L. / Picard, S. et al. | 2003
- 236
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Results from international comparisons at the BIPM providing a world-wide reference network of /sup 127/I/sub 2/ stabilized frequency-doubled Nd:YAG lasersPicard, S. / Robertsson, L. / Ma, L.-S. et al. | 2003
- 236
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Frequency Standards, Lasers, and Trapped Particles - Results From International Comparisons at the BIPM Providing a World-Wide Reference Network of 127I2 Stabilized Frequency-Doubled Nd:YAG LasersPicard, S. et al. | 2003
- 240
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Frequency Standards, Lasers, and Trapped Particles - Comparison of Independent Optical Frequency Measurements Using a Portable Iodine-Stabilized Nd:YAG LaserHong, F.-L. et al. | 2003
- 240
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Comparison of independent optical frequency measurements using a portable iodine-stabilized Nd:YAG laserFeng-Lei Hong, / Ishikawa, J. / Sugiyama, K. et al. | 2003
- 245
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Optical frequency standards based on the /sup 199/Hg/sup +/ ionTanaka, U. / Bergquist, J.C. / Bize, S. et al. | 2003
- 245
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Frequency Standards, Lasers, and Trapped Particles - Optical Frequency Standards Based on the 199Hg+ IonTanaka, U. et al. | 2003
- 250
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Frequency Standards, Lasers, and Trapped Particles - Optical Frequency Standard Based on Cold Ca AtomsHelmcke, J. et al. | 2003
- 250
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Optical frequency standard based on cold Ca atomsHelmcke, J. / Wilpers, G. / Binnewies, T. et al. | 2003
- 255
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Frequency Standards, Lasers, and Trapped Particles - Cold Strontium Atoms for an Optical Frequency StandardCourtillot, I. et al. | 2003
- 255
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Cold strontium atoms for an optical frequency standardCourtillot, I. / Quessada, A. / Kovacich, R.P. et al. | 2003
- 258
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The coherent population trapping passive frequency standard [Rb example]Vanier, J. / Levine, M.W. / Janssen, D. et al. | 2003
- 258
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Frequency Standards, Lasers, and Trapped Particles - The Coherent Population Trapping Passive Frequency StandardVanier, J. et al. | 2003
- 263
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Development of a cesium atomic fountain frequency standardTaeg Yong Kwon, / Ho Seong Lee, / Sung Hoon Yang, et al. | 2003
- 263
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Frequency Standards, Lasers, and Trapped Particles - Development of a Cesium Atomic Fountain Frequency StandardKwon, T.Y. et al. | 2003
- 267
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Frequency Standards, Lasers, and Trapped Particles - Systematic Shift Uncertainty Evaluation of IEN CSF1 Primary Frequency StandardLevi, F. et al. | 2003
- 267
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Systematic shift uncertainty evaluation of IEN CSF1 primary frequency standardLevi, F. / Lorini, L. / Calonico, D. et al. | 2003
- 272
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Frequency Standards, Lasers, and Trapped Particles - Iodine Stabilized Dye Laser System for Frequency Measurements in the Visible and Near IR Region of the SpectrumMadej, A.A. et al. | 2003
- 272
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Iodine stabilized dye laser system for frequency measurements in the visible and near IR region of the spectrumMadej, A.A. / Ball, M. et al. | 2003
- 277
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Frequency Standards, Lasers, and Trapped Particles - Production of Raman Laser Beams Using Injection-Locking TechniquePark, S.E. et al. | 2003
- 277
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Production of Raman laser beams using injection-locking techniqueSang Eon Park, / Taeg Yong Kwon, / Ho Seong Lee, et al. | 2003
- 280
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Frequency Standards, Lasers, and Trapped Particles - A Compact Extended-Cavity Diode Laser With a Littman ConfigurationPark, S.E. et al. | 2003
- 280
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A compact extended-cavity diode laser with a Littman configurationSang Eon Park, / Taeg Yong Kwon, / Eun-joo Shin, et al. | 2003
- 284
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Frequency stabilization of a diode-pumped Nd:Yag laser at 532 nm to iodine by using third-harmonic techniqueNyholm, K. / Merimaa, M. / Ahola, T. et al. | 2003
- 284
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Frequency Standards, Lasers, and Trapped Particles - Frequency Stabilization of a Diode-Pumped Nd:Yag Laser at 532 nm to Iodine by Using Third-Harmonic TechniqueNyholm, K. et al. | 2003
- 288
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Frequency Standards, Lasers, and Trapped Particles - Narrow-Band Correction of the Residual Amplitude Modulation in Frequency-Modulation SpectroscopyBurck, F.du et al. | 2003
- 288
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Narrow-band correction of the residual amplitude modulation in frequency-modulation spectroscopydu Burck, F. / Lopez, O. / El Basri, A. et al. | 2003
- 292
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Frequency Standards, Lasers, and Trapped Particles - Two Ions in One Trap: Ultra-High Precision Mass Spectrometry?Rainville, S. et al. | 2003
- 292
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Two ions in one trap: ultra-high precision mass spectrometry?Rainville, S. / Thompson, J.K. / Pritchard, D.E. et al. | 2003
- 297
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Application of a six-port wave-correlator for a very low velocity measurement using the Doppler effectFengchao Xiao, / Ghannouchi, F.M. / Yakabe, T. et al. | 2003
- 297
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Microwaves and RF - Application of a Six-Port Wave-Correlator for a Very Low Velocity Measurement Using the Doppler EffectXiao, F. et al. | 2003
- 302
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Microwaves and RF - Attenuation Measurement System in the Frequency Range of 10 to 100 MHzWidarta, A. et al. | 2003
- 302
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Attenuation measurement system in the frequency range of 10 to 100 MHzWidarta, A. / Tomoteru, K. et al. | 2003
- 306
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An experiment for verification of the auxiliary transmission-line method to evaluate a microwave thermal noise sourceNakano, H. / Murakami, H. / Inoue, T. et al. | 2003
- 306
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Microwaves and RF - An Experiment for Verification of the Auxiliary Transmission-Line Method to Evaluate a Microwave Thermal Noise SourceNakano, H. et al. | 2003
- 311
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Microwaves and RF - Influence of TMSO Calibration Standards Uncertainties on VNA S-Parameter MeasurementsStumper, U. et al. | 2003
- 311
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Influence of TMSO calibration standards uncertainties on VNA S-parameter measurementsStumper, U. et al. | 2003
- 316
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LRR-a self-calibration technique for the calibration of vector network analyzersRolfes, I. / Schiek, B. et al. | 2003
- 316
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Microwaves and RF - LRR -- A Self-Calibration Technique for the Calibration of Vector Network AnalyzersRolfes, I. et al. | 2003
- 320
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A new microcalorimeter for measurements in 3.5-mm coaxial lineBrunetti, L. / Vremera, E.T. et al. | 2003
- 320
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Microwaves and RF - A New Microcalorimeter for Measurements in 3.5-mm Coaxial LineBrunetti, L. et al. | 2003
- 324
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A high precision 24-GHz FMCW radar based on a fractional-N ramp-PLLMusch, T. et al. | 2003
- 324
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Microwaves and RF - A High Precision 24-GHz FMCW Radar Based on a Fractional-N Ramp-PLLMusch, T. et al. | 2003
- 328
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Microwaves and RF - Coupled Microwave Resonators as the Basis for Sensitive Bolometric DetectionHao, L. et al. | 2003
- 328
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Coupled microwave resonators as the basis for sensitive bolometric detectionLing Hao, / Gallop, J.C. / Macfarlane, J.C. et al. | 2003
- 333
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Microwaves and RF - Material Characterization Using a Quasi-Optical Measurement SystemGagnon, N. et al. | 2003
- 333
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Material characterization using a quasi-optical measurement systemGagnon, N. / Shaker, J. / Berini, P. et al. | 2003
- 337
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Frequency band requirement for a precision RMS measurement system based on successive extraction of the means of absolute valuesPogliano, U. et al. | 2003
- 337
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AC Measurements and Devices - Frequency Band Requirement for a Precision RMS Measurement System Based on Successive Extraction of the Means of Absolute ValuesPogliano, U. et al. | 2003
- 341
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AC Measurements and Devices - High Performance Millivolt-Amplifier for the Planar Multijunction Thermal ConverterStojanovic, M. et al. | 2003
- 341
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High performance millivolt-amplifier for the planar multijunction thermal converterStojanovic, M. / Klonz, M. / Stojanovic, B. et al. | 2003
- 345
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AC Measurements and Devices - High-Frequency Thin-Film Multijunction Thermal Converter on a Quartz Crystal ChipScarioni, L. et al. | 2003
- 345
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High-frequency thin-film multijunction thermal converter on a quartz crystal chipScarioni, L. / Klonz, M. / Janik, D. et al. | 2003
- 350
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AC Measurements and Devices - Low-Frequency AC-DC Voltage Transfer Standards With New High-Sensitivity and Low-Power-Coefficient Thin-Film Multijunction Thermal ConvertersLaiz, H. et al. | 2003
- 350
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Low-frequency AC-DC voltage transfer standards with new high-sensitivity and low-power-coefficient thin-film multijunction thermal convertersLaiz, H. / Klonz, M. / Kessler, E. et al. | 2003
- 355
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AC-DC voltage transfer module with thin-film multijunction thermal converterStojanovic, B. / Klonz, M. / Laiz, H. et al. | 2003
- 359
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Measurement of thermoelectric effects in a thermal converter using a NbN/TiN/NbN Josephson junction arraySasaki, H. / Yamamori, H. / Fujiki, H. et al. | 2003
- 359
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AC Measurements and Devices - Measurement of Thermoelectric Effects in a Thermal Converter Using a NbN-TiN-NbN Josephson Junction ArraySasaki, H. et al. | 2003
- 363
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Behavior and frequency dependence of AC-DC high voltage transfer standard under humidity step changesLing Xiang Liu, / Sze Wey Chua, / Chee Kiang Ang, et al. | 2003
- 363
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AC Measurements and Devices - Behavior and Frequency Dependence of AC-DC High Voltage Transfer Standard Under Humidity Step ChangesLiu, L.X. et al. | 2003
- 367
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AC Measurements and Devices - Extension of Swerlein's Algorithm for AC Voltage Measurement in the Frequency DomainKyriazis, G.A. et al. | 2003
- 367
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Extension of Swerlein's algorithm for AC voltage measurement in the frequency domainKyriazis, G.A. et al. | 2003
- 371
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AC Measurements and Devices - Evaluation of the Synchronous Generation and Sampling TechniqueIhlenfeld, W.G.K. et al. | 2003
- 371
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Evaluation of the synchronous generation and sampling techniqueIhlenfeld, W.G.K. / Mohns, E. / Bachmair, H. et al. | 2003
- 375
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AC Measurements and Devices - Extension of the IEN Traceability for AC Voltages Below 200 mVPogliano, U. et al. | 2003
- 375
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Extension of the IEN traceability for AC voltages below 200 mVPogliano, U. / Bosco, G.C. / D'Elia, V. et al. | 2003
- 380
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AC Measurements and Devices - Direct-Reading Absolute Calibration of AC Voltage Ratio StandardsCallegaro, L. et al. | 2003
- 380
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Direct-reading absolute calibration of AC voltage ratio standardsCallegaro, L. / Bosco, G.C. / D'Elia, V. et al. | 2003
- 384
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AC Measurements and Devices - Precise Ratio Transformer: A New Concept of the Magnetic SystemLee, R.D. et al. | 2003
- 384
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Precise ratio transformer: a new concept of the magnetic systemRae Duk Lee, / Han Jun Kim, / Semyonov, Yu.P. et al. | 2003
- 388
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AC Measurements and Devices - Digital Generator Assisted Impedance BridgeCorney, A.C. et al. | 2003
- 388
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Digital generator assisted impedance bridgeCorney, A.C. et al. | 2003
- 392
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AC Measurements and Devices - Improving the Mechanical Stability of a Standard CapacitorMoodley, S.S. et al. | 2003
- 392
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Improving the mechanical stability of a standard capacitorMoodley, S.S. / van den Berg, W. / Veldman, C.S. et al. | 2003
- 396
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Calibration of electronic capacitance and dissipation factor bridgesRamm, G. / Moser, H. et al. | 2003
- 396
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AC Measurements and Devices - Calibration of Electronic Capacitance and Dissipation Factor BridgesRamm, G. et al. | 2003
- 400
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A calculable impulse voltage calibrator for calibration of impulse digitizersHallstrom, J.K. / Chekurov, Yu.Y. / Aro, M.M. et al. | 2003
- 400
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AC Measurements and Devices - A Calculable Impulse Voltage Calibrator for Calibration of Impulse DigitizersHällström, J.K. et al. | 2003
- 404
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Comparative impulse voltage measurements at the National Measurement Laboratory (NML), CSIRO, Australia, and the Institute for National Measurement Standards (INMS), NRC, CanadaYi Li, / Rungis, J. / McComb, T.R. et al. | 2003
- 404
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AC Measurements and Devices - Comparative Impulse Voltage Measurements at the National Measurement Laboratory (NML), CSIRO, Australia, and the Institute for National Measurement Standards (INMS), NRC, CanadaLi, Y. et al. | 2003
- 408
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Power and Energy - Electronic System for Increasing the Accuracy of In-Service Instrument-Current TransformersSlomovitz, D. et al. | 2003
- 408
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Electronic system for increasing the accuracy of in-service instrument-current transformersSlomovitz, D. et al. | 2003
- 411
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Power and Energy - A New Transfer Device for the NRC Travelling Standard ProgramArseneau, R. et al. | 2003
- 411
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A new transfer device for the NRC Travelling Standard ProgramArseneau, R. / Sutherland, M. / Zelle, J. et al. | 2003
- 415
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Power and Energy - Calibration for Time Domain Propagation Constant Measurements on Power CablesPapazyan, R. et al. | 2003
- 415
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Calibration for time domain propagation constant measurements on power cablesPapazyan, R. / Eriksson, R. et al. | 2003
- 419
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Comparison CCEM-K8 of DC voltage ratio: resultsMarullo-Reedtz, G. / Cerri, R. / Blanc, I. et al. | 2003
- 419
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Power and Energy - Comparison CCEM-K8 of DC Voltage Ratio: ResultsMarullo-Reedtz, G. et al. | 2003
- 424
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Power and Energy - NRC-NIST Intercomparison of Calibration Systems for Current Transducers With a Voltage Output at Power FrequenciesSo, E. et al. | 2003
- 424
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NRC-NIST intercomparison of calibration systems for current transducers with a voltage output at power frequenciesSo, E. / Arseneau, R. / Bennett, D. et al. | 2003
- 429
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No-load loss measurements of power transformers under distorted supply voltage waveform conditionsSo, E. / Arseneau, R. / Hanique, E. et al. | 2003
- 429
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Power and Energy - No-Load Loss Measurements of Power Transformers Under Distorted Supply Voltage Waveform ConditionsSo, E. et al. | 2003
- 433
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The long-term stability of an atomic magnetic resonance standard system for the reproduction of direct current and magnetic flux densityShifrin, V.Ya. / Khorev, V.N. / Shilov, A.Ye. et al. | 2003
- 433
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DC Measurements and Devices - The Long-Term Stability of an Atomic Magnetic Resonance Standard System for the Reproduction of Direct Current and Magnetic Flux DensityShifrin, V.Y. et al. | 2003
- 436
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DC Measurements and Devices - A Traceable Precision Current Source for Currents Between 100 aA and 10 pAWillenberg, G.-D. et al. | 2003
- 436
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A traceable precision current source for currents between 100 aA and 10 pAWillenberg, G.-D. / Tauscher, H.N. / Warnecke, P. et al. | 2003
- 440
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Design and evaluation of a 10-mA DC current reference standardFernqvist, G. / Hudson, G. / Pickering, J. et al. | 2003
- 440
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DC Measurements and Devices - Design and Evaluation of a 10-mA DC Current Reference StandardFernqvist, G. et al. | 2003
- 445
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A novel current calibration system up to 20 kAFernqvist, G. / Halvarsson, B. / Pett, J. et al. | 2003
- 445
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DC Measurements and Devices - A Novel Current Calibration System up to 20 kAFernqvist, G. et al. | 2003
- 449
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DC conductivity measurements in the Van der Pauw geometryRietveld, G. / Koijmans, Ch.V. / Henderson, L.C.A. et al. | 2003
- 449
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DC Measurements and Devices - DC Conductivity Measurements in the Van Der Pauw GeometryRietveld, G. et al. | 2003
- 454
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DC Measurements and Devices - Projecting Zener DC Reference Performance Between CalibrationsHamilton, C.A. et al. | 2003
- 454
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Projecting Zener DC reference performance between calibrationsHamilton, C.A. / Tarr, L.W. et al. | 2003
- 457
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DC Measurements and Devices - Stability of a Micromechanical Pull-In Voltage ReferenceRocha, L.A. et al. | 2003
- 457
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Stability of a micromechanical pull-in voltage referenceRocha, L.A. / Cretu, E. / Wolffenbuttel, R.F. et al. | 2003
- 461
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DC Measurements and Devices - A Precision Setup and Method for Calibrating a DC Voltage Divider's Ratios From 10 V to 1000 VSlinde, H. et al. | 2003
- 461
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A precision setup and method for calibrating a DC voltage divider's ratios from 10 V to 1000 VSlinde, H. / Lind, K. et al. | 2003
- 465
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DC Measurements and Devices - DC Voltage Divider Calibration System at NMIJSakamoto, Y. et al. | 2003
- 465
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DC voltage divider calibration system at NMIJSakamoto, Y. / Fujiki, H. et al. | 2003
- 469
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Method to determine the voltage coefficient of a DC high-voltage dividerKyu-Tae Kim, / Sang-Hwa Lee, / Jae Kap Jung, et al. | 2003
- 469
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DC Measurements and Devices - Method to Determine the Voltage Coefficient of a DC High-Voltage DividerKim, K.-T. et al. | 2003
- 474
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CCEM-K2 key comparison of 10-M/spl Omega/ and 1-G/spl Omega/ resistance standardsJarrett, D.G. / Dziuba, R.F. et al. | 2003
- 474
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DC Measurements and Devices - CCEM-K2 Key Comparison of 10-MO and 1-GO Resistance StandardsJarrett, D.G. et al. | 2003
- 478
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DC Measurements and Devices - Study on Temperature Stability Improvement of On-Chip Reference Elements Using Integrated Peltier CoolersWijngaards, D.D.L. et al. | 2003
- 478
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Study on temperature stability improvement of on-chip reference elements using integrated Peltier coolersWijngaards, D.D.L. / Wolffenbuttel, R.F. et al. | 2003
- 483
-
Data Analysis and Measurement of Non-Electromagnetic Quantities - Use of the Allan Deviation and Linear Prediction for the Determination of the Uncertainty on Time Calibrations Against Predicted TimescalesBernier, L.-G. et al. | 2003
- 483
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Use of the Allan deviation and linear prediction for the determination of the uncertainty on time calibrations against predicted timescalesBernier, L.-G. et al. | 2003
- 487
-
Experimental sampling distributions and confidence intervals of the Allan variance in some DC electrical measurementsWitt, T.J. et al. | 2003
- 487
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Data Analysis and Measurement of Non-Electromagnetic Quantities - Experimental Sampling Distributions and Confidence Intervals of the Allan Variance in Some DC Electrical MeasurementsWitt, T.J. et al. | 2003
- 491
-
Statistical uncertainty analysis of key comparison CCEM-K2Nien Fan Zhang, / Sedransk, N. / Jarrett, D.G. et al. | 2003
- 491
-
Data Analysis and Measurement of Non-Electromagnetic Quantities - Statistical Uncertainty Analysis of Key Comparison CCEM-K2Zhang, N.F. et al. | 2003
- 495
-
Analysis of international comparisons with the minimum variance methodHelisto, P. / Seppa, H. et al. | 2003
- 495
-
Data Analysis and Measurement of Non-Electromagnetic Quantities - Analysis of International Comparisons With the Minimum Variance MethodHelistö, P. et al. | 2003
- 500
-
Accuracy assessment of data analysis in absolute gravimetryDurando, G. / Mana, G. / Mazzoleni, F. et al. | 2003
- 500
-
Data Analysis and Measurement of Non-Electromagnetic Quantities - Accuracy Assessment of Data Analysis in Absolute GravimetryDurando, G. et al. | 2003
- 504
-
Data Analysis and Measurement of Non-Electromagnetic Quantities - Methods to Determine the Density of Moist AirPicard, A. et al. | 2003
- 504
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Methods to determine the density of moist airPicard, A. / Hao Fang, et al. | 2003
- 508
-
The NIST microforce realization and measurement projectNewell, D.B. / Kramar, J.A. / Pratt, J.R. et al. | 2003
- 508
-
Data Analysis and Measurement of Non-Electromagnetic Quantities - The NIST Microforce Realization and Measurement ProjectNewell, D.B. et al. | 2003
- 512
-
Development of 10-V Josephson series arraysSe Il Park, / Hyun Kwon Hong, et al. | 2003
- 512
-
Application of the Josephson Effect - Development of 10-V Josephson Series ArraysPark, S.I. et al. | 2003
- 516
-
Characterization of binary Josephson series arrays of different types at BNM-LNE and comparisons with conventional SIS arraysLo-Hive, J.-P. / Djordjevic, S. / Cancela, P. et al. | 2003
- 516
-
Application of the Josephson Effect - Characterization of Binary Josephson Series Arrays of Different Types at BNM-LNE and Comparisons With Conventional SIS ArraysLo-Hive, J.-P. et al. | 2003
- 521
-
Measuring resistance standards in terms of the quantized Hall resistance with a dual Josephson voltage standard using SINIS Josephson arraysBehr, R. / Funck, T. / Schumacher, B. et al. | 2003
- 521
-
Application of the Josephson Effect - Measuring Resistance Standards in Terms of the Quantized Hall Resistance With a Dual Josephson Voltage Standard Using SINIS Josephson ArraysBehr, R. et al. | 2003
- 524
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Analysis of different measurement setups for a programmable Josephson voltage standardBehr, R. / Kohlmann, J. / Janssen, J.-T.B.M. et al. | 2003
- 524
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Application of the Josephson Effect - Analysis of Different Measurement Setups for a programmable Josephson Voltage StandardBehr, R. et al. | 2003
- 529
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DC voltage calibrator based on an array of high-temperature superconductor Josephson junctionsKlushin, A.M. / Komkov, A.V. / Gelikonova, V.D. et al. | 2003
- 529
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Application of the Josephson Effect - DC Voltage Calibrator Based on an Array of High-Temperature Superconductor Josephson JunctionsKlushin, A.M. et al. | 2003
- 533
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AC voltage standard based on a programmable SIS arrayHelisto, P. / Nissila, J. / Ojasalo, K. et al. | 2003
- 533
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Application of the Josephson Effect - AC Voltage Standard Based on a Programmable SIS ArrayHelistö, P. et al. | 2003
- 538
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Application of the Josephson Effect - AC-DC Transfer Comparator for the Calibration of Thermal Voltage Converters Against Josephson Alternating Voltage StandardsBudovsky, I. et al. | 2003
- 538
-
AC-DC transfer comparator for the calibration of thermal voltage converters against Josephson alternating voltage standardsBudovsky, I. / Sasaki, H. / Coogan, P. et al. | 2003
- 542
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Application of the Josephson Effect - AC Josephson Voltage Standard Error Measurements and AnalysisBurroughs, C.J. et al. | 2003
- 542
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AC Josephson voltage standard error measurements and analysisBurroughs, C.J. / Benz, S.P. / Dresselhaus, P.D. et al. | 2003
- 545
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Application of the Josephson Effect - An AC Josephson Source for Johnson Noise ThermometryBenz, S.P. et al. | 2003
- 545
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An AC Josephson source for Johnson noise thermometryBenz, S.P. / Martinis, J.M. / Dresselhaus, P.D. et al. | 2003
- 550
-
Application of the Josephson Effect - Johnson Noise Thermometry Measurements Using a Quantized Voltage Noise Source for CalibrationNam, S.W. et al. | 2003
- 550
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Johnson noise thermometry measurements using a quantized voltage noise source for calibrationSae Woo Nam, / Benz, S.P. / Dresselhaus, P.D. et al. | 2003
- 555
-
Application of the Quantum Hall Effect - Quantum Resistance Standards With Double 2DEGBounouh, A. et al. | 2003
- 555
-
Quantum resistance standards with double 2DEGBounouh, A. / Poirier, W. / Piquemal, F. et al. | 2003
- 559
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Application of the Quantum Hall Effect - Direct Determination of Capacitance Standards Using a Quadrature Bridge and a Pair of Quantized Hall ResistorsInglis, A.D. et al. | 2003
- 559
-
Direct determination of capacitance standards using a quadrature bridge and a pair of quantized Hall resistorsInglis, A.D. / Wood, B.M. / Cote, M. et al. | 2003
- 563
-
The European ACQHE project: modular system for the calibration of capacitance standards based on the quantum Hall effectMelcher, J. / Schurr, J. / Pierz, K. et al. | 2003
- 563
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Application of the Quantum Hall Effect - The European ACQHE Project: Modular System for the Calibration of Capacitance Standards Based on the Quantum Hall EffectMelcher, J. et al. | 2003
- 569
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Plateau flatness in the ACQHR: do gates really help?Inglis, A.D. / Wood, B.M. / Cote, M. et al. | 2003
- 569
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Application of the Quantum Hall Effect - Plateau Flatness in the ACQHR: Do Gates Really Help?Inglis, A.D. et al. | 2003
- 574
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Application of the Quantum Hall Effect - Effects of Metallic Gates on AC Measurements of the Quantum Hall ResistanceOverney, F. et al. | 2003
- 574
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Effects of metallic gates on AC measurements of the quantum Hall resistanceOverney, F. / Jeanneret, B. / Jeckelmann, B. et al. | 2003
- 579
-
Four-port AC quantized Hall resistance measurementsRicketts, B.W. / Fiander, J.R. / Johnson, H.L. et al. | 2003
- 579
-
Application of the Quantum Hall Effect - Four-Port AC Quantized Hall Resistance MeasurementsRicketts, B.W. et al. | 2003
- 584
-
Counting electrons one by one-overview of a joint European research projectvan den Brom, H.E. / Kerkhof, O. / Lotkhov, S.V. et al. | 2003
- 584
-
Single Electron Counting and Cryogenic Current Comparator - Counting Electrons One by One -- Overview of a Joint European Research ProjectBrom, H.E.van den et al. | 2003
- 590
-
Single Electron Counting and Cryogenic Current Comparator - Using a High-Value Resistor in Triangle Comparisons of Electrical StandardsElmquist, R.E. et al. | 2003
- 590
-
Using a high-value resistor in triangle comparisons of electrical standardsElmquist, R.E. / Zimmerman, N.M. / Huber, W.H. et al. | 2003
- 594
-
Study of the limitations of the quantized acoustic current technique at PTB and NPLEbbecke, J. / Fletcher, N.E. / Ahlers, F.-J. et al. | 2003
- 594
-
Single Electron Counting and Cryogenic Current Comparator - Study of the Limitations of the Quantized Acoustic Current Technique at PTB and NPLEbbecke, J. et al. | 2003
- 599
-
Progress in measurements of a single-electron pump by means of a CCCFeltin, N. / Devoille, L. / Piquemal, F. et al. | 2003
- 599
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Single Electron Counting and Cryogenic Current Comparator - Progress in Measurements of a Single-Electron Pump by Means of a CCCFeltin, N. et al. | 2003
- 604
-
Single Electron Counting and Cryogenic Current Comparator - First Steps Toward a Quantum Capacitance Standard at METASHof, C. et al. | 2003
- 604
-
First steps toward a quantum capacitance standard at METASHof, C. / Jeanneret, B. / Eichenberger, A. et al. | 2003
- 608
-
Larger value and SI measurement of the improved cryogenic capacitor for the electron-counting capacitance standardZimmerman, N.M. / El Sabbagh, M.A. / Yicheng Wang, et al. | 2003
- 608
-
Single Electron Counting and Cryogenic Current Comparator - Larger Value and SI Measurement of the Improved Cryogenic Capacitor for the Electron-Counting Capacitance StandardZimmerman, N.M. et al. | 2003
- 612
-
Single Electron Counting and Cryogenic Current Comparator - Simplified Calculus for the Design of a Cryogenic Current ComparatorSesé, J. et al. | 2003
- 612
-
Simplified calculus for the design of a cryogenic current comparatorSese, J. / Bartolome, E. / Camon, A. et al. | 2003
- 617
-
Single Electron Counting and Cryogenic Current Comparator - HTS Cryogenic Current Comparator for Non-Invasive Sensing of Charged Particle BeamsHao, L. et al. | 2003
- 617
-
HTS cryogenic current comparator for non-invasive sensing of charged particle beamsLing Hao, / Gallop, J.C. / Macfarlane, J.C. et al. | 2003
- 621
-
Single Electron Counting and Cryogenic Current Comparator - 1:30 000 Cryogenic Current Comparator With Optimum SQUID ReadoutRietveld, G. et al. | 2003
- 621
-
1:30000 cryogenic current comparator with optimum SQUID readoutRietveld, G. / Bartolome, E. / Sese, J. et al. | 2003
- 626
-
Status of the METAS watt balance experimentBeer, W. / Eichenberger, A.L. / Jeanneret, B. et al. | 2003
- 626
-
Watt Balance and Avogadro Constant - Status of the METAS Watt Balance ExperimentBeer, W. et al. | 2003
- 631
-
Interferometric determination of the diameter of a silicon sphere using a direct optical frequency tuning systemKuramoto, N. / Fujii, K. et al. | 2003
- 631
-
Watt Balance and Avogadro Constant - Interferometric Determination of the Diameter of a Silicon Sphere Using a Direct Optical Frequency Tuning SystemKuramoto, N. et al. | 2003
- 636
-
Watt Balance and Avogadro Constant - Flotation Measurements to Reveal the Reason for the Discrepancy in the Molar Volume of SiliconBettin, H. et al. | 2003
- 636
-
Flotation measurements to reveal the reason for the discrepancy in the molar volume of siliconBettin, H. / Toth, H. et al. | 2003
- 641
-
A Web-based database for the international programme to improve the Avogadro constant along the silicon routeKenny, M.J. / De Bievre, P. / Picard, A. et al. | 2003
- 641
-
Watt Balance and Avogadro Constant - A Web-Based Database for the International Programme to Improve the Avogadro Constant Along the Silicon RouteKenny, M.J. et al. | 2003
- 646
-
Watt Balance and Avogadro Constant - Evaluation of the Molar Volume of Silicon Crystals for a Determination of the Avogadro ConstantFujii, K. et al. | 2003
- 646
-
Evaluation of the molar volume of silicon crystals for a determination of the Avogadro constantFujii, K. / Waseda, A. / Kuramoto, N. et al. | 2003